{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T03:54:34Z","timestamp":1775274874166,"version":"3.50.1"},"publisher-location":"Cham","reference-count":37,"publisher":"Springer International Publishing","isbn-type":[{"value":"9783030042714","type":"print"},{"value":"9783030042721","type":"electronic"}],"license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018]]},"DOI":"10.1007\/978-3-030-04272-1_13","type":"book-chapter","created":{"date-parts":[[2018,11,19]],"date-time":"2018-11-19T01:02:36Z","timestamp":1542589356000},"page":"202-218","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Transient Fault Detection and Recovery Mechanisms in \u03bcC\/OS-II"],"prefix":"10.1007","author":[{"given":"Chengrui","family":"He","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Li","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gang","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ziqi","family":"Zhen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lei","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2018,11,20]]},"reference":[{"key":"13_CR1","unstructured":"James, B.F., Norton, O.W., Alexander, M.B.: The natural space environment: effects on spacecraft. NASA STI\/Recon, Technical report N 95 (1994)"},{"key":"13_CR2","doi-asserted-by":"crossref","unstructured":"Boudjemai, A., Hocine, R., Guerionne, S.: Space environment effect on earth observation satellite instruments. In: International Conference on Recent Advances in Space Technologies, pp. 627\u2013634. IEEE (2015)","DOI":"10.1109\/RAST.2015.7208419"},{"key":"13_CR3","doi-asserted-by":"crossref","unstructured":"Amrbar, M., Irom, F., Guertin, S.M., et al.: Heavy ion single event effects measurements of Xilinx Zynq-7000 FPGA. In: Radiation Effects Data Workshop, pp. 1\u20134. IEEE (2015)","DOI":"10.1109\/REDW.2015.7336714"},{"key":"13_CR4","doi-asserted-by":"publisher","unstructured":"Mccollum, M., James, B., Herr, J.: Operating in the space environment - a spacecraft charging study of the advanced X-ray astrophysics facility-spectroscopy. AIAA SPACE Forum (1994). https:\/\/doi.org\/10.2514\/6.1994-4471","DOI":"10.2514\/6.1994-4471"},{"issue":"1","key":"13_CR5","doi-asserted-by":"publisher","first-page":"22","DOI":"10.2514\/1.31851","volume":"46","author":"Y Kimoto","year":"2015","unstructured":"Kimoto, Y., Yano, K., Ishizawa, J., et al.: Passive space-environment-effect measurement on the international space station. J. Spacecraft Rockets 46(1), 22\u201327 (2015)","journal-title":"J. Spacecraft Rockets"},{"issue":"6","key":"13_CR6","doi-asserted-by":"publisher","first-page":"256","DOI":"10.1016\/j.measurement.2014.02.018","volume":"54","author":"L Ciani","year":"2014","unstructured":"Ciani, L., Catelani, M.: A fault tolerant architecture to avoid the effects of Single Event Upset (SEU) in avionics applications. Measurement 54(6), 256\u2013263 (2014)","journal-title":"Measurement"},{"issue":"1","key":"13_CR7","doi-asserted-by":"publisher","first-page":"123","DOI":"10.1145\/2189750.2150990","volume":"40","author":"SKS Hari","year":"2015","unstructured":"Hari, S.K.S., Adve, S.V., Naeimi, H., et al.: Relyzer: exploiting application-level fault equivalence to analyze application resiliency to transient faults. Comput. Archit. News 40(1), 123 (2015)","journal-title":"Comput. Archit. News"},{"key":"13_CR8","doi-asserted-by":"crossref","unstructured":"Nazarian, G., Rodrigues, D.G., Moreira, A., et al.: Bit-flip aware control-flow error detection. In: Euromicro International Conference on Parallel, Distributed and Network-Based Processing, pp. 215\u2013221. IEEE (2015)","DOI":"10.1109\/PDP.2015.114"},{"key":"13_CR9","unstructured":"Jimenez, R.: Effects of natural environment charged particle heating on the design and performance of spacecraft cryogenic components. In: AIAA, 24th Thermophysics Conference (2013)"},{"key":"13_CR10","doi-asserted-by":"crossref","unstructured":"Nazarian, G., Nane, R., Gaydadjiev, G.N.: Low-cost software control-flow error recovery. In: Digital System Design, pp. 510\u2013517. IEEE (2015)","DOI":"10.1109\/DSD.2015.92"},{"key":"13_CR11","unstructured":"Rhisheekesan, A.: Quantitative evaluation of control flow based soft error protection mechanisms. Dissertations & theses - Gradworks (2013)"},{"key":"13_CR12","doi-asserted-by":"crossref","unstructured":"Wolf, J., Fechner, B., Uhrig, S., et al.: Fine-grained timing and control flow error checking for hard real-time task execution. In: IEEE ISIE, pp. 257\u2013266. IEEE (2012)","DOI":"10.1109\/SIES.2012.6356592"},{"key":"13_CR13","doi-asserted-by":"crossref","unstructured":"Ge, X., Talele, N., Payer, M., et al.: Fine-grained control-flow integrity for kernel software. In: IEEE European Symposium on Security and Privacy, pp. 179\u2013194. IEEE (2016)","DOI":"10.1109\/EuroSP.2016.24"},{"issue":"1","key":"13_CR14","doi-asserted-by":"publisher","first-page":"111","DOI":"10.1109\/24.994926","volume":"51","author":"N Oh","year":"2002","unstructured":"Oh, N., Shirvani, P.P., Mccluskey, E.J.: Control-flow checking by software signatures. IEEE Trans. Reliab. 