{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T20:14:08Z","timestamp":1785010448673,"version":"3.55.0"},"publisher-location":"Cham","reference-count":180,"publisher":"Springer International Publishing","isbn-type":[{"value":"9783030002619","type":"print"},{"value":"9783030002626","type":"electronic"}],"license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019]]},"DOI":"10.1007\/978-3-030-00262-6_4","type":"book-chapter","created":{"date-parts":[[2019,2,11]],"date-time":"2019-02-11T10:02:09Z","timestamp":1549879329000},"page":"123-192","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":22,"title":["Software Testing"],"prefix":"10.1007","author":[{"given":"Gordon","family":"Fraser","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jos\u00e9 Miguel","family":"Rojas","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2019,2,12]]},"reference":[{"key":"4_CR1","unstructured":"Acree, A.T.: On mutation. PhD thesis, Georgia Institute of Technology, Atlanta, GA (1980)"},{"issue":"6","key":"4_CR2","doi-asserted-by":"publisher","first-page":"957","DOI":"10.1016\/j.infsof.2008.12.005","volume":"51","author":"W Afzal","year":"2009","unstructured":"Afzal, W., Torkar, R., Feldt, R.: A systematic review of search-based testing for non-functional system properties. Inf. Softw. Technol. 51(6), 957\u2013976 (2009)","journal-title":"Inf. Softw. Technol."},{"issue":"6","key":"4_CR3","doi-asserted-by":"publisher","first-page":"742","DOI":"10.1109\/TSE.2009.52","volume":"36","author":"S Ali","year":"2010","unstructured":"Ali, S., Briand, L.C., Hemmati, H., Panesar-Walawege, R.K.: A systematic review of the application and empirical investigation of search-based test case generation. IEEE Trans. Softw. Eng. 36(6), 742\u2013762 (2010)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR4","doi-asserted-by":"publisher","DOI":"10.1017\/9781316771273","volume-title":"Introduction to Software Testing","author":"P Ammann","year":"2016","unstructured":"Ammann, P., Offutt, J.: Introduction to Software Testing. Cambridge University Press, Cambridge (2016)"},{"key":"4_CR5","doi-asserted-by":"crossref","unstructured":"Ammann, P., Offutt, J., Huang, H.: Coverage criteria for logical expressions. In: IEEE International Symposium on Software Reliability Engineering (ISSRE), pp. 99\u2013107 (2003)","DOI":"10.1109\/ISSRE.2003.1251034"},{"key":"4_CR6","doi-asserted-by":"crossref","unstructured":"Andrews, J.H., Briand, L.C., Labiche, Y.: Is mutation an appropriate tool for testing experiments? In: ACM\/IEEE International Conference on Software Engineering (ICSE), pp. 402\u2013411 (2005)","DOI":"10.1145\/1062455.1062530"},{"issue":"2","key":"4_CR7","doi-asserted-by":"publisher","first-page":"119","DOI":"10.1002\/stvr.457","volume":"23","author":"A Arcuri","year":"2013","unstructured":"Arcuri, A.: It really does matter how you normalize the branch distance in search-based software testing. Softw. Test. Verification Reliab. 23(2), 119\u2013147 (2013)","journal-title":"Softw. Test. Verification Reliab."},{"key":"4_CR8","doi-asserted-by":"crossref","unstructured":"Arcuri, A., Briand, L.: Adaptive random testing: an illusion of effectiveness? In: ACM International Symposium on Software Testing and Analysis (ISSTA), pp. 265\u2013275 (2011)","DOI":"10.1145\/2001420.2001452"},{"issue":"9","key":"4_CR9","doi-asserted-by":"publisher","first-page":"705","DOI":"10.1109\/32.464549","volume":"21","author":"A Avritzer","year":"1995","unstructured":"Avritzer, A., Weyuker, E.: The automatic generation of load test suites and the assessment of the resulting software. IEEE Trans. Softw. Eng. 21(9), 705\u2013716 (1995)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"5","key":"4_CR10","doi-asserted-by":"publisher","first-page":"507","DOI":"10.1109\/TSE.2014.2372785","volume":"41","author":"ET Barr","year":"2015","unstructured":"Barr, E.T., Harman, M., McMinn, P., Shahbaz, M., Yoo, S.: The oracle problem in software testing: a survey. IEEE Trans. Softw. Eng. 41(5), 507\u2013525 (2015)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR11","volume-title":"Kent Beck\u2019s Guide to Better Smalltalk: A Sorted Collection","author":"K Beck","year":"1999","unstructured":"Beck, K.: Kent Beck\u2019s Guide to Better Smalltalk: A Sorted Collection, vol. 14. Cambridge University Press, Cambridge (1999)"},{"key":"4_CR12","volume-title":"Test-Driven Development: By Example","author":"K Beck","year":"2003","unstructured":"Beck, K.: Test-Driven Development: By Example. Addison-Wesley Professional, Upper Saddle River (2003)"},{"key":"4_CR13","doi-asserted-by":"crossref","unstructured":"Bell, J., Kaiser, G.: Unit test virtualization with VMVM. In: ACM\/IEEE International Conference on Software Engineering (ICSE), pp. 550\u2013561. ACM, New York (2014)","DOI":"10.1145\/2568225.2568248"},{"issue":"3","key":"4_CR14","doi-asserted-by":"publisher","first-page":"229","DOI":"10.1147\/sj.223.0229","volume":"22","author":"DL Bird","year":"1983","unstructured":"Bird, D.L., Munoz, C.U.: Automatic generation of random self-checking test cases. IBM Syst. J. 22(3), 229\u2013245 (1983)","journal-title":"IBM Syst. J."},{"issue":"1","key":"4_CR15","doi-asserted-by":"publisher","first-page":"16","DOI":"10.1016\/j.infsof.2008.09.010","volume":"51","author":"LC Briand","year":"2009","unstructured":"Briand, L.C., Labiche, Y., He, S.: Automating regression test selection based on UML designs. Inf. Softw. Technol. 51(1), 16\u201330 (2009)","journal-title":"Inf. Softw. Technol."},{"key":"4_CR16","volume-title":"Testing Embedded Software","author":"B Broekman","year":"2003","unstructured":"Broekman, B., Notenboom, E.: Testing Embedded Software. Pearson Education, Boston (2003)"},{"key":"4_CR17","doi-asserted-by":"crossref","unstructured":"Bron, A., Farchi, E., Magid, Y., Nir, Y., Ur, S.: Applications of synchronization coverage. In: Proceedings of the Tenth ACM SIGPLAN Symposium on Principles and Practice of Parallel Programming (PPoPP), pp. 206\u2013212. ACM, New York (2005)","DOI":"10.1145\/1065944.1065972"},{"issue":"10","key":"4_CR18","doi-asserted-by":"publisher","first-page":"3144","DOI":"10.1016\/j.cor.2007.01.015","volume":"35","author":"O B\u00fchler","year":"2008","unstructured":"B\u00fchler, O., Wegener, J.: Evolutionary functional testing. Comput. Oper. Res. 35(10), 3144\u20133160 (2008)","journal-title":"Comput. Oper. Res."