{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T17:52:44Z","timestamp":1725472364464},"publisher-location":"Berlin, Heidelberg","reference-count":11,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540472421"},{"type":"electronic","value":"9783540472438"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2006]]},"DOI":"10.1007\/11902140_106","type":"book-chapter","created":{"date-parts":[[2006,10,26]],"date-time":"2006-10-26T13:35:29Z","timestamp":1161869729000},"page":"1021-1030","source":"Crossref","is-referenced-by-count":3,"title":["Test Suite Reduction Based on Dependence Analysis"],"prefix":"10.1007","author":[{"given":"Guy-Vincent","family":"Jourdan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Panitee","family":"Ritthiruangdech","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hasan","family":"Ural","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"106_CR1","doi-asserted-by":"crossref","unstructured":"Tahat, L., Vaysburg, B., Korel, B., Bader, A.: Requirement-based automated black-box test generation. In: IEEE COMPSAC, pp. 489\u2013495 (2001)","DOI":"10.1109\/CMPSAC.2001.960658"},{"key":"106_CR2","unstructured":"Bourhfir, C., Dssouli, R., Aboulhamid, E.M.: Automatic test generation for EFSM-based systems. Tech. Rep. IRO 1043, University of Montreal (1996)"},{"key":"106_CR3","doi-asserted-by":"publisher","first-page":"107","DOI":"10.1145\/566172.566188","volume-title":"International Symposium on Software Testing and Analysis (ISSTA 2002)","author":"B. Vaysburg","year":"2002","unstructured":"Vaysburg, B., Tahat, L., Korel, B.: Dependence analysis in reduction of requirement based test suites. In: International Symposium on Software Testing and Analysis (ISSTA 2002), Roma, Italy, pp. 107\u2013111. ACM Press, New York (2002)"},{"key":"106_CR4","doi-asserted-by":"publisher","first-page":"609","DOI":"10.1016\/S0140-3664(99)00227-3","volume":"23","author":"K. Saleh","year":"2000","unstructured":"Saleh, K., Ural, H., Williams, A.: Test generation based on control and data dependencies within system specifications in sdl. Computer Communications\u00a023, 609\u2013627 (2000)","journal-title":"Computer Communications"},{"key":"106_CR5","doi-asserted-by":"publisher","first-page":"514","DOI":"10.1109\/26.81739","volume":"39","author":"H. Ural","year":"1991","unstructured":"Ural, H., Yang, B.: A test sequence selection method for protocol testing. IEEE Transactions on Communications\u00a039, 514\u2013523 (1991)","journal-title":"IEEE Transactions on Communications"},{"key":"106_CR6","doi-asserted-by":"publisher","first-page":"367","DOI":"10.1109\/TSE.1985.232226","volume":"11","author":"S. Rapps","year":"1985","unstructured":"Rapps, S., Weyuker, E.J.: Selecting software test data using data flow information. IEEE Trans. Software Eng.\u00a011, 367\u2013375 (1985)","journal-title":"IEEE Trans. Software Eng."},{"key":"106_CR7","doi-asserted-by":"publisher","first-page":"1483","DOI":"10.1109\/32.6194","volume":"14","author":"P.G. Frankl","year":"1988","unstructured":"Frankl, P.G., Weyuker, E.J.: An applicable family of data flow testing criteria. IEEE Trans. Software Eng.\u00a014, 1483\u20131498 (1988)","journal-title":"IEEE Trans. Software Eng."},{"key":"106_CR8","doi-asserted-by":"publisher","first-page":"319","DOI":"10.1145\/24039.24041","volume":"9","author":"K. Ferrante","year":"1987","unstructured":"Ferrante, K., Ottenstein, K., Warren, J.: The program dependence graph and its use in optimization. ACM Trans. Progr. Lang. & Systems\u00a09, 319\u2013349 (1987)","journal-title":"ACM Trans. Progr. Lang. & Systems"},{"key":"106_CR9","unstructured":"Ural, H., et al.: TSR (2006), \n                    \n                      http:\/\/www.site.uottawa.ca\/~ural\/TSR"},{"key":"106_CR10","unstructured":"Chemli, O.: Reduced test suite generation. University of Ottawa, Master Thesis in Computer Science (2006)"},{"key":"106_CR11","unstructured":"Ritthiruangdech, P.: Test suite reduction using sdl and efsm dependency analysis. University of Ottawa, Master Thesis in Computer Science (2004)"}],"container-title":["Lecture Notes in Computer Science","Computer and Information Sciences \u2013 ISCIS 2006"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/11902140_106.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,27]],"date-time":"2021-04-27T07:37:15Z","timestamp":1619509035000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/11902140_106"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2006]]},"ISBN":["9783540472421","9783540472438"],"references-count":11,"URL":"https:\/\/doi.org\/10.1007\/11902140_106","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2006]]}}}