{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,23]],"date-time":"2026-01-23T20:27:17Z","timestamp":1769200037427,"version":"3.49.0"},"publisher-location":"Cham","reference-count":35,"publisher":"Springer International Publishing","isbn-type":[{"value":"9783030519643","type":"print"},{"value":"9783030519650","type":"electronic"}],"license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020]]},"DOI":"10.1007\/978-3-030-51965-0_43","type":"book-chapter","created":{"date-parts":[[2020,8,8]],"date-time":"2020-08-08T15:04:30Z","timestamp":1596899070000},"page":"492-503","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":25,"title":["Search-Based Wrapper Feature Selection Methods in Software Defect Prediction: An Empirical Analysis"],"prefix":"10.1007","author":[{"given":"Abdullateef O.","family":"Balogun","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shuib","family":"Basri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Said A.","family":"Jadid","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Saipunidzam","family":"Mahamad","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Malek A.","family":"Al-momani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Amos O.","family":"Bajeh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ammar K.","family":"Alazzawi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2020,8,9]]},"reference":[{"key":"43_CR1","first-page":"3213","volume":"14","author":"HA Mojeed","year":"2019","unstructured":"Mojeed, H.A., Bajeh, A.O., Balogun, A.O., Adeleke, H.O.: Memetic approach for multi-objective overtime planning in software engineering projects. J. Eng. Sci. Technol. 14, 3213\u20133233 (2019)","journal-title":"J. Eng. Sci. Technol."},{"key":"43_CR2","first-page":"3294","volume":"14","author":"AO Balogun","year":"2019","unstructured":"Balogun, A.O., Basri, S., Abdulkadir, S.J., Adeyemo, V.E., Imam, A.A., Bajeh, A.O.: Software defect prediction: analysis of class imbalance and performance stability. J. Eng. Sci. Technol. 14, 3294\u20133308 (2019)","journal-title":"J. Eng. Sci. Technol."},{"key":"43_CR3","first-page":"44","volume":"11","author":"A Iqbal","year":"2019","unstructured":"Iqbal, A., Aftab, S., Matloob, F.: Performance analysis of resampling techniques on class imbalance issue in software defect prediction. Int. J. Inf. Technol. Comput. Sci. 11, 44\u201354 (2019)","journal-title":"Int. J. Inf. Technol. Comput. Sci."},{"issue":"12","key":"43_CR4","doi-asserted-by":"publisher","first-page":"14","DOI":"10.5815\/ijmecs.2019.12.01","volume":"11","author":"F Matloob","year":"2019","unstructured":"Matloob, F., Aftab, S., Iqbal, A.: A framework for software defect prediction using feature selection and ensemble learning techniques. Int. J. Mod. Educ. Comput. Sci. 11(12), 14\u201320 (2019)","journal-title":"Int. J. Mod. Educ. Comput. Sci."},{"key":"43_CR5","doi-asserted-by":"crossref","unstructured":"Basri, S., Almomani, M.A., Imam, A.A., Thangiah, M., Gilal, A.R., Balogun, A.O.: The organisational factors of software process improvement in small software industry: comparative study. In: International Conference of Reliable Information and Communication Technology, pp. 1132\u20131143. Springer, Johor (2019)","DOI":"10.1007\/978-3-030-33582-3_106"},{"key":"43_CR6","doi-asserted-by":"crossref","unstructured":"Mabayoje, M.A., Balogun, A.O., Jibril, H.A., Atoyebi, J.O., Mojeed, H.A., Adeyemo, V.E.: Parameter tuning in KNN for software defect prediction: an empirical analysis. Jurnal Teknologi dan Sistem Komputer 7 (2019)","DOI":"10.14710\/jtsiskom.7.4.2019.121-126"},{"key":"43_CR7","doi-asserted-by":"crossref","unstructured":"Li, L., Lessmann, S., Baesens, B.: Evaluating software defect prediction performance: an updated benchmarking study. arXiv preprint arXiv:1901.01726 (2019)","DOI":"10.2139\/ssrn.3312070"},{"key":"43_CR8","doi-asserted-by":"publisher","first-page":"1092","DOI":"10.1109\/TSE.2016.2553030","volume":"42","author":"C Tantithamthavorn","year":"2016","unstructured":"Tantithamthavorn, C., McIntosh, S., Hassan, A.E., Matsumoto, K.: comments on \u201cresearcher bias: the use of machine learning in software defect prediction\u201d. IEEE Trans. Softw. Eng. 42, 1092\u20131094 (2016)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"43_CR9","doi-asserted-by":"publisher","first-page":"874","DOI":"10.1109\/TSE.2017.2720603","volume":"44","author":"J Nam","year":"2017","unstructured":"Nam, J., Fu, W., Kim, S., Menzies, T., Tan, L.: Heterogeneous defect prediction. IEEE Trans. Softw. Eng. 44, 874\u2013896 (2017)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"43_CR10","doi-asserted-by":"crossref","first-page":"134","DOI":"10.46792\/fuoyejet.v3i1.178","volume":"3","author":"AG Akintola","year":"2018","unstructured":"Akintola, A.G., Balogun, A.O., Lafenwa-Balogun, F., Mojeed, H.A.: Comparative analysis of selected heterogeneous classifiers for software defects prediction using filter-based feature selection methods. FUOYE J. Eng. Technol. 3, 134\u2013137 (2018)","journal-title":"FUOYE J. Eng. Technol."},{"issue":"2","key":"43_CR11","doi-asserted-by":"publisher","first-page":"525","DOI":"10.1007\/s11219-016-9353-3","volume":"26","author":"D Bowes","year":"2017","unstructured":"Bowes, D., Hall, T., Petri\u0107, J.: Software defect prediction: do different classifiers find the same defects? Softw. Qual. J. 26(2), 525\u2013552 (2017). https:\/\/doi.org\/10.1007\/s11219-016-9353-3","journal-title":"Softw. Qual. J."},{"key":"43_CR12","first-page":"1","volume":"2","author":"MA Mabayoje","year":"2019","unstructured":"Mabayoje, M.A., Balogun, A.O., Bello, S.M., Atoyebi, J.O., Mojeed, H.A., Ekundayo, A.H.: Wrapper feature selection based heterogeneous classifiers for software defect prediction. Adeleke Univ. J. Eng. Technol. 2, 1\u201311 (2019)","journal-title":"Adeleke Univ. J. Eng. Technol."},{"key":"43_CR13","doi-asserted-by":"crossref","unstructured":"Gao, K., Khoshgoftaar, T.M., Wang, H., Seliya, N.: Choosing software metrics for defect prediction: an investigation on feature selection techniques. Softw.: Pract. Exp. 41, 579\u2013606 (2011)","DOI":"10.1002\/spe.1043"},{"key":"43_CR14","doi-asserted-by":"crossref","first-page":"50","DOI":"10.46792\/fuoyejet.v3i2.200","volume":"3","author":"AO Balogun","year":"2018","unstructured":"Balogun, A.O., Bajeh, A.O., Orie, V.A., Yusuf-Asaju, W.A.: Software defect prediction using ensemble learning: an ANP based evaluation method. FUOYE J. Eng. Technol. 3, 50\u201355 (2018)","journal-title":"FUOYE J. Eng. Technol."},{"key":"43_CR15","first-page":"106","volume":"25","author":"R Jimoh","year":"2018","unstructured":"Jimoh, R., Balogun, A., Bajeh, A., Ajayi, S.: A PROMETHEE based evaluation of software defect predictors. J. Comput. Sci. Appl. 25, 106\u2013119 (2018)","journal-title":"J. Comput. Sci. Appl."},{"key":"43_CR16","doi-asserted-by":"crossref","unstructured":"Xu, Z., Liu, J., Yang, Z., An, G., Jia, X.: The impact of feature selection on defect prediction performance: An empirical comparison. In: 2016 IEEE 27th International Symposium on Software Reliability Engineering (ISSRE), pp. 309\u2013320. IEEE (2016)","DOI":"10.1109\/ISSRE.2016.13"},{"key":"43_CR17","first-page":"63","volume":"7","author":"AO Ameen","year":"2016","unstructured":"Ameen, A.O., Balogun, A.O., Usman, G., Fashoto, G.S.: Heterogeneous ensemble methods based on filter feature selection. Comput. Inf. Syst. Dev. Inform. J. 7, 63\u201378 (2016)","journal-title":"Comput. Inf. Syst. Dev. Inform. J."},{"key":"43_CR18","doi-asserted-by":"crossref","unstructured":"Ghotra, B., McