{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,11]],"date-time":"2024-09-11T14:26:17Z","timestamp":1726064777455},"publisher-location":"Cham","reference-count":47,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030353292"},{"type":"electronic","value":"9783030353308"}],"license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019]]},"DOI":"10.1007\/978-3-030-35330-8_2","type":"book-chapter","created":{"date-parts":[[2020,1,16]],"date-time":"2020-01-16T12:12:28Z","timestamp":1579176748000},"page":"25-38","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Hybrid Is Better: Why and How Test Coverage and Software Reliability Can Benefit Each Other"],"prefix":"10.1007","author":[{"given":"Antonia","family":"Bertolino","sequence":"first","affiliation":[]},{"given":"Breno","family":"Miranda","sequence":"additional","affiliation":[]},{"given":"Roberto","family":"Pietrantuono","sequence":"additional","affiliation":[]},{"given":"Stefano","family":"Russo","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2020,1,17]]},"reference":[{"issue":"1","key":"2_CR1","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1147\/rd.281.0002","volume":"28","author":"EN Adams","year":"1984","unstructured":"Adams, E.N.: Optimizing preventive service of software products. IBM J. Res. Dev. 28(1), 2\u201314 (1984)","journal-title":"IBM J. Res. Dev."},{"key":"2_CR2","doi-asserted-by":"crossref","unstructured":"Alrmuny, D.: A comparative study of test coverage-based software reliability growth models. In: Proceedings of the 11th International Conference on Information Technology: New Generations, pp. 255\u2013259. ITNG, IEEE (2014)","DOI":"10.1109\/ITNG.2014.85"},{"key":"2_CR3","volume-title":"Software Testing Techniques","author":"B Beizer","year":"1990","unstructured":"Beizer, B.: Software Testing Techniques, 2nd edn. Van Nostrand Reinhold Co., New York (1990)","edition":"2"},{"key":"2_CR4","unstructured":"Bertolino, A.: Software testing. In: Bourque, P., Dupuis, R. (eds.) Software Engineering Body of Knowledge (SWEBOK), Chap. 5. IEEE Computer Society (2001)"},{"key":"2_CR5","doi-asserted-by":"crossref","unstructured":"Bertolino, A., Miranda, B., Pietrantuono, R., Russo, S.: Adaptive coverage and operational profile-based testing for reliability improvement. In: Proceedings of the 39th International Conference on Software Engineering, pp. 541\u2013551. ICSE, IEEE (2017)","DOI":"10.1109\/ICSE.2017.56"},{"key":"2_CR6","series-title":"Information Science and Statistics","volume-title":"Pattern Recognition and Machine Learning","author":"C Bishop","year":"2006","unstructured":"Bishop, C.: Pattern Recognition and Machine Learning. Information Science and Statistics. Springer-Verlag, New York (2006)"},{"issue":"15","key":"2_CR7","doi-asserted-by":"publisher","first-page":"989","DOI":"10.1016\/j.infsof.2004.07.006","volume":"46","author":"KY Cai","year":"2004","unstructured":"Cai, K.Y., Li, Y.C., Liu, K.: Optimal and adaptive testing for software reliability assessment. Inf. Softw. Technol. 46(15), 989\u20131000 (2004)","journal-title":"Inf. Softw. Technol."