{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,13]],"date-time":"2025-09-13T15:37:26Z","timestamp":1757777846282,"version":"3.40.3"},"publisher-location":"Cham","reference-count":17,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030336066"},{"type":"electronic","value":"9783030336073"}],"license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019]]},"DOI":"10.1007\/978-3-030-33607-3_41","type":"book-chapter","created":{"date-parts":[[2019,11,7]],"date-time":"2019-11-07T00:05:28Z","timestamp":1573085128000},"page":"375-385","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":4,"title":["A Deep Learning-Based Surface Defect Inspection System for Smartphone Glass"],"prefix":"10.1007","author":[{"given":"Gwang-Myong","family":"Go","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Seok-Jun","family":"Bu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sung-Bae","family":"Cho","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2019,10,18]]},"reference":[{"key":"41_CR1","doi-asserted-by":"crossref","unstructured":"Sun, J., Wang, P., Luo, Y.K., Li, W.: Surface defects detection based on adaptive multiscale image collection and convolutional neural networks. IEEE Trans. Instrum. Measur. 1\u201311 (2019)","DOI":"10.1109\/TIM.2019.2899478"},{"key":"41_CR2","doi-asserted-by":"crossref","unstructured":"Natarajan, V., Hung, T.Y., Vaikundam, S., Chia, L.T.: Convolutional networks for voting-based anomaly classification in metal surface inspection. In: IEEE International Conference on Industrial Technology, pp. 986\u2013991 (2017)","DOI":"10.1109\/ICIT.2017.7915495"},{"key":"41_CR3","doi-asserted-by":"publisher","first-page":"2055","DOI":"10.1109\/TIM.2016.2566442","volume":"65","author":"T Chen","year":"2016","unstructured":"Chen, T., Wang, Y., Xiao, C., Wu, Q.J.: A machine vision apparatus and method for can-end inspection. IEEE Trans. Instrum. Measur. 65, 2055\u20132066 (2016)","journal-title":"IEEE Trans. Instrum. Measur."},{"key":"41_CR4","doi-asserted-by":"publisher","first-page":"36235","DOI":"10.1109\/ACCESS.2018.2842028","volume":"6","author":"G Cao","year":"2018","unstructured":"Cao, G., Ruan, S., Peng, Y., Huang, S., Kwok, N.: Large-complex-surface defect detection by hybrid gradient threshold segmentation and image registration. IEEE Access 6, 36235\u201336246 (2018)","journal-title":"IEEE Access"},{"key":"41_CR5","doi-asserted-by":"publisher","first-page":"348","DOI":"10.1016\/j.asoc.2016.10.030","volume":"52","author":"C Jian","year":"2017","unstructured":"Jian, C., Gao, J., Ao, Y.: Automatic surface defect detection for mobile phone screen glass based on machine vision. Appl. Soft Comput. 52, 348\u2013358 (2017)","journal-title":"Appl. Soft Comput."},{"key":"41_CR6","doi-asserted-by":"publisher","first-page":"889","DOI":"10.1109\/83.841534","volume":"9","author":"JA Stark","year":"2000","unstructured":"Stark, J.A.: Adaptive image contrast enhancement using generalizations of histogram equalization. IEEE Trans. Image Process. 9, 889\u2013896 (2000)","journal-title":"IEEE Trans. Image Process."},{"key":"41_CR7","doi-asserted-by":"crossref","unstructured":"Gupta, E., Kushwah, R.S.: Combination of global and local features using DWT with SVM for CBIR. In: International Conference on Reliability, Infocom Technologies and Optimization, pp. 1\u20136 (2015)","DOI":"10.1109\/ICRITO.2015.7359320"},{"key":"41_CR8","doi-asserted-by":"crossref","unstructured":"Zhou, B., Khosla, A., Lapedriza, A., Olivia, A., Torralba, A.: Learning deep features for discriminative localization. In: IEEE Conference on Computer Vision and Pattern Recognition, pp. 2921\u20132929 (2016)","DOI":"10.1109\/CVPR.2016.319"},{"key":"41_CR9","doi-asserted-by":"publisher","first-page":"690","DOI":"10.1109\/TIM.2017.2783098","volume":"67","author":"R Borwankar","year":"2018","unstructured":"Borwankar, R., Ludwig, R.: An optical surface inspection and automatic classification technique using the rotated wavelet transform. IEEE Trans. Instrum. Measur. 67, 690\u2013697 (2018)","journal-title":"IEEE Trans. Instrum. Measur."