{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T03:28:57Z","timestamp":1742959737274,"version":"3.40.3"},"publisher-location":"Cham","reference-count":23,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030317225"},{"type":"electronic","value":"9783030317232"}],"license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019]]},"DOI":"10.1007\/978-3-030-31723-2_14","type":"book-chapter","created":{"date-parts":[[2019,10,31]],"date-time":"2019-10-31T00:05:31Z","timestamp":1572480331000},"page":"161-172","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Automatic Inspection of Yarn Locations by Utilizing Histogram Segmentation and Monotone Hypothesis"],"prefix":"10.1007","author":[{"given":"Yu","family":"Han","sequence":"first","affiliation":[]},{"given":"Ling","family":"Luo","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2019,10,31]]},"reference":[{"issue":"1","key":"14_CR1","first-page":"35","volume":"23","author":"R Pan","year":"2015","unstructured":"Pan, R., Gao, W., Li, Z., Gou, J., Zhang, J., Zhu, D.: Measuring thread densities of woven fabric using the Fourier transform. Fibres Text. East. Eur. 23(1), 35\u201340 (2015)","journal-title":"Fibres Text. East. Eur."},{"issue":"2","key":"14_CR2","doi-asserted-by":"publisher","first-page":"66","DOI":"10.5604\/12303666.1191429","volume":"24","author":"R Pan","year":"2016","unstructured":"Pan, R., Zhang, J., Li, Z., Gao, W., Xu, B., Li, W.: Applying image analysis for automatic density measurement of high-tightness woven fabrics. Fibres Text. East. Eur. 24(2), 66\u201372 (2016)","journal-title":"Fibres Text. East. Eur."},{"issue":"4","key":"14_CR3","doi-asserted-by":"publisher","first-page":"966","DOI":"10.1364\/AO.54.000966","volume":"54","author":"J Zhang","year":"2015","unstructured":"Zhang, J., Pan, R., Gao, W.: Automatic inspection of density in yarn-dyed fabrics by utilizing fabric light transmittance and Fourier analysis. Appl. Opt. 54(4), 966 (2015)","journal-title":"Appl. Opt."},{"issue":"2","key":"14_CR4","first-page":"32","volume":"28","author":"F He","year":"2007","unstructured":"He, F., Li, L., Xu, J.: Woven fabric density measure based on adaptive wavelets transform. J. Text. Res 28(2), 32\u201335 (2007)","journal-title":"J. Text. Res"},{"issue":"8","key":"14_CR5","doi-asserted-by":"publisher","first-page":"2559","DOI":"10.12733\/jics20103491","volume":"11","author":"J Jing","year":"2014","unstructured":"Jing, J., Liu, S., Li, P., Li, Q., Liu, S., Jiang, M.: Automatic density detection of woven fabrics via wavelet transform. J. Inf. Comput. Sci. 11(8), 2559\u20132568 (2014)","journal-title":"J. Inf. Comput. Sci."},{"issue":"2","key":"14_CR6","first-page":"74","volume":"98","author":"L Technikova","year":"2013","unstructured":"Technikova, L., Tunak, M.: Weaving density evaluation with the aid of image analysis. Fibres Text. East. Eur. 98(2), 74\u201379 (2013)","journal-title":"Fibres Text. East. Eur."},{"issue":"4","key":"14_CR7","first-page":"46","volume":"81","author":"R Pan","year":"2010","unstructured":"Pan, R., Gao, W., Liu, J., Wang, H.: Automatic inspection of woven fabric density of solid colour fabric density by the Hough transform. Fibres Text. East. Eur. 81(4), 46\u201351 (2010)","journal-title":"Fibres Text. East. Eur."},{"issue":"1","key":"14_CR8","doi-asserted-by":"publisher","first-page":"31","DOI":"10.35530\/IT.068.01.1321","volume":"68","author":"J Zhang","year":"2017","unstructured":"Zhang, J., Gao, W., Pan, R.: A backlighting method for accurate inspection of woven fabric density. Ind. Textila 68(1), 31\u201336 (2017)","journal-title":"Ind. Textila"},{"issue":"6","key":"14_CR9","doi-asserted-by":"crossref","first-page":"456","DOI":"10.1002\/col.21738","volume":"38","author":"R Pan","year":"2013","unstructured":"Pan, R., Liu, J., Gao, W.: Measuring linear density of threads in single system melange color fabrics with FCM algorithm. Color Res. Appl. 38(6), 456\u2013462 (2013)","journal-title":"Color Res. Appl."},{"issue":"8","key":"14_CR10","doi-asserted-by":"publisher","first-page":"823","DOI":"10.1080\/00405000.2014.946342","volume":"106","author":"J Zhang","year":"2015","unstructured":"Zhang, J., Pan, R., Gao, W., Zhu, D.: Automatic inspection of yarn-dyed fabric density by mathematical statistics of sub-images. J. Text. Inst. 106(8), 823\u2013834 (2015)","journal-title":"J. Text. Inst."},{"issue":"20","key":"14_CR11","doi-asserted-by":"publisher","first-page":"2524","DOI":"10.1177\/0040517516673331","volume":"87","author":"D Zheng","year":"2017","unstructured":"Zheng, D., Wang, L.: Multi-scale density detection for yarn-dyed fabrics with deformed repeat patterns. Text. Res. J. 87(20), 2524\u20132540 (2017)","journal-title":"Text. Res. J."},{"issue":"1","key":"14_CR12","doi-asserted-by":"publisher","first-page":"105","DOI":"10.1080\/00405000.2018.1467743","volume":"110","author":"E Aldemir","year":"2019","unstructured":"Aldemir, E., \u00d6zdemir, H., Sar\u0131, Z.: An improved gray line profile method to inspect the warp\u2013weft density of fabrics. J. Text. Inst. 110(1), 105\u2013116 (2019)","journal-title":"J. Text. Inst."