{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,28]],"date-time":"2025-03-28T08:17:43Z","timestamp":1743149863592,"version":"3.40.3"},"publisher-location":"Cham","reference-count":17,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030146863"},{"type":"electronic","value":"9783030146870"}],"license":[{"start":{"date-parts":[[2019,3,19]],"date-time":"2019-03-19T00:00:00Z","timestamp":1552953600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020]]},"DOI":"10.1007\/978-3-030-14687-0_7","type":"book-chapter","created":{"date-parts":[[2019,3,18]],"date-time":"2019-03-18T01:35:21Z","timestamp":1552872921000},"page":"76-85","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["An Open-Source Software Metric Tool for Defect Prediction, Its Case Study and Lessons We Learned"],"prefix":"10.1007","author":[{"given":"Bulat","family":"Gabdrakhmanov","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aleksey","family":"Tolkachev","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Giancarlo","family":"Succi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jooyong","family":"Yi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2019,3,19]]},"reference":[{"issue":"6","key":"7_CR1","doi-asserted-by":"publisher","first-page":"476","DOI":"10.1109\/32.295895","volume":"20","author":"SR Chidamber","year":"1994","unstructured":"Chidamber SR, Kemerer CF (1994) A metrics suite for object oriented design. IEEE Trans Softw Eng 20(6):476\u2013493","journal-title":"IEEE Trans Softw Eng"},{"key":"7_CR2","doi-asserted-by":"crossref","unstructured":"D\u2019Ambros M, Lanza M, Robbes R (2010) An extensive comparison of bug prediction approaches. In: Proceedings of MSR 2010, 7th IEEE working conference on mining software repositories. IEEE CS Press, pp 31\u201341","DOI":"10.1109\/MSR.2010.5463279"},{"key":"7_CR3","doi-asserted-by":"crossref","unstructured":"Ghotra B, McIntosh S, Hassan AE (2015) Revisiting the impact of classification techniques on the performance of defect prediction models. In: 37th IEEE\/ACM international conference on software engineering, ICSE 2015, Florence, Italy, 16\u201324 May 2015, vol 1, pp 789\u2013800","DOI":"10.1109\/ICSE.2015.91"},{"issue":"1","key":"7_CR4","first-page":"86","volume":"1","author":"M Jureczko","year":"2011","unstructured":"Jureczko M (2011) Significance of different software metrics in defect prediction. Softw Eng Int J 1(1):86\u201395","journal-title":"Softw Eng Int J"},{"key":"7_CR5","doi-asserted-by":"crossref","unstructured":"Jureczko M, Madeyski L (2010) Towards identifying software project clusters with regard to defect prediction. In: Proceedings of the 6th international conference on predictive models in software engineering, PROMISE, p 9","DOI":"10.1145\/1868328.1868342"},{"key":"7_CR6","doi-asserted-by":"crossref","unstructured":"Madeyski L, Kawalerowicz M (2017) Continuous defect prediction: the idea and a related dataset. In: Proceedings of the 14th international conference on mining software repositories. IEEE Press, pp 515\u2013518","DOI":"10.1109\/MSR.2017.46"},{"key":"7_CR7","doi-asserted-by":"publisher","first-page":"504","DOI":"10.1016\/j.asoc.2014.11.023","volume":"27","author":"R Malhotra","year":"2015","unstructured":"Malhotra R (2015) A systematic review of machine learning techniques for software fault prediction. Appl Soft Comput 27:504\u2013518","journal-title":"Appl Soft Comput"},{"key":"7_CR8","doi-asserted-by":"crossref","unstructured":"Osman H (2017) An extensive analysis of efficient bug prediction configurations. In: Proceedings of the 13th international conference on predictive models and data analytics in software engineering. ACM, pp 107\u2013116","DOI":"10.1145\/3127005.3127017"},{"key":"7_CR9","unstructured":"Parr T (2013) The definitive ANTLR 4 reference, 2nd edn. Pragmatic Bookshelf"},{"key":"7_CR10","doi-asserted-by":"crossref","unstructured":"Moser R, Pedrycz W, Giancarlo S (2008) A