{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,16]],"date-time":"2023-10-16T13:14:21Z","timestamp":1697462061169},"reference-count":24,"publisher":"Wiley","issue":"2","license":[{"start":{"date-parts":[[2010,12,22]],"date-time":"2010-12-22T00:00:00Z","timestamp":1292976000000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Physica Rapid Research Ltrs"],"published-print":{"date-parts":[[2011,2]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>We demonstrate a standard\u2010free method to retrieve compositional information in Al<jats:italic><jats:sub>x<\/jats:sub><\/jats:italic> In<jats:sub>1\u2013<jats:italic>x<\/jats:italic><\/jats:sub>N thin films by measuring the bulk plasmon energy (<jats:italic>E<\/jats:italic><jats:sub>p<\/jats:sub>), employing electron energy loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM). Two series of samples were grown by magnetron sputter epitaxy (MSE) and metal organic vapor phase epitaxy (MOVPE), which together cover the full com\u2010 positional range 0 \u2264 <jats:italic>x<\/jats:italic> \u2264 1. Complementary compositional measurements were obtained using Rutherford backscattering spectroscopy (RBS) and the lattice parameters were obtained by X\u2010ray diffraction (XRD). It is shown that <jats:italic>E<\/jats:italic><jats:sub>p<\/jats:sub> follows a linear relation with respect to composition and lattice parameter between the alloying elements from AlN to InN allowing for straightforward compositional analysis. (\u00a9 2011 WILEY\u2010VCH Verlag GmbH &amp; Co. KGaA, Weinheim)<\/jats:p>","DOI":"10.1002\/pssr.201004407","type":"journal-article","created":{"date-parts":[[2010,12,22]],"date-time":"2010-12-22T22:30:39Z","timestamp":1293057039000},"page":"50-52","source":"Crossref","is-referenced-by-count":15,"title":["Standard\u2010free composition measurements of Al<i><sub>x<\/sub><\/i> In<sub>1\u2013<i>x<\/i><\/sub>N by low\u2010loss electron energy loss spectroscopy"],"prefix":"10.1002","volume":"5","author":[{"given":"Justinas","family":"Palisaitis","sequence":"first","affiliation":[]},{"given":"Ching\u2010Lien","family":"Hsiao","sequence":"additional","affiliation":[]},{"given":"Muhammad","family":"Junaid","sequence":"additional","affiliation":[]},{"given":"Mengyao","family":"Xie","sequence":"additional","affiliation":[]},{"given":"Vanya","family":"Darakchieva","sequence":"additional","affiliation":[]},{"given":"Jean\u2010Francois","family":"Carlin","sequence":"additional","affiliation":[]},{"given":"Nicolas","family":"Grandjean","sequence":"additional","affiliation":[]},{"given":"Jens","family":"Birch","sequence":"additional","affiliation":[]},{"given":"Lars","family":"Hultman","sequence":"additional","affiliation":[]},{"given":"Per O. \u00c5.","family":"Persson","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2010,12,22]]},"reference":[{"key":"e_1_2_2_2_2","doi-asserted-by":"publisher","DOI":"10.1116\/1.585897"},{"key":"e_1_2_2_3_2","doi-asserted-by":"publisher","DOI":"10.1063\/1.3155798"},{"key":"e_1_2_2_4_2","doi-asserted-by":"publisher","DOI":"10.1063\/1.2804568"},{"key":"e_1_2_2_5_2","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/40\/20\/S16"},{"key":"e_1_2_2_6_2","doi-asserted-by":"publisher","DOI":"10.1063\/1.1368156"},{"key":"e_1_2_2_7_2","doi-asserted-by":"publisher","DOI":"10.1063\/1.114359"},{"key":"e_1_2_2_8_2","doi-asserted-by":"publisher","DOI":"10.1063\/1.2936289"},{"key":"e_1_2_2_9_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.micron.2007.09.009"},{"key":"e_1_2_2_10_2","doi-asserted-by":"publisher","DOI":"10.1016\/S0304-3991(99)00018-2"},{"key":"e_1_2_2_11_2","unstructured":"D. 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