},{"key":"41_CR10","doi-asserted-by":"crossref","unstructured":"Dong, X., Taylor, C.J., Cootes, T.F.: Small defect detection using convolutional neural network features and random forests. In: European Conference on Computer Vision, pp. 1\u201315 (2018)","DOI":"10.1007\/978-3-030-11018-5_35"},{"key":"41_CR11","doi-asserted-by":"publisher","first-page":"397","DOI":"10.1016\/j.optlaseng.2019.05.005","volume":"121","author":"G Fu","year":"2019","unstructured":"Fu, G., et al.: A deep-learning-based approach for fast and robust steel surface defects classification. Opt. Lasers Eng. 121, 397\u2013405 (2019)","journal-title":"Opt. Lasers Eng."},{"key":"41_CR12","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1109\/TASE.2019.2941047","volume":"99","author":"H Yang","year":"2019","unstructured":"Yang, H., Chen, Y., Song, K., Yin, Z.: Multiscale feature-clustering-based fully convolutional autoencoder for fast accurate visual inspection of texture surface defects. IEEE Trans. Autom. Sci. Eng. 99, 1\u201318 (2019)","journal-title":"IEEE Trans. Autom. Sci. Eng."},{"key":"41_CR13","doi-asserted-by":"publisher","first-page":"484","DOI":"10.1016\/j.procir.2019.02.123","volume":"79","author":"B Staar","year":"2019","unstructured":"Staar, B., Lutjen, M., Freitag, M.: Anomaly detection with convolutional neural networks for industrial surface inspection. Procedia CIRP. 79, 484\u2013489 (2019)","journal-title":"Procedia CIRP."},{"key":"41_CR14","doi-asserted-by":"crossref","unstructured":"Sainath, T., Parada, C.: Convolutional neural networks for small-footprint keyword spotting. In: InterSpeech, pp. 1478\u20131482 (2015)","DOI":"10.21437\/Interspeech.2015-352"},{"key":"41_CR15","doi-asserted-by":"crossref","unstructured":"Donahue, J., et al.: Long-term recurrent convolutional networks for visual recognition and description. In: IEEE Conference on Computer Vision and Pattern Recognition, pp. 2625\u20132634 (2015)","DOI":"10.1109\/CVPR.2015.7298878"},{"key":"41_CR16","unstructured":"Rippel, O., Snoek, J., Adams, R.P.: Spectral representations for convolutional neural networks. In: Advances in Neural Information Processing Systems, pp. 2449\u20132457 (2015)"},{"key":"41_CR17","unstructured":"Krizhevsky, A., Sutskever, I., Hinton, G.E.: Imagenet classification with deep convolutional neural networks. In: Advances in Neural Information Processing Systems, pp. 1097\u20131105 (2012)"}],"container-title":["Lecture Notes in Computer Science","Intelligent Data Engineering and Automated Learning \u2013 IDEAL 2019"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-33607-3_41","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,12]],"date-time":"2024-03-12T13:58:48Z","timestamp":1710251928000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-33607-3_41"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"ISBN":["9783030336066","9783030336073"],"references-count":17,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-33607-3_41","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2019]]},"assertion":[{"value":"18 October 2019","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"IDEAL","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Intelligent Data Engineering and Automated Learning","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Manchester","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"United Kingdom","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2019","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"14 November 2019","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"16 November 2019","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"20","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"ideal2019","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.confercare.manchester.ac.uk\/events\/ideal2019\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Open","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EasyChair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"149","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"94","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"63% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.5","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}