},{"key":"4_CR19","unstructured":"Cadar, C., Dunbar, D., Engler, D.: KLEE: unassisted and automatic generation of high-coverage tests for complex systems programs. In: Symposium on Operating Systems Design and Implementation (USENIX), pp. 209\u2013224 (2008)"},{"key":"4_CR20","doi-asserted-by":"crossref","unstructured":"Cadar, C., Godefroid, P., Khurshid, S., Pa\u030csa\u030creanu, C.S., Sen, K., Tillmann, N., Visser, W.: Symbolic execution for software testing in practice: preliminary assessment. In: ACM\/IEEE International Conference on Software Engineering (ICSE), pp. 1066\u20131071 (2011)","DOI":"10.1145\/1985793.1985995"},{"key":"4_CR21","unstructured":"Chen, T.Y., Cheung, S.C., Yiu, S.M.: Metamorphic testing: a new approach for generating next test cases. Department of Computer Science, Hong Kong University of Science and Technology, Technical Report HKUST-CS98-01 (1998)"},{"key":"4_CR22","doi-asserted-by":"crossref","unstructured":"Chen, T.Y., Lau, M.F., Yu, Y.T.: Mumcut: a fault-based strategy for testing boolean specifications. In: Sixth Asia Pacific Software Engineering Conference (APSEC), pp. 606\u2013613. IEEE, New York (1999)","DOI":"10.1109\/APSEC.1999.809656"},{"key":"4_CR23","doi-asserted-by":"publisher","first-page":"320","DOI":"10.1007\/978-3-540-30502-6_23","volume-title":"Advances in Computer Science - ASIAN 2004. Higher-Level Decision Making","author":"T. Y. Chen","year":"2004","unstructured":"Chen, T.Y., Leung, H., Mak, I.K.: Adaptive random testing. In: Advances in Computer Science, pp. 320\u2013329 (2004)"},{"key":"4_CR24","unstructured":"Chilenski, J.J.: An investigation of three forms of the modified condition decision coverage (MCDC) criterion. Technical Report, DTIC Document (2001)"},{"issue":"5","key":"4_CR25","doi-asserted-by":"publisher","first-page":"193","DOI":"10.1049\/sej.1994.0025","volume":"9","author":"JJ Chilenski","year":"1994","unstructured":"Chilenski, J.J., Miller, S.P.: Applicability of modified condition\/decision coverage to software testing. Softw. Eng. J. 9(5), 193\u2013200 (1994)","journal-title":"Softw. Eng. J."},{"key":"4_CR26","doi-asserted-by":"crossref","unstructured":"Choudhary, S.R., Gorla, A., Orso, A.: Automated test input generation for android: are we there yet?(e). In: IEEE\/ACM International Conference on Automated Software Engineering (ASE), pp. 429\u2013440. IEEE, New York (2015)","DOI":"10.1109\/ASE.2015.89"},{"issue":"3","key":"4_CR27","doi-asserted-by":"publisher","first-page":"178","DOI":"10.1109\/TSE.1978.231496","volume":"4","author":"TS Chow","year":"1978","unstructured":"Chow, T.S.: Testing software design modeled by finite-state machines. IEEE Trans. Softw. Eng. 4(3), 178 (1978)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR28","doi-asserted-by":"crossref","unstructured":"Ciupa, I., Leitner, A., Oriol, M., Meyer, B.: Experimental assessment of random testing for object-oriented software. In: ACM International Symposium on Software Testing and Analysis (ISSTA), pp. 84\u201394 (2007)","DOI":"10.1145\/1273463.1273476"},{"issue":"4","key":"4_CR29","doi-asserted-by":"publisher","first-page":"53","DOI":"10.1145\/1988042.1988046","volume":"46","author":"K Claessen","year":"2011","unstructured":"Claessen, K., Hughes, J.: QuickCheck: a lightweight tool for random testing of Haskell programs. ACM Sigplan Not. 46(4), 53\u201364 (2011)","journal-title":"ACM Sigplan Not."},{"key":"4_CR30","doi-asserted-by":"crossref","unstructured":"Clarke, D., Lee, I.: Testing real-time constraints in a process algebraic setting. In: ACM\/IEEE International Conference on Software Engineering (ICSE), pp. 51\u201360. ACM, New York (1995)","DOI":"10.1145\/225014.225019"},{"issue":"3","key":"4_CR31","doi-asserted-by":"publisher","first-page":"25","DOI":"10.1145\/1127878.1127900","volume":"31","author":"LA Clarke","year":"2006","unstructured":"Clarke, L.A., Rosenblum, D.S.: A historical perspective on runtime assertion checking in software development. ACM SIGSOFT Softw. Eng. Notes 31(3), 25\u201337 (2006)","journal-title":"ACM SIGSOFT Softw. Eng. Notes"},{"key":"4_CR32","volume-title":"Model Checking","author":"EM Clarke","year":"1999","unstructured":"Clarke, E.M., Grumberg, O., Peled, D.: Model Checking. MIT Press, Cambridge (1999)"},{"issue":"5","key":"4_CR33","doi-asserted-by":"publisher","first-page":"83","DOI":"10.1109\/52.536462","volume":"13","author":"DM Cohen","year":"1996","unstructured":"Cohen, D.M., Dalal, S.R., Parelius, J., Patton, G.C.: The combinatorial design approach to automatic test generation. IEEE Softw. 13(5), 83 (1996)","journal-title":"IEEE Softw."},{"issue":"7","key":"4_CR34","doi-asserted-by":"publisher","first-page":"437","DOI":"10.1109\/32.605761","volume":"23","author":"DM Cohen","year":"1997","unstructured":"Cohen, D.M., Dalal, S.R., Fredman, M.L., Patton, G.C.: The AETG system: an approach to testing based on combinatorial design. IEEE Trans. Softw. Eng. 23(7), 437\u2013444 (1997)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR35","doi-asserted-by":"crossref","unstructured":"Cohen, M., Gibbons, P., Mugridge, W., Colbourn, C.: Constructing test suites for interaction testing. In: ACM\/IEEE International Conference on Software Engineering (ICSE), pp. 38\u201348 (2003)","DOI":"10.1109\/ICSE.2003.1201186"},{"key":"4_CR36","unstructured":"Commission, I.E., et al.: IEC 61508: functional safety of electrical. Electronic\/Programmable Electronic Safety-Related Systems (1999)"},{"issue":"9","key":"4_CR37","doi-asserted-by":"publisher","first-page":"900","DOI":"10.1109\/32.92910","volume":"17","author":"RA DeMillo","year":"1991","unstructured":"DeMillo, R.A., Offutt, A.J.: Constraint-based automatic test data generation. IEEE Trans. Softw. Eng. 17(9), 900\u2013910 (1991)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"4","key":"4_CR38","doi-asserted-by":"publisher","first-page":"34","DOI":"10.1109\/C-M.1978.218136","volume":"11","author":"RA DeMillo","year":"1978","unstructured":"DeMillo, R.A., Lipton, R.J., Sayward, F.G.: Hints on test data selection: help for the practicing programmer. Computer 11(4), 34\u201341 (1978)","journal-title":"Computer"},{"issue":"3","key":"4_CR39","doi-asserted-by":"publisher","first-page":"331","DOI":"10.1093\/comjnl\/bxl003","volume":"49","author":"K Derderian","year":"2006","unstructured":"Derderian, K., Hierons, R.M., Harman, M., Guo, Q.: Automated unique input output sequence generation for conformance testing of FSMs. Comput. J. 49(3), 331\u2013344 (2006)","journal-title":"Comput. J."},{"issue":"12","key":"4_CR40","doi-asserted-by":"publisher","first-page":"1172","DOI":"10.1016\/j.infsof.2006.06.006","volume":"48","author":"GA Lucca Di","year":"2006","unstructured":"Di Lucca, G.A., Fasolino, A.R.: Testing web-based applications: the state of the art and future trends. Inf. Softw. Technol. 48(12), 1172\u20131186 (2006)","journal-title":"Inf. Softw. Technol."},{"issue":"2","key":"4_CR41","doi-asserted-by":"publisher","first-page":"84","DOI":"10.1145\/251880.251992","volume":"22","author":"M Dowson","year":"1997","unstructured":"Dowson, M.: The Ariane 5 software failure. ACM SIGSOFT Softw. Eng. Notes 22(2), 84 (1997)","journal-title":"ACM SIGSOFT Softw. Eng. Notes"},{"issue":"4","key":"4_CR42","doi-asserted-by":"publisher","first-page":"438","DOI":"10.1109\/TSE.1984.5010257","volume":"SE-10","author":"JW Duran","year":"1984","unstructured":"Duran, J.W., Ntafos, S.C.: An evaluation of random testing. IEEE Trans. Softw. Eng. SE-10(4), 438\u2013444 (1984)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"1","key":"4_CR43","doi-asserted-by":"publisher","first-page":"111","DOI":"10.1147\/sj.411.0111","volume":"41","author":"O Edelstein","year":"2002","unstructured":"Edelstein, O., Farchi, E., Nir, Y., Ratsaby, G., Ur, S.: Multithreaded java program test generation. IBM Syst. J. 41(1), 111\u2013125 (2002)","journal-title":"IBM Syst. J."},{"issue":"2","key":"4_CR44","doi-asserted-by":"publisher","first-page":"159","DOI":"10.1109\/32.988497","volume":"28","author":"S Elbaum","year":"2002","unstructured":"Elbaum, S., Malishevsky, A.G., Rothermel, G.: Test case prioritization: a family of empirical studies. IEEE Trans. Softw. Eng. 28(2), 159\u2013182 (2002)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR45","unstructured":"Faught, D.R.: Keyword-driven testing. Sticky minds. https:\/\/www.stickyminds.com\/article\/keyword-driven-testing [online]. Retrieved 28.10.2018"},{"issue":"1","key":"4_CR46","doi-asserted-by":"publisher","first-page":"63","DOI":"10.1145\/226155.226158","volume":"5","author":"R Ferguson","year":"1996","unstructured":"Ferguson, R., Korel, B.: The chaining approach for software test data generation. ACM Trans. Softw. Eng. Methodol. 