{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T00:58:21Z","timestamp":1740099501053,"version":"3.37.3"},"publisher-location":"Cham","reference-count":22,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030307530"},{"type":"electronic","value":"9783030307547"}],"license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019]]},"DOI":"10.1007\/978-3-030-30754-7_38","type":"book-chapter","created":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T19:02:23Z","timestamp":1567364543000},"page":"385-394","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Grain Segmentation in Atomic Force Microscopy for Thin-Film Deposition Quality Control"],"prefix":"10.1007","author":[{"given":"Nicol\u00f2","family":"Lanza","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5068-8788","authenticated-orcid":false,"given":"Alessandro","family":"Romeo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0523-6042","authenticated-orcid":false,"given":"Marco","family":"Cristani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0015-5534","authenticated-orcid":false,"given":"Francesco","family":"Setti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2019,9,2]]},"reference":[{"issue":"12","key":"38_CR1","doi-asserted-by":"publisher","first-page":"2481","DOI":"10.1109\/TPAMI.2016.2644615","volume":"39","author":"V Badrinarayanan","year":"2017","unstructured":"Badrinarayanan, V., Kendall, A., Cipolla, R.: SegNet: a deep convolutional encoder-decoder architecture for image segmentation. IEEE Trans. Pattern Anal. Mach. Intell. 39(12), 2481\u20132495 (2017)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"issue":"1\u20132","key":"38_CR2","doi-asserted-by":"publisher","first-page":"17","DOI":"10.1016\/j.jvolgeores.2005.09.017","volume":"154","author":"J Barraud","year":"2006","unstructured":"Barraud, J.: The use of watershed segmentation and GIS software for textural analysis of thin sections. J. Volcanol. Geoth. Res. 154(1\u20132), 17\u201333 (2006)","journal-title":"J. Volcanol. Geoth. Res."},{"issue":"2","key":"38_CR3","doi-asserted-by":"publisher","first-page":"179","DOI":"10.1016\/S0098-3004(01)00038-3","volume":"28","author":"EH Berg Van den","year":"2002","unstructured":"Van den Berg, E.H., Meesters, A.G.C.A., Kenter, J.A.M., Schlager, W.: Automated separation of touching grains in digital images of thin sections. Comput. Geosci. 28(2), 179\u2013190 (2002)","journal-title":"Comput. Geosci."},{"issue":"2","key":"38_CR4","doi-asserted-by":"publisher","first-page":"13","DOI":"10.1080\/2151237X.2007.10129236","volume":"12","author":"D Bradley","year":"2007","unstructured":"Bradley, D., Roth, G.: Adaptive thresholding using the integral image. J. Graph. Tools 12(2), 13\u201321 (2007)","journal-title":"J. Graph. Tools"},{"doi-asserted-by":"crossref","unstructured":"Croft, D., Shedd, G., Devasia, S.: Creep, hysteresis, and vibration compensation for piezoactuators: atomic force microscopy application. In: American Control Conference (ACC), vol. 3, pp. 2123\u20132128. IEEE (2000)","key":"38_CR5","DOI":"10.1109\/ACC.2000.879576"},{"issue":"1","key":"38_CR6","doi-asserted-by":"publisher","first-page":"269","DOI":"10.1007\/BF01386390","volume":"1","author":"EW Dijkstra","year":"1959","unstructured":"Dijkstra, E.W.: A note on two problems in connection with graphs. Numer. Math. 1(1), 269\u2013271 (1959). \n                      https:\/\/doi.org\/10.1007\/BF01386390","journal-title":"Numer. Math."},{"key":"38_CR7","doi-asserted-by":"publisher","first-page":"136","DOI":"10.1016\/j.cageo.2011.09.008","volume":"42","author":"PV Gorsevski","year":"2012","unstructured":"Gorsevski, P.V., Onasch, C.M., Farver, J.R., Ye, X.: Detecting grain boundaries in deformed rocks using a cellular automata approach. Comput. Geosci. 42, 136\u2013142 (2012). \n                      https:\/\/doi.org\/10.1016\/j.cageo.2011.09.008","journal-title":"Comput. Geosci."