{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T02:58:06Z","timestamp":1772333886468,"version":"3.50.1"},"reference-count":0,"publisher":"Wiley","issue":"3","license":[{"start":{"date-parts":[[2012,12,21]],"date-time":"2012-12-21T00:00:00Z","timestamp":1356048000000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Phys. Status Solidi C"],"published-print":{"date-parts":[[2013,3]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>X\u2010ray Reciprocal Space Mapping (RSM) is a powerful tool to explore the structure of semiconductor materials. However, conventional lab\u2010based RSMs are usually measured in two dimensions (2D) ignoring the third dimension of diffraction\u2010space volume. We report the use of a combination of X\u2010ray microfocusing and state\u2010of\u2010the\u2010art 2D area detectors to study the full volume of diffraction\u2013space while probing III\u2010nitride materials on the microscale. (\u00a9 2012 WILEY\u2010VCH Verlag GmbH &amp; Co. KGaA, Weinheim)<\/jats:p>","DOI":"10.1002\/pssc.201200596","type":"journal-article","created":{"date-parts":[[2012,12,22]],"date-time":"2012-12-22T05:21:16Z","timestamp":1356153676000},"page":"481-485","source":"Crossref","is-referenced-by-count":5,"title":["Characterisation of III\u2010nitride materials by synchrotron X\u2010ray microdiffraction reciprocal space mapping"],"prefix":"10.1002","volume":"10","author":[{"given":"Vyacheslav","family":"Kachkanov","sequence":"first","affiliation":[]},{"given":"Igor","family":"Dolbnya","sequence":"additional","affiliation":[]},{"given":"Kevin","family":"O'Donnell","sequence":"additional","affiliation":[]},{"given":"Katharina","family":"Lorenz","sequence":"additional","affiliation":[]},{"given":"Sergio","family":"Pereira","sequence":"additional","affiliation":[]},{"given":"Ian","family":"Watson","sequence":"additional","affiliation":[]},{"given":"Thomas","family":"Sadler","sequence":"additional","affiliation":[]},{"given":"Haoning","family":"Li","sequence":"additional","affiliation":[]},{"given":"Vitaly","family":"Zubialevich","sequence":"additional","affiliation":[]},{"given":"Peter","family":"Parbrook","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2012,12,21]]},"container-title":["physica status solidi c"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fpssc.201200596","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/pssc.201200596","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/pssc.201200596","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,14]],"date-time":"2023-09-14T00:05:04Z","timestamp":1694649904000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/pssc.201200596"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,12,21]]},"references-count":0,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2013,3]]}},"alternative-id":["10.1002\/pssc.201200596"],"URL":"https:\/\/doi.org\/10.1002\/pssc.201200596","archive":["Portico"],"relation":{},"ISSN":["1862-6351","1610-1642"],"issn-type":[{"value":"1862-6351","type":"print"},{"value":"1610-1642","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,12,21]]}}}