5(1), 63\u201386 (1996)","journal-title":"ACM Trans. Softw. Eng. Methodol."},{"key":"4_CR47","unstructured":"Forrester, J.E., Miller, B.P.: An empirical study of the robustness of windows nt applications using random testing. In: Proceedings of the 4th Conference on USENIX Windows Systems Symposium - Volume 4, WSS\u201900, p. 6. USENIX Association, Berkeley (2000)"},{"issue":"3","key":"4_CR48","doi-asserted-by":"publisher","first-page":"305","DOI":"10.1145\/356674.356676","volume":"8","author":"LD Fosdick","year":"1976","unstructured":"Fosdick, L.D., Osterweil, L.J.: Data flow analysis in software reliability. ACM Comput. Surv. 8(3), 305\u2013330 (1976)","journal-title":"ACM Comput. Surv."},{"issue":"2","key":"4_CR49","doi-asserted-by":"publisher","first-page":"276","DOI":"10.1109\/TSE.2012.14","volume":"39","author":"G Fraser","year":"2013","unstructured":"Fraser, G., Arcuri, A.: Whole test suite generation. IEEE Trans. Softw. Eng. 39(2), 276\u2013291 (2013)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"8","key":"4_CR50","doi-asserted-by":"publisher","first-page":"749","DOI":"10.1002\/stvr.1575","volume":"25","author":"G Fraser","year":"2015","unstructured":"Fraser, G., Walkinshaw, N.: Assessing and generating test sets in terms of behavioural adequacy. Softw. Test. Verification Reliab. 25(8), 749\u2013780 (2015)","journal-title":"Softw. Test. Verification Reliab."},{"key":"4_CR51","doi-asserted-by":"crossref","unstructured":"Fraser, G., Wotawa, F.: Redundancy Based Test-Suite Reduction, pp. 291\u2013305. Springer, Heidelberg (2007)","DOI":"10.1007\/978-3-540-71289-3_23"},{"issue":"2","key":"4_CR52","doi-asserted-by":"publisher","first-page":"278","DOI":"10.1109\/TSE.2011.93","volume":"28","author":"G Fraser","year":"2012","unstructured":"Fraser, G., Zeller, A.: Mutation-driven generation of unit tests and oracles. IEEE Trans. Softw. Eng. 28(2), 278\u2013292 (2012)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"3","key":"4_CR53","doi-asserted-by":"publisher","first-page":"215","DOI":"10.1002\/stvr.402","volume":"19","author":"G Fraser","year":"2009","unstructured":"Fraser, G., Wotawa, F., Ammann, P.E.: Testing with model checkers: a survey. Softw. Test. Verification Reliab. 19(3), 215\u2013261 (2009)","journal-title":"Softw. Test. Verification Reliab."},{"issue":"4","key":"4_CR54","doi-asserted-by":"publisher","first-page":"23","DOI":"10.1145\/2699688","volume":"24","author":"G Fraser","year":"2015","unstructured":"Fraser, G., Staats, M., McMinn, P., Arcuri, A., Padberg, F.: Does automated unit test generation really help software testers? a controlled empirical study. ACM Trans. Softw. Eng. Methodol. 24(4), 23 (2015)","journal-title":"ACM Trans. Softw. Eng. Methodol."},{"issue":"6","key":"4_CR55","doi-asserted-by":"publisher","first-page":"591","DOI":"10.1109\/32.87284","volume":"17","author":"S Fujiwara","year":"1991","unstructured":"Fujiwara, S., Bochmann, G.V., Khendek, F., Amalou, M., Ghedamsi, A.: Test selection based on finite state models. IEEE Trans. Softw. Eng. 17(6), 591\u2013603 (1991)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR56","doi-asserted-by":"crossref","unstructured":"Gambi, A., Bell, J., Zeller, A.: Practical test dependency detection. In: 2018 IEEE 11th International Conference on Software Testing, Verification and Validation (ICST), V\u00e4ster\u00e5s, Sweden, pp. 1\u201311 (2018)","DOI":"10.1109\/ICST.2018.00011"},{"key":"4_CR57","doi-asserted-by":"publisher","first-page":"146","DOI":"10.1007\/3-540-48166-4_10","volume-title":"Software Engineering \u2014 ESEC\/FSE \u201999","author":"Angelo Gargantini","year":"1999","unstructured":"Gargantini, A., Heitmeyer, C.: Using model checking to generate tests from requirements specifications. In: ACM Symposium on the Foundations of Software Engineering (FSE), pp. 146\u2013162. Springer, Berlin (1999)"},{"issue":"6","key":"4_CR58","doi-asserted-by":"publisher","first-page":"213","DOI":"10.1145\/1064978.1065036","volume":"40","author":"P Godefroid","year":"2005","unstructured":"Godefroid, P., Klarlund, N., Sen, K.: DART: directed automated random testing. SIGPLAN Not. 40(6), 213\u2013223 (2005)","journal-title":"SIGPLAN Not."},{"issue":"6","key":"4_CR59","doi-asserted-by":"publisher","first-page":"206","DOI":"10.1145\/1379022.1375607","volume":"43","author":"P Godefroid","year":"2008","unstructured":"Godefroid, P., Kiezun, A., Levin, M.Y.: Grammar-based whitebox fuzzing. ACM Sigplan Not. 43(6), 206\u2013215 (2008a)","journal-title":"ACM Sigplan Not."},{"key":"4_CR60","unstructured":"Godefroid, P., Levin, M., Molnar, D.: Automated whitebox fuzz testing. In: Network and Distributed System Security Symposium (NDSS), pp. 1\u201316 (2008b)"},{"issue":"2","key":"4_CR61","doi-asserted-by":"publisher","first-page":"156","DOI":"10.1109\/TSE.1975.6312836","volume":"SE-1","author":"JB Goodenough","year":"1975","unstructured":"Goodenough, J.B., Gerhart, S.L.: Toward a theory of test data selection. IEEE Trans. Softw. Eng. SE-1(2), 156\u2013173 (1975)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"2","key":"4_CR62","doi-asserted-by":"publisher","first-page":"53","DOI":"10.1145\/271775.271790","volume":"23","author":"A Gotlieb","year":"1998","unstructured":"Gotlieb, A., Botella, B., Rueher, M.: Automatic test data generation using constraint solving techniques. ACM SIGSOFT Softw. Eng. Notes 23(2), 53\u201362 (1998)","journal-title":"ACM SIGSOFT Softw. Eng. Notes"},{"issue":"2","key":"4_CR63","doi-asserted-by":"publisher","first-page":"184","DOI":"10.1145\/367008.367020","volume":"10","author":"TL Graves","year":"2001","unstructured":"Graves, T.L., Harrold, M.J., Kim, J.M., Porter, A., Rothermel, G.: An empirical study of regression test selection techniques. ACM Trans. Softw. Eng. Methodol. 10(2), 184\u2013208 (2001)","journal-title":"ACM Trans. Softw. Eng. Methodol."},{"key":"4_CR64","doi-asserted-by":"crossref","unstructured":"Grechanik, M., Fu, C., Xie, Q.: Automatically finding performance problems with feedback-directed learning software testing. In: Proceedings of the 34th International Conference on Software Engineering, pp. 156\u2013166. IEEE Press, New York (2012)","DOI":"10.1109\/ICSE.2012.6227197"},{"issue":"3","key":"4_CR65","doi-asserted-by":"publisher","first-page":"167","DOI":"10.1002\/stvr.319","volume":"15","author":"M Grindal","year":"2005","unstructured":"Grindal, M., Offutt, J., Andler, S.: Combination testing strategies: a survey. Softw. Test. Verification Reliab. 15(3), 167\u2013199 (2005)","journal-title":"Softw. Test. Verification Reliab."