{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T08:31:11Z","timestamp":1762504271574,"version":"3.40.3"},"publisher-location":"Cham","reference-count":21,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030177706"},{"type":"electronic","value":"9783030177713"}],"license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019]]},"DOI":"10.1007\/978-3-030-17771-3_35","type":"book-chapter","created":{"date-parts":[[2019,4,30]],"date-time":"2019-04-30T13:06:30Z","timestamp":1556629590000},"page":"405-413","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":12,"title":["Thermal Degradation and Condition Monitoring of Low Voltage Power Cables in Nuclear Power Industry"],"prefix":"10.1007","author":[{"given":"Ehtasham","family":"Mustafa","sequence":"first","affiliation":[]},{"given":"Tamus Zolt\u00e1n","family":"\u00c1d\u00e1m","sequence":"additional","affiliation":[]},{"given":"Ramy S. A.","family":"Afia","sequence":"additional","affiliation":[]},{"given":"Angel","family":"Asipuela","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2019,4,16]]},"reference":[{"key":"35_CR1","doi-asserted-by":"crossref","unstructured":"Afia, R.S.A., Mustafa, E., Tamus, Z.\u00c1.: Mechanical Stresses in polymer insulating materials. In: IEEE International Conference on Diagnostics in Electrical Engineering (Diagnostika), pp. 170\u2013173, IEEE Press, New York (2018)","DOI":"10.1109\/DIAGNOSTIKA.2018.8526097"},{"key":"35_CR2","unstructured":"International Atomic Energy Agency (IAEA): Pilot study on the management of aging of instrumentation and control cables, vol. 2 (1997)"},{"key":"35_CR3","unstructured":"International Atomic Energy Agency (IAEA): Assessing and managing cable aging in nuclear power plants, Vienna, Austria (2012)"},{"key":"35_CR4","unstructured":"IAEA TECDOC Series: Benchmark Analysis for Condition Monitoring Test Techniques of Aged Low Voltage Cables in Nuclear Power Plants, Vienna, Austria (2017)"},{"key":"35_CR5","doi-asserted-by":"crossref","unstructured":"Subudhi, M.: Literature Review of Environmental Qualification of Safety-Related Electric Cable, New York, USA (1996)","DOI":"10.2172\/226028"},{"key":"35_CR6","unstructured":"Initial Acceptance Criteria Concepts and Data for Assessing Longevity of Low-Voltage Cable Insulations and Jackets, California, USA"},{"key":"35_CR7","doi-asserted-by":"crossref","unstructured":"Blocker, E., Smith, S., Philpot, L., Conley, J.: Aging management guideline for commercial nuclear power plants-tanks and pools (1996)","DOI":"10.2172\/204243"},{"key":"35_CR8","unstructured":"Brookhaven National Laboratory: Condition Monitoring of Cables, Task 3 Report: Condition Monitoring Techniques for Electric Cables, BNL-90735-2009-IR (2009)"},{"key":"35_CR9","doi-asserted-by":"crossref","unstructured":"Fifield, L.S., Duckworth, R., Glass III, S.W.: Long-term operation issues for electrical cable systems in nuclear power plants. In: Proceedings of 24th International Conference Nuclear Engineering, vol. 2, pp. 1\u20135 (2016)","DOI":"10.1115\/ICONE24-60729"},{"key":"35_CR10","unstructured":"Tamus, Z.\u00c1., Cs\u00e1nyi, G.M.: Modeling of insulations by the results of voltage response measurement. In: The 19th International Symposium on High Voltage Engineering, pp. 6\u201310. Czech Republic, Pilsen (2015)"},{"key":"35_CR11","doi-asserted-by":"crossref","unstructured":"Mustafa, E., Afia, R.S.A., Tamus, Z.\u00c1.: A review of methods and associated models used in return voltage measurement. In: IEEE International Conference on Diagnostics in Electrical Engineering (Diagnostika), pp. 69\u201372. IEEE Press, New York (2018)","DOI":"10.1109\/DIAGNOSTIKA.2018.8526127"},{"key":"35_CR12","unstructured":"Tamus, Z.\u00c1., Cs\u00e1nyi, G.M., Szirmai, \u00c1., Nagy, A.: Insulation diagnostics of high voltage equipment by dielectric measurements \u2013 hungarian research and experience. In: International Scientific Symposium on Electrical Power Engineering, pp. 7\u201313 (2016)"},{"key":"35_CR13","doi-asserted-by":"crossref","unstructured":"Cs\u00e1nyi, G.M., Tamus, Z.\u00c1.: Investigation of dielectric properties of mixed PILC and XLPE cable insulation by the extended Voltage Response Method. In: 6th International Youth Conference on Energy, IYCE 2017, pp. 2\u20135 (2017)","DOI":"10.1109\/IYCE.2017.8003702"},{"key":"35_CR14","unstructured":"Tamus, Z.