{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,9]],"date-time":"2025-01-09T05:28:43Z","timestamp":1736400523214,"version":"3.32.0"},"publisher-location":"Berlin, Heidelberg","reference-count":13,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540341840"},{"type":"electronic","value":"9783540341857"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2006]]},"DOI":"10.1007\/11754008_16","type":"book-chapter","created":{"date-parts":[[2006,4,26]],"date-time":"2006-04-26T17:22:40Z","timestamp":1146072160000},"page":"245-258","source":"Crossref","is-referenced-by-count":7,"title":["FSM Test Translation Through Context"],"prefix":"10.1007","author":[{"given":"Khaled","family":"El-Fakih","sequence":"first","affiliation":[]},{"given":"Alexandre","family":"Petrenko","sequence":"additional","affiliation":[]},{"given":"Nina","family":"Yevtushenko","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"issue":"3","key":"16_CR1","doi-asserted-by":"publisher","first-page":"178","DOI":"10.1109\/TSE.1978.231496","volume":"4","author":"T.S. Chow","year":"1978","unstructured":"Chow, T.S.: Test design modeled by finite-state machines. IEEE Trans. SE\u00a04(3), 178\u2013187 (1978)","journal-title":"IEEE Trans. SE"},{"key":"16_CR2","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"185","DOI":"10.1007\/978-3-540-30232-2_12","volume-title":"Formal Techniques for Networked and Distributed Systems \u2013 FORTE 2004","author":"K. El-Fakih","year":"2004","unstructured":"El-Fakih, K., Yevtushenko, N.: Fault propagation by equation solving. In: de Frutos-Escrig, D., N\u00fa\u00f1ez, M. (eds.) FORTE 2004. LNCS, vol.\u00a03235, pp. 185\u2013198. Springer, Heidelberg (2004)"},{"key":"16_CR3","volume-title":"Introduction to automata theory, languages, and computation","author":"J.E. Hopcroft","year":"1979","unstructured":"Hopcroft, J.E., Ullman, J.D.: Introduction to automata theory, languages, and computation. Addison-Wesley, N.Y (1979)"},{"key":"16_CR4","first-page":"25","volume-title":"Proc. of the IFIP Joint Intl. Conf. Formal Description Techniques for Distributed Systems and Communication Protocols and Protocol Specification, Testing and Verification (FORTE XII \/ PSTV XIX) IFIP Conference Proceedings","author":"C. Jard","year":"1999","unstructured":"Jard, C., J\u00e9ron, T., Tanguy, L., Viho, C.: Remote testing can be as powerful as local testing. In: Proc. of the IFIP Joint Intl. Conf. Formal Description Techniques for Distributed Systems and Communication Protocols and Protocol Specification, Testing and Verification (FORTE XII \/ PSTV XIX) IFIP Conference Proceedings, Beijing, China, October 5-8, vol.\u00a0156, pp. 25\u201340. Kluwer, Dordrecht (1999)"},{"key":"16_CR5","doi-asserted-by":"crossref","unstructured":"Lima, L.P.: A pragmatic method to generate test sequences for embedded systems, Ph.D. Thesis, Institute National des Telecommunications, Evry, France (1998)","DOI":"10.1007\/978-0-387-35198-8_18"},{"key":"16_CR6","doi-asserted-by":"crossref","unstructured":"Lima, L.P., Cavalli, A.R.: A pragmatic approach to generating test sequences for embedded systems. In: Proc. of the 10th International Workshop on Testing of Communicating Systems, pp. 125\u2013140 (1997)","DOI":"10.1007\/978-0-387-35198-8_18"},{"key":"16_CR7","doi-asserted-by":"crossref","unstructured":"Petrenko, A., Yevtushenko, N.: Testing faults in embedded components. In: Proc. of the 10th International Workshop on Testing of Communicating Systems, pp. 272\u2013287 (1997)","DOI":"10.1007\/978-0-387-35198-8_17"},{"issue":"9","key":"16_CR8","doi-asserted-by":"publisher","first-page":"1154","DOI":"10.1109\/TC.2005.152","volume":"54","author":"A. Petrenko","year":"2005","unstructured":"Petrenko, A., Yevtushenko, N.: Testing from partial deterministic FSM specifications. IEEE Transactions on Computers\u00a054(9), 1154\u20131165 (2005)","journal-title":"IEEE Transactions on Computers"},{"key":"16_CR9","doi-asserted-by":"crossref","unstructured":"Petrenko, A., Yevtushenko, N., Bochmann, G.v.: Fault models for testing in context. In: Proc. International Conference on Formal Techniques for Networked and Distributed Systems, pp. 125\u2013140 (1996)","DOI":"10.1007\/978-0-387-35079-0_10"},{"key":"16_CR10","doi-asserted-by":"publisher","first-page":"1236","DOI":"10.1016\/S0140-3664(96)01157-7","volume":"19","author":"A. Petrenko","year":"1996","unstructured":"Petrenko, A., Yevtushenko, N., Bochmann, G.v., Dssouli, R.: Testing in context: framework and test derivation. Computer communications\u00a019, 1236\u20131249 (1996)","journal-title":"Computer communications"},{"key":"16_CR11","doi-asserted-by":"crossref","unstructured":"Tretmans, J., Verhaard, L.: A queue model relating synchronous and asynchronous communication. In: Linn Jr., R.J., Uyar, M.\u00dc. (eds.) Proc. of the IFIP TC6\/WG6.1 12th Intl. Symp. Protocol Specification, Testing and Verification, IFIP Transactions, Lake Buena Vista, Florida, USA, vol.\u00a0C-8, pp. 131\u2013145 (1992)","DOI":"10.1016\/B978-0-444-89874-6.50015-5"},{"key":"16_CR12","unstructured":"Vasilevskii, M.P.: Failure diagnosis of automata. Kibernetika 4, 98\u2013108 (1973) (translated)"},{"key":"16_CR13","unstructured":"Yannakakis, M., Lee, D.: Testing finite state machines. In: Proc. of the 23rd Annual ACM Symposium on Theory of Computing, New Orleans, Louisiana, pp. 476\u2013485 (1995)"}],"container-title":["Lecture Notes in Computer Science","Testing of Communicating Systems"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/11754008_16.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,27]],"date-time":"2021-04-27T07:04:00Z","timestamp":1619507040000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/11754008_16"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2006]]},"ISBN":["9783540341840","9783540341857"],"references-count":13,"URL":"https:\/\/doi.org\/10.1007\/11754008_16","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2006]]}}}