{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T07:15:53Z","timestamp":1742973353514,"version":"3.40.3"},"publisher-location":"Cham","reference-count":20,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030284633"},{"type":"electronic","value":"9783030284640"}],"license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019]]},"DOI":"10.1007\/978-3-030-28464-0_17","type":"book-chapter","created":{"date-parts":[[2019,9,11]],"date-time":"2019-09-11T23:06:24Z","timestamp":1568243184000},"page":"185-192","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["Methods of Data Mining for Quality Assurance in Glassworks"],"prefix":"10.1007","author":[{"given":"\u0141ukasz","family":"Pa\u015bko","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pawe\u0142","family":"Litwin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2019,8,15]]},"reference":[{"key":"17_CR1","volume-title":"Odkrywanie wiedzy z danych: wprowadzenie do eksploracji danych","author":"DT Larose","year":"2006","unstructured":"Larose, D.T.: Odkrywanie wiedzy z danych: wprowadzenie do eksploracji danych. Wydawnictwo Naukowe PWN, Warsaw (2006)"},{"key":"17_CR2","doi-asserted-by":"publisher","first-page":"761","DOI":"10.1007\/978-3-642-40060-5_73","volume-title":"Proceedings of 2013 4th International Asia Conference on Industrial Engineering and Management Innovation (IEMI2013)","author":"Y Wang","year":"2014","unstructured":"Wang, Y., Zhang, Y., Yu, Y., Zhang, C.: Data mining based approach for jobshop scheduling. In: Qi, E., Shen, J., Dou, R. (eds.) Proceedings of 2013 4th International Asia Conference on Industrial Engineering and Management Innovation (IEMI2013), pp. 761\u2013771. Springer, Heidelberg (2014). https:\/\/doi.org\/10.1007\/978-3-642-40060-5_73"},{"issue":"4","key":"17_CR3","doi-asserted-by":"publisher","first-page":"757","DOI":"10.1007\/s40092-018-0253-y","volume":"14","author":"C Kittidecha","year":"2018","unstructured":"Kittidecha, C., Yamada, K.: Application of Kansei engineering and data mining in the thai ceramic manufacturing. J. Ind. Eng. Int. 14(4), 757\u2013766 (2018)","journal-title":"J. Ind. Eng. Int."},{"key":"17_CR4","doi-asserted-by":"publisher","unstructured":"Ruschel, E., Santos, E.A.P., Loures, E.F.R.: Establishment of maintenance inspection intervals: an application of process mining techniques in manufacturing. J. Intell. Manuf. 1\u201320 (2018). Springer, Heidelberg. https:\/\/doi.org\/10.1007\/s10845-018-1434-7","DOI":"10.1007\/s10845-018-1434-7"},{"key":"17_CR5","volume-title":"Zastosowania metod sztucznej inteligencji w inzynierii produkcji","author":"R Knosala","year":"2002","unstructured":"Knosala, R.: Zastosowania metod sztucznej inteligencji w inzynierii produkcji. WNT, Warsaw (2002)"},{"key":"17_CR6","series-title":"Advances in Intelligent Systems and Computing","doi-asserted-by":"publisher","first-page":"186","DOI":"10.1007\/978-3-319-76351-4_19","volume-title":"Hybrid Intelligent Systems","author":"MD Akhtar","year":"2018","unstructured":"Akhtar, M.D., Manupati, V.K., Varela, M.L.R., Putnik, G.D., Madureira, A.M., Abraham, A.: Manufacturing services classification in a decentralized supply chain using text mining. In: Abraham, A., Muhuri, P.Kr., Muda, A.K., Gandhi, N. (eds.) HIS 2017. AISC, vol. 734, pp. 186\u2013193. Springer, Cham (2018). https:\/\/doi.org\/10.1007\/978-3-319-76351-4_19"},{"key":"17_CR7","unstructured":"Giess, M.D., Culley, S.J.: Investigating manufacturing data for use within design. In: DS 31: Proceedings of ICED 03, the 14th International Conference on Engineering Design, Stockholm (2003)"},{"key":"17_CR8","doi-asserted-by":"crossref","unstructured":"Biuk-Aghai, R.P., Simoff, S.J.: An integrative framework for knowledge extraction in collaborative virtual environments. In: Proceedings of the 2001 International ACM SIGGROUP Conference on Supporting Group Work, New York, pp. 61\u201370 (2001)","DOI":"10.1145\/500286.500298"},{"key":"17_CR9","doi-asserted-by":"publisher","unstructured":"Tomasello, M.V., Vaccario, G., Schweitzer, F.: Data-driven modeling of collaboration networks: a cross-domain analysis. EPJ Data Sci. 6 (2017). https:\/\/doi.org\/10.1140\/epjds\/s13688-017-0117-5","DOI":"10.1140\/epjds\/s13688-017-0117-5"},{"key":"17_CR10","doi-asserted-by":"crossref","unstructured":"Zuo, Y., Kajikawa, Y.: Prediction of collaborative relationships by using network representation learning. In: 2017 IEEE International Conference on Systems, Man, and Cybernetics, pp. 69\u201374 (2017)","DOI":"10.1109\/SMC.2017.8122580"},{"key":"17_CR11","doi-asserted-by":"publisher","first-page":"28","DOI":"10.1111\/j.1745-493X.2001.tb00097.x","volume":"37","author":"A Cox","year":"2001","unstructured":"Cox, A., Sanderson, J., Watson, G.: Supply chains and power regimes: toward an analytic framework for managing extended networks of buyer and supplier relationships. J. Supply Chain Manag. 37, 28\u201335 (2001)","journal-title":"J. Supply Chain Manag."},{"issue":"1","key":"17_CR12","doi-asserted-by":"publisher","first-page":"43","DOI":"10.1179\/030192304225012060","volume":"31","author":"JBO Mere","year":"2004","unstructured":"Mere, J.B.O., Marcos, A.G., Gonzalez, J.A., Rubio, V.L.: Estimation of mechanical properties of steel strip in hot dip galvanising lines. Ironmaking Steelmaking 31(1), 43\u201350 (2004)","journal-title":"Ironmaking Steelmaking"},{"issue":"5","key":"17_CR13","doi-asserted-by":"publisher","first-page":"509","DOI":"10.1007\/s00170-004-2218-0","volume":"27","author":"A Krimpenis","year":"2006","unstructured":"Krimpenis, A., Benardos, P.G., Vosniakos, G.