},{"key":"4_CR66","doi-asserted-by":"crossref","unstructured":"Gross, F., Fraser, G., Zeller, A.: Search-based system testing: high coverage, no false alarms. In: ACM International Symposium on Software Testing and Analysis (2012)","DOI":"10.1145\/2338965.2336762"},{"issue":"5","key":"4_CR67","doi-asserted-by":"publisher","first-page":"661","DOI":"10.1109\/32.815325","volume":"25","author":"W.J. Gutjahr","year":"1999","unstructured":"Gutjahr, W.J.: Partition testing vs. random testing: the influence of uncertainty. IEEE Trans. Softw. Eng. 25(5), 661\u2013674 (1999)","journal-title":"IEEE Transactions on Software Engineering"},{"key":"4_CR68","doi-asserted-by":"crossref","unstructured":"Gyori, A., Shi, A., Hariri, F., Marinov, D.: Reliable testing: detecting state-polluting tests to prevent test dependency. In: Proceedings of the 2015 International Symposium on Software Testing and Analysis (ISSTA), pp. 223\u2013233. ACM, New York (2015)","DOI":"10.1145\/2771783.2771793"},{"key":"4_CR69","unstructured":"Hamlet, R.: Random testing. In: Encyclopedia of Software Engineering, pp. 970\u2013978. Wiley, New York (1994)"},{"issue":"12","key":"4_CR70","doi-asserted-by":"publisher","first-page":"1402","DOI":"10.1109\/32.62448","volume":"16","author":"D Hamlet","year":"1990","unstructured":"Hamlet, D., Taylor, R.: Partition testing does not inspire confidence. IEEE Trans. Softw. Eng. 16(12), 1402\u20131411 (1990)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR71","doi-asserted-by":"crossref","unstructured":"Hammoudi, M., Rothermel, G., Tonella, P.: Why do record\/replay tests of web applications break? In: IEEE International Conference on Software Testing, Verification and Validation (ICST), pp. 180\u2013190. IEEE, New York (2016)","DOI":"10.1109\/ICST.2016.16"},{"issue":"4","key":"4_CR72","doi-asserted-by":"publisher","first-page":"242","DOI":"10.1147\/sj.94.0242","volume":"9","author":"KV Hanford","year":"1970","unstructured":"Hanford, K.V.: Automatic generation of test cases. IBM Syst. J. 9(4), 242\u2013257 (1970)","journal-title":"IBM Syst. J."},{"key":"4_CR73","doi-asserted-by":"crossref","unstructured":"Hao, S., Li, D., Halfond, W.G., Govindan, R.: Estimating mobile application energy consumption using program analysis. In: 35th International Conference on Software Engineering, pp. 92\u2013101. IEEE, New York (2013)","DOI":"10.1109\/ICSE.2013.6606555"},{"key":"4_CR74","doi-asserted-by":"crossref","unstructured":"Harman, M., Clark, J.: Metrics are fitness functions too. In: Proceedings. 10th International Symposium on, Software Metrics, pp. 58\u201369. IEEE, New York (2004)","DOI":"10.1109\/METRIC.2004.1357891"},{"issue":"14","key":"4_CR75","doi-asserted-by":"publisher","first-page":"833","DOI":"10.1016\/S0950-5849(01)00189-6","volume":"43","author":"M Harman","year":"2001","unstructured":"Harman, M., Jones, B.F.: Search-based software engineering. Inf. Softw. Technol. 43(14), 833\u2013839 (2001)","journal-title":"Inf. Softw. Technol."},{"issue":"5","key":"4_CR76","doi-asserted-by":"publisher","first-page":"154","DOI":"10.1145\/195274.195402","volume":"19","author":"MJ Harrold","year":"1994","unstructured":"Harrold, M.J., Rothermel, G.: Performing data flow testing on classes. ACM SIGSOFT Softw. Eng. Notes 19(5), 154\u2013163 (1994)","journal-title":"ACM SIGSOFT Softw. Eng. Notes"},{"issue":"3","key":"4_CR77","doi-asserted-by":"publisher","first-page":"270","DOI":"10.1145\/152388.152391","volume":"2","author":"MJ Harrold","year":"1993","unstructured":"Harrold, M.J., Gupta, R., Soffa, M.L.: A methodology for controlling the size of a test suite. ACM Trans. Softw. Eng. Methodol. 2(3), 270\u2013285 (1993)","journal-title":"ACM Trans. Softw. Eng. Methodol."},{"key":"4_CR78","doi-asserted-by":"crossref","unstructured":"Herzig, K., Nagappan, N.: Empirically detecting false test alarms using association rules. In: ICSE SEIP (2015)","DOI":"10.1109\/ICSE.2015.133"},{"key":"4_CR79","doi-asserted-by":"crossref","unstructured":"Herzig, K., Greiler, M., Czerwonka, J., Murphy, B.: The art of testing less without sacrificing quality. In: ACM\/IEEE International Conference on Software Engineering (ICSE), pp. 483\u2013493. IEEE Press, New York (2015)","DOI":"10.1109\/ICSE.2015.66"},{"issue":"5","key":"4_CR80","doi-asserted-by":"publisher","first-page":"279","DOI":"10.1109\/32.588521","volume":"23","author":"GJ Holzmann","year":"1997","unstructured":"Holzmann, G.J.: The model checker spin. IEEE Trans. Softw. Eng. 23(5), 279\u2013295 (1997)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"2","key":"4_CR81","doi-asserted-by":"publisher","first-page":"65","DOI":"10.1002\/stvr.228","volume":"11","author":"Gerard J. Holzmann","year":"2001","unstructured":"Holzmann, G.J., H Smith, M.: Software model checking: extracting verification models from source code. Softw. Test. Verification Reliab. 11(2), 65\u201379 (2001)","journal-title":"Software Testing, Verification and Reliability"},{"issue":"3","key":"4_CR82","doi-asserted-by":"publisher","first-page":"208","DOI":"10.1109\/TSE.1976.233816","volume":"SE-2","author":"WE Howden","year":"1976","unstructured":"Howden, W.E.: Reliability of the path analysis testing strategy. IEEE Trans. Softw. Eng. SE-2(3), 208\u2013215 (1976)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR83","doi-asserted-by":"crossref","unstructured":"Hsu, H., Orso, A.: MINTS: a general framework and tool for supporting test-suite minimization. In: ACM\/IEEE International Conference on Software Engineering (ICSE), pp. 419\u2013429 (2009)","DOI":"10.1109\/ICSE.2009.5070541"},{"issue":"3","key":"4_CR84","doi-asserted-by":"publisher","first-page":"113","DOI":"10.1145\/356651.356652","volume":"7","author":"JC Huang","year":"1975","unstructured":"Huang, J.C.: An approach to program testing. ACM Comput. Surv. 7(3), 113\u2013128 (1975)","journal-title":"ACM Comput. Surv."},{"key":"4_CR85","volume-title":"Continuous Delivery: Reliable Software Releases Through Build, Test, and Deployment Automation","author":"J Humble","year":"2010","unstructured":"Humble, J., Farley, D.: Continuous Delivery: Reliable Software Releases Through Build, Test, and Deployment Automation. Pearson Education, Boston (2010)"},{"key":"4_CR86","doi-asserted-by":"crossref","unstructured":"Inozemtseva, L., Holmes, R.: Coverage is not strongly correlated with test suite effectiveness. In: ACM\/IEEE International Conference on Software Engineering (ICSE), pp. 435\u2013445. ACM, New York (2014)","DOI":"10.1145\/2568225.2568271"},{"key":"4_CR87","unstructured":"Jia, Y., Harman, M.: An analysis and survey of the development of mutation testing. Technical Report TR-09-06, CREST Centre, King\u2019s College London, London (2009)"},{"issue":"5","key":"4_CR88","doi-asserted-by":"publisher","first-page":"649","DOI":"10.1109\/TSE.2010.62","volume":"37","author":"Y Jia","year":"2011","unstructured":"Jia, Y., Harman, M.: An analysis and survey of the development of mutation testing. IEEE Trans. Softw. Eng. 37(5), 649\u2013678 (2011)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR89","doi-asserted-by":"crossref","unstructured":"Jiang, B., Zhang, Z., Chan, W., Tse, T.: Adaptive random test case prioritization. In: IEEE\/ACM International Conference on Automated Software Engineering (ASE), pp. 233\u2013244 (2009)","DOI":"10.1109\/ASE.2009.77"},{"key":"4_CR90","unstructured":"Johnson, L.A., et al.: Do-178b, software considerations in airborne systems and equipment certification. Crosstalk, October 1998"},{"issue":"5","key":"4_CR91","doi-asserted-by":"publisher","first-page":"299","DOI":"10.1049\/sej.1996.0040","volume":"11","author":"BF Jones","year":"1996","unstructured":"Jones, B.F., Sthamer, H.H., Eyres, D.E.: Automatic structural testing using genetic algorithms. Softw. Eng. J. 11(5), 299\u2013306 (1996)","journal-title":"Softw. Eng. J."