{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,17]],"date-time":"2025-12-17T08:47:10Z","timestamp":1765961230992},"publisher-location":"Cham","reference-count":12,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030420673"},{"type":"electronic","value":"9783030420680"}],"license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020]]},"DOI":"10.1007\/978-3-030-42068-0_11","type":"book-chapter","created":{"date-parts":[[2020,3,9]],"date-time":"2020-03-09T00:02:15Z","timestamp":1583712135000},"page":"176-192","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["Design Considerations for EM Pulse Fault\u00a0Injection"],"prefix":"10.1007","author":[{"given":"Arthur","family":"Beckers","sequence":"first","affiliation":[]},{"given":"Masahiro","family":"Kinugawa","sequence":"additional","affiliation":[]},{"given":"Yuichi","family":"Hayashi","sequence":"additional","affiliation":[]},{"given":"Daisuke","family":"Fujimoto","sequence":"additional","affiliation":[]},{"given":"Josep","family":"Balasch","sequence":"additional","affiliation":[]},{"given":"Benedikt","family":"Gierlichs","sequence":"additional","affiliation":[]},{"given":"Ingrid","family":"Verbauwhede","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2020,3,9]]},"reference":[{"key":"11_CR1","doi-asserted-by":"crossref","unstructured":"Balasch, J., Arumi, D., Manich, S.: Design and validation of a platform for electromagnetic fault injection. In: DCIS 2017, pp. 1\u20136. IEEE (2017)","DOI":"10.1109\/DCIS.2017.8311630"},{"issue":"2","key":"11_CR2","doi-asserted-by":"publisher","first-page":"370","DOI":"10.1109\/JPROC.2005.862424","volume":"94","author":"H Bar-El","year":"2006","unstructured":"Bar-El, H., Choukri, H., Naccache, D., Tunstall, M., Whelan, C.: The sorcerer\u2019s apprentice guide to fault attacks. Proc. IEEE 94(2), 370\u2013382 (2006)","journal-title":"Proc. IEEE"},{"key":"11_CR3","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"37","DOI":"10.1007\/3-540-69053-0_4","volume-title":"Advances in Cryptology \u2014 EUROCRYPT \u201997","author":"D Boneh","year":"1997","unstructured":"Boneh, D., DeMillo, R.A., Lipton, R.J.: On the importance of checking cryptographic protocols for faults. In: Fumy, W. (ed.) EUROCRYPT 1997. LNCS, vol. 1233, pp. 37\u201351. Springer, Heidelberg (1997). \nhttps:\/\/doi.org\/10.1007\/3-540-69053-0_4"},{"key":"11_CR4","unstructured":"Cui, A., Housley, R.: BADFET: defeating modern secure boot using second-order pulsed electromagnetic fault injection. In: 11th USENIX Workshop on Offensive Technologies (WOOT 2017). USENIX Association, Vancouver (2017)"},{"key":"11_CR5","doi-asserted-by":"crossref","unstructured":"Dumont, M., Lisart, M., Maurine, P.: Electromagnetic fault injection: how faults occur. In: FDTC 2019, pp. 9\u201316. IEEE (2019)","DOI":"10.1109\/FDTC.2019.00010"},{"key":"11_CR6","volume-title":"Physics: Principles with Applications","author":"DC Giancoli","year":"2014","unstructured":"Giancoli, D.C.: Physics: Principles with Applications. Pearson, Boston (2014)"},{"key":"11_CR7","doi-asserted-by":"crossref","unstructured":"Maurine, P.: Techniques for EM fault injection: equipments and experimental results. In: FDTC 2012, pp. 3\u20134 (2012)","DOI":"10.1109\/FDTC.2012.21"},{"key":"11_CR8","doi-asserted-by":"crossref","unstructured":"Moro, N., Dehbaoui, A., Heydemann, K., Robisson, B., Encrenaz, E.: Electromagnetic fault injection: towards a fault model on a 32-bit microcontroller. In: Fischer, W., Schmidt, J. (eds.) FDTC 2013, pp. 77\u201388. IEEE (2013)","DOI":"10.1109\/FDTC.2013.9"},{"key":"11_CR9","first-page":"949","volume-title":"EMC 2013","author":"R Omarouayache","year":"2013","unstructured":"Omarouayache, R., Raoult, J., Jarrix, S., Chusseau, L., Maurine, P.: Magnetic microprobe design for EM fault attack. In: Catrysse, J., Pissoort, D. (eds.) EMC 2013, pp. 949\u2013954. IEEE Computer Society, Brugge (2013)"},{"key":"11_CR10","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"245","DOI":"10.1007\/978-3-319-16763-3_15","volume-title":"Smart Card Research and Advanced Applications","author":"S Ordas","year":"2015","unstructured":"Ordas, S., Guillaume-Sage, L., Tobich, K., Dutertre, J.-M., Maurine, P.: Evidence of a larger EM-induced fault model. In: Joye, M., Moradi, A. (eds.) CARDIS 2014. LNCS, vol. 8968, pp. 245\u2013259. Springer, Cham (2015). \nhttps:\/\/doi.org\/10.1007\/978-3-319-16763-3_15"},{"key":"11_CR11","unstructured":"Quisquater, J.J., Samyde, D.: Eddy current for magnetic analysis with active sensor. In: Esmart 2002 (2002)"},{"key":"11_CR12","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1007\/3-540-36400-5_2","volume-title":"Cryptographic Hardware and Embedded Systems - CHES 2002","author":"SP Skorobogatov","year":"2003","unstructured":"Skorobogatov, S.P., Anderson, R.J.: Optical fault induction attacks. In: Kaliski, B.S., Ko\u00e7, K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 2\u201312. Springer, Heidelberg (2003). \nhttps:\/\/doi.org\/10.1007\/3-540-36400-5_2"}],"container-title":["Lecture Notes in Computer Science","Smart Card Research and Advanced Applications"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-42068-0_11","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,3,9]],"date-time":"2020-03-09T00:03:18Z","timestamp":1583712198000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-030-42068-0_11"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"ISBN":["9783030420673","9783030420680"],"references-count":12,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-42068-0_11","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2020]]},"assertion":[{"value":"9 March 2020","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"CARDIS","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Smart Card Research and Advanced Applications","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Prague","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Czech Republic","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2019","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"11 November 2019","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"13 November 2019","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"18","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"cardis2019","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/cardis2019.fit.cvut.cz\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EasyChair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"31","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"15","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"48% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}