},{"key":"2_CR8","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"320","DOI":"10.1007\/978-3-540-30502-6_23","volume-title":"Advances in Computer Science - ASIAN 2004. Higher-Level Decision Making","author":"TY Chen","year":"2004","unstructured":"Chen, T.Y., Leung, H., Mak, I.K.: Adaptive random testing. In: Maher, M.J. (ed.) ASIAN 2004. LNCS, vol. 3321, pp. 320\u2013329. Springer, Heidelberg (2004). \nhttps:\/\/doi.org\/10.1007\/978-3-540-30502-6_23"},{"key":"2_CR9","doi-asserted-by":"crossref","unstructured":"Cotroneo, D., Pietrantuono, R., Russo, S.: A learning-based method for combining testing techniques. In: Proceedings of the 35th International Conference on Software Engineering (ICSE), pp. 142\u2013151. IEEE (2013)","DOI":"10.1109\/ICSE.2013.6606560"},{"issue":"2","key":"2_CR10","doi-asserted-by":"publisher","first-page":"408","DOI":"10.1109\/TR.2013.2257051","volume":"62","author":"D Cotroneo","year":"2013","unstructured":"Cotroneo, D., Pietrantuono, R., Russo, S.: Combining operational and debug testing for improving reliability. IEEE Trans. Reliab. 62(2), 408\u2013423 (2013)","journal-title":"IEEE Trans. Reliab."},{"issue":"5","key":"2_CR11","doi-asserted-by":"publisher","first-page":"452","DOI":"10.1109\/TSE.2015.2491931","volume":"42","author":"D Cotroneo","year":"2016","unstructured":"Cotroneo, D., Pietrantuono, R., Russo, S.: RELAI testing: a technique to assess and improve software reliability. IEEE Trans. Software Eng. 42(5), 452\u2013475 (2016)","journal-title":"IEEE Trans. Software Eng."},{"key":"2_CR12","unstructured":"Del Frate, F., Garg, P., Mathur, A., Pasquini, A.: On the correlation between code coverage and software reliability. In: Proceedings of the 6th International Symposium on Software Reliability Engineering, pp. 124\u2013132. ISSRE, IEEE, October 1995"},{"key":"2_CR13","unstructured":"Dijkstra, E.W.: Structured programming. In: N.Buxton, J., Randell, B. (eds.) Software Engineering Techniques. NATO Science Committee (1970)"},{"key":"2_CR14","unstructured":"Donnelly, M., Everett, B., Musa, J., Wilson, G., Nikora, A.: Best current practice of SRE. In: Handbook of software Reliability Engineering, Chap. 6, pp. 219\u2013254. IEEE Computer Society Press and McGraw-Hill (1996)"},{"issue":"8","key":"2_CR15","doi-asserted-by":"publisher","first-page":"586","DOI":"10.1109\/32.707695","volume":"24","author":"PG Frankl","year":"1998","unstructured":"Frankl, P.G., Hamlet, R.G., Littlewood, B., Strigini, L.: Evaluating testing methods by delivered reliability. IEEE Trans. Software Eng. 24(8), 586\u2013601 (1998)","journal-title":"IEEE Trans. Software Eng."},{"issue":"10","key":"2_CR16","doi-asserted-by":"publisher","first-page":"1483","DOI":"10.1109\/32.6194","volume":"14","author":"PG Frankl","year":"1988","unstructured":"Frankl, P.G., Weyuker, E.J.: An applicable family of data flow testing criteria. IEEE Trans. Software Eng. 14(10), 1483\u20131498 (1988)","journal-title":"IEEE Trans. Software Eng."},{"issue":"5","key":"2_CR17","doi-asserted-by":"publisher","first-page":"124","DOI":"10.1145\/347636.348926","volume":"25","author":"PG Frankl","year":"2000","unstructured":"Frankl, P.G., Deng, Y.: Comparison of delivered reliability of branch, data flow and operational testing: a case study. ACM SIGSOFT Software Eng. Notes 25(5), 124\u2013134 (2000)","journal-title":"ACM SIGSOFT Software Eng. Notes"},{"issue":"8","key":"2_CR18","doi-asserted-by":"publisher","first-page":"803","DOI":"10.1109\/TSE.2015.2421011","volume":"41","author":"G Gay","year":"2015","unstructured":"Gay, G., Staats, M., Whalen, M., Heimdahl, M.P.: The risks of coverage-directed test case generation. IEEE Trans. Software Eng. 41(8), 803\u2013819 (2015)","journal-title":"IEEE Trans. Software Eng."