-C., Koukouvitaki, A.: Simulation-based selection of optimum pressure die-casting process parameters using neural nets and genetic algorithms. Int. J. Adv. Manuf. Technol. 27(5), 509\u2013517 (2006)","journal-title":"Int. J. Adv. Manuf. Technol."},{"key":"17_CR14","series-title":"Lecture Notes in Computer Science (Lecture Notes in Artificial Intelligence)","doi-asserted-by":"publisher","first-page":"791","DOI":"10.1007\/3-540-45517-5_86","volume-title":"Engineering of Intelligent Systems","author":"L Cser","year":"2001","unstructured":"Cser, L., Guly\u00e1s, J., Sz\u00fccs, L., Horv\u00e1th, A., \u00c1rvai, L., Baross, B.: Different kinds of neural networks in control and monitoring of hot rolling mill. In: Monostori, L., V\u00e1ncza, J., Ali, M. (eds.) IEA\/AIE 2001. LNCS (LNAI), vol. 2070, pp. 791\u2013796. Springer, Heidelberg (2001). https:\/\/doi.org\/10.1007\/3-540-45517-5_86"},{"issue":"2","key":"17_CR15","doi-asserted-by":"publisher","first-page":"417","DOI":"10.1016\/S0360-8352(02)00035-9","volume":"42","author":"DS Chang","year":"2002","unstructured":"Chang, D.S., Jiang, S.-T.: Assessing quality performance based on the on-line sensor measurements using neural networks. Comput. Ind. Eng. 42(2), 417\u2013424 (2002)","journal-title":"Comput. Ind. Eng."},{"issue":"10","key":"17_CR16","doi-asserted-by":"publisher","first-page":"2201","DOI":"10.1080\/00207540050028052","volume":"38","author":"RP Cherian","year":"2000","unstructured":"Cherian, R.P., Midha, P.S., Pipe, A.G.: Modelling the relationship between process parameters and mechanical properties using Bayesian neural networks for powder metal parts. Int. J. Prod. Res. 38(10), 2201\u20132214 (2000)","journal-title":"Int. J. Prod. Res."},{"key":"17_CR17","unstructured":"Hu, C.-H., Su, S.-F.: Hierarchical clustering methods for semiconductor manufacturing data. In: IEEE International Conference on Networking, Sensing and Control, vol. 2, pp. 1063\u20131068 (2004)"},{"issue":"4","key":"17_CR18","doi-asserted-by":"publisher","first-page":"807","DOI":"10.1016\/j.eswa.2005.06.004","volume":"29","author":"W-C Chen","year":"2005","unstructured":"Chen, W.-C., Tseng, S.-S., Wang, C.-Y.: A novel manufacturing defect detection method using association rule mining techniques. Expert Syst. Appl. 29(4), 807\u2013815 (2005)","journal-title":"Expert Syst. Appl."},{"issue":"10","key":"17_CR19","doi-asserted-by":"publisher","first-page":"13448","DOI":"10.1016\/j.eswa.2011.04.063","volume":"38","author":"G Koksal","year":"2011","unstructured":"Koksal, G., Batmaz, I., Testik, M.C.: A review of data mining applications for quality improvement in manufacturing industry. Expert Syst. Appl. 38(10), 13448\u201313467 (2011)","journal-title":"Expert Syst. Appl."},{"issue":"1","key":"17_CR20","first-page":"234","volume":"4","author":"M Perzyk","year":"2010","unstructured":"Perzyk, M., Soroczynski, A.: Comparative study of decision trees and rough sets theory as knowledge extraction tools for design and control of industrial processes. Int. J. Ind. Manuf. Eng., 4(1), 234\u2013239 (2010)","journal-title":"Int. J. Ind. Manuf. Eng.,"}],"container-title":["IFIP Advances in Information and Communication Technology","Collaborative Networks and Digital Transformation"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-28464-0_17","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,13]],"date-time":"2024-03-13T12:28:37Z","timestamp":1710332917000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-28464-0_17"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"ISBN":["9783030284633","9783030284640"],"references-count":20,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-28464-0_17","relation":{},"ISSN":["1868-4238","1868-422X"],"issn-type":[{"type":"print","value":"1868-4238"},{"type":"electronic","value":"1868-422X"}],"subject":[],"published":{"date-parts":[[2019]]},"assertion":[{"value":"15 August 2019","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"PRO-VE","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Working Conference on Virtual Enterprises","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Turin","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Italy","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2019","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"23 September 2019","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"25 September 2019","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"20","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"pro-ve2019","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.pro-ve.org\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EasyChair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"141","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"56","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"40% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.16","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"This content has been made available to all.","name":"free","label":"Free to read"}]}}