},{"key":"38_CR8","doi-asserted-by":"publisher","first-page":"38","DOI":"10.1016\/j.cageo.2015.04.008","volume":"81","author":"H Izadi","year":"2015","unstructured":"Izadi, H., Sadri, J., Mehran, N.A.: A new intelligent method for minerals segmentation in thin sections based on a novel incremental color clustering. Comput. Geosci. 81, 38\u201352 (2015). \n                      https:\/\/doi.org\/10.1016\/j.cageo.2015.04.008","journal-title":"Comput. Geosci."},{"issue":"8","key":"38_CR9","doi-asserted-by":"publisher","first-page":"907","DOI":"10.1016\/j.mechatronics.2004.04.005","volume":"14","author":"N Jalili","year":"2004","unstructured":"Jalili, N., Laxminarayana, K.: A review of atomic force microscopy imaging systems: application to molecular metrology and biological sciences. Mechatronics 14(8), 907\u2013945 (2004). \n                      https:\/\/doi.org\/10.1016\/j.mechatronics.2004.04.005","journal-title":"Mechatronics"},{"doi-asserted-by":"publisher","unstructured":"Jiang, F., Gu, Q., Hao, H., Li, N.: Grain segmentation of multi-angle petrographic thin section microscopic images. In: IEEE International Conference on Image Processing (ICIP) (2017). \n                      https:\/\/doi.org\/10.1109\/ICIP.2017.8297009","key":"38_CR10","DOI":"10.1109\/ICIP.2017.8297009"},{"key":"38_CR11","doi-asserted-by":"publisher","first-page":"143","DOI":"10.1016\/j.cageo.2018.03.010","volume":"115","author":"F Jiang","year":"2018","unstructured":"Jiang, F., Gu, Q., Hao, H., Li, N., Wang, B., Hu, X.: A method for automatic grain segmentation of multi-angle cross-polarized microscopic images of sandstone. Comput. Geosci. 115, 143\u2013153 (2018). \n                      https:\/\/doi.org\/10.1016\/j.cageo.2018.03.010","journal-title":"Comput. Geosci."},{"key":"38_CR12","doi-asserted-by":"publisher","first-page":"33","DOI":"10.1016\/j.cageo.2014.07.002","volume":"72","author":"M Jungmann","year":"2014","unstructured":"Jungmann, M., Pape, H., Wi\u00dfkirchen, P., Clauser, C., Berlage, T.: Segmentation of thin section images for grain size analysis using region competition and edge-weighted region merging. Comput. Geosci. 72, 33\u201348 (2014). \n                      https:\/\/doi.org\/10.1016\/j.cageo.2014.07.002","journal-title":"Comput. Geosci."},{"key":"38_CR13","first-page":"223","volume":"53","author":"P Klapetek","year":"2003","unstructured":"Klapetek, P., et al.: Atomic force microscopy characterization of ZnTe epitaxial films. Acta Physica Slovaca 53, 223\u2013230 (2003)","journal-title":"Acta Physica Slovaca"},{"key":"38_CR14","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"239","DOI":"10.1007\/978-3-642-15555-0_18","volume-title":"Computer Vision \u2013 ECCV 2010","author":"L Ladicky","year":"2010","unstructured":"Ladicky, L., Russell, C., Kohli, P., Torr, P.H.S.: Graph cut based inference with co-occurrence statistics. In: Daniilidis, K., Maragos, P., Paragios, N. (eds.) ECCV 2010. LNCS, vol. 6315, pp. 239\u2013253. Springer, Heidelberg (2010). \n                      https:\/\/doi.org\/10.1007\/978-3-642-15555-0_18"},{"issue":"2","key":"38_CR15","doi-asserted-by":"publisher","first-page":"267","DOI":"10.1016\/j.cageo.2008.05.006","volume":"35","author":"B Lu","year":"2009","unstructured":"Lu, B., Cui, M., Liu, Q., Wang, Y.: Automated grain boundary detection using the level set method. Comput. Geosci. 35(2), 267\u2013275 (2009)","journal-title":"Comput. Geosci."},{"key":"38_CR16","doi-asserted-by":"publisher","first-page":"113","DOI":"10.1016\/0165-1684(94)90060-4","volume":"38","author":"F Meyer","year":"1994","unstructured":"Meyer, F.: Topographic distance and watershed lines. Sig. Process. 38, 113\u2013125 (1994)","journal-title":"Sig. Process."