},{"key":"2_CR19","doi-asserted-by":"crossref","unstructured":"Harrold, M.J., Rothermel, G., Wu, R., Yi, L.: An Empirical Investigation of Program Spectra. In: Proceedings of the 1998 ACM SIGPLAN-SIGSOFT Workshop on Program Analysis for Software Tools and Engineering, pp. 83\u201390. PASTE, ACM (1998)","DOI":"10.1145\/277633.277647"},{"key":"2_CR20","doi-asserted-by":"crossref","unstructured":"Herzig, K.: There\u2019s never enough time to do all the testing you want. In: Perspectives on Data Science for Software Engineering, pp. 91\u201395. Elsevier (2016)","DOI":"10.1016\/B978-0-12-804206-9.00018-0"},{"key":"2_CR21","unstructured":"Herzig, K.: Let\u2019s assume we had to pay for testing. In: Keynote at the 11th IEEE\/ACM International Workshop on Automation of Software Test (2016). \nhttps:\/\/www.kim-herzig.de\/2016\/06\/28\/keynote-ast-2016\/"},{"key":"2_CR22","unstructured":"Horgan, J., Mathur, A.: Software testing and reliability. The Handbook of Software Reliability Engineering, pp. 531\u2013565 (1996)"},{"key":"2_CR23","doi-asserted-by":"crossref","unstructured":"Inozemtseva, L., Holmes, R.: Coverage is not strongly correlated with test suite effectiveness. In: Proceedings of the 36th International Conference on Software Engineering, pp. 435\u2013445. ICSE, ACM (2014)","DOI":"10.1145\/2568225.2568271"},{"key":"2_CR24","unstructured":"Institute of Electrical and Electronic Engineers: IEEE standard glossary of software engineering terminology. IEEE Standard 610 12, 09 1990"},{"key":"2_CR25","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"345","DOI":"10.1007\/978-3-540-78917-8_12","volume-title":"Formal Methods and Testing","author":"B Littlewood","year":"2008","unstructured":"Littlewood, B., Popov, P., Strigini, L., Shryane, N.: Modelling the effects of combining diverse software fault detection techniques. In: Hierons, R.M., Bowen, J.P., Harman, M. (eds.) Formal Methods and Testing. LNCS, vol. 4949, pp. 345\u2013366. Springer, Heidelberg (2008). \nhttps:\/\/doi.org\/10.1007\/978-3-540-78917-8_12"},{"key":"2_CR26","doi-asserted-by":"crossref","unstructured":"Lyu, M.R.: Software reliability engineering: a roadmap. In: Future of Software Engineering, pp. 153\u2013170. FOSE, IEEE (2007)","DOI":"10.1109\/FOSE.2007.24"},{"key":"2_CR27","unstructured":"Marick, B.: How to misuse code coverage. In: Proceedings of the 16th International Conference on Testing Computer Software, pp. 16\u201318 (1999)"},{"key":"2_CR28","doi-asserted-by":"crossref","unstructured":"Miranda, B., Bertolino, A.: Does code coverage provide a good stopping rule for operational profile based testing? In: Proceedings of the 11th International Workshop on Automation of Software Test, pp. 22\u201328. AST, ACM (2016)","DOI":"10.1145\/2896921.2896934"},{"issue":"4","key":"2_CR29","doi-asserted-by":"publisher","first-page":"1571","DOI":"10.1007\/s11219-017-9388-0","volume":"26","author":"B Miranda","year":"2018","unstructured":"Miranda, B., Bertolino, A.: An assessment of operational coverage as both an adequacy and a selection criterion for operational profile based testing. Software Qual. J. 26(4), 1571\u20131594 (2018)","journal-title":"Software Qual. J."},{"issue":"3","key":"2_CR30","doi-asserted-by":"publisher","first-page":"312","DOI":"10.1109\/TSE.1975.6312856","volume":"SE\u20131","author":"JD Musa","year":"1975","unstructured":"Musa, J.D.: A theory of software reliability and its application. IEEE Trans. Software Eng. SE\u20131(3), 312\u2013327 (1975)","journal-title":"IEEE Trans. Software Eng."},{"issue":"2","key":"2_CR31","doi-asserted-by":"publisher","first-page":"14","DOI":"10.1109\/52.199724","volume":"10","author":"JD Musa","year":"1993","unstructured":"Musa, J.D.: Operational profiles in software-reliability engineering. IEEE Softw. 10(2), 14\u201332 (1993)","journal-title":"IEEE Softw."