{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,26]],"date-time":"2025-09-26T13:36:52Z","timestamp":1758893812342},"publisher-location":"Boston, MA","reference-count":13,"publisher":"Springer US","isbn-type":[{"type":"print","value":"9780387731360"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1007\/978-0-387-73137-7_31","type":"book-chapter","created":{"date-parts":[[2007,9,28]],"date-time":"2007-09-28T05:06:58Z","timestamp":1190956018000},"page":"351-360","source":"Crossref","is-referenced-by-count":1,"title":["Design and Prototyping of an Industrial Fault Clustering System Combining Image Processing and Artificial Neural Network Based Approaches"],"prefix":"10.1007","author":[{"given":"Matthieu","family":"Voiry","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V\u00e9ronique","family":"Amarger","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kurosh","family":"Madani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fran\u00e7ois","family":"Houbre","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"31_CR1","doi-asserted-by":"crossref","unstructured":"P. Bouchareine: M\u00e9trologie des Surfaces. Techniques de l\u2019Ing\u00e9nieur, vol. R1390, 1999.","DOI":"10.51257\/a-v1-r1390"},{"issue":"8","key":"31_CR2","doi-asserted-by":"publisher","first-page":"2202","DOI":"10.1117\/1.1590320","volume":"42","author":"S. Chatterjee","year":"2003","unstructured":"S. Chatterjee: Design Considerations and Fabrication Techniques of Nomarski Reflection Microscope. Optical Engineering, vol. 42, no. 8, pp. 2202-2212, 2003.","journal-title":"Optical Engineering"},{"key":"31_CR3","unstructured":"P. E. J. Flewitt and R. K. Wild: Light Microscopy. in Physical Methods for materials characterisation, 1994."},{"key":"31_CR4","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-642-56927-2","volume-title":"Self Organizing Maps","author":"T. Kohonen","year":"2001","unstructured":"T. Kohonen: Self Organizing Maps, 3rd edition, Berlin: Springer, 2001.","edition":"3rd edition"},{"key":"31_CR5","unstructured":"P. Bourgeat, F. Meriaudeau, K. W. Tobin, and P. Gorria: Patterned Wafer Segmentation. Proceedings of SPIE, vol. 5132, no. Quality Control by Artificial Vision VI, pp. 36-44, 2004."},{"key":"31_CR6","unstructured":"R. C. Gonzalez and R. E. Woods: Digital Image Processing, 2nd edition Addison- Wesley, 2002."},{"key":"31_CR7","doi-asserted-by":"crossref","unstructured":"A. Choksuriwong, H. Laurent, and B. Emile: Comparison of invariant descriptors for object recognition. IEEE International Conference on Image Processing (ICIP), pp. 377-380, 2005.","DOI":"10.1109\/ICIP.2005.1529766"},{"key":"31_CR8","unstructured":"S. Derrode, \u2018Repr\u00e9sentation de Formes Planes \u00e1 Niveaux de Gris par Diff\u00e9rentes Approximations de Fourier-Mellin Analytique en vue d\u2019Indexation de Bases d\u2019Images.;\u2019 Th\u00e8se de Doctorat - Universit\u00e9 de Rennes I, 1999."},{"key":"31_CR9","doi-asserted-by":"publisher","first-page":"1043","DOI":"10.1016\/0167-8655(94)90037-X","volume":"15","author":"F. Ghorbel","year":"1994","unstructured":"F. Ghorbel: A Complete Invariant Description for Gray Level Images by the Harmonic Analysis Approach. Pattern Recognition, vol. 15, pp. 1043-1051, 1994.","journal-title":"Pattern Recognition"},{"key":"31_CR10","doi-asserted-by":"crossref","unstructured":"G. Ravichandran and M. Trivedi: Circular-Mellin features for texture segmentation. IEEE Trans. Image Processing, vol. 4, pp. 1629-1640, 1995.","DOI":"10.1109\/83.475513"},{"key":"31_CR11","doi-asserted-by":"crossref","unstructured":"T. Kohonen, E. Oja, O. Simula, A. Visa, and J. Kangas: Engineering Applications of the Self-Organizing Maps. Proceedings of the IEEE, vol. 84, no. 10, pp. 1358- 1384, Oct.1996.","DOI":"10.1109\/5.537105"},{"key":"31_CR12","unstructured":"J. Heikkonen and J. Lampinen: Building Industrial Applications with Neural Networks., Proc. European Symposium on Intelligent Techniques, ESIT\u201999, 1999."},{"issue":"5","key":"31_CR13","doi-asserted-by":"publisher","first-page":"275","DOI":"10.1007\/s00138-002-0084-z","volume":"13","author":"O. Silv\u00e9n","year":"2000","unstructured":"O. Silv\u00e9n, M. Niskanen, and H. Kauppinen: Wood Inspection with Non- Supervised Clustering. Machine Vision and Applications, vol. 13, no. 5, pp. 275-285, 2000.","journal-title":"Machine Vision and Applications"}],"container-title":["Advances in Information Processing and Protection"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-0-387-73137-7_31.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,5,14]],"date-time":"2023-05-14T07:59:15Z","timestamp":1684051155000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-0-387-73137-7_31"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"ISBN":["9780387731360"],"references-count":13,"URL":"https:\/\/doi.org\/10.1007\/978-0-387-73137-7_31","relation":{},"subject":[]}}