{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,26]],"date-time":"2026-01-26T00:58:42Z","timestamp":1769389122026,"version":"3.49.0"},"reference-count":0,"publisher":"Wiley","issue":"9","license":[{"start":{"date-parts":[[2010,6,10]],"date-time":"2010-06-10T00:00:00Z","timestamp":1276128000000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Phys. Status Solidi (c)"],"published-print":{"date-parts":[[2010,9]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>Fluorine doped tin oxide (FTO) semiconductor thin films were deposited on glass substrates using spray pyrolysis technique and the effect of fluorine (F\u2010) doping (varying 0\u201030 at%) is explored. X\u2010ray diffraction studies confirmed the tetragonal structure with polycrystalline nature. The crystallinity of undoped films is enhanced with the increase in F\u2010doping. The films doped with 25 at% F show a strong orientation along (101) plane. The grain size of the undoped films (214 nm) is increased with the increase in F\u2010doping level to reach a maximum of 415 nm (25 at% F). A minimum sheet resistance of \u223c5.4 \u03a9\/\u25a1 obtained for the 30 at% F doped films is among the lowest reported values. The average visible transmittance (400\u2010700 nm) of the undoped films (61.4%) is increased with the increasing F\u2010doping to reach a maximum of 74.5% (25 at%. F). The films doped with 25 at.% F showed high value of figure of merit (4.55 \u00d7 10<jats:sup>\u20103<\/jats:sup> \u03a9<jats:sup>\u20101<\/jats:sup>). The obtained results authenticate the influence of F\u2010doping on the properties of the deposited films. (\u00a9 2010 WILEY\u2010VCH Verlag GmbH &amp; Co. KGaA, Weinheim)<\/jats:p>","DOI":"10.1002\/pssc.200983738","type":"journal-article","created":{"date-parts":[[2010,6,10]],"date-time":"2010-06-10T12:02:39Z","timestamp":1276171359000},"page":"2277-2281","source":"Crossref","is-referenced-by-count":38,"title":["Characterization of SnO<sub>2<\/sub>:F thin films deposited by an economic spray pyrolysis technique"],"prefix":"10.1002","volume":"7","author":[{"given":"Nafiseh","family":"Memarian","sequence":"first","affiliation":[]},{"given":"Seyed Mohammad","family":"Rozati","sequence":"additional","affiliation":[]},{"given":"Elangovan","family":"Elamurugu","sequence":"additional","affiliation":[]},{"given":"Elvira","family":"Fortunato","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2010,6,10]]},"container-title":["physica status solidi c"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fpssc.200983738","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/pssc.200983738","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/pssc.200983738","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,12]],"date-time":"2023-09-12T14:26:02Z","timestamp":1694528762000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/pssc.200983738"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,6,10]]},"references-count":0,"journal-issue":{"issue":"9","published-print":{"date-parts":[[2010,9]]}},"alternative-id":["10.1002\/pssc.200983738"],"URL":"https:\/\/doi.org\/10.1002\/pssc.200983738","archive":["Portico"],"relation":{},"ISSN":["1862-6351","1610-1642"],"issn-type":[{"value":"1862-6351","type":"print"},{"value":"1610-1642","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,6,10]]}}}