},{"issue":"3","key":"2_CR32","doi-asserted-by":"publisher","first-page":"257","DOI":"10.1017\/S0269888900003039","volume":"15","author":"M Neil","year":"2000","unstructured":"Neil, M., Fenton, N., Nielson, L.: Building large-scale Bayesian networks. Knowl. Eng. Rev. 15(3), 257\u2013284 (2000)","journal-title":"Knowl. Eng. Rev."},{"key":"2_CR33","doi-asserted-by":"crossref","unstructured":"Omri, F.: Weighted statistical white-box testing with proportional-optimal stratification. In: WCOP 2014 Proceedings of the 19th International Doctoral Symposium on Components and Architecture, pp. 19\u201324. ACM (2014)","DOI":"10.1145\/2601328.2601333"},{"key":"2_CR34","doi-asserted-by":"crossref","unstructured":"Pietrantuono, R., Russo, S.: On adaptive sampling-based testing for software reliability assessment. In: Proceedings of the 27th International Symposium on Software Reliability Engineering, pp. 1\u201311. ISSRE, IEEE, October 2016","DOI":"10.1109\/ISSRE.2016.50"},{"key":"2_CR35","doi-asserted-by":"crossref","unstructured":"Pietrantuono, R., Russo, S.: Probabilistic sampling-based testing for accelerated reliability assessment. In: Proceedings of the IEEE 18th International Conference on Software Quality, Reliability and Security (QRS), pp. 35\u201346. IEEE, July 2018","DOI":"10.1109\/QRS.2018.00017"},{"key":"2_CR36","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"351","DOI":"10.1007\/978-3-319-69926-4_25","volume-title":"Product-Focused Software Process Improvement","author":"CR Prause","year":"2017","unstructured":"Prause, C.R., Werner, J., Hornig, K., Bosecker, S., Kuhrmann, M.: Is 100% test coverage a reasonable requirement? Lessons learned from a space software project. In: Felderer, M., M\u00e9ndez Fern\u00e1ndez, D., Turhan, B., Kalinowski, M., Sarro, F., Winkler, D. (eds.) PROFES 2017. LNCS, vol. 10611, pp. 351\u2013367. Springer, Cham (2017). \nhttps:\/\/doi.org\/10.1007\/978-3-319-69926-4_25"},{"issue":"14","key":"2_CR37","doi-asserted-by":"publisher","first-page":"991","DOI":"10.1016\/S0950-5849(99)00074-9","volume":"41","author":"M Roper","year":"1999","unstructured":"Roper, M.: Software testing\u2013searching for the missing link. Inf. Softw. Technol. 41(14), 991\u2013994 (1999)","journal-title":"Inf. Softw. Technol."},{"key":"2_CR38","unstructured":"Singh, H., Cortellessa, V., Cukic, B., Gunel, E., Bharadwaj, V.: A Bayesian approach to reliability prediction and assessment of component based systems. In: Proceedings of the 12th International Symposium on Software Reliability Engineering, pp. 12\u201321. ISSRE, November 2001"},{"key":"2_CR39","unstructured":"Smidts, C., Cukic, B., Gunel, E., Li, M., Singh, H.: Software reliability corroboration. In: Proceedings of the 27th Annual NASA Goddard\/IEEE Software Engineering Workshop, pp. 82\u201387. IEEE, December 2002"},{"issue":"3","key":"2_CR40","doi-asserted-by":"publisher","first-page":"39:1","DOI":"10.1145\/2518106","volume":"46","author":"C Smidts","year":"2014","unstructured":"Smidts, C., Mutha, C., Rodr\u00edguez, M., Gerber, M.J.: Software testing with an operational profile: OP definition. ACM Comput. Surv. 46(3), 39:1\u201339:39 (2014)","journal-title":"ACM Comput. Surv."},{"key":"2_CR41","doi-asserted-by":"crossref","unstructured":"Sridharan, M., Namin, A.: Prioritizing mutation operators based on importance sampling. In: 21st International Symposium on Software Reliability Engineering, pp. 378\u2013387. ISSRE, IEEE, November 2010","DOI":"10.1109\/ISSRE.2010.16"},{"issue":"5","key":"2_CR42","doi-asserted-by":"publisher","first-page":"405","DOI":"10.1109\/32.387470","volume":"21","author":"J Tian","year":"1995","unstructured":"Tian, J., Lu, P., Palma, J.: Test-execution-based reliability measurement and modeling for large commercial software. IEEE Trans. Software Eng. 21(5), 405\u2013414 (1995)","journal-title":"IEEE Trans. Software Eng."