{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T02:17:02Z","timestamp":1742955422806,"version":"3.40.3"},"publisher-location":"Cham","reference-count":12,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030276140"},{"type":"electronic","value":"9783030276157"}],"license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019]]},"DOI":"10.1007\/978-3-030-27615-7_16","type":"book-chapter","created":{"date-parts":[[2019,8,18]],"date-time":"2019-08-18T23:02:41Z","timestamp":1566169361000},"page":"215-224","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["FFT-2PCA: A New Feature Extraction Method for Data-Based Fault Detection"],"prefix":"10.1007","author":[{"given":"Matheus Maia","family":"de Souza","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jo\u00e3o Cesar","family":"Netto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Renata","family":"Galante","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2019,8,3]]},"reference":[{"issue":"4","key":"16_CR1","doi-asserted-by":"publisher","first-page":"433","DOI":"10.1002\/wics.101","volume":"2","author":"H Abdi","year":"2010","unstructured":"Abdi, H., Williams, L.J.: Principal component analysis. Wiley Interdiscip. Rev. Comput. Stat. 2(4), 433\u2013459 (2010)","journal-title":"Wiley Interdiscip. Rev. Comput. Stat."},{"key":"16_CR2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-35653-0","volume-title":"Diagnosis and Fault-Tolerant Control","author":"M Blanke","year":"2006","unstructured":"Blanke, M., Kinnaert, M., Lunze, J., Staroswiecki, M., Schr\u00f6der, J.: Diagnosis and Fault-Tolerant Control, vol. 691. Springer, Heidelberg (2006). https:\/\/doi.org\/10.1007\/978-3-540-35653-0"},{"key":"16_CR3","volume-title":"The Fast Fourier Transform and Its Applications","author":"EO Brigham","year":"1988","unstructured":"Brigham, E.O., Brigham, E.: The Fast Fourier Transform and Its Applications, vol. 1. Prentice Hall, Englewood Cliffs (1988)"},{"issue":"3","key":"16_CR4","doi-asserted-by":"publisher","first-page":"287","DOI":"10.1016\/0165-1684(94)90029-9","volume":"36","author":"P Comon","year":"1994","unstructured":"Comon, P.: Independent component analysis, a new concept? Signal Process. 36(3), 287\u2013314 (1994)","journal-title":"Signal Process."},{"issue":"3","key":"16_CR5","doi-asserted-by":"publisher","first-page":"245","DOI":"10.1016\/0098-1354(93)80018-I","volume":"17","author":"JJ Downs","year":"1993","unstructured":"Downs, J.J., Vogel, E.F.: A plant-wide industrial process control problem. Comput. Chem. Eng. 17(3), 245\u2013255 (1993)","journal-title":"Comput. Chem. Eng."},{"key":"16_CR6","first-page":"1871","volume":"9","author":"RE Fan","year":"2008","unstructured":"Fan, R.E., Chang, K.W., Hsieh, C.J., Wang, X.R., Lin, C.J.: LIBLINEAR: a library for large linear classification. J. Mach. Learn. Res. 9, 1871\u20131874 (2008)","journal-title":"J. Mach. Learn. Res."},{"key":"16_CR7","unstructured":"Frank, P.M., Blanke, M.: Fault diagnosis and fault-tolerant control. In: Control Systems, Robotics and Automation XVI (2007)"},{"key":"16_CR8","doi-asserted-by":"publisher","first-page":"636","DOI":"10.1016\/j.neucom.2015.03.082","volume":"167","author":"C Jing","year":"2015","unstructured":"Jing, C., Hou, J.: SVM and PCA based fault classification approaches for complicated industrial process. Neurocomputing 167, 636\u2013642 (2015)","journal-title":"Neurocomputing"},{"issue":"2","key":"16_CR9","doi-asserted-by":"publisher","first-page":"115","DOI":"10.1007\/BF02289694","volume":"29","author":"JB Kruskal","year":"1964","unstructured":"Kruskal, J.B.: Nonmetric multidimensional scaling: a numerical method. Psychometrika 29(2), 115\u2013129 (1964)","journal-title":"Psychometrika"},{"key":"16_CR10","unstructured":"Nair, V., Hinton, G.E.: Rectified linear units improve restricted Boltzmann machines. In: Proceedings of the 27th International Conference on Machine Learning (ICML 2010), pp. 807\u2013814 (2010)"},{"key":"16_CR11","doi-asserted-by":"crossref","unstructured":"Nashalji, M.N., Arvand, S., Norouzifard, M.: Integration of principal component analysis and neural classifier for fault detection and diagnosis of Tennessee Eastman process. In: 2014 4th International Conference on Engineering Technology and Technopreneuship (ICE2T), pp. 166\u2013170. IEEE (2014)","DOI":"10.1109\/ICE2T.2014.7006240"},{"issue":"9","key":"16_CR12","doi-asserted-by":"publisher","first-page":"1567","DOI":"10.1016\/j.jprocont.2012.06.009","volume":"22","author":"S Yin","year":"2012","unstructured":"Yin, S., Ding, S.X., Haghani, A., Hao, H., Zhang, P.: A comparison study of basic data-driven fault diagnosis and process monitoring methods on the benchmark Tennessee Eastman process. J. Process Control 22(9), 1567\u20131581 (2012)","journal-title":"J. Process Control"}],"container-title":["Lecture Notes in Computer Science","Database and Expert Systems Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-27615-7_16","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,12]],"date-time":"2024-03-12T13:14:26Z","timestamp":1710249266000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-27615-7_16"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"ISBN":["9783030276140","9783030276157"],"references-count":12,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-27615-7_16","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2019]]},"assertion":[{"value":"3 August 2019","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"DEXA","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Database and Expert Systems Applications","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Linz","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Austria","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2019","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"26 August 2019","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"29 August 2019","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"30","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"dexa2019a","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.dexa.org\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Mixed (Single-blind and Double-blind)","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"ConfDriver","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"157","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"32","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"34","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"20% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4-6","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3-4","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}