},{"key":"4_CR92","doi-asserted-by":"crossref","unstructured":"Just, R., Schweiggert, F., Kapfhammer, G.: Major: an efficient and extensible tool for mutation analysis in a Java compiler. In: IEEE\/ACM International Conference on Automated Software Engineering (ASE), pp. 612\u2013615 (2011)","DOI":"10.1109\/ASE.2011.6100138"},{"key":"4_CR93","doi-asserted-by":"crossref","unstructured":"Just, R., Jalali, D., Inozemtseva, L., Ernst, M., Holmes, R., Fraser, G.: Are mutants a valid substitute for real faults in software testing? In: ACM Symposium on the Foundations of Software Engineering (FSE), pp. 654\u2013665 (2014)","DOI":"10.1145\/2635868.2635929"},{"key":"4_CR94","unstructured":"Kane, S., Liberman, E., DiViesti, T., Click, F.: Toyota Sudden Unintended Acceleration. Safety Research & Strategies, Rehoboth (2010)"},{"key":"4_CR95","unstructured":"Kaner, C.: Exploratory testing. In: Quality Assurance Institute Worldwide Annual Software Testing Conference (2006)"},{"issue":"7","key":"4_CR96","doi-asserted-by":"publisher","first-page":"385","DOI":"10.1145\/360248.360252","volume":"19","author":"JC King","year":"1976","unstructured":"King, J.C.: Symbolic execution and program testing. Commun. ACM 19(7), 385\u2013394 (1976)","journal-title":"Commun. ACM"},{"key":"4_CR97","doi-asserted-by":"publisher","first-page":"870","DOI":"10.1109\/32.57624","volume":"16","author":"B Korel","year":"1990","unstructured":"Korel, B.: Automated software test data generation. IEEE Trans. Softw. Eng. 16, 870\u2013879 (1990)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR98","doi-asserted-by":"crossref","unstructured":"Korel, B., Tahat, L.H., Vaysburg, B.: Model based regression test reduction using dependence analysis. In: IEEE International Conference on Software Maintenance (ICSM), pp. 214\u2013223 (2002)","DOI":"10.1109\/ICSM.2002.1167768"},{"key":"4_CR99","doi-asserted-by":"crossref","unstructured":"Korel, B., Tahat, L.H., Harman, M.: Test prioritization using system models. In: IEEE International Conference on Software Maintenance (ICSM), pp. 559\u2013568 (2005)","DOI":"10.1109\/ICSM.2005.87"},{"issue":"3","key":"4_CR100","doi-asserted-by":"publisher","first-page":"238","DOI":"10.1007\/s10703-009-0065-1","volume":"34","author":"M Krichen","year":"2009","unstructured":"Krichen, M., Tripakis, S.: Conformance testing for real-time systems. Formal Methods Syst. Des. 34(3), 238\u2013304 (2009)","journal-title":"Formal Methods Syst. Des."},{"issue":"6","key":"4_CR101","doi-asserted-by":"publisher","first-page":"418","DOI":"10.1109\/TSE.2004.24","volume":"30","author":"D Kuhn","year":"2004","unstructured":"Kuhn, D., Wallace, D., Gallo, A. Jr.: Software fault interactions and implications for software testing. IEEE Trans. Softw. Eng. 30(6), 418\u2013421 (2004)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR102","doi-asserted-by":"crossref","unstructured":"Labuschagne, A., Inozemtseva, L., Holmes, R.: Measuring the cost of regression testing in practice: a study of java projects using continuous integration. In: Proceedings of the 2017 11th Joint Meeting on Foundations of Software Engineering, ESEC\/FSE, pp. 821\u2013830. ACM, New York (2017)","DOI":"10.1145\/3106237.3106288"},{"issue":"8","key":"4_CR103","doi-asserted-by":"publisher","first-page":"1090","DOI":"10.1109\/5.533956","volume":"84","author":"D Lee","year":"1996","unstructured":"Lee, D., Yannakakis, M.: Principles and methods of testing finite state machines-a survey. Proc. IEEE 84(8), 1090\u20131123 (1996)","journal-title":"Proc. IEEE"},{"key":"4_CR104","doi-asserted-by":"crossref","unstructured":"Leitner, A., Oriol, M., Zeller, A., Ciupa, I., Meyer, B.: Efficient unit test case minimization. In: IEEE\/ACM International Conference on Automated Software Engineering (ASE), pp. 417\u2013420 (2007)","DOI":"10.1145\/1321631.1321698"},{"issue":"7","key":"4_CR105","doi-asserted-by":"publisher","first-page":"18","DOI":"10.1109\/MC.1993.274940","volume":"26","author":"NG Leveson","year":"1993","unstructured":"Leveson, N.G., Turner, C.S.: An investigation of the Therac-25 accidents. Computer 26(7), 18\u201341 (1993)","journal-title":"Computer"},{"issue":"4","key":"4_CR106","doi-asserted-by":"publisher","first-page":"225","DOI":"10.1109\/TSE.2007.38","volume":"33","author":"Z Li","year":"2007","unstructured":"Li, Z., Harman, M., Hierons, R.M.: Search algorithms for regression test case prioritization. IEEE Trans. Softw. Eng. 33(4), 225\u2013237 (2007)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR107","doi-asserted-by":"crossref","unstructured":"Lieberman, H., Patern\u00f2, F., Klann, M., Wulf, V.: End-user development: an emerging paradigm. In: End User Development, pp. 1\u20138. Springer, Berlin (2006)","DOI":"10.1007\/1-4020-5386-X_1"},{"issue":"3","key":"4_CR108","doi-asserted-by":"publisher","first-page":"19","DOI":"10.1109\/MS.2009.80","volume":"26","author":"Peter Liggesmeyer","year":"2009","unstructured":"Liggesmeyer, P., Trapp. M.: Trends in embedded software engineering. IEEE Softw. 26(3), 19\u201325 (2009)","journal-title":"IEEE Software"},{"key":"4_CR109","doi-asserted-by":"crossref","unstructured":"Lu, S., Jiang, W., Zhou, Y.: A study of interleaving coverage criteria. In: The 6th Joint Meeting on European Software Engineering Conference and the ACM SIGSOFT Symposium on the Foundations of Software Engineering: Companion Papers, pp. 533\u2013536. ACM, New York (2007)","DOI":"10.1145\/1295014.1295034"},{"issue":"3","key":"4_CR110","doi-asserted-by":"publisher","first-page":"329","DOI":"10.1145\/1353536.1346323","volume":"43","author":"S Lu","year":"2008","unstructured":"Lu, S., Park, S., Seo, E., Zhou, Y.: Learning from mistakes: a comprehensive study on real world concurrency bug characteristics. ACM Sigplan Not. 43(3), 329\u2013339 (2008)","journal-title":"ACM Sigplan Not."},{"key":"4_CR111","doi-asserted-by":"crossref","unstructured":"Luo, Q., Hariri, F., Eloussi, L., Marinov, D.: An empirical analysis of flaky tests. In: ACM Symposium on the Foundations of Software Engineering (FSE), pp. 643\u2013653. ACM, New York (2014)","DOI":"10.1145\/2635868.2635920"},{"issue":"1","key":"4_CR112","doi-asserted-by":"publisher","first-page":"79","DOI":"10.1016\/S0164-1212(00)00119-9","volume":"57","author":"N Mansour","year":"2001","unstructured":"Mansour, N., Bahsoon, R., Baradhi, G.: Empirical comparison of regression test selection algorithms. J. Syst. Softw. 57(1), 79\u201390 (2001)","journal-title":"J. Syst. Softw."},{"key":"4_CR113","doi-asserted-by":"publisher","first-page":"25","DOI":"10.1007\/978-1-4615-3190-6_3","volume-title":"Symbolic Model Checking","author":"Kenneth L. McMillan","year":"1993","unstructured":"McMillan, K.L.: Symbolic model checking. In: Symbolic Model Checking, pp. 25\u201360. Springer, Berlin (1993)"},{"issue":"2","key":"4_CR114","doi-asserted-by":"publisher","first-page":"105","DOI":"10.1002\/stvr.294","volume":"14","author":"P McMinn","year":"2004","unstructured":"McMinn, P.: Search-based software test data generation: a survey. Softw. Test. Verification Reliab. 14(2), 105\u2013156 (2004)","journal-title":"Softw. Test. Verification Reliab."