comparative analysis of the efficiency of change metrics and static code attributes for defect prediction. In: Proceedings of ICSE, the ACM\/IEEE international conference on software engineering, pp 181\u201390","DOI":"10.1145\/1368088.1368114"},{"key":"7_CR11","doi-asserted-by":"crossref","unstructured":"Rahman F, Devanbu PT (2013) How, and why, process metrics are better. In: 35th International conference on software engineering (ICSE), pp 432\u2013441","DOI":"10.1109\/ICSE.2013.6606589"},{"issue":"6","key":"7_CR12","doi-asserted-by":"publisher","first-page":"603","DOI":"10.1109\/TSE.2014.2322358","volume":"40","author":"MJ Shepperd","year":"2014","unstructured":"Shepperd MJ, Bowes D, Hall T (2014) Researcher bias: the use of machine learning in software defect prediction. IEEE Trans Softw Eng 40(6):603\u2013616","journal-title":"IEEE Trans Softw Eng"},{"issue":"9","key":"7_CR13","doi-asserted-by":"publisher","first-page":"1208","DOI":"10.1109\/TSE.2013.11","volume":"39","author":"MJ Shepperd","year":"2013","unstructured":"Shepperd MJ, Song Q, Sun Z, Mair C (2013) Data quality: some comments on the NASA software defect datasets. IEEE Trans Softw Eng 39(9):1208\u20131215","journal-title":"IEEE Trans Softw Eng"},{"key":"7_CR14","unstructured":"\u015aliwerski J, Zimmermann T, Zeller A (2005) When do changes induce fixes? In: ACM SIGSOFT software engineering notes, vol 30. ACM, pp 1\u20135"},{"issue":"4","key":"7_CR15","doi-asserted-by":"publisher","first-page":"9","DOI":"10.1109\/MS.2005.111","volume":"22","author":"D Spinellis","year":"2005","unstructured":"Spinellis D (2005) Tool writing: a forgotten art? (software tools). IEEE Softw 22(4):9\u201311","journal-title":"IEEE Softw"},{"key":"7_CR16","doi-asserted-by":"publisher","first-page":"164","DOI":"10.1016\/j.jss.2017.03.044","volume":"128","author":"ASN Varela","year":"2017","unstructured":"Varela ASN, P\u00e9rez-Gonz\u00e1lez HG, Mart\u00ednez-Perez FE, Soubervielle-Montalvo C (2017) Source code metrics: a systematic mapping study. J Syst Softw 128:164\u2013197","journal-title":"J Syst Softw"},{"key":"7_CR17","doi-asserted-by":"crossref","unstructured":"Zimmermann T, Premraj R, Zeller A (May 2007) Predicting defects for eclipse. In: Proceedings of the third international workshop on predictor models in software engineering","DOI":"10.1109\/PROMISE.2007.10"}],"container-title":["Advances in Intelligent Systems and Computing","Proceedings of 6th International Conference in Software Engineering for Defence Applications"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-14687-0_7","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,18]],"date-time":"2019-05-18T03:09:37Z","timestamp":1558148977000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-030-14687-0_7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3,19]]},"ISBN":["9783030146863","9783030146870"],"references-count":17,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-14687-0_7","relation":{},"ISSN":["2194-5357","2194-5365"],"issn-type":[{"type":"print","value":"2194-5357"},{"type":"electronic","value":"2194-5365"}],"subject":[],"published":{"date-parts":[[2019,3,19]]},"assertion":[{"value":"19 March 2019","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"SEDA","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference in Software Engineering for Defence Applications","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Rome","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Italy","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2018","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"7 June 2018","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"8 June 2018","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"6","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"seda2018","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.sedaconference.eu\/2018\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}