{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,11]],"date-time":"2024-09-11T07:47:10Z","timestamp":1726040830280},"publisher-location":"Cham","reference-count":5,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030272012"},{"type":"electronic","value":"9783030272029"}],"license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019]]},"DOI":"10.1007\/978-3-030-27202-9_33","type":"book-chapter","created":{"date-parts":[[2019,8,11]],"date-time":"2019-08-11T23:02:59Z","timestamp":1565564579000},"page":"364-375","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Construction and Optimization of Feature Descriptor Based on Dynamic Local Intensity Order Relations of Pixel Group"],"prefix":"10.1007","author":[{"given":"Wen-Hung","family":"Liao","sequence":"first","affiliation":[]},{"given":"Carolyn","family":"Yu","sequence":"additional","affiliation":[]},{"given":"Yi-Chieh","family":"Wu","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2019,8,8]]},"reference":[{"key":"33_CR1","unstructured":"Wang, Z., Fan, B., Wu, F.: Local intensity order pattern for feature description. In: 2011 IEEE International Conference on Computer Vision (ICCV), pp. 603\u2013610. IEEE (2011)"},{"key":"33_CR2","unstructured":"Liao, W.-H., Wu, C.-C., Lin, M.-C.: Feature descriptor based on local intensity order relations of pixel group. In: 2016 23rd International Conference on Pattern Recognition (ICPR). IEEE (2016)"},{"issue":"11","key":"33_CR3","doi-asserted-by":"publisher","first-page":"2198","DOI":"10.1109\/TPAMI.2015.2513396","volume":"38","author":"Z Wang","year":"2016","unstructured":"Wang, Z., Fan, B., Wang, G., Wu, F.: Exploring local and overall ordinal information for robust feature description. IEEE Trans. Pattern Anal. Mach. Intell. 38(11), 2198\u20132211 (2016)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"issue":"1","key":"33_CR4","doi-asserted-by":"publisher","first-page":"63","DOI":"10.1023\/B:VISI.0000027790.02288.f2","volume":"60","author":"K Mikolajczyk","year":"2004","unstructured":"Mikolajczyk, K., Schmid, C.: Scale & affine invariant interest point detectors. Int. J. Comput. Vis. 60(1), 63\u201386 (2004)","journal-title":"Int. J. Comput. Vis."},{"key":"33_CR5","unstructured":"Miksik, O., Mikolajczyk, K.: Evaluation of local detectors and descriptors for fast feature matching, In: 21st International Conference on Pattern Recognition (ICPR), pp. 2681\u20132684 (2012)"}],"container-title":["Lecture Notes in Computer Science","Image Analysis and Recognition"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-27202-9_33","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,11]],"date-time":"2019-08-11T23:12:42Z","timestamp":1565565162000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-030-27202-9_33"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"ISBN":["9783030272012","9783030272029"],"references-count":5,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-27202-9_33","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2019]]},"assertion":[{"value":"8 August 2019","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICIAR","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Image Analysis and Recognition","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Waterloo, ON","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Canada","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2019","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"27 August 2019","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"29 August 2019","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"16","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"iciar2019","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.aimiconf.org\/iciar19\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"ConfTool","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"142","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"58","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"26","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"41% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.7","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.8","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}