{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T17:37:45Z","timestamp":1725471465690},"publisher-location":"Berlin, Heidelberg","reference-count":36,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540659228"},{"type":"electronic","value":"9783540488552"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[1999]]},"DOI":"10.1007\/10703163_3","type":"book-chapter","created":{"date-parts":[[2006,10,9]],"date-time":"2006-10-09T14:15:50Z","timestamp":1160403350000},"page":"29-44","source":"Crossref","is-referenced-by-count":5,"title":["Testing of Finite State Systems"],"prefix":"10.1007","author":[{"given":"Mihalis","family":"Yannakakis","sequence":"first","affiliation":[]},{"given":"David","family":"Lee","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"3_CR1","unstructured":"Agrawal, V.D., Seth, S.C.: Test Generation for VLSI Chips. Computer Society Press (1988)"},{"issue":"11","key":"3_CR2","doi-asserted-by":"publisher","first-page":"1604","DOI":"10.1109\/26.111442","volume":"39","author":"A.V. Aho","year":"1991","unstructured":"Aho, A.V., Dahbura, A.T., Lee, D., Uyar, M.U.: An optimization technique for protocol conformance test generation based on UIO sequences and rural Chinese postman tours. IEEE Trans. on Communication\u00a039(11), 1604\u20131615 (1991)","journal-title":"IEEE Trans. on Communication"},{"key":"3_CR3","doi-asserted-by":"crossref","unstructured":"Alur, R., Courcoubetis, C., Yannakakis, M.: Distinguishing tests for nondeterministic and probabilistic machines. In: Proc. 27th Ann. ACM Symp. on Theory of Computing, pp. 363\u2013372 (1995)","DOI":"10.1145\/225058.225161"},{"key":"3_CR4","doi-asserted-by":"publisher","first-page":"87","DOI":"10.1016\/0890-5401(87)90052-6","volume":"75","author":"D. Angluin","year":"1987","unstructured":"Angluin, D.: Learning regular sets from queries and counter examples. Inform. and Comp.\u00a075, 87\u2013106 (1987)","journal-title":"Inform. and Comp."},{"key":"3_CR5","unstructured":"International standard ISO 8802-2, ANSI\/IEEE std 802.2 (1989)"},{"key":"3_CR6","doi-asserted-by":"crossref","unstructured":"Apfelbaum, L.: Automated functional test generation. In: Proc. IEEE Autotestcon Conference (1995)","DOI":"10.1109\/AUTEST.1995.522660"},{"key":"3_CR7","doi-asserted-by":"crossref","unstructured":"Chan, W.Y.L., Vuong, S.T., Ito, M.R.: An improved protocol test generation procedure based on UIOs. In: Proc. SIGCOM, pp. 283\u2013294 (1989)","DOI":"10.1145\/75246.75274"},{"key":"3_CR8","doi-asserted-by":"crossref","unstructured":"Chanson, S.T., Zhu, J.: A unified approach to protocol test sequence generation. In: Proc. INFOCOM, pp. 106\u2013114 (1993)","DOI":"10.1109\/INFCOM.1993.253243"},{"key":"3_CR9","first-page":"85","volume-title":"Proc. IFIP WG6.1 10th Intl. Symp. on Protocol Specification, Testing, and Verification","author":"M.-S. Chen","year":"1990","unstructured":"Chen, M.-S., Choi, Y., Kershenbaum, A.: Approaches utilizing segment overlap to minimize test sequences. In: Logrippo, L., Probert, R.L., Ural, H. (eds.) Proc. IFIP WG6.1 10th Intl. Symp. on Protocol Specification, Testing, and Verification, pp. 85\u201398. North-Holland, Amsterdam (1990)"},{"issue":"3","key":"3_CR10","doi-asserted-by":"publisher","first-page":"178","DOI":"10.1109\/TSE.1978.231496","volume":"SE-4","author":"T.S. Chow","year":"1978","unstructured":"Chow, T.S.: Testing software design modeled by finite-state machines. IEEE Trans. on Software Engineering\u00a0SE-4(3), 178\u2013187 (1978)","journal-title":"IEEE Trans. on Software Engineering"},{"key":"3_CR11","doi-asserted-by":"publisher","first-page":"88","DOI":"10.1007\/BF01580113","volume":"5","author":"J. Edmonds","year":"1973","unstructured":"Edmonds, J., Johnson, E.L.: Matching, Euler tours and the Chinese postman. Mathematical Programming\u00a05, 88\u2013124 (1973)","journal-title":"Mathematical Programming"},{"key":"3_CR12","volume-title":"Fault Detection in Digital Circuits","author":"A.D. Friedman","year":"1971","unstructured":"Friedman, A.D., Menon, P.R.: Fault Detection in Digital Circuits. Prentice-Hall, Englewood Cliffs (1971)"},{"key":"3_CR13","doi-asserted-by":"crossref","unstructured":"Hennie, F.C.: Fault detecting experiments for sequential circuits. In: Proc. 5th Ann. Symp. Switching Circuit Theory and Logical Design, pp. 95\u2013110 (1964)","DOI":"10.1109\/SWCT.1964.8"},{"key":"3_CR14","volume-title":"Design and Validation of Computer Protocols","author":"G.J. Holzmann","year":"1991","unstructured":"Holzmann, G.J.: Design and Validation of Computer Protocols. Prentice-Hall, Englewood Cliffs (1991)"},{"key":"3_CR15","volume-title":"OSI Protocol Conformance Testing","author":"K.G. Knightson","year":"1993","unstructured":"Knightson, K.G.: OSI Protocol Conformance Testing. McGraw Hill, New York (1993)"},{"key":"3_CR16","volume-title":"Switching and Finite Automata Theory","author":"Z. Kohavi","year":"1978","unstructured":"Kohavi, Z.: Switching and Finite Automata Theory, 2nd edn. McGraw-Hill, New York (1978)","edition":"2"},{"key":"3_CR17","doi-asserted-by":"crossref","DOI":"10.1515\/9781400864041","volume-title":"Computer-aided Verification of Coordinating Processes","author":"R.P. Kurshan","year":"1995","unstructured":"Kurshan, R.P.: Computer-aided Verification of Coordinating Processes. Princeton University Press, Princeton (1995)"},{"issue":"5","key":"3_CR18","doi-asserted-by":"publisher","first-page":"631","DOI":"10.1109\/26.494307","volume":"44","author":"D. Lee","year":"1996","unstructured":"Lee, D., Sabnani, K.K., Kristol, D.M., Paul, S.: Conformance testing of protocols specified as communicating finite state machines - a guided random walk based approach. IEEE Trans. on Communications\u00a044(5), 631\u2013640 (1996)","journal-title":"IEEE Trans. on Communications"},{"key":"3_CR19","doi-asserted-by":"crossref","unstructured":"Lee, D., Yannakakis, M.: On-line minimization of transition systems. In: Proc. 24th Ann. ACM Symp. on Theory of Computing, pp. 264\u2013274 (1992)","DOI":"10.1145\/129712.129738"},{"issue":"3","key":"3_CR20","doi-asserted-by":"publisher","first-page":"306","DOI":"10.1109\/12.272431","volume":"43","author":"D. Lee","year":"1994","unstructured":"Lee, D., Yannakakis, M.: Testing finite state machines: state identification and verification. IEEE Trans. on Computers\u00a043(3), 306\u2013320 (1994)","journal-title":"IEEE Trans. on Computers"},{"issue":"8","key":"3_CR21","doi-asserted-by":"publisher","first-page":"1089","DOI":"10.1109\/5.533956","volume":"84","author":"D. Lee","year":"1996","unstructured":"Lee, D., Yannakakis, M.: Principles and Methods of Testing Finite State Machines - a Survey. Proceedings of IEEE\u00a084(8), 1089\u20131123 (1996)","journal-title":"Proceedings of IEEE"},{"key":"3_CR22","doi-asserted-by":"crossref","unstructured":"Lee, D., Yannakakis, M.: Optimization Problems from Feature Testing of Communication Protocols. In: Proc. of Intl. Conf. on Network Protocols, pp. 66\u201375 (1996)","DOI":"10.1109\/ICNP.1996.564905"},{"key":"3_CR23","unstructured":"Lee, D., Yannakakis, M.: in preparation"},{"key":"3_CR24","unstructured":"Lee, D., Yannakakis, M.: Pithia - An automatic test generation software tool for communication systems (in preparation)"},{"issue":"1","key":"3_CR25","doi-asserted-by":"publisher","first-page":"116","DOI":"10.1109\/90.222912","volume":"1","author":"R.E. Miller","year":"1993","unstructured":"Miller, R.E., Paul, S.: On the generation of minimal length test sequences for conformance testing of communication protocols. IEEE\/ACM Trans. on Networking\u00a01(1), 116\u2013129 (1993)","journal-title":"IEEE\/ACM Trans. on Networking"},{"key":"3_CR26","first-page":"129","volume-title":"Automata Studies, Annals of Mathematics Studies","author":"E.F. Moore","year":"1956","unstructured":"Moore, E.F.: Gedanken-experiments on sequential machines. In: Automata Studies, Annals of Mathematics Studies, vol.