{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T20:08:29Z","timestamp":1725566909976},"publisher-location":"Berlin, Heidelberg","reference-count":23,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540290131"},{"type":"electronic","value":"9783540320807"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2005]]},"DOI":"10.1007\/11556930_25","type":"book-chapter","created":{"date-parts":[[2010,9,28]],"date-time":"2010-09-28T21:18:41Z","timestamp":1285708721000},"page":"237-246","source":"Crossref","is-referenced-by-count":11,"title":["Optimization of Reliability and Power Consumption in Systems on a Chip"],"prefix":"10.1007","author":[{"given":"Tajana","family":"Simunic","sequence":"first","affiliation":[]},{"given":"Kresimir","family":"Mihic","sequence":"additional","affiliation":[]},{"given":"Giovanni","family":"De Micheli","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"25_CR1","doi-asserted-by":"crossref","unstructured":"Beaudry, M.D.: Performance-related reliability measures for computing systems. IEEE Trans. on Comp.\u00a0c-27 540(6) (June 1978)","DOI":"10.1109\/TC.1978.1675145"},{"key":"25_CR2","doi-asserted-by":"crossref","unstructured":"Shivakumar, P., et al.: Exploiting microarchitectural redundancy for defect tolerance. In: 21st Intl. Conference on Computer Design (2003)","DOI":"10.1109\/ICCD.2003.1240944"},{"key":"25_CR3","doi-asserted-by":"crossref","unstructured":"Simunic, T., Boyd, S.: Managing Power Consumption in Networks on Chips. In: Design, Automation and Test in Europe, pp. 110\u2013116 (2002)","DOI":"10.1109\/DATE.2002.998257"},{"key":"25_CR4","doi-asserted-by":"crossref","unstructured":"Qiu, Q., Wu, Q., Pedram, M.: Dynamic Power Management in a Mobile Multimedia System with Guaranteed Quality-of-Service. In: Design Automation Conference, pp. 701\u2013707 (2001)","DOI":"10.1145\/378239.379075"},{"key":"25_CR5","doi-asserted-by":"crossref","unstructured":"Simunic, T., Benini, L., Glynn, P., De Micheli, G.: Event-driven Power Management. IEEE Transactions on CAD, 840\u2013857 (July 2001)","DOI":"10.1109\/43.931003"},{"key":"25_CR6","unstructured":"Rotenberg, E.: Ar\/smt: A microarchitectural approach to fault tolerance in microprocessors. In: Intl. Symp. on Fault Tolerant Comp. (1998)"},{"key":"25_CR7","unstructured":"Srinivasan, J., Adve, S.V., Bose, P., Rivers, J., Hu, C.K.: RAMP: A Model for Reliability Aware MicroProcessor Design, IBM Research Report, December 29 (2003)"},{"key":"25_CR8","doi-asserted-by":"crossref","unstructured":"Srinivasan, J., Adve, S.V.: Predictive dynamic thermal management for multimedia applications. In: Proc. of the 2003 Intl Conf. on Supercomputing (2003)","DOI":"10.1145\/782814.782831"},{"key":"25_CR9","doi-asserted-by":"crossref","unstructured":"Srinivasan, J., Bose, P., Rivers, J.: The impact of Technology Scaling on Processor Lifetime Reliability, UIUC CS Technical Report (December 2003)","DOI":"10.1109\/DSN.2004.1311888"},{"key":"25_CR10","unstructured":"Skadron, K., Abdelzaher, T., Stan, M.R.: Control-Theoretic Techniques and Thermal-RC Modeling for Accurate Localized Dynamic Thermal ManagementProceedings. In: Proc. of the 8th Intl. Symp. on High-Performance Computer Architecture, HPCA 2002 (2002)"},{"key":"25_CR11","unstructured":"Semiconductor Device Reliability Failure Models, International Sematech Technology Transfer document 00053955A-XFR (2000)"},{"key":"25_CR12","unstructured":"Nguyen, H.V.: Multilevel Interconnect Reliability on the effects of electrothremomechanical stresses. Ph.D. dissertation, Univ. of Twente, Netherland (March 2004)"},{"key":"25_CR13","doi-asserted-by":"crossref","unstructured":"Huang, M., Suo, Z.: Thin film cracking and rathcheting caused by temperature cycling. J. Mater. Res.\u00a015(6), 1239(4) (2000)","DOI":"10.1557\/JMR.2000.0177"},{"key":"25_CR14","doi-asserted-by":"crossref","unstructured":"Degraeve, R., Ogier, J.L., et al.: A New Model for the Field Dependence of Intristic and Extrinsic Time-Dependent Dielectric Breakdown. IEEE Trans. on Elect. Devices\u00a0472(10), 45(2) (1998)","DOI":"10.1109\/16.658683"},{"key":"25_CR15","volume-title":"Introduction to Reliability Engineering","author":"E.E. Lewis","year":"1996","unstructured":"Lewis, E.E.: Introduction to Reliability Engineering. Wiley, Chichester (1996)"},{"key":"25_CR16","unstructured":"Simunic, T., Mihic, K., De Micheli, G.: Reliability and Power Management of Integrated Systems. In: DSD 2004 (2004)"},{"key":"25_CR17","unstructured":"TMS320C6211, TMS320C6211B, Fixed-Point Digital Signal Processors, Texas Instruments (2002)"},{"key":"25_CR18","unstructured":"SAF7113H datasheet, Philips Semiconductors (March 2004)"},{"key":"25_CR19","unstructured":"SST-Melody-DAP Audio Processor, Analog Devices (2002)"},{"key":"25_CR20","unstructured":"MSP430x11x2, MSP430x12x2 Mixed Signal Microcontroller, Texas Instruments (August 2004)"},{"key":"25_CR21","unstructured":"RDRAM 512Mb, Rambus (July 2003)"},{"key":"25_CR22","unstructured":"Maheshwari, W., Burleson, R.: Tessier,Trading off Reliability and Power-Consumption in Ultra-Low Power Systems. In: ISQED 2002 (2002)"},{"key":"25_CR23","doi-asserted-by":"crossref","unstructured":"Stanley-Marbell, P., Marculescu, D.: Dynamic Fault-Tolerance and Metrics for Battery Powered, Failure-Prone Systems. In: ICCAD 2003 (2003)","DOI":"10.1109\/ICCAD.2003.159747"}],"container-title":["Lecture Notes in Computer Science","Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/11556930_25","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,4]],"date-time":"2019-06-04T23:55:41Z","timestamp":1559692541000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/11556930_25"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2005]]},"ISBN":["9783540290131","9783540320807"],"references-count":23,"URL":"https:\/\/doi.org\/10.1007\/11556930_25","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2005]]}}}