{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T17:02:37Z","timestamp":1743094957589,"version":"3.40.3"},"publisher-location":"Cham","reference-count":22,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030202040"},{"type":"electronic","value":"9783030202057"}],"license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019]]},"DOI":"10.1007\/978-3-030-20205-7_37","type":"book-chapter","created":{"date-parts":[[2019,5,20]],"date-time":"2019-05-20T14:34:37Z","timestamp":1558362877000},"page":"452-464","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Parameter Selection for Regularized Electron Tomography Without a Reference Image"],"prefix":"10.1007","author":[{"given":"Yan","family":"Guo","sequence":"first","affiliation":[]},{"given":"Bernd","family":"Rieger","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2019,5,12]]},"reference":[{"key":"37_CR1","unstructured":"DIPlib & DIPimage. http:\/\/www.diplib.org. Accessed 16 Dec 2018"},{"key":"37_CR2","unstructured":"Adler, J., Kohr, H., \u00d6ktem, O.: Operator discretization library (ODL) (2017). https:\/\/github.com\/odlgroup\/odl"},{"key":"37_CR3","doi-asserted-by":"publisher","first-page":"96","DOI":"10.1016\/j.ultramic.2016.09.003","volume":"171","author":"R Aveyard","year":"2016","unstructured":"Aveyard, R., Rieger, B.: Tilt series STEM simulation of a $$25\\times 25\\times 25\\,{\\rm nm}$$ semiconductor with characteristic X-ray emission. Ultramicroscopy 171, 96\u2013103 (2016)","journal-title":"Ultramicroscopy"},{"key":"37_CR4","doi-asserted-by":"publisher","first-page":"417","DOI":"10.1109\/34.857000","volume":"22","author":"J Chen","year":"2000","unstructured":"Chen, J., Sato, Y., Tamura, S.: Orientation space filtering for multiple orientation line segmentation. IEEE Trans. Pattern Anal. Mach. Intell. 22, 417\u2013430 (2000)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"37_CR5","doi-asserted-by":"publisher","first-page":"36","DOI":"10.1007\/3-540-45103-X_6","volume-title":"Image Analysis","author":"Frank G. A. Faas","year":"2003","unstructured":"Faas, F.G.A., van Vliet, L.J.: 3D-orientation space; filters and sampling. In: Proceedings of the 13th Scandinavian Conference on Image Analysis, pp. 36\u201342 (2003)"},{"key":"37_CR6","unstructured":"van Ginkel, M.: Image analysis using orientation space based on steerable filters. Ph.D. thesis, Delft University of Technology, Delft, The Netherlands (2002)"},{"key":"37_CR7","unstructured":"van Ginkel, M., van Vliet, L.J., Verbeek, P.W.: Applications of image analysis in orientation space. In: Fourth Quinquennial Review 1996\u20132001 Dutch Society for Pattern Recognition and Image Processing, pp. 355\u2013370 (2001)"},{"key":"37_CR8","doi-asserted-by":"publisher","first-page":"120","DOI":"10.1016\/j.ultramic.2011.11.004","volume":"113","author":"B Goris","year":"2012","unstructured":"Goris, B., et al.: Electron tomography based on a total variation minimization reconstruction technique. Ultramicroscopy 113, 120\u2013130 (2012)","journal-title":"Ultramicroscopy"},{"key":"37_CR9","doi-asserted-by":"crossref","unstructured":"Guo, Y., Rieger, B.: No-reference weighting factor selection for bimodal tomography. In: IEEE International Conference on Acoustics, Speech and Signal Processing, Calgary, Canada (2018)","DOI":"10.1109\/ICASSP.2018.8461828"},{"key":"37_CR10","doi-asserted-by":"publisher","first-page":"3975","DOI":"10.1109\/TIP.2014.2332397","volume":"23","author":"KM Holt","year":"2014","unstructured":"Holt, K.M.: Total nuclear variation and Jacobian extensions of total variation for vector fields. IEEE Trans. Image Process. 23, 3975\u20133989 (2014)","journal-title":"IEEE Trans. Image Process."},{"key":"37_CR11","doi-asserted-by":"crossref","unstructured":"Liang, H., Weller, D.S.: Regularization parameter trimming for iterative image reconstruction. In: 49th Asilomar Conference on Signals, Systems and Computers, pp. 755\u2013759 (2015)","DOI":"10.1109\/ACSSC.2015.7421235"},{"key":"37_CR12","doi-asserted-by":"publisher","first-page":"413","DOI":"10.1016\/S0304-3991(03)00105-0","volume":"96","author":"PA Midgley","year":"2003","unstructured":"Midgley, P.A., Weyland, M.: 3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography. Ultramicroscopy 96, 413\u2013431 (2003)","journal-title":"Ultramicroscopy"},{"key":"37_CR13","doi-asserted-by":"publisher","first-page":"36","DOI":"10.1016\/j.ultramic.2016.10.013","volume":"173","author":"A Okariz","year":"2017","unstructured":"Okariz, A., Guraya, T., Iturrondobeitia, M., Ibarretxe, J.: A methodology for finding the optimal iteration number of the SIRT algorithm for quantitative electron tomography. Ultramicroscopy 173, 36\u201346 (2017)","journal-title":"Ultramicroscopy"},{"key":"37_CR14","volume-title":"Numerical Recipes: The Art of Scientific Computing","author":"WH Press","year":"2007","unstructured":"Press, W.H., et al.: Numerical Recipes: The Art of Scientific Computing, 3rd edn. Cambridge University Press, Cambridge (2007)","edition":"3"},{"key":"37_CR15","doi-asserted-by":"publisher","first-page":"1741","DOI":"10.1088\/0031-9155\/60\/5\/1741","volume":"60","author":"DS Rigie","year":"2015","unstructured":"Rigie, D.S., Rivi\u00e9re, P.J.L.: Joint reconstruction of multi-channel, spectral CT data via constrained total nuclear variation minimization. Phys. Med. Biol. 60, 1741\u20131771 (2015)","journal-title":"Phys. Med. Biol."