\u00a034, pp. 129\u2013153. Princeton University Press, Princeton (1956)"},{"key":"3_CR27","first-page":"238","volume-title":"Proc. IEEE Fault Tolerant Comput. Symp.","author":"S. Naito","year":"1981","unstructured":"Naito, S., Tsunoyama, M.: Fault detection for sequential machines by transitions tours. In: Proc. IEEE Fault Tolerant Comput. Symp., pp. 238\u2013243. IEEE Computer Society Press, Los Alamitos (1981)"},{"key":"3_CR28","doi-asserted-by":"crossref","unstructured":"Rivest, R.L., Schapire, R.E.: Inference of finite automata using homing sequences. In: Proc. 21st Ann. Symp. on Theory of Computing, pp. 411\u2013420 (1989)","DOI":"10.1145\/73007.73047"},{"issue":"4","key":"3_CR29","doi-asserted-by":"publisher","first-page":"285","DOI":"10.1016\/0169-7552(88)90064-5","volume":"15","author":"K.K. Sabnani","year":"1988","unstructured":"Sabnani, K.K., Dahbura, A.T.: A protocol test generation procedure. Computer Networks and ISDN Systems\u00a015(4), 285\u2013297 (1988)","journal-title":"Computer Networks and ISDN Systems"},{"issue":"4","key":"3_CR30","doi-asserted-by":"publisher","first-page":"389","DOI":"10.1109\/TCOM.1984.1096074","volume":"COM-32","author":"B. Sarikaya","year":"1984","unstructured":"Sarikaya, B., Bochmann, G.v.: Synchronization and specification issues in protocol testing. IEEE Trans. on Commun.\u00a0COM-32(4), 389\u2013395 (1984)","journal-title":"IEEE Trans. on Commun."},{"issue":"4","key":"3_CR31","doi-asserted-by":"publisher","first-page":"413","DOI":"10.1109\/32.16602","volume":"15","author":"D.P. Sidhu","year":"1989","unstructured":"Sidhu, D.P., Leung, T.-K.: Formal methods for protocol testing: a detailed study. IEEE Trans. Soft. Eng.\u00a015(4), 413\u2013426 (1989)","journal-title":"IEEE Trans. Soft. Eng."},{"key":"3_CR32","first-page":"44","volume":"6","author":"M.N. Sokolovskii","year":"1971","unstructured":"Sokolovskii, M.N.: Diagnostic experiments with automata. Kibernetika\u00a06, 44\u201349 (1971)","journal-title":"Kibernetika"},{"key":"3_CR33","unstructured":"Uyar, M.U., Dahbura, A.T.: Optimal test sequence generation for protocols: the Chinese postman algorithm applied to Q.931. In: Proc. IEEE Global Telecommunications Conference (1986)"},{"key":"3_CR34","first-page":"98","volume":"4","author":"M.P. Vasilevskii","year":"1973","unstructured":"Vasilevskii, M.P.: Failure diagnosis of automata. Kibernetika\u00a04, 98\u2013108 (1973)","journal-title":"Kibernetika"},{"key":"3_CR35","doi-asserted-by":"crossref","unstructured":"Yang, B., Ural, H.: Protocol conformance test generation using multiple UIO sequences with overlapping. In: Proc. SIGCOM, pp. 118\u2013125 (1990)","DOI":"10.1145\/99508.99543"},{"issue":"2","key":"3_CR36","doi-asserted-by":"publisher","first-page":"209","DOI":"10.1006\/jcss.1995.1019","volume":"50","author":"M. Yannakakis","year":"1995","unstructured":"Yannakakis, M., Lee, D.: Testing finite state machines: fault detection. J. of Computer and System Sciences\u00a050(2), 209\u2013227 (1995)","journal-title":"J. of Computer and System Sciences"}],"container-title":["Lecture Notes in Computer Science","Computer Science Logic"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/10703163_3","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,21]],"date-time":"2019-04-21T11:16:01Z","timestamp":1555845361000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/10703163_3"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1999]]},"ISBN":["9783540659228","9783540488552"],"references-count":36,"URL":"https:\/\/doi.org\/10.1007\/10703163_3","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[1999]]}}}