{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T17:34:27Z","timestamp":1725471267052},"publisher-location":"Berlin, Heidelberg","reference-count":13,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540366799"},{"type":"electronic","value":"9783540366812"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2006]]},"DOI":"10.1007\/11802167_76","type":"book-chapter","created":{"date-parts":[[2006,10,5]],"date-time":"2006-10-05T11:58:29Z","timestamp":1160049509000},"page":"754-765","source":"Crossref","is-referenced-by-count":2,"title":["Fault-Tolerant VLIW Processor Design and Error Coverage Analysis"],"prefix":"10.1007","author":[{"given":"Yung-Yuan","family":"Chen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kuen-Long","family":"Leu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chao-Sung","family":"Yeh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"issue":"5","key":"76_CR1","doi-asserted-by":"publisher","first-page":"12","DOI":"10.1109\/40.877947","volume":"20","author":"J. Huck","year":"2000","unstructured":"Huck, J., et al.: Introducing the IA-64 Architecture. IEEE Micro\u00a020(5), 12\u201323 (2000)","journal-title":"IEEE Micro"},{"issue":"2","key":"76_CR2","doi-asserted-by":"publisher","first-page":"128","DOI":"10.1109\/TDSC.2004.14","volume":"1","author":"T. Karnik","year":"2004","unstructured":"Karnik, T., Hazucha, P., Patel, J.: Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes. IEEE Trans. on Dependable and Secure Computing\u00a01(2), 128\u2013143 (2004)","journal-title":"IEEE Trans. on Dependable and Secure Computing"},{"key":"76_CR3","doi-asserted-by":"crossref","unstructured":"Nickle, J.B., Somani, A.K.: REESE: A Method of Soft Error Detection in Microprocessors. In: DSN 2001, pp. 401\u2013410 (2001)","DOI":"10.1109\/DSN.2001.941424"},{"key":"76_CR4","unstructured":"Holm, J.G., Banerjee, P.: Low Cost Concurrent Error Detection in A VLIW Architecture Using Replicated Instructions. In: Intl. Conf. on Parallel Processing, pp. 192\u2013195 (1992)"},{"key":"76_CR5","doi-asserted-by":"crossref","unstructured":"Franklin, M.: A Study of Time Redundant Fault Tolerance Techniques for Superscalar Processors. In: IEEE Intl. Workshop on Defect and Fault Tolerance in VLSI Systems (DFT 1995), pp. 207\u2013215 (1995)","DOI":"10.1109\/DFTVS.1995.476954"},{"key":"76_CR6","unstructured":"Kim, S., Somani, A.K.: SSD: An Affordable Fault Tolerant Architecture for Superscalar Processors. In: Pacific Rim Intl. Symposium. On Dependable Computing, pp. 27\u201334 (2001)"},{"issue":"1","key":"76_CR7","doi-asserted-by":"publisher","first-page":"63","DOI":"10.1109\/24.994913","volume":"51","author":"N. Oh","year":"2002","unstructured":"Oh, N., Shirvani, P.P., McCluskey, E.J.: Error Detection by Duplicated Instructions in Super-Scalar Processors. IEEE Trans. on Reliability\u00a051(1), 63\u201375 (2002)","journal-title":"IEEE Trans. on Reliability"},{"issue":"4","key":"76_CR8","doi-asserted-by":"publisher","first-page":"458","DOI":"10.1109\/TR.2003.821935","volume":"52","author":"C. Bolchini","year":"2003","unstructured":"Bolchini, C.: A Software Methodology for Detecting Hardware Faults in VLIW Data Paths. IEEE Trans. on Reliability\u00a052(4), 458\u2013468 (2003)","journal-title":"IEEE Trans. on Reliability"},{"key":"76_CR9","doi-asserted-by":"crossref","unstructured":"Qureshi, M.K., Mutlu, O., Patt, Y.N.: Microarchitecture-Based Introspection: A Technique for Transient-Fault Tolerance in Microprocessors. In: DSN 2005, pp. 434 \u2013 443 (June-July 2005)","DOI":"10.1109\/DSN.2005.62"},{"issue":"3","key":"76_CR10","doi-asserted-by":"publisher","first-page":"285","DOI":"10.1109\/24.914545","volume":"49","author":"S. Mitra","year":"2000","unstructured":"Mitra, S., Saxena, N.R., McCluskey, E.J.: Common-Mode Failures in Redundant VLSI Systems: A Survey. IEEE Trans. on Reliability\u00a049(3), 285\u2013295 (2000)","journal-title":"IEEE Trans. on Reliability"},{"issue":"1","key":"76_CR11","doi-asserted-by":"publisher","first-page":"11","DOI":"10.1109\/TDSC.2004.2","volume":"1","author":"A. Avizienis","year":"2004","unstructured":"Avizienis, A., Laprie, J.-C., Randell, B., Landwehr, C.: Basic Concepts and Taxonomy of Dependable and Secure Computing. IEEE Trans. on Dependable and Secure Computing\u00a01(1), 11\u201333 (2004)","journal-title":"IEEE Trans. on Dependable and Secure Computing"},{"issue":"6","key":"76_CR12","doi-asserted-by":"publisher","first-page":"775","DOI":"10.1109\/12.24286","volume":"38","author":"J.B. Dugan","year":"1989","unstructured":"Dugan, J.B., Trivedi, K.S.: Coverage Modeling for Dependability Analysis of Fault-Tolerant Systems. IEEE Trans. on Computers\u00a038(6), 775\u2013787 (1989)","journal-title":"IEEE Trans. on Computers"},{"issue":"6","key":"76_CR13","doi-asserted-by":"crossref","first-page":"47","DOI":"10.1109\/2.386985","volume":"28","author":"J. Clark","year":"1995","unstructured":"Clark, J., Pradhan, D.: Fault Injection: A Method for Validating Computer-System Dependability. IEEE Computer\u00a028(6), 47\u201356 (1995)","journal-title":"IEEE Computer"}],"container-title":["Lecture Notes in Computer Science","Embedded and Ubiquitous Computing"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/11802167_76.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,27]],"date-time":"2021-04-27T03:25:10Z","timestamp":1619493910000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/11802167_76"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2006]]},"ISBN":["9783540366799","9783540366812"],"references-count":13,"URL":"https:\/\/doi.org\/10.1007\/11802167_76","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2006]]}}}