},{"issue":"5","key":"4_CR115","doi-asserted-by":"publisher","first-page":"256","DOI":"10.1145\/503271.503244","volume":"26","author":"AM Memon","year":"2001","unstructured":"Memon, A.M., Soffa, M.L., Pollack, M.E.: Coverage criteria for gui testing. ACM SIGSOFT Softw. Eng. Notes 26(5), 256\u2013267 (2001)","journal-title":"ACM SIGSOFT Softw. Eng. Notes"},{"key":"4_CR116","doi-asserted-by":"crossref","unstructured":"Memon, A., Banerjee, I., Nagarajan, A.: What test oracle should i use for effective gui testing? In: 18th IEEE International Conference on Automated Software Engineering, 2003. Proceedings, pp. 164\u2013173. IEEE, New York (2003a)","DOI":"10.1109\/ASE.2003.1240304"},{"key":"4_CR117","first-page":"260","volume":"3","author":"AM Memon","year":"2003","unstructured":"Memon, A.M., Banerjee, I., Nagarajan, A.: Gui ripping: reverse engineering of graphical user interfaces for testing. In: WCRE, vol. 3, p. 260 (2003b)","journal-title":"In: WCRE"},{"key":"4_CR118","doi-asserted-by":"crossref","unstructured":"Memon, A., Gao, Z., Nguyen, B., Dhanda, S., Nickell, E., Siemborski, R., Micco, J.: Taming Google-scale continuous testing. In: 2017 IEEE\/ACM 39th International Conference on Software Engineering: Software Engineering in Practice Track (ICSE-SEIP), pp. 233\u2013242 (2017)","DOI":"10.1109\/ICSE-SEIP.2017.16"},{"issue":"10","key":"4_CR119","doi-asserted-by":"publisher","first-page":"40","DOI":"10.1109\/2.161279","volume":"25","author":"B Meyer","year":"1992","unstructured":"Meyer, B.: Applying\u2019design by contract\u2019. Computer 25(10), 40\u201351 (1992)","journal-title":"Computer"},{"issue":"12","key":"4_CR120","doi-asserted-by":"publisher","first-page":"1085","DOI":"10.1109\/32.988709","volume":"27","author":"CC Michael","year":"2001","unstructured":"Michael, C.C., McGraw, G., Schatz, M.A.: Generating software test data by evolution. IEEE Trans. Softw. Eng. 27(12), 1085\u20131110 (2001)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"2","key":"4_CR121","doi-asserted-by":"publisher","first-page":"58","DOI":"10.1145\/366246.366248","volume":"6","author":"JC Miller","year":"1963","unstructured":"Miller, J.C., Maloney, C.J.: Systematic mistake analysis of digital computer programs. Commun. ACM 6(2), 58\u201363 (1963)","journal-title":"Commun. ACM"},{"issue":"3","key":"4_CR122","doi-asserted-by":"publisher","first-page":"223","DOI":"10.1109\/TSE.1976.233818","volume":"2","author":"W Miller","year":"1976","unstructured":"Miller, W., Spooner, D.L.: Automatic generation of floating-point test data. IEEE Trans. Softw. Eng. 2(3), 223\u2013226 (1976)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"12","key":"4_CR123","doi-asserted-by":"publisher","first-page":"32","DOI":"10.1145\/96267.96279","volume":"33","author":"BP Miller","year":"1990","unstructured":"Miller, B.P., Fredriksen, L., So, B.: An empirical study of the reliability of unix utilities. Commun. ACM 33(12), 32\u201344 (1990)","journal-title":"Commun. ACM"},{"issue":"4","key":"4_CR124","doi-asserted-by":"publisher","first-page":"936","DOI":"10.1109\/TSE.2011.56","volume":"38","author":"S Mirarab","year":"2012","unstructured":"Mirarab, S., Akhlaghi, S., Tahvildari, L.: Size-constrained regression test case selection using multicriteria optimization. IEEE Trans. Softw. Eng. 38(4), 936\u2013956 (2012)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR125","unstructured":"Musuvathi, M., Qadeer, S., Ball, T., Basler, G., Nainar, P.A., Neamtiu, I.: Finding and reproducing Heisenbugs in concurrent programs. In: Proceedings of the 8th USENIX Conference on Operating Systems Design and Implementation (OSDI), pp. 267\u2013280. USENIX Association, Berkeley (2008)"},{"key":"4_CR126","volume-title":"The Art of Software Testing","author":"G Myers","year":"1979","unstructured":"Myers, G.: The Art of Software Testing. Wiley, New York (1979)"},{"issue":"2","key":"4_CR127","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/1883612.1883618","volume":"43","author":"Changhai Nie","year":"2011","unstructured":"Nie, C., Leung, H.: A survey of combinatorial testing. ACM Comput. Surv. 43(2), 1\u201329 (2011). Article 11","journal-title":"ACM Computing Surveys"},{"key":"4_CR128","doi-asserted-by":"publisher","first-page":"343","DOI":"10.1007\/3-540-45319-9_24","volume-title":"Tools and Algorithms for the Construction and Analysis of Systems","author":"Brian Nielsen","year":"2001","unstructured":"Nielsen, B., Skou, A.: Automated test generation from timed automata. In: International Conference on Tools and Algorithms for the Construction and Analysis of Systems, pp. 343\u2013357. Springer, Berlin (2001)"},{"key":"4_CR129","doi-asserted-by":"crossref","unstructured":"Nistor, A., Luo, Q., Pradel, M., Gross, T.R., Marinov, D.: BALLERINA: automatic generation and clustering of efficient random unit tests for multithreaded code. In: ACM\/IEEE International Conference on Software Engineering (ICSE), pp. 727\u2013737 (2012)","DOI":"10.1109\/ICSE.2012.6227145"},{"key":"4_CR130","unstructured":"North, D.: Behavior modification: the evolution of behavior-driven development. Better Softw. 8(3) (2006). https:\/\/www.stickyminds.com\/better-software-magazine-volume-issue\/2006-03"},{"issue":"6","key":"4_CR131","doi-asserted-by":"publisher","first-page":"868","DOI":"10.1109\/32.6165","volume":"14","author":"SC Ntafos","year":"1988","unstructured":"Ntafos, S.C.: A comparison of some structural testing strategies. IEEE Trans. Softw. Eng. 14(6), 868 (1988)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR132","first-page":"416","volume-title":"Lecture Notes in Computer Science","author":"Jeff Offutt","year":"1999","unstructured":"Offutt, J., Abdurazik, A.: Generating tests from UML specifications. In: International Conference on the Unified Modeling Language: Beyond the Standard (UML), pp. 416\u2013429. Springer, Berlin (1999)"},{"key":"4_CR133","doi-asserted-by":"publisher","first-page":"34","DOI":"10.1007\/978-1-4757-5939-6_7","volume-title":"Mutation Testing for the New Century","author":"AJ Offutt","year":"2001","unstructured":"Offutt, A.J., Untch, R.H.: Mutation 2000: uniting the orthogonal. In: Wong, W.E. (ed.) Mutation Testing for the New Century, pp. 34\u201344. Kluwer Academic Publishers, Boston (2001)"},{"key":"4_CR134","doi-asserted-by":"crossref","unstructured":"Offutt, A.J, Rothermel, G., Zapf, C.: An experimental evaluation of selective mutation. In: ACM\/IEEE International Conference on Software Engineering (ICSE), pp. 100\u2013107 (1993)","DOI":"10.1109\/ICSE.1993.346062"},{"issue":"4","key":"4_CR135","doi-asserted-by":"publisher","first-page":"473","DOI":"10.1002\/spe.4380060405","volume":"6","author":"LJ Osterweil","year":"1976","unstructured":"Osterweil, L.J., Fosdick, L.D.: Dave\u2013a validation error detection and documentation system for fortran programs. Softw. Pract. Exp. 6(4), 473\u2013486 (1976)","journal-title":"Softw. Pract. Exp."