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One of the challenges is the power reduction of this expanding network of connected devices, where the majority is permanently connected. In a large set of applications, another significant issue is reliability, especially on critical areas as health and transport. This paper shows an overview of design strategies that we have developed to reduce power consumption and to increase reliability in circuits that are components of the IoT, as the reduction of the number of transistors in IoT devices, using optimisation techniques and the physical design of circuits tolerant to radiation effects.<\/jats:p>","DOI":"10.1007\/978-3-030-15651-0_8","type":"book-chapter","created":{"date-parts":[[2019,3,19]],"date-time":"2019-03-19T11:09:26Z","timestamp":1552993766000},"page":"76-88","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["Strategies for Reducing Power Consumption and Increasing Reliability in IoT"],"prefix":"10.1007","author":[{"given":"Ricardo","family":"Reis","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2019,3,20]]},"reference":[{"key":"8_CR1","doi-asserted-by":"crossref","unstructured":"Aguiar, Y., Zimpeck, A., Meinhardt, C., Reis, R.: Permanent and single event transient faults reliability evaluation EDA Tool. 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