{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T09:07:13Z","timestamp":1775725633834,"version":"3.50.1"},"publisher-location":"Cham","reference-count":27,"publisher":"Springer International Publishing","isbn-type":[{"value":"9783030267650","type":"print"},{"value":"9783030267667","type":"electronic"}],"license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019]]},"DOI":"10.1007\/978-3-030-26766-7_6","type":"book-chapter","created":{"date-parts":[[2019,7,29]],"date-time":"2019-07-29T23:18:04Z","timestamp":1564442284000},"page":"53-64","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":17,"title":["A Welding Defect Identification Approach in X-ray Images Based on Deep Convolutional Neural Networks"],"prefix":"10.1007","author":[{"given":"Yuting","family":"Wang","sequence":"first","affiliation":[]},{"given":"Fanhuai","family":"Shi","sequence":"additional","affiliation":[]},{"given":"Xuefeng","family":"Tong","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2019,7,24]]},"reference":[{"key":"6_CR1","doi-asserted-by":"crossref","unstructured":"Tang, G., Zhong, X., Zhang, F., et al.: X-ray image edge detection based on wavelet transform and lipschitz exponent. In: International Symposium on Intelligent Information Technology and Security Informatics, pp. 195\u2013197. IEEE (2009)","DOI":"10.1109\/IITSI.2009.50"},{"key":"6_CR2","doi-asserted-by":"crossref","unstructured":"Chen, F.L., Wang, L.M., Han, Y.: X-ray detection of tiny defects in strongly scattered structures using the EMD method. In: International Congress on Image and Signal Processing, pp. 1033\u20131037. IEEE (2010)","DOI":"10.1109\/CISP.2010.5646943"},{"issue":"3","key":"6_CR3","doi-asserted-by":"publisher","first-page":"238","DOI":"10.1016\/j.cviu.2006.02.004","volume":"102","author":"MK Felisberto","year":"2006","unstructured":"Felisberto, M.K., Lopes, H.S., Centeno, T.M., et al.: An object detection and recognition system for weld bead extraction from digital radiographs. Comput. Vis. Image Underst. 102(3), 238\u2013249 (2006)","journal-title":"Comput. Vis. Image Underst."},{"issue":"5","key":"6_CR4","doi-asserted-by":"publisher","first-page":"261","DOI":"10.1016\/S0262-8856(00)00075-5","volume":"19","author":"V Lashkia","year":"2001","unstructured":"Lashkia, V.: Defect detection in X-ray images using fuzzy reasoning. Image Vis. Comput. 19(5), 261\u2013269 (2001)","journal-title":"Image Vis. Comput."},{"issue":"2","key":"6_CR5","doi-asserted-by":"publisher","first-page":"226","DOI":"10.1016\/j.ndteint.2010.10.005","volume":"44","author":"H Kasban","year":"2011","unstructured":"Kasban, H., Zahran, O., Arafa, H., et al.: Welding defect detection from radiography images with a cepstral approach. NDT E Int. 44(2), 226\u2013231 (2011)","journal-title":"NDT E Int."},{"key":"6_CR6","doi-asserted-by":"crossref","unstructured":"Tong, T., Cai, Y., Sun, D.: Defects detection of weld image based on mathematical morphology and thresholding segmentation. In: 2012 8th International Conference on Wireless Communications, Networking and Mobile Computing (WiCOM), pp. 1\u20134. IEEE (2012)","DOI":"10.1109\/WiCOM.2012.6478476"},{"key":"6_CR7","doi-asserted-by":"crossref","unstructured":"Hassan, J., Awan, A.M., Jalil, A.: Welding defect detection and classification using geometric features. In: 2012 10th International Conference on Frontiers of Information Technology (FIT), pp. 139\u2013144. IEEE (2012)","DOI":"10.1109\/FIT.2012.33"},{"key":"6_CR8","doi-asserted-by":"publisher","first-page":"2278","DOI":"10.1109\/5.726791","volume":"86","author":"Y LeCun","year":"1998","unstructured":"LeCun, Y., Bottou, L., Bengio, Y., Haffner, P.: Gradient-based learning applied to document recognition. Proc. IEEE 86, 2278\u20132324 (1998)","journal-title":"Proc. IEEE"},{"issue":"2","key":"6_CR9","doi-asserted-by":"publisher","first-page":"137","DOI":"10.1080\/02564602.2014.892739","volume":"31","author":"Y Wang","year":"2014","unstructured":"Wang, Y., Guo, H.: Weld defect detection of X-ray images based on support vector machine. IETE Tech. Rev. 31(2), 137\u2013142 (2014)","journal-title":"IETE Tech. Rev."},{"key":"6_CR10","doi-asserted-by":"crossref","unstructured":"Shao, J., Shi, H., Du, D., Wang, L., Cao, H.: Automatic weld defect detection in real-time X-ray images based on support vector machine. In: 2011 4th International Congress on Image and Signal Processing (CISP), vol. 4, pp. 1842\u20131846. IEEE (2011)","DOI":"10.1109\/CISP.2011.6100637"},{"key":"6_CR11","doi-asserted-by":"crossref","unstructured":"Sikora, R., Baniukiewicz, P., Chady, T., et al.: Detection and classification of weld defects in industrial radiography with use of advanced AI methods. In: Nondestructive Evaluation\/Testing: New Technology & Application (2013)","DOI":"10.1109\/FENDT.2013.6635520"},{"key":"6_CR12","doi-asserted-by":"publisher","first-page":"85","DOI":"10.1016\/j.neunet.2014.09.003","volume":"61","author":"J Schmidhuber","year":"2015","unstructured":"Schmidhuber, J.: Deep learning in neural networks: an overview. Neural Netw. 61, 85\u2013117 (2015)","journal-title":"Neural Netw."},{"key":"6_CR13","first-page":"1364","volume":"37","author":"Y Yu","year":"2016","unstructured":"Yu, Y., Du, L., Zeng, C., Zhang, J.: Automatic localization method of small casting defect based on deep learning feature. Chin. J. Sci. Instrum. 