{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T14:43:06Z","timestamp":1761662586821,"version":"build-2065373602"},"reference-count":12,"publisher":"Wiley","issue":"2","license":[{"start":{"date-parts":[[2008,2,25]],"date-time":"2008-02-25T00:00:00Z","timestamp":1203897600000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["X-Ray Spectrometry"],"published-print":{"date-parts":[[2008,3]]},"abstract":"<jats:title>Abstract<\/jats:title>\n                  <jats:p>Recently, a new PIXE code, LibCPIXE, was produced as a variant to the old DATTPIXE package following a simulation\u2010based approach usually not used in PIXE data handling. This approach required to merge the PIXE data handling code, LibCPIXE to NDF, a well\u2010known code for handling RBS and other IBA methods data, and showed that complex structures in the samples can dramatically change the observed PIXE yields. A full stepwise process was then undertaken in order to produce a new PIXE data handling code that uses the simulation approach not only to estimate the number of K\u2010\u03b1 and L\u2010\u03b1 x\u2010rays emitted by the elements present in structured samples but to fit the entire PIXE energy spectra. This approach is of particular importance for the new high x\u2010ray energy and high resolution PIXE set\u2010up being installed at ITN, for the precise interpretation of PIXE spectra from complex targets, and also as a robust basis to relative yield ion energy dependence (RYIED) work discussed elsewhere in this conference. In this communication we present the fitting core for the new DT2 package and discuss its capacity. Copyright \u00a9 2008 John Wiley &amp; Sons, Ltd.<\/jats:p>","DOI":"10.1002\/xrs.1027","type":"journal-article","created":{"date-parts":[[2008,2,25]],"date-time":"2008-02-25T06:17:08Z","timestamp":1203920228000},"page":"100-102","source":"Crossref","is-referenced-by-count":16,"title":["DT2, a PIXE spectra simulation and fitting package"],"prefix":"10.1002","volume":"37","author":[{"given":"M. A.","family":"Reis","sequence":"first","affiliation":[]},{"given":"P. C.","family":"Chaves","sequence":"additional","affiliation":[]},{"given":"L. C.","family":"Alves","sequence":"additional","affiliation":[]},{"given":"N. P.","family":"Barradas","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[2008,2,25]]},"reference":[{"key":"e_1_2_1_2_2","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-583X(01)01016-3"},{"key":"e_1_2_1_3_2","unstructured":"ChavesPC ReisMA. InProceedings of the X International Conference on PIXE and its Analytical Applications Portoro\u017e Slovenia LjubLjana June 4\u20138 \u2014IJS 2004; (ed. in CD\u2010ROM)."},{"key":"e_1_2_1_4_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.nimb.2004.12.113"},{"key":"e_1_2_1_5_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.nimb.2007.04.049"},{"key":"e_1_2_1_6_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.susc.2006.01.051"},{"key":"e_1_2_1_7_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.nimb.2006.03.190"},{"key":"e_1_2_1_8_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.nimb.2007.04.284"},{"key":"e_1_2_1_9_2","doi-asserted-by":"publisher","DOI":"10.1016\/0168-583X(92)96098-J"},{"key":"e_1_2_1_10_2","unstructured":"ReisMA ChavesPC TabordaA CarvalhoA. InProceedings of the XI International Conference on PIXE and its Analytical Applications Puebla M\u00e9xico 25 to 29thMay 2006; PI\u20106."},{"key":"e_1_2_1_11_2","unstructured":"ChavesPC ReisMA Kav\u00e8i\u00e8M. InProceedings of the XI International Conference on PIXE and its Analytical Applications Puebla M\u00e9xico 25 to 29thMay 2006; PI\u20104."},{"key":"e_1_2_1_12_2","doi-asserted-by":"publisher","DOI":"10.1016\/0168-583X(95)01210-9"},{"key":"e_1_2_1_13_2","doi-asserted-by":"publisher","DOI":"10.1002\/xrs.903"}],"container-title":["X-Ray Spectrometry"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1002%2Fxrs.1027","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/analyticalsciencejournals.onlinelibrary.wiley.com\/doi\/pdf\/10.1002\/xrs.1027","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T09:59:54Z","timestamp":1761559194000},"score":1,"resource":{"primary":{"URL":"https:\/\/analyticalsciencejournals.onlinelibrary.wiley.com\/doi\/10.1002\/xrs.1027"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,2,25]]},"references-count":12,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2008,3]]}},"alternative-id":["10.1002\/xrs.1027"],"URL":"https:\/\/doi.org\/10.1002\/xrs.1027","archive":["Portico"],"relation":{},"ISSN":["0049-8246","1097-4539"],"issn-type":[{"type":"print","value":"0049-8246"},{"type":"electronic","value":"1097-4539"}],"subject":[],"published":{"date-parts":[[2008,2,25]]}}}