},{"key":"37_CR16","doi-asserted-by":"publisher","first-page":"97","DOI":"10.1016\/j.ultramic.2016.12.020","volume":"174","author":"T Sanders","year":"2017","unstructured":"Sanders, T., Gelb, A., Platte, R.B., Arslan, I., Landskron, K.: Recovering fine details from under-resolved electron tomography data using higher order total variation $$l_1$$ regularization. Ultramicroscopy 174, 97\u2013105 (2017)","journal-title":"Ultramicroscopy"},{"key":"37_CR17","doi-asserted-by":"publisher","first-page":"12","DOI":"10.1186\/s40679-018-0061-x","volume":"4","author":"T Sanders","year":"2018","unstructured":"Sanders, T., Platte, R.B.: Multiscale higher order TV operators for $$l_1$$ regularization. Adv. Struct. Chem. Imaging 4, 12\u201329 (2018)","journal-title":"Adv. Struct. Chem. Imaging"},{"key":"37_CR18","doi-asserted-by":"publisher","first-page":"444","DOI":"10.1038\/nature10934","volume":"483","author":"MC Scott","year":"2012","unstructured":"Scott, M.C., et al.: Electron tomography at 2.4-\u00e5ngstr\u00f6m resolution. Nature 483, 444\u2013447 (2012)","journal-title":"Nature"},{"key":"37_CR19","doi-asserted-by":"publisher","first-page":"61","DOI":"10.1016\/j.ultramic.2015.10.007","volume":"162","author":"TJA Slater","year":"2016","unstructured":"Slater, T.J.A., et al.: STEM-EDX tomography of bimetallic nanoparticles: a methodological investigation. Ultramicroscopy 162, 61\u201373 (2016)","journal-title":"Ultramicroscopy"},{"key":"37_CR20","doi-asserted-by":"publisher","first-page":"35","DOI":"10.1016\/j.ultramic.2016.12.008","volume":"174","author":"Z Zhong","year":"2017","unstructured":"Zhong, Z., Goris, B., Schoenmakers, R., Bals, S., Batenburg, K.J.: A bimodal tomographic reconstruction technique combining EDS-STEM and HAADF-STEM. Ultramicroscopy 174, 35\u201345 (2017)","journal-title":"Ultramicroscopy"},{"key":"37_CR21","doi-asserted-by":"publisher","first-page":"34","DOI":"10.1016\/j.ultramic.2018.04.011","volume":"191","author":"Z Zhong","year":"2018","unstructured":"Zhong, Z., Palenstijn, W.J., Adler, J., Batenburg, K.J.: EDS tomographic reconstruction regularized by total nuclear variation joined with HAADF-STEM tomography. Ultramicroscopy 191, 34\u201343 (2018)","journal-title":"Ultramicroscopy"},{"key":"37_CR22","doi-asserted-by":"publisher","first-page":"3116","DOI":"10.1109\/TIP.2010.2052820","volume":"19","author":"X Zhu","year":"2010","unstructured":"Zhu, X., Milanfar, P.: Automatic parameter selection for denoising algorithms using a no-reference measure of image content. IEEE Trans. Image Process. 19, 3116\u20133132 (2010)","journal-title":"IEEE Trans. Image Process."}],"container-title":["Lecture Notes in Computer Science","Image Analysis"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-20205-7_37","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:05:49Z","timestamp":1684713949000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-20205-7_37"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"ISBN":["9783030202040","9783030202057"],"references-count":22,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-20205-7_37","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2019]]},"assertion":[{"value":"12 May 2019","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"SCIA","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Scandinavian Conference on Image Analysis","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Norrk\u00f6ping","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Sweden","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2019","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"11 June 2019","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"13 June 2019","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"21","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"scia2019","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/ssba.org.se\/scia2019\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"CMT3","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"62","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"40","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"65% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.8","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4.5","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"This content has been made available to all.","name":"free","label":"Free to read"}]}}