},{"key":"14_CR13","doi-asserted-by":"crossref","unstructured":"Delon, J., Desolneux, A., Lisani, J.L., Petro, A.B.: Automatic color palette. In IEEE International Conference on Image Processing 2005, vol. 2, pp. II\u2013706. IEEE (2005)","DOI":"10.1109\/ICIP.2005.1530153"},{"issue":"1","key":"14_CR14","doi-asserted-by":"publisher","first-page":"253","DOI":"10.1109\/TIP.2006.884951","volume":"16","author":"J Delon","year":"2007","unstructured":"Delon, J., Desolneux, A., Lisani, J.L., Petro, A.B.: A nonparametric approach for histogram segmentation. IEEE Trans. Image Process. 16(1), 253\u2013261 (2007)","journal-title":"IEEE Trans. Image Process."},{"issue":"2","key":"14_CR15","doi-asserted-by":"publisher","first-page":"265","DOI":"10.3934\/ipi.2007.1.265","volume":"1","author":"J Delon","year":"2007","unstructured":"Delon, J., Desolneux, A., Lisani, J.L., Petro, A.B.: Automatic color palette. Inverse Probl. Imaging 1(2), 265\u2013287 (2007)","journal-title":"Inverse Probl. Imaging"},{"key":"14_CR16","doi-asserted-by":"crossref","unstructured":"Lu, C., Xu, L., Jia, J.: Real-time contrast preserving decolorization. In: SIGGRAPH Asia 2012 Posters, p. 161. ACM, Singapore (2012)","DOI":"10.1145\/2407156.2407174"},{"key":"14_CR17","doi-asserted-by":"publisher","first-page":"967","DOI":"10.1007\/978-3-642-10268-4","volume-title":"Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications","author":"BC Eduardo","year":"2009","unstructured":"Eduardo, B.C., Jan-Olof, E.: Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications, p. 967. Springer, Heidelberg (2009). https:\/\/doi.org\/10.1007\/978-3-642-10268-4"},{"issue":"1","key":"14_CR18","doi-asserted-by":"publisher","first-page":"35","DOI":"10.1186\/s13640-019-0429-4","volume":"2019","author":"S Le Hegarat-Mascle","year":"2019","unstructured":"Le Hegarat-Mascle, S., Aldea, E., Vandoni, J.: Efficient evaluation of the number of false alarm criterion. EURASIP J. Image Video Process. 2019(1), 35 (2019)","journal-title":"EURASIP J. Image Video Process."},{"key":"14_CR19","doi-asserted-by":"crossref","unstructured":"Rajaei, B., von Gioi, R.G., Morel, J.: From line segments to more organized gestalts. In: 2016 IEEE Southwest Symposium on Image Analysis and Interpretation (SSIAI), pp. 137\u2013140. IEEE (2016)","DOI":"10.1109\/SSIAI.2016.7459194"},{"issue":"4","key":"14_CR20","doi-asserted-by":"publisher","first-page":"641","DOI":"10.1214\/aoms\/1177728423","volume":"26","author":"A Miriam","year":"1955","unstructured":"Miriam, A., Brunk, H.D., Ewing, G.M., Reid, W.T., Edward, S.S.: An empirical distribution function for sampling with incomplete information. Ann. Math. Stat. 26(4), 641\u2013647 (1955)","journal-title":"Ann. Math. Stat."},{"issue":"4","key":"14_CR21","doi-asserted-by":"publisher","first-page":"508","DOI":"10.1109\/TPAMI.2003.1190576","volume":"25","author":"A Desolneux","year":"2003","unstructured":"Desolneux, A., Moisah, L., Morel, J.M.: A grouping principle and four applications. IEEE Trans. Pattern Anal. Mach. Intell. 25(4), 508\u2013513 (2003)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"issue":"17","key":"14_CR22","doi-asserted-by":"publisher","first-page":"1819","DOI":"10.1177\/0040517510369411","volume":"80","author":"R Pan","year":"2010","unstructured":"Pan, R., Gao, W., Liu, J., Wang, H., Zhang, X.: Automatic detection of structure parameters of yarn-dyed fabric. Text. Res. J. 80(17), 1819\u20131832 (2010)","journal-title":"Text. Res. J."},{"issue":"14","key":"14_CR23","doi-asserted-by":"publisher","first-page":"1520","DOI":"10.1177\/0040517514561920","volume":"85","author":"D Zheng","year":"2015","unstructured":"Zheng, D.: A new method for automatic separation of fabric color. Text. Res. J. 85(14), 1520\u20131538 (2015)","journal-title":"Text. Res. J."}],"container-title":["Lecture Notes in Computer Science","Pattern Recognition and Computer Vision"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-31723-2_14","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,31]],"date-time":"2024-10-31T00:21:32Z","timestamp":1730334092000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-31723-2_14"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"ISBN":["9783030317225","9783030317232"],"references-count":23,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-31723-2_14","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2019]]},"assertion":[{"value":"31 October 2019","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"PRCV","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Chinese Conference on Pattern Recognition and Computer Vision  (PRCV)","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Xi'an","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2019","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"8 November 2019","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"11 November 2019","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"ccprcv2019","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.prcv2019.com\/en\/index.html","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"CMT","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"412","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"165","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"40% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}