},{"issue":"6","key":"4_CR136","doi-asserted-by":"publisher","first-page":"676","DOI":"10.1145\/62959.62964","volume":"31","author":"TJ Ostrand","year":"1988","unstructured":"Ostrand, T.J., Balcer, M.J.: The category-partition method for specifying and generating functional tests. Commun. ACM 31(6), 676\u2013686 (1988)","journal-title":"Commun. ACM"},{"key":"4_CR137","doi-asserted-by":"crossref","unstructured":"Pacheco, C., Ernst, M.D.: Randoop: feedback-directed random testing for Java. In: ACM SIGPLAN Conference on Object-Oriented Programming Systems and Application (OOPSLA Companion), pp. 815\u2013816. ACM, New York (2007)","DOI":"10.1145\/1297846.1297902"},{"key":"4_CR138","doi-asserted-by":"crossref","unstructured":"Pacheco, C., Lahiri, S.K., Ernst, M.D., Ball, T.: Feedback-directed random test generation. In: ACM\/IEEE International Conference on Software Engineering (ICSE), pp. 75\u201384 (2007)","DOI":"10.1109\/ICSE.2007.37"},{"issue":"4","key":"4_CR139","doi-asserted-by":"publisher","first-page":"358","DOI":"10.1109\/TSE.2014.2364175","volume":"41","author":"A Panichella","year":"2015","unstructured":"Panichella, A., Oliveto, R., Penta, M.D., Lucia, A.D.: Improving multi-objective test case selection by injecting diversity in genetic algorithms. IEEE Trans. Softw. Eng. 41(4), 358\u2013383 (2015)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"4","key":"4_CR140","doi-asserted-by":"publisher","first-page":"263","DOI":"10.1002\/(SICI)1099-1689(199912)9:4<263::AID-STVR190>3.0.CO;2-Y","volume":"9","author":"RP Pargas","year":"1999","unstructured":"Pargas, R.P., Harrold, M.J., Peck, R.: Test-data generation using genetic algorithms. Softw. Test. Verification Reliab. 9(4), 263\u2013282 (1999)","journal-title":"Softw. Test. Verification Reliab."},{"issue":"5","key":"4_CR141","doi-asserted-by":"publisher","first-page":"81","DOI":"10.1109\/MSP.2004.84","volume":"2","author":"B Potter","year":"2004","unstructured":"Potter, B., McGraw, G.: Software security testing. IEEE Secur. Priv. 2(5), 81\u201385 (2004)","journal-title":"IEEE Secur. Priv."},{"key":"4_CR142","doi-asserted-by":"publisher","first-page":"367","DOI":"10.1109\/TSE.1985.232226","volume":"4","author":"S Rapps","year":"1985","unstructured":"Rapps, S., Weyuker, E.J.: Selecting software test data using data flow information. IEEE Trans. Softw. Eng. (4), 367\u2013375 (1985). https:\/\/doi.org\/10.1109\/TSE.1985.232226","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"2","key":"4_CR143","doi-asserted-by":"publisher","first-page":"173","DOI":"10.1145\/248233.248262","volume":"6","author":"G Rothermel","year":"1997","unstructured":"Rothermel, G., Harrold, M.J.: A safe, efficient regression test selection technique. ACM Trans. Softw. Eng. Methodol. 6(2), 173\u2013210 (1997)","journal-title":"ACM Trans. Softw. Eng. Methodol."},{"key":"4_CR144","doi-asserted-by":"crossref","unstructured":"Rothermel, G., Harrold, M.J., Ostrin, J., Hong, C.: An empirical study of the effects of minimization on the fault detection capabilities of test suites. In: IEEE International Conference on Software Maintenance (ICSM), pp. 34\u201343 (1998)","DOI":"10.1109\/ICSM.1998.738487"},{"issue":"10","key":"4_CR145","doi-asserted-by":"publisher","first-page":"929","DOI":"10.1109\/32.962562","volume":"27","author":"G Rothermel","year":"2001","unstructured":"Rothermel, G., Untch, R.H., Chu, C., Harrold, M.J.: Prioritizing test cases for regression testing. IEEE Trans. Softw. Eng. 27(10), 929\u2013948 (2001)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"4","key":"4_CR146","doi-asserted-by":"publisher","first-page":"285","DOI":"10.1016\/0169-7552(88)90064-5","volume":"15","author":"K Sabnani","year":"1988","unstructured":"Sabnani, K., Dahbura, A.: A protocol test generation procedure. Comput Netw. ISDN Syst. 15(4), 285\u2013297 (1988)","journal-title":"Comput Netw. ISDN Syst."},{"issue":"9","key":"4_CR147","doi-asserted-by":"publisher","first-page":"805","DOI":"10.1109\/TSE.2016.2532875","volume":"42","author":"Sergio Segura","year":"2016","unstructured":"Segura, S., Fraser, G., Sanchez, A., Ruiz-Cortes, A.: A survey on metamorphic testing. IEEE Trans. Softw. Eng. (TSE) 42(9), 805\u2013824 (2016)","journal-title":"IEEE Transactions on Software Engineering"},{"issue":"5","key":"4_CR148","doi-asserted-by":"publisher","first-page":"263","DOI":"10.1145\/1095430.1081750","volume":"30","author":"Koushik Sen","year":"2005","unstructured":"Sen, K., Marinov, D., Agha, G.: CUTE: a concolic unit testing engine for C. In: ACM Symposium on the Foundations of Software Engineering, pp. 263\u2013272. ACM, New York (2005)","journal-title":"ACM SIGSOFT Software Engineering Notes"},{"issue":"6","key":"4_CR149","doi-asserted-by":"publisher","first-page":"16","DOI":"10.1109\/MS.2010.152","volume":"27","author":"F Shull","year":"2010","unstructured":"Shull, F., Melnik, G., Turhan, B., Layman, L., Diep, M., Erdogmus, H.: What do we know about test-driven development? IEEE Softw. 27(6), 16\u201319 (2010). https:\/\/doi.org\/10.1109\/MS.2010.152","journal-title":"IEEE Softw."},{"issue":"1","key":"4_CR150","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/331963.331965","volume":"35","author":"Emin G\u00fcn Sirer","year":"2000","unstructured":"Sirer, E.G., Bershad, B.N.: Using production grammars in software testing. In: ACM SIGPLAN Notices, vol. 35, pp. 1\u201313. ACM, New York (1999)","journal-title":"ACM SIGPLAN Notices"},{"key":"4_CR151","doi-asserted-by":"crossref","unstructured":"Steenbuck, S., Fraser, G.: Generating unit tests for concurrent classes. In: IEEE International Conference on Software Testing, Verification and Validation (ICST), pp. 144\u2013153. IEEE, New York (2013)","DOI":"10.1109\/ICST.2013.33"},{"issue":"11","key":"4_CR152","doi-asserted-by":"publisher","first-page":"777","DOI":"10.1109\/32.553698","volume":"22","author":"P Stocks","year":"1996","unstructured":"Stocks, P., Carrington, D.: A framework for specification-based testing. IEEE Trans. Softw. Eng. 22(11), 777\u2013793 (1996)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR153","volume-title":"Fuzzing: Brute Force Vulnerability Discovery","author":"M Sutton","year":"2007","unstructured":"Sutton, M., Greene, A., Amini, P.: Fuzzing: Brute Force Vulnerability Discovery. Pearson Education, Boston (2007)"},{"key":"4_CR154","unstructured":"Tassey, G.: The economic impacts of inadequate infrastructure for software testing, final report. National Institute of Standards and Technology (2002)"},{"issue":"4","key":"4_CR155","doi-asserted-by":"publisher","first-page":"86","DOI":"10.1145\/566171.566186","volume":"27","author":"MM Tikir","year":"2002","unstructured":"Tikir, M.M., Hollingsworth, J.K.: Efficient instrumentation for code coverage testing. ACM SIGSOFT Softw. Eng. Notes 27(4), 86\u201396 (2002)","journal-title":"ACM SIGSOFT Softw. Eng. Notes"},{"key":"4_CR156","doi-asserted-by":"crossref","unstructured":"Tonella, P.: Evolutionary testing of classes. In: ACM International Symposium on Software Testing and Analysis (ISSTA), pp. 119\u2013128 (2004)","DOI":"10.1145\/1007512.1007528"},{"key":"4_CR157","doi-asserted-by":"crossref","unstructured":"Tracey, N., Clark, J., Mander, K., McDermid, J.A.: An automated framework for structural test-data generation. In: IEEE\/ACM International Conference on Automated Software Engineering (ASE), pp. 285\u2013288 (1998)","DOI":"10.1109\/ASE.1998.732680"},{"key":"4_CR158","doi-asserted-by":"crossref","unstructured":"Tretmans, J.: Test generation with inputs, outputs and repetitive quiescence (1996)","DOI":"10.1007\/3-540-61042-1_42"},{"key":"4_CR159","unstructured":"Tretmans, J., Brinksma, E.: TorX: automated model-based testing. In: First European Conference on Model-Driven Software Engineering, pp. 31\u201343 (2003)"},{"issue":"3","key":"4_CR160","doi-asserted-by":"publisher","first-page":"139","DOI":"10.1145\/174146.154265","volume":"18","author":"RH Untch","year":"1993","unstructured":"Untch, R.H., Offutt, A.J., Harrold, M.J.: Mutation analysis using mutant schemata. ACM SIGSOFT Softw. Eng. Notes 18(3), 139\u2013148 (1993)","journal-title":"ACM SIGSOFT Softw. Eng. Notes"},{"key":"4_CR161","volume-title":"Practical Model-Based Testing: A Tools Approach","author":"M Utting","year":"2010","unstructured":"Utting, M., Legeard, B.: Practical Model-Based Testing: A Tools Approach. Morgan Kaufmann, San Francisco (2010)"},{"issue":"5","key":"4_CR162","doi-asserted-by":"publisher","first-page":"297","DOI":"10.1002\/stvr.456","volume":"22","author":"M Utting","year":"2012","unstructured":"Utting, M., Pretschner, A., Legeard, B.: A taxonomy of model-based testing approaches. Softw. Test. Verif. Reliab. 