{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,10]],"date-time":"2025-01-10T05:30:09Z","timestamp":1736487009396,"version":"3.32.0"},"publisher-location":"Berlin, Heidelberg","reference-count":14,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540617235"},{"type":"electronic","value":"9783540706687"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[1996]]},"DOI":"10.1007\/3-540-61723-x_1042","type":"book-chapter","created":{"date-parts":[[2006,7,12]],"date-time":"2006-07-12T14:34:58Z","timestamp":1152714898000},"page":"791-800","source":"Crossref","is-referenced-by-count":0,"title":["Exploiting competing subpopulations for automatic generation of test sequences for digital circuits"],"prefix":"10.1007","author":[{"given":"Fulvio","family":"Corno","sequence":"first","affiliation":[]},{"given":"Paolo","family":"Prinetto","sequence":"additional","affiliation":[]},{"given":"Maurizio","family":"Rebaudengo","sequence":"additional","affiliation":[]},{"given":"Matteo Sonza","family":"Reorda","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2005,7,11]]},"reference":[{"key":"79_CR1","unstructured":"M. Abramovici, M.A. Breuer, A.D. Friedman: \u201cDigital Systems Testing and Testable Design,\u201d Computer Science Press, 1990"},{"key":"79_CR2","doi-asserted-by":"crossref","unstructured":"V.D. Agrawal, K.-T. Cheng, P. Agrawal, \u201cCONTEST: A Concurrent Test Generator for Sequential Circuits,\u201d Proc. 25th Design Automation Conference, 1988, pp. 84\u201389","DOI":"10.1109\/DAC.1988.14739"},{"key":"79_CR3","doi-asserted-by":"crossref","unstructured":"F. Brglez, D. Bryant, K. Kozminski, \u201cCombinational profiles of sequential benchmark circuits,\u201d Proc. Int. Symp. on Circuits And Systems, 1989, pp. 1929\u20131934","DOI":"10.1109\/ISCAS.1989.100747"},{"issue":"No.7","key":"79_CR4","first-page":"935","volume":"CAD-12","author":"H. Cho","year":"1993","unstructured":"H. Cho, G.D. Hatchel, F. Somenzi, \u201cRedundancy Identification\/Removal and Test Generation for Sequential Circuits Using Implicit State Enumeration,\u201d IEEE Trans. on CAD\/ICAS, Vol. CAD-12, No. 7, pp. 935\u2013945, 1993","journal-title":"IEEE Trans. on CAD\/ICAS"},{"key":"79_CR5","doi-asserted-by":"crossref","unstructured":"F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda, E. Veiluva, \u201cA Portable ATPG Tool for Parallel and Distributed Systems,\u201d Proc. IEEE VLSI Test Symposium, 1995, pp. 29\u201334","DOI":"10.1109\/VTEST.1995.512613"},{"key":"79_CR6","unstructured":"F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda, \u201cA Genetic Algorithm for Automatic Test Pattern Generation for Large Synchronous Sequential Circuits,\u201d to appear on the IEEE Transactions on Computer Aided Design"},{"key":"79_CR7","doi-asserted-by":"crossref","unstructured":"F. Corno, P. Prinetto, M. Rebaudengo, M. Sonza Reorda, R. Mosca, \u201dAdvanced Techniques for GA-based sequential ATPGs,\u201d IEEE Design & Test Conf., Paris (France), March 1996, pp. 75\u2013379","DOI":"10.1109\/EDTC.1996.494328"},{"key":"79_CR8","doi-asserted-by":"crossref","unstructured":"A. Geist, A. Beguelin, J. Dongarra, W. Jiang, R. Manchek, V. Sunderam, \u201cPVM 3 User's Guide and Reference Manual,\u201d Oak Ridge Nat. Lab., Internal Report ORNL\/TM-12187, 1993","DOI":"10.7551\/mitpress\/5712.001.0001"},{"key":"79_CR9","unstructured":"D.E. Goldberg, \u201cGenetic Algorithms in Search, Optimization, and Machine Learning,\u201d Addison-Wesley, 1989"},{"key":"79_CR10","doi-asserted-by":"crossref","unstructured":"T. Niermann, J.H. Patel, \u201cHITEC: A Test Generator Package for Sequential Circuits,\u201d Proc. European Design Automation Conf., 1991, pp. 214\u2013218","DOI":"10.1109\/EDAC.1991.206393"},{"key":"79_CR11","doi-asserted-by":"crossref","unstructured":"P. Prinetto, M. Rebaudengo, M. Sonza Reorda, \u201cAn Automatic Test Pattern Generator for Large Sequential Circuits based on Genetic Algorithms,\u201d Proc. Int. Test Conf., 1994, pp. 240\u2013249","DOI":"10.1109\/TEST.1994.527955"},{"key":"79_CR12","doi-asserted-by":"crossref","unstructured":"E.M. Rudnick, J.H. Patel, G.S. Greenstein, T.M. Niermann, \u201cSequential Circuit Test Generation in a Genetic Algorithm Framework,\u201d Proc. Design Automation Conf., 1994, pp. 698\u2013704","DOI":"10.1145\/196244.196619"},{"key":"79_CR13","doi-asserted-by":"crossref","unstructured":"D. Schlierkamp-Voosen, H. M\u00fchlenbein, \u201cStrategy Adaptation by Competing Subpopulations,\u201d Proc. Int. Conf. on Parallel Problem Solving from Nature, 1994, pp. 199\u2013208","DOI":"10.1007\/3-540-58484-6_264"},{"key":"79_CR14","doi-asserted-by":"crossref","unstructured":"D.G. Saab, Y.G. Saab, J. Abraham, \u201cCRIS: A Test Cultivation Program for Sequential VLSI Circuits,\u201d Proc. Int. Conf. on Computer Aided Design, 1992, pp. 216\u2013219","DOI":"10.1109\/ICCAD.1992.279372"}],"container-title":["Lecture Notes in Computer Science","Parallel Problem Solving from Nature \u2014 PPSN IV"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/3-540-61723-X_1042","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,9]],"date-time":"2025-01-09T21:51:47Z","timestamp":1736459507000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/3-540-61723-X_1042"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1996]]},"ISBN":["9783540617235","9783540706687"],"references-count":14,"URL":"https:\/\/doi.org\/10.1007\/3-540-61723-x_1042","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[1996]]}}}