37, 1364\u20131370 (2016)","journal-title":"Chin. J. Sci. Instrum."},{"key":"6_CR14","doi-asserted-by":"crossref","unstructured":"Hou, W., Wei, Y., Guo, J., et al.: Automatic detection of welding defects using deep neural network, p. 012006 (2018)","DOI":"10.1088\/1742-6596\/933\/1\/012006"},{"key":"6_CR15","series-title":"Communications in Computer and Information Science","doi-asserted-by":"publisher","first-page":"215","DOI":"10.1007\/978-981-10-8108-8_20","volume-title":"Digital TV and Wireless Multimedia Communication","author":"B Liu","year":"2018","unstructured":"Liu, B., Zhang, X., Gao, Z., Chen, L.: Weld defect images classification with VGG16-based neural network. In: Zhai, G., Zhou, J., Yang, X. (eds.) IFTC 2017. CCIS, vol. 815, pp. 215\u2013223. Springer, Singapore (2018). https:\/\/doi.org\/10.1007\/978-981-10-8108-8_20"},{"key":"6_CR16","doi-asserted-by":"crossref","unstructured":"Girshick, R., Donahue, J., Darrell, T., Malik, J.: Rich feature hierarchies for accurate object detection and semantic segmentation. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, Columbus, OH, USA, 23\u201328 June 2014, pp. 580\u2013587 (2014)","DOI":"10.1109\/CVPR.2014.81"},{"key":"6_CR17","doi-asserted-by":"crossref","unstructured":"Girshick, R.: Fast R-CNN. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 1440\u20131448 (2015)","DOI":"10.1109\/ICCV.2015.169"},{"key":"6_CR18","unstructured":"Ren, S., He, K., Girshick, R., et al.: Faster R-CNN: towards real-time object detection with region proposal networks. In: Advances in Neural Information Processing Systems, pp. 91\u201399 (2015)"},{"key":"6_CR19","doi-asserted-by":"crossref","unstructured":"He, K., Gkioxari, G., Doll\u00e1r, P., et al.: Mask R-CNN. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 2961\u20132969 (2017)","DOI":"10.1109\/ICCV.2017.322"},{"key":"6_CR20","doi-asserted-by":"crossref","unstructured":"Redmon, J., Divvala, S., Girshick, R., Farhadi, A.: You only look once: unified, real-time object detection. In: CVPR (2016)","DOI":"10.1109\/CVPR.2016.91"},{"key":"6_CR21","doi-asserted-by":"crossref","unstructured":"Redmon, J., Farhadi, A.: YOLO9000: better, faster, stronger. In: CVPR (2017)","DOI":"10.1109\/CVPR.2017.690"},{"key":"6_CR22","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"21","DOI":"10.1007\/978-3-319-46448-0_2","volume-title":"Computer Vision \u2013 ECCV 2016","author":"W Liu","year":"2016","unstructured":"Liu, W., et al.: SSD: Single Shot MultiBox Detector. In: Leibe, B., Matas, J., Sebe, N., Welling, M. (eds.) ECCV 2016. LNCS, vol. 9905, pp. 21\u201337. Springer, Cham (2016). https:\/\/doi.org\/10.1007\/978-3-319-46448-0_2"},{"key":"6_CR23","unstructured":"Fu, C.-Y., Liu, W., Ranga, A., Tyagi, A., Berg, A.C.: DSSD: deconvolutional single shot detector. arXiv: 1701.06659 (2016)"},{"key":"6_CR24","doi-asserted-by":"crossref","unstructured":"Lin, T.Y., Goyal, P., Girshick, R., et al.: Focal loss for dense object detection. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 2980\u20132988 (2017)","DOI":"10.1109\/ICCV.2017.324"},{"key":"6_CR25","doi-asserted-by":"crossref","unstructured":"Lin, T.-Y., Doll\u00e1r, P., Girshick, R., He, K., Hariharan, B., Belongie, S.: Feature pyramid networks for object detection. In: CVPR (2017)","DOI":"10.1109\/CVPR.2017.106"},{"key":"6_CR26","doi-asserted-by":"crossref","unstructured":"He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: CVPR (2016)","DOI":"10.1109\/CVPR.2016.90"},{"issue":"4","key":"6_CR27","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1007\/s10921-015-0315-7","volume":"34","author":"D Mery","year":"2015","unstructured":"Mery, D., et al.: GDXray: the database of X-ray images for nondestructive testing. J. Nondestruct. Eval. 34(4), 1\u201312 (2015)","journal-title":"J. Nondestruct. Eval."}],"container-title":["Lecture Notes in Computer Science","Intelligent Computing Methodologies"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-26766-7_6","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,13]],"date-time":"2024-03-13T10:22:07Z","timestamp":1710325327000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-26766-7_6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"ISBN":["9783030267650","9783030267667"],"references-count":27,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-26766-7_6","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019]]},"assertion":[{"value":"24 July 2019","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICIC","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Intelligent Computing","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Nanchang","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2019","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"3 August 2019","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"6 August 2019","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"15","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"icic2019","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/ic-ic.tongji.edu.cn\/2019\/index.htm","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}