22(5), 297\u2013312 (2012)","journal-title":"Softw. Test. Verif. Reliab."},{"issue":"2","key":"4_CR163","doi-asserted-by":"publisher","first-page":"203","DOI":"10.1023\/A:1022920129859","volume":"10","author":"W Visser","year":"2003","unstructured":"Visser, W., Havelund, K., Brat, G., Park, S., Lerda, F.: Model checking programs. Autom. Softw. Eng. 10(2), 203\u2013232 (2003)","journal-title":"Autom. Softw. Eng."},{"issue":"4","key":"4_CR164","doi-asserted-by":"publisher","first-page":"97","DOI":"10.1145\/1013886.1007526","volume":"29","author":"W Visser","year":"2004","unstructured":"Visser, W., Pasareanu, C.S., Khurshid, S.: Test input generation with Java PathFinder. ACM SIGSOFT Softw. Eng. Notes 29(4), 97\u2013107 (2004)","journal-title":"ACM SIGSOFT Softw. Eng. Notes"},{"issue":"14","key":"4_CR165","doi-asserted-by":"publisher","first-page":"841","DOI":"10.1016\/S0950-5849(01)00190-2","volume":"43","author":"J Wegener","year":"2001","unstructured":"Wegener, J., Baresel, A., Sthamer, H.: Evolutionary test environment for automatic structural testing. Inf. Softw. Technol. 43(14), 841\u2013854 (2001)","journal-title":"Inf. Softw. Technol."},{"issue":"4","key":"4_CR166","doi-asserted-by":"publisher","first-page":"465","DOI":"10.1093\/comjnl\/25.4.465","volume":"25","author":"EJ Weyuker","year":"1982","unstructured":"Weyuker, E.J.: On testing non-testable programs. Comput. J. 25(4), 465\u2013470 (1982)","journal-title":"Comput. J."},{"issue":"4","key":"4_CR167","doi-asserted-by":"publisher","first-page":"641","DOI":"10.1145\/69575.357231","volume":"5","author":"EJ Weyuker","year":"1983","unstructured":"Weyuker, E.J.: Assessing test data adequacy through program inference. ACM Trans. Program. Lang. Syst. 5(4), 641\u2013655 (1983)","journal-title":"ACM Trans. Program. Lang. Syst."},{"issue":"5","key":"4_CR168","doi-asserted-by":"publisher","first-page":"353","DOI":"10.1109\/32.286420","volume":"20","author":"E Weyuker","year":"1994","unstructured":"Weyuker, E., Goradia, T., Singh, A.: Automatically generating test data from a boolean specification. IEEE Trans. Softw. Eng. 20(5), 353 (1994)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"3","key":"4_CR169","doi-asserted-by":"publisher","first-page":"247","DOI":"10.1109\/TSE.1980.234486","volume":"6","author":"LJ White","year":"1980","unstructured":"White, L.J., Cohen, E.I.: A domain strategy for computer program testing. IEEE Trans. Softw. Eng. 6(3), 247\u2013257 (1980)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR170","volume-title":"How Google Tests Software","author":"JA Whittaker","year":"2012","unstructured":"Whittaker, J.A., Arbon, J., Carollo, J.: How Google Tests Software. Addison-Wesley, Upper Saddle River (2012)"},{"issue":"4","key":"4_CR171","doi-asserted-by":"publisher","first-page":"347","DOI":"10.1002\/(SICI)1097-024X(19980410)28:4<347::AID-SPE145>3.0.CO;2-L","volume":"28","author":"WE Wong","year":"1998","unstructured":"Wong, W.E., Horgan, J.R., London, S., Mathur, A.P.: Effect of test set minimization on fault detection effectiveness. Softw. Pract. Exper. 28(4), 347\u2013369 (1998)","journal-title":"Softw. Pract. Exper."},{"key":"4_CR172","unstructured":"Xanthakis, S., Ellis, C., Skourlas, C., Le Gall, A., Katsikas, S., Karapoulios, K.: Application of genetic algorithms to software testing. In: Proceedings of the 5th International Conference on Software Engineering and Applications, pp. 625\u2013636 (1992)"},{"issue":"2","key":"4_CR173","doi-asserted-by":"publisher","first-page":"153","DOI":"10.1145\/271775.271804","volume":"23","author":"CSD Yang","year":"1998","unstructured":"Yang, C.S.D., Souter, A.L., Pollock, L.L.: All-du-path coverage for parallel programs. ACM SIGSOFT Softw. Eng. Notes 23(2), 153\u2013162 (1998)","journal-title":"ACM SIGSOFT Softw. Eng. Notes"},{"key":"4_CR174","doi-asserted-by":"crossref","unstructured":"Yoo, S., Harman, M.: Pareto efficient multi-objective test case selection. In: ACM International Symposium on Software Testing and Analysis (ISSTA), pp. 140\u2013150. ACM, New York (2007)","DOI":"10.1145\/1273463.1273483"},{"issue":"2","key":"4_CR175","doi-asserted-by":"publisher","first-page":"67","DOI":"10.1002\/stv.430","volume":"22","author":"S Yoo","year":"2012","unstructured":"Yoo, S., Harman, M.: Regression testing minimization, selection and prioritization: a survey. Softw. Test. Verif. Reliab. 22(2), 67\u2013120 (2012)","journal-title":"Softw. Test. Verif. Reliab."},{"key":"4_CR176","unstructured":"Young, M., Pezze, M.: Software Testing and Analysis: Process, Principles and Techniques. Wiley, New York (2005)"},{"issue":"4","key":"4_CR177","doi-asserted-by":"publisher","first-page":"559","DOI":"10.1109\/TSE.2010.50","volume":"37","author":"X Yuan","year":"2011","unstructured":"Yuan, X., Cohen, M.B., Memon, A.M.: GUI interaction testing: incorporating event context. IEEE Trans. Softw. Eng. 37(4), 559\u2013574 (2011)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"4_CR178","doi-asserted-by":"crossref","unstructured":"Zhang, P., Elbaum, S., Dwyer, M.B.: Automatic generation of load tests. In: Proceedings of the 2011 26th IEEE\/ACM International Conference on Automated Software Engineering, pp. 43\u201352. IEEE Computer Society, Washington (2011)","DOI":"10.1109\/ASE.2011.6100093"},{"key":"4_CR179","doi-asserted-by":"crossref","unstructured":"Zhang, S., Jalali, D., Wuttke, J., Mu\u015flu, K., Lam, W., Ernst, M.D., Notkin, D.: Empirically revisiting the test independence assumption. In: ACM International Symposium on Software Testing and Analysis (ISSTA), pp. 385\u2013396. ACM, New York (2014)","DOI":"10.1145\/2610384.2610404"},{"issue":"4","key":"4_CR180","doi-asserted-by":"publisher","first-page":"366","DOI":"10.1145\/267580.267590","volume":"29","author":"H Zhu","year":"1997","unstructured":"Zhu, H., Hall, P.A.V., May, J.H.R.: Software unit test coverage and adequacy. ACM Comput. Surv. 29(4), 366\u2013427 (1997)","journal-title":"ACM Comput. Surv."}],"container-title":["Handbook of Software Engineering"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-00262-6_4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,11,16]],"date-time":"2019-11-16T11:55:25Z","timestamp":1573905325000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-030-00262-6_4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"ISBN":["9783030002619","9783030002626"],"references-count":180,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-00262-6_4","relation":{},"subject":[],"published":{"date-parts":[[2019]]},"assertion":[{"value":"12 February 2019","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}}]}}