51(1), 111\u2013122 (2002)","journal-title":"IEEE Trans. Reliab."},{"key":"13_CR15","doi-asserted-by":"crossref","unstructured":"Borin, E., Wang, C., Wu, Y., et al.: Software-based transparent and comprehensive control-flow error detection. In: International Symposium on Code Generation and Optimization, pp. 333\u2013345. IEEE (2006)","DOI":"10.1109\/CGO.2006.33"},{"key":"13_CR16","series-title":"Smart Innovation, Systems and Technologies","doi-asserted-by":"publisher","first-page":"117","DOI":"10.1007\/978-3-319-04129-2_12","volume-title":"Recent Advances of Neural Network Models and Applications","author":"A Troiano","year":"2014","unstructured":"Troiano, A., Corinto, F., Pasero, E.: A memristor circuit using basic elements with memory capability. In: Bassis, S., Esposito, A., Morabito, F.C. (eds.) Recent Advances of Neural Network Models and Applications. SIST, vol. 26, pp. 117\u2013124. Springer, Cham (2014). https:\/\/doi.org\/10.1007\/978-3-319-04129-2_12"},{"issue":"4","key":"13_CR17","first-page":"549","volume":"17","author":"CM Lin","year":"2011","unstructured":"Lin, C.M., Dow, C.R.: Efficient checkpoint-based failure recovery techniques in mobile computing systems. J. Inf. Sci. Eng. 17(4), 549\u2013573 (2011)","journal-title":"J. Inf. Sci. Eng."},{"key":"13_CR18","doi-asserted-by":"crossref","unstructured":"Wang, R., Li, Z.H.: A multiprocessor RTOS design of uC\/OS. In: Advanced Materials Research, vol. 756, pp. 814\u2013819. Trans Tech Publications (2013)","DOI":"10.4028\/www.scientific.net\/AMR.756-759.814"},{"key":"13_CR19","doi-asserted-by":"crossref","unstructured":"Mutuel, L.H.: Appreciating the effectiveness of single event effect mitigation techniques. In: Digital Avionics Systems Conference, pp. 5B1-1\u20135B1-11. IEEE (2014)","DOI":"10.1109\/DASC.2014.6979481"},{"issue":"6","key":"13_CR20","doi-asserted-by":"publisher","first-page":"497","DOI":"10.4103\/0256-4602.125674","volume":"30","author":"KS Beenamole","year":"2013","unstructured":"Beenamole, K.S.: Understanding single-event effects in FPGA for avionic system design. IETE Tech. Rev. 30(6), 497\u2013505 (2013)","journal-title":"IETE Tech. Rev."},{"issue":"3","key":"13_CR21","doi-asserted-by":"publisher","first-page":"1767","DOI":"10.1109\/TNS.2013.2255624","volume":"60","author":"V Ferlet-Cavrois","year":"2013","unstructured":"Ferlet-Cavrois, V., et al.: Single event transients in digital CMOS\u2014a review. IEEE Trans. Nuclear Sci. 60(3), 1767\u20131790 (2013)","journal-title":"IEEE Trans. Nuclear Sci."},{"issue":"1","key":"13_CR22","doi-asserted-by":"publisher","first-page":"587","DOI":"10.1109\/TNS.2016.2612000","volume":"64","author":"A Hands","year":"2017","unstructured":"Hands, A., Fan, L., Ryden, K., et al.: New data and modelling for single event effects in the stratospheric radiation environment. IEEE Trans. Nucl. Sci. 64(1), 587\u2013595 (2017)","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"13_CR23","doi-asserted-by":"crossref","unstructured":"Hayes, J.P., Polian, I., Becker, B.: An analysis framework for transient-error tolerance. In: IEEE VLSI Test Symposium, pp. 249\u2013255. IEEE Computer Society (2007)","DOI":"10.1109\/VTS.2007.13"},{"key":"13_CR24","doi-asserted-by":"crossref","unstructured":"Rohani, A., Kerkhoff, H.G., Costenaro, E., et al.: Pulse-length determination techniques in the rectangular single event transient fault model. In: ICEC: Architectures, Modeling, and Simulation, pp. 213\u2013218 (2015)","DOI":"10.1109\/SAMOS.2013.6621125"},{"issue":"2","key":"13_CR25","doi-asserted-by":"publisher","first-page":"160","DOI":"10.1109\/12.2145","volume":"37","author":"A Mahmood","year":"1988","unstructured":"Mahmood, A., Mccluskey, E.J.: Concurrent error detection using watchdog processors-a survey. IEEE Trans. Comput. 37(2), 160\u2013174 (1988)","journal-title":"IEEE Trans. Comput."