{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T11:32:43Z","timestamp":1742383963094},"publisher-location":"Berlin, Heidelberg","reference-count":25,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540422815"},{"type":"electronic","value":"9783540482130"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2001]]},"DOI":"10.1007\/3-540-48213-x_11","type":"book-chapter","created":{"date-parts":[[2007,7,2]],"date-time":"2007-07-02T18:01:14Z","timestamp":1183399274000},"page":"168-181","source":"Crossref","is-referenced-by-count":6,"title":["Some Implications of MSC, SDL and TTCN Time Extensions for Computer-Aided Test Generation"],"prefix":"10.1007","author":[{"given":"Dieter","family":"Hogrefe","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Beat","family":"Koch","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Helmut","family":"Neukirchen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2001,6,22]]},"reference":[{"key":"11_CR1","doi-asserted-by":"crossref","unstructured":"C. Bourhfir, R. Dssouli, E. Aboulhamid, and N. Rico. Automatic executable test case generation for extended finite state machine protocols protocols. In IWTCS\u201997 [17], pages 75\u201390.","DOI":"10.1007\/978-0-387-35198-8_6"},{"key":"11_CR2","doi-asserted-by":"crossref","unstructured":"C. Bourhfir, R. Dssouli, E. Aboulhamid, and N. Rico. A test case generation tool for conformance testing of SDL systems. In SDL\u201999 [23], pages 405\u2013419.","DOI":"10.1016\/B978-044450228-5\/50027-8"},{"key":"11_CR3","unstructured":"M. Bozga, S. Graf, A. Kerbrat, L. Mounier, I. Ober, and D. Vincent. SDL for realtime: what is missing? In SAM 2000-2 nd Workshop on SDL and MSC, pages 108\u2013122, Grenoble, France, June 2000."},{"key":"11_CR4","doi-asserted-by":"crossref","unstructured":"M. Bozga, S. Graf, L. Mounier, I. Ober, J.-L. Roux, and D. Vincent. Timed extensions for SDL. In SDL Forum 2001, Copenhagen, Denmark, June 2001.","DOI":"10.1007\/3-540-48213-X_14"},{"key":"11_CR5","doi-asserted-by":"crossref","unstructured":"M. Clatin, R. Groz, M. Phalippou, and R. Thummel. Two approaches linking a test generation tool with verification techniques. In Proceedings of IWPTS\u2019 95 8 th Int. Workshop on Protocol Test Systems, pages 151\u2013166, Evry, France, September 1995.","DOI":"10.1007\/978-0-387-34988-6_10"},{"key":"11_CR6","doi-asserted-by":"crossref","unstructured":"A. Ek, J. Grabowski, D. Hogrefe, R. Jerome, B. Koch, and M. Schmitt. Towards the industrial use of validation techniques and automatic test generation methods for SDL specifications. In SDL\u201997 [22], pages 245\u2013259.","DOI":"10.1016\/B978-044482816-3\/50017-4"},{"key":"11_CR7","unstructured":"ETSI, Sophia Antipolis, France. Methods for Testing and Specification (MTS); The Tree and Tabular Combined Notation version 3; TTCN-3: Core Language, v1.0.10 edition, November 2000. DES\/MTS-00063-1."},{"key":"11_CR8","doi-asserted-by":"crossref","unstructured":"J.-C. Fernandez, C. Jard, T. J\u00e9ron, and C. Viho. An experiment in automatic generation of test suites for protocols with verification technology. Science of Computer Programming, 29, 1997.","DOI":"10.1016\/S0167-6423(96)00032-9"},{"key":"11_CR9","unstructured":"J. Grabowski. Test Case Generation and Test Case Specification with Message Sequence Charts. PhD thesis, University of Bern, Bern, Switzerland, February 1994."