{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T18:30:58Z","timestamp":1725474658070},"publisher-location":"Berlin, Heidelberg","reference-count":33,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540683711"},{"type":"electronic","value":"9783540683735"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2006]]},"DOI":"10.1007\/11951148_10","type":"book-chapter","created":{"date-parts":[[2006,12,5]],"date-time":"2006-12-05T11:22:53Z","timestamp":1165317773000},"page":"148-165","source":"Crossref","is-referenced-by-count":12,"title":["Refactoring and Metrics for TTCN-3 Test Suites"],"prefix":"10.1007","author":[{"given":"Benjamin","family":"Zeiss","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Helmut","family":"Neukirchen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jens","family":"Grabowski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dominic","family":"Evans","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paul","family":"Baker","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"10_CR1","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"476","DOI":"10.1007\/11557432_36","volume-title":"Model Driven Engineering Languages and Systems","author":"P. Baker","year":"2005","unstructured":"Baker, P., Loh, S.C., Weil, F.: Model-Driven Engineering in a Large Industrial Context \u2014 Motorola Case Study. In: Briand, L.C., Williams, C. (eds.) MoDELS 2005. LNCS, vol.\u00a03713, pp. 476\u2013491. Springer, Heidelberg (2005)"},{"key":"10_CR2","unstructured":"ETSI: European Standard (ES) 201 873-1 V3.1.1 (2005-06): The Testing and Test Control Notation version 3; Part 1: TTCN-3 Core Language. European Telecommunications Standards Institute (ETSI), Sophia-Antipolis, France; Also published as ITU-T Recommendation\u00a0Z.140 (2005)"},{"issue":"3","key":"10_CR3","doi-asserted-by":"publisher","first-page":"375","DOI":"10.1016\/S1389-1286(03)00249-4","volume":"42","author":"J. Grabowski","year":"2003","unstructured":"Grabowski, J., Hogrefe, D., R\u00e9thy, G., Schieferdecker, I., Wiles, A., Willcock, C.: An Introduction into the Testing and Test Control Notation (TTCN-3). Computer Networks\u00a042(3), 375\u2013403 (2003)","journal-title":"Computer Networks"},{"issue":"2","key":"10_CR4","doi-asserted-by":"publisher","first-page":"126","DOI":"10.1109\/TSE.2004.1265817","volume":"30","author":"T. Mens","year":"2004","unstructured":"Mens, T., Tourwe, T.: A Survey of Software Refactoring. IEEE Transactions on Software Engineering\u00a030(2), 126\u2013139 (2004)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"10_CR5","volume-title":"Refactoring","author":"M. Fowler","year":"1999","unstructured":"Fowler, M.: Refactoring. Addison-Wesley, Reading (1999)"},{"key":"10_CR6","doi-asserted-by":"crossref","unstructured":"Parnas, D.L.: Software Aging. In: Proceedings of the 16th International Conference on Software Engineering (ICSE), Sorrento, Italy, May 16\u201321, 1994, pp. 279\u2013287. IEEE Computer Society\/ACM Press (1994)","DOI":"10.1109\/ICSE.1994.296790"},{"key":"10_CR7","unstructured":"Opdyke, W.F.: Refactoring Object-Oriented Frameworks. PhD thesis, University of Illinois at Urbana-Champaign, USA (1992)"},{"key":"10_CR8","volume-title":"Extreme Programming Explained","author":"K. Beck","year":"2000","unstructured":"Beck, K.: Extreme Programming Explained. Addison-Wesley, Reading (2000)"},{"key":"10_CR9","unstructured":"Gamma, E., Beck, K.: JUnit (2006), \n                    \n                      http:\/\/junit.sourceforge.net"},{"key":"10_CR10","unstructured":"v. Deursen, A., Moonen, L., v. d. Bergh, A., Kok, G.: Refactoring Test Code. In: Marchesi, M., Succi, G. (eds.) Proceedings of the 2nd International Conference on Extreme Programming and Flexible Processes in Software Engineering (2001)"},{"key":"10_CR11","unstructured":"ETSI: Technical Report (TR) 101 666 (1999-05): Information technology \u2013 Open Systems Interconnection Conformance testing methodology and framework; The Tree and Tabular Combined Notation (TTCN) (Ed.