},{"key":"13_CR26","unstructured":"Chitsaz, B., Kirovski, D.: Watchdog processors in multicore systems: US, US7958396 (2011)"},{"key":"13_CR27","doi-asserted-by":"crossref","unstructured":"Zarandi, H.R., Miremadi, S.G., Argyrides, C., et al.: Fast SEU detection and correction in LUT configuration bits of SRAM-based FPGAs. In: IEEE IPDPS, pp. 1\u20136 (2007)","DOI":"10.1109\/IPDPS.2007.370378"},{"key":"13_CR28","doi-asserted-by":"crossref","unstructured":"Nidhin, T.S., Bhattacharyya, A., Behera, R.P., et al.: SEU mitigation by golay code in the configuration memory of SRAM based FPGAs. In: ICCICCT. IEEE (2017)","DOI":"10.1109\/ICCICCT.2016.7987918"},{"issue":"05","key":"13_CR29","first-page":"725","volume":"23","author":"PY Yin","year":"2013","unstructured":"Yin, P.Y., Chen, Y.H., Lu, C.W., et al.: A multi-stage fault-tolerant multiplier with triple module redundancy (TMR) technique. J. Circuits Syst. Comput. 23(05), 725\u2013735 (2013)","journal-title":"J. Circuits Syst. Comput."},{"key":"13_CR30","doi-asserted-by":"crossref","unstructured":"Almukhaizim, S., Sinanoglu, O.: A hazard-free majority voter for TMR-based fault tolerance in asynchronous circuits. In: International Design and Test Workshop, IDT 2007, pp. 93\u201398. IEEE (2008)","DOI":"10.1109\/IDT.2007.4437437"},{"issue":"1","key":"13_CR31","doi-asserted-by":"publisher","first-page":"114","DOI":"10.1016\/j.microrel.2012.07.030","volume":"53","author":"NN Mahatme","year":"2013","unstructured":"Mahatme, N.N., Chatterjee, I., Patki, A., et al.: An efficient technique to select logic nodes for single event transient pulse-width reduction. Microelectron. Reliab. 53(1), 114\u2013117 (2013)","journal-title":"Microelectron. Reliab."},{"key":"13_CR32","unstructured":"Munk, P., et al.: A software fault-tolerance mechanism for real-time applications on many-core processors. In: The Workshop on Highly-Reliable Power-Efficient Embedded Designs (2016)"},{"issue":"6","key":"13_CR33","doi-asserted-by":"publisher","first-page":"800","DOI":"10.1109\/TC.2011.68","volume":"60","author":"X Zhu","year":"2011","unstructured":"Zhu, X., Qin, X., Qiu, M.: QoS-aware fault-tolerant scheduling for real-time tasks on heterogeneous clusters. IEEE Trans. Comput. 60(6), 800\u2013812 (2011)","journal-title":"IEEE Trans. Comput."},{"issue":"6","key":"13_CR34","doi-asserted-by":"publisher","first-page":"627","DOI":"10.1109\/71.774911","volume":"10","author":"Z Alkhalifa","year":"1999","unstructured":"Alkhalifa, Z., Nair, V.S.S., et al.: Design and evaluation of system-level checks for on-line control flow error detection. IEEE Trans. Parallel Distrib. Syst. 10(6), 627\u2013641 (1999)","journal-title":"IEEE Trans. Parallel Distrib. Syst."},{"key":"13_CR35","doi-asserted-by":"crossref","unstructured":"Jafari-Nodoushan, M., Miremadi, S.G., Ejlali, A.: Control-flow checking using branch instructions. In: IEEE\/IFIP International Conference on Embedded and Ubiquitous Computing, pp. 66\u201372. IEEE (2009)","DOI":"10.1109\/EUC.2008.44"},{"key":"13_CR36","doi-asserted-by":"crossref","unstructured":"Ju, X., Zhang, H., Wang, A.: Error detection by software signatures based on control flow graph. In: International Conference on Future Computer and Information Technology, pp. 51\u201363 (2013)","DOI":"10.2495\/ICFCIT130071"},{"issue":"1","key":"13_CR37","doi-asserted-by":"publisher","first-page":"481","DOI":"10.1109\/TII.2013.2248373","volume":"10","author":"SA Asghari","year":"2013","unstructured":"Asghari, S.A., Taheri, H., et al.: Software-based control flow checking against transient faults in industrial environments. IEEE Trans. Industr. Inf. 10(1), 481\u2013490 (2013)","journal-title":"IEEE Trans. Industr. Inf."}],"container-title":["Lecture Notes in Computer Science","Software Analysis, Testing, and Evolution"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-04272-1_13","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T03:09:01Z","timestamp":1775272141000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-030-04272-1_13"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"ISBN":["9783030042714","9783030042721"],"references-count":37,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-04272-1_13","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018]]},"assertion":[{"value":"20 November 2018","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"SATE","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Software Analysis, Testing, and Evolution","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Shenzheng","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2018","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"23 November 2018","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"24 November 2018","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"8","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"satev2018","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/xiongyingfei.github.io\/confs\/sate18\/index_en.html","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}