},{"key":"11_CR10","unstructured":"J. Grabowski, D. Hogrefe, and R. Nahm. Test case generation with test purpose specification by MSCs. In SDL\u201993: Using Objects, pages 253\u2013265, Darmstadt, Germany, October 1993. Elsevier Science Publishers B.V."},{"key":"11_CR11","unstructured":"S. Graf. Timed extensions for SDL, November 2000. Delayed Contribution No. 13 to ITU-T Study Group 10, Questions 6&7."},{"key":"11_CR12","unstructured":"ISO\/IEC. Information technology-Open Systems Interconnection-Conformance testing methodology and framework, 1994. International ISO\/IEC multipart standard No. 9646."},{"key":"11_CR13","unstructured":"ITU-T, Geneva, Switzerland. Message Sequence Charts, 1996. ITU-T Recommendation Z.120."},{"key":"11_CR14","unstructured":"ITU-T, Geneva, Switzerland. Information technology-Open Systems Interconnection-Conformance testing methodology and framework-Part 3: The Tree and Tabular Combined Notation, 1997. ITU-T Recommendation X.293-ISO\/IEC 9646-3."},{"key":"11_CR15","unstructured":"ITU-T, Geneva, Switzerland. Message Sequence Charts, November 1999. ITU-T Recommendation Z.120."},{"key":"11_CR16","unstructured":"ITU-T, Geneva, Switzerland. Specification and Description Language (SDL), 1999. ITU-T Recommendation Z.100."},{"key":"11_CR17","unstructured":"Testing of Communicating Systems, Cheju Island, Korea, September 1997. Chapman & Hall."},{"key":"11_CR18","doi-asserted-by":"crossref","unstructured":"A. Kerbrat, T. J\u00e9ron, and R. Groz. Automated test generation from SDL specifications. In SDL\u201999 [23], pages 135\u2013151.","DOI":"10.1016\/B978-044450228-5\/50011-4"},{"key":"11_CR19","doi-asserted-by":"crossref","unstructured":"A. Mitschele-Thiel. Systems Engineering with SDL-Developing Performance-Critical Communication Systems. Wiley, Chichester, England, 2001.","DOI":"10.1002\/0470841966"},{"key":"11_CR20","unstructured":"H. Neukirchen. Corrections and extensions to Z.120, November 2000. Delayed Contribution No. 9 to ITU-T Study Group 10, Question 9."},{"key":"11_CR21","unstructured":"Interval Consortium Web Page. http:\/\/www-interval.imag.fr\/ , 2000."},{"key":"11_CR22","unstructured":"SDL\u201997-Time for Testing, Evry, France, September 1997. Elsevier."},{"key":"11_CR23","unstructured":"SDL\u201999-The Next Millennium, Montr\u00e9al, Qu\u00e9bec, Canada, June 1999. Elsevier."},{"key":"11_CR24","doi-asserted-by":"crossref","unstructured":"G. v. Bochmann, A. Petrenko, O. Bellal, and S. Maguiraga. Automating the process of test derivation from SDL specifications. In SDL\u201997 [22], pages 261\u2013276.","DOI":"10.1016\/B978-044482816-3\/50018-6"},{"key":"11_CR25","doi-asserted-by":"crossref","unstructured":"Th. Walter and J. Grabowski. Real-time TTCN for testing real-time and multimedia systems. In IWTCS\u201997 [17].","DOI":"10.1007\/978-0-387-35198-8_3"}],"container-title":["Lecture Notes in Computer Science","SDL 2001: Meeting UML"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/3-540-48213-X_11","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,30]],"date-time":"2019-04-30T01:36:34Z","timestamp":1556588194000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/3-540-48213-X_11"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2001]]},"ISBN":["9783540422815","9783540482130"],"references-count":25,"URL":"https:\/\/doi.org\/10.1007\/3-540-48213-x_11","relation":{},"ISSN":["0302-9743"],"issn-type":[{"type":"print","value":"0302-9743"}],"subject":[],"published":{"date-parts":[[2001]]}}}