},{"key":"2_CR43","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"194","DOI":"10.1007\/978-3-642-25231-0_5","volume-title":"Empirical Software Engineering and Verification","author":"Y Wei","year":"2012","unstructured":"Wei, Y., Meyer, B., Oriol, M.: Is branch coverage a good measure of testing effectiveness? In: Meyer, B., Nordio, M. (eds.) LASER 2008-2010. LNCS, vol. 7007, pp. 194\u2013212. Springer, Heidelberg (2012). \nhttps:\/\/doi.org\/10.1007\/978-3-642-25231-0_5"},{"issue":"7","key":"2_CR44","doi-asserted-by":"publisher","first-page":"703","DOI":"10.1109\/32.83906","volume":"17","author":"EJ Weyuker","year":"1991","unstructured":"Weyuker, E.J., Jeng, B.: Analyzing partition testing strategies. IEEE Trans. Software Eng. 17(7), 703\u2013711 (1991)","journal-title":"IEEE Trans. Software Eng."},{"issue":"8","key":"2_CR45","doi-asserted-by":"publisher","first-page":"707","DOI":"10.1109\/TSE.2016.2521368","volume":"42","author":"W Wong","year":"2016","unstructured":"Wong, W., Gao, R., Li, Y., Abreu, R., Wotawa, F.: A survey on software fault localization. IEEE Trans. Software Eng. 42(8), 707\u2013740 (2016)","journal-title":"IEEE Trans. Software Eng."},{"issue":"10","key":"2_CR46","doi-asserted-by":"publisher","first-page":"869","DOI":"10.1109\/TSE.2005.107","volume":"31","author":"T Xie","year":"2005","unstructured":"Xie, T., Notkin, D.: Checking inside the black box: regression testing by comparing value spectra. IEEE Trans. Software Eng. 31(10), 869\u2013883 (2005)","journal-title":"IEEE Trans. Software Eng."},{"issue":"4","key":"2_CR47","doi-asserted-by":"publisher","first-page":"366","DOI":"10.1145\/267580.267590","volume":"29","author":"H Zhu","year":"1997","unstructured":"Zhu, H., Hall, P.A.V., May, J.H.R.: Software unit test coverage and adequacy. ACM Comput. Surv. 29(4), 366\u2013427 (1997)","journal-title":"ACM Comput. Surv."}],"container-title":["Lecture Notes in Business Information Processing","Web Information Systems and Technologies"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-35330-8_2","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,1,16]],"date-time":"2020-01-16T12:16:43Z","timestamp":1579177003000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-030-35330-8_2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019]]},"ISBN":["9783030353292","9783030353308"],"references-count":47,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-35330-8_2","relation":{},"ISSN":["1865-1348","1865-1356"],"issn-type":[{"type":"print","value":"1865-1348"},{"type":"electronic","value":"1865-1356"}],"subject":[],"published":{"date-parts":[[2019]]},"assertion":[{"value":"17 January 2020","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"WEBIST","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Web Information Systems and Technologies","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Seville","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Spain","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2018","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"18 September 2018","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"20 September 2018","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"14","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"webist2018","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.webist.org\/?y=2018","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}