\u00c1., Szirmai, \u00c1., Nemeth, B.: Comparison of voltage response and return voltage measurements of a transformer insulation model. In: The 19th International Symposium on High Voltage Engineering, ISH 2015 (2015)"},{"key":"35_CR15","doi-asserted-by":"publisher","first-page":"115","DOI":"10.1016\/B978-012396561-5\/50013-X","volume-title":"Dielectric Phenomena in Solids","author":"Kwan Chi Kao","year":"2004","unstructured":"Kao, K.C.: Dielectric Phenomena in Solids with Emphasis on Physical Concepts of Electronic Processes (2004)"},{"key":"35_CR16","unstructured":"Power, N., Committee, E.: IEEE Guide for Assessing, Monitoring, and Mitigating Aging Effects on Class 1E Equipment Used in Nuclear Power Generating Stations (2000)"},{"issue":"2","key":"35_CR17","doi-asserted-by":"publisher","first-page":"112","DOI":"10.1007\/s42341-018-0020-1","volume":"19","author":"Yong-Deok Shin","year":"2018","unstructured":"Shin, Y.D.: Phase degree of response voltage and current versus excitation voltage of the accelerated thermally aged CSPE. Trans. Electr. Electron. Mater. 19, 112\u2013117 (2018)","journal-title":"Transactions on Electrical and Electronic Materials"},{"key":"35_CR18","doi-asserted-by":"publisher","first-page":"61","DOI":"10.1016\/0141-3910(95)00018-H","volume":"48","author":"JF Chailan","year":"1995","unstructured":"Chailan, J.F., Boiteux, G., Chauchard, J., Pinel, B., Seytre, G.: Effects of thermal degradation on the viscoelastic and dielectric properties of chlorosulfonated polyethylene (CSPE) compounds. Polym. Degrad. Stab. 48, 61\u201365 (1995)","journal-title":"Polym. Degrad. Stab."},{"key":"35_CR19","doi-asserted-by":"publisher","first-page":"152","DOI":"10.1002\/pc.20779","volume":"31","author":"M Nanda","year":"2009","unstructured":"Nanda, M., Chaudhary, R.N., Tripathy, D.K.: Dielectric relaxation of conductive carbon black reinforced chlorosulfonated polyethylene vulcanizates. Polym. Compos. 31, 152\u2013162 (2009)","journal-title":"Polym. Compos."},{"key":"35_CR20","unstructured":"Pinel, B.: Effects of irradiation dose rate and thermal aging on changes in the properties of elastomeric materials (EPR-CSPE) for cable insulation and sheathing. In: 7th International Symposium on Electrets, pp. 944\u2013949 (1991)"},{"key":"35_CR21","unstructured":"Chailan, J.F., Chauchard, J., Seytre, G., Boiteux, G., Escoubes, M., Pinel, B.: Effects of radiation and thermal ageing on physico-chemical properties of elastomeric materials (EPR-CSPE) for cable insulation and sheathing. In: Sixth International Conference on Dielectric Materials, Measurements and Applications, pp. 418\u2013421 (1992)"}],"container-title":["IFIP Advances in Information and Communication Technology","Technological Innovation for Industry and Service Systems"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-17771-3_35","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,20]],"date-time":"2019-05-20T14:34:44Z","timestamp":1558362884000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-030-17771-3_35"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"ISBN":["9783030177706","9783030177713"],"references-count":21,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-17771-3_35","relation":{},"ISSN":["1868-4238","1868-422X"],"issn-type":[{"type":"print","value":"1868-4238"},{"type":"electronic","value":"1868-422X"}],"subject":[],"published":{"date-parts":[[2019]]},"assertion":[{"value":"16 April 2019","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"DoCEIS","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Doctoral Conference on Computing, Electrical and Industrial Systems","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Costa de Caparica","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Portugal","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2019","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"8 May 2019","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"10 May 2019","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"10","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"doceis2019","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/doceis.dee.fct.unl.pt\/index.html","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information"}},{"value":"EasyChair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information"}},{"value":"73","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information"}},{"value":"36","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information"}},{"value":"49% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information"}},{"value":"3.17","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information"}},{"value":"n\/a","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information"}}]}}