},{"unstructured":"Ross, B.J., Fueten, P., Yashkir, D.Y.: Edge detection of petrographic images using genetic programming. In: Annual Conference on Genetic and Evolutionary Computation (2000)","key":"38_CR17"},{"key":"38_CR18","doi-asserted-by":"publisher","first-page":"310","DOI":"10.1016\/j.cageo.2012.01.001","volume":"46","author":"N Yesiloglu-Gultekin","year":"2012","unstructured":"Yesiloglu-Gultekin, N., Keceli, A.S., Sezer, E.A., Can, A.B., Gokceoglu, C., Bayhan, H.: A computer program (TSecSoft) to determine mineral percentages using photographs obtained from thin sections. Comput. Geosci. 46, 310\u2013316 (2012)","journal-title":"Comput. Geosci."},{"issue":"8","key":"38_CR19","doi-asserted-by":"publisher","first-page":"817","DOI":"10.1016\/j.cageo.2004.05.002","volume":"30","author":"Y Zhou","year":"2004","unstructured":"Zhou, Y., Starkey, J., Mansinha, L.: Segmentation of petrographic images by integrating edge detection and region growing. Comput. Geosci. 30(8), 817\u2013831 (2004)","journal-title":"Comput. Geosci."},{"key":"38_CR20","doi-asserted-by":"publisher","first-page":"286","DOI":"10.1016\/j.powtec.2015.11.029","volume":"288","author":"W Xia","year":"2016","unstructured":"Xia, W., Ni, C., Xie, G.: The influence of surface roughness on wettability of natural\/gold-coated ultra-low ash coal particles. Powder Technol. 288, 286\u2013290 (2016). \n                      https:\/\/doi.org\/10.1016\/j.powtec.2015.11.029","journal-title":"Powder Technol."},{"key":"38_CR21","doi-asserted-by":"publisher","first-page":"1231","DOI":"10.1016\/j.wear.2014.11.030","volume":"332-333","author":"M.L. Rahaman","year":"2015","unstructured":"Rahaman, M.L., Zhang, L., Liu, M., Liu, W.: Surface roughness effect on the friction and wear of bulk metallic glasses. In: 20th International Conference on Wear of Materials. Wear 332\u2013333, 1231\u20131237 (2015). \n                      https:\/\/doi.org\/10.1016\/j.wear.2014.11.030","journal-title":"Wear"},{"key":"38_CR22","doi-asserted-by":"publisher","first-page":"52","DOI":"10.1016\/j.jqsrt.2015.01.006","volume":"158","author":"Y Chen","year":"2015","unstructured":"Chen, Y., Xuan, Y.: The influence of surface roughness on nanoscale radiative heat flux between two objects. J. Quant. Spectrosc. Radiat. Transfer 158, 52\u201360 (2015). \n                      https:\/\/doi.org\/10.1016\/j.jqsrt.2015.01.006","journal-title":"J. Quant. Spectrosc. Radiat. Transfer"}],"container-title":["Lecture Notes in Computer Science","New Trends in Image Analysis and Processing \u2013 ICIAP 2019"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-30754-7_38","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T19:04:21Z","timestamp":1567364661000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-030-30754-7_38"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"ISBN":["9783030307530","9783030307547"],"references-count":22,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-30754-7_38","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2019]]},"assertion":[{"value":"2 September 2019","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICIAP","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Image Analysis and Processing","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Trento","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Italy","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2019","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"9 September 2019","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"13 September 2019","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"20","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"iciap2019","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/event.unitn.it\/iciap2019\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"CMT","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"207","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"117","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"57% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.6","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}