\u00a02++). European Telecommunications Standards Institute (ETSI), Sophia-Antipolis, France (1999)"},{"key":"10_CR12","unstructured":"Schmitt, M.: Automatic Test Generation Based on Formal Specifications \u2013 Practical Procedures for Efficient State Space Exploration and Improved Representation of Test Cases. PhD thesis, University of G\u00f6ttingen, Germany (2003)"},{"key":"10_CR13","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"180","DOI":"10.1007\/978-3-540-31848-4_13","volume-title":"Formal Approaches to Software Testing","author":"A. Wu-Hen-Chang","year":"2005","unstructured":"Wu-Hen-Chang, A., Viet, D.L., Batori, G., Gecse, R., Csopaki, G.: High-Level Restructuring of TTCN-3 Test Data. In: Grabowski, J., Nielsen, B. (eds.) FATES 2004. LNCS, vol.\u00a03395, pp. 180\u2013194. Springer, Heidelberg (2005)"},{"key":"10_CR14","unstructured":"Dei\u00df, T.: Refactoring and Converting a TTCN-2 Test Suite. In: Presentation at the TTCN-3 User Conference 2005, Sophia-Antipolis, France, June 6\u20138 (2005)"},{"key":"10_CR15","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"crossref","DOI":"10.1007\/3-540-10235-3","volume-title":"A Calculus of Communicating Systems","author":"R. Milner","year":"1980","unstructured":"Milner, R.: A Calculus of Communication Systems. LNCS, vol.\u00a092. Springer, Heidelberg (1980)"},{"key":"10_CR16","unstructured":"Zeiss, B.: A Refactoring Tool for TTCN-3. Master\u2019s thesis, Institute for Informatics, University of G\u00f6ttingen, Germany, ZFI-BM-2006-05 (2006)"},{"key":"10_CR17","volume-title":"Anti-Patterns","author":"W.J. Brown","year":"1998","unstructured":"Brown, W.J., Malveau, R.C., McCormick, H.: Anti-Patterns. Wiley, Chichester (1998)"},{"key":"10_CR18","unstructured":"Fenton, N.E., Pfleeger, S.L.: Software Metrics. PWS Publishing Company (1997)"},{"key":"10_CR19","volume-title":"Elements of Software Science","author":"M.H. Halstead","year":"1977","unstructured":"Halstead, M.H.: Elements of Software Science. Elsevier, Amsterdam (1977)"},{"key":"10_CR20","unstructured":"Watson, A.H., McCabe, T.J.: Structured Testing: A Testing Methodology Using the Cyclomatic Complexity Metric. NIST Special Publication 500-235, National Institute of Standards and Technology, Gaithersburg, MD, USA (1996)"},{"key":"10_CR21","volume-title":"Object-Oriented Metrics","author":"B. Henderson-Sellers","year":"1996","unstructured":"Henderson-Sellers, B.: Object-Oriented Metrics. Prentice-Hall, Englewood Cliffs (1996)"},{"issue":"6","key":"10_CR22","doi-asserted-by":"publisher","first-page":"476","DOI":"10.1109\/32.295895","volume":"20","author":"S.R. Chidamber","year":"1994","unstructured":"Chidamber, S.R., Kemerer, C.: A Metric Suite for Object-Oriented Design. IEEE Transactions of Software Engineering\u00a020(6), 476\u2013493 (1994)","journal-title":"IEEE Transactions of Software Engineering"},{"key":"10_CR23","volume-title":"Proceedings of SAM\u201906: Fifth Workshop on System Analysis and Modelling","author":"D.E. Vega","year":"2006","unstructured":"Vega, D.E., Schieferdecker, I.: Towards Quality of TTCN-3 Tests. In: Proceedings of SAM\u201906: Fifth Workshop on System Analysis and Modelling. University of Kaiserslautern, Germany (2006)"},{"key":"10_CR24","doi-asserted-by":"publisher","first-page":"728","DOI":"10.1109\/TSE.1984.5010301","volume":"6","author":"V.R. Basili","year":"1984","unstructured":"Basili, V.R., Weiss, D.M.: A Methodology for Collecting Valid Software Engineering Data. IEEE Transactions on Software Engineering SE-10\u00a06, 728\u2013738 (1984)","journal-title":"IEEE Transactions on Software Engineering SE-10"},{"key":"10_CR25","unstructured":"Eclipse Foundation: Eclipse (2006), \n                    \n                      http:\/\/www.eclipse.org"},{"key":"10_CR26","unstructured":"Parr, T.: ANTLR parser generator (2006), \n                    \n                      http:\/\/www.antlr.org"},{"key":"10_CR27","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"366","DOI":"10.1007\/978-3-540-30233-9_27","volume-title":"Applying Formal Methods: Testing, Performance, and M\/E-Commerce","author":"I. Schieferdecker","year":"2004","unstructured":"Schieferdecker, I., Din, G.: A meta-model for TTCN-3. In: N\u00fa\u00f1ez, M., Maamar, Z., Pelayo, F.L., Pousttchi, K., Rubio, F. (eds.) FORTE 2004. LNCS, vol.\u00a03236, pp. 366\u2013379. Springer, Heidelberg (2004)"},{"key":"10_CR28","unstructured":"TRex Website (2006), \n                    \n                      http:\/\/www.trex.informatik.uni-goettingen.de"},{"key":"10_CR29","volume-title":"Proceedings of TAIC PART 2006 (Testing: Academic & Industrial Conference \u2013 Practice And Research Techniques)","author":"P. Baker","year":"2006","unstructured":"Baker, P., Evans, D., Grabowski, J., Neukirchen, H., Zeiss, B.: TRex \u2013 The Refactoring and Metrics Tool for TTCN-3 Test Specifications. In: Proceedings of TAIC PART 2006 (Testing: Academic & Industrial Conference \u2013 Practice And Research Techniques), Windsor, UK, 29th\u201331st August 2006. IEEE Computer Society, Los Alamitos (2006)"},{"key":"10_CR30","unstructured":"ETSI: TS 102 027-3: SIP ATS & PIXIT; Part 3: Abstract Test Suite (ATS) and partial Protocol Implementation eXtra Information for Testing (PIXIT). European Telecommunications Standards Institute (ETSI), Sophia-Antipolis, France (2005)"},{"key":"10_CR31","unstructured":"Zeiss, B., Neukirchen, H., Grabowski, J., Evans, D., Baker, P.: TRex \u2013 An Open-Source Tool for Quality Assurance of TTCN-3 Test Suites. In: Proceeedings of CONQUEST 2006 \u2013 9th International Conference on Quality Engineering in Software Technology, Berlin, Germany, September 27\u201329. dpunkt.Verlag (2006)"},{"key":"10_CR32","unstructured":"OMG: UML Testing Profile (Version 1.0 formal\/05-07-07). Object Management Group (OMG) (2005)"},{"key":"10_CR33","unstructured":"ITU-T: Recommendation Z.100 (08\/02): Specification and Description Language (SDL). International Telecommunication Union (ITU-T), Geneve (2002)"}],"container-title":["Lecture Notes in Computer Science","System Analysis and Modeling: Language Profiles"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/11951148_10.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,27]],"date-time":"2021-04-27T07:20:47Z","timestamp":1619508047000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/11951148_10"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2006]]},"ISBN":["9783540683711","9783540683735"],"references-count":33,"URL":"https:\/\/doi.org\/10.1007\/11951148_10","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2006]]}}}