{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T15:48:46Z","timestamp":1725551326773},"publisher-location":"Berlin, Heidelberg","reference-count":9,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540635079"},{"type":"electronic","value":"9783540695851"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[1997]]},"DOI":"10.1007\/3-540-63507-6_223","type":"book-chapter","created":{"date-parts":[[2010,4,5]],"date-time":"2010-04-05T20:01:16Z","timestamp":1270497676000},"page":"377-384","source":"Crossref","is-referenced-by-count":1,"title":["A new algorithm for 3D profilometry based on phase measurement"],"prefix":"10.1007","author":[{"given":"Luigi","family":"Di Stefano","sequence":"first","affiliation":[]},{"given":"Frank","family":"Boland","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2005,7,30]]},"reference":[{"key":"47_CR1","doi-asserted-by":"crossref","unstructured":"D. Poussart and D. Laurendau. 3-D sensing for industrial computer vision. in J. Sanz, editor, Advances in Machine Vision, Springer-Verlag, 1989.","DOI":"10.1007\/978-1-4612-4532-2_3"},{"key":"47_CR2","doi-asserted-by":"crossref","unstructured":"P. Besl. Active, optical range imaging sensors. Machine Vision and Applications, Vol. 1, 1988.","DOI":"10.1007\/978-1-4612-4532-2_1"},{"key":"47_CR3","doi-asserted-by":"crossref","unstructured":"M. Takeda, H. Ina and S. Kobayashi. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry. Journal of the Optical Society of America, Vol. 72, No. 1, 1982.","DOI":"10.1364\/JOSA.72.000156"},{"key":"47_CR4","doi-asserted-by":"crossref","unstructured":"M. Takeda and K. Mutoh. Fourier transform profilometry for the automatic measurement of 3-D object shapes. Applied Optics, Vol. 22, No. 24, 1983.","DOI":"10.1364\/AO.22.003977"},{"key":"47_CR5","doi-asserted-by":"crossref","unstructured":"S. Tang and Y. Hung. Fast profilometer for the automatic measurement of 3-D object shapes. Applied Optics, Vol. 29, No. 20, 1990.","DOI":"10.1364\/AO.29.003012"},{"key":"47_CR6","unstructured":"E. Cunningham. Digital Filtering: an introduction. Houghton Mifflin, 1992."},{"key":"47_CR7","first-page":"4","volume":"43","author":"G. Sansoni","year":"1994","unstructured":"G. Sansoni, L. Biancardi, U. Minoni and F. Docchio. A Novel Adaptive System for 3-D Optical Profilometry Using a Liquid Crystal Light Projector. IEEE Transactions on Instrumentation and Measurement, Vol. 43, No. 4, 1994.","journal-title":"IEEE Transactions on Instrumentation and Measurement"},{"key":"47_CR8","unstructured":"L. Di Stefano and F. Boland. Three-Dimensional Inspection of Printed Circuit Boards Using Phase Profilometry. In Proceedings of EUSIPCO-96, Trieste, 10\u201313 September, 1996."},{"key":"47_CR9","doi-asserted-by":"crossref","unstructured":"L. Di Stefano and F. Boland. Solder paste inspection by structured light methods based on phase measurement. In SPIE Proceedings, Vol. 2899, 1996.","DOI":"10.1117\/12.253007"}],"container-title":["Lecture Notes in Computer Science","Image Analysis and Processing"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/3-540-63507-6_223","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,28]],"date-time":"2019-05-28T00:26:55Z","timestamp":1559003215000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/3-540-63507-6_223"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1997]]},"ISBN":["9783540635079","9783540695851"],"references-count":9,"URL":"https:\/\/doi.org\/10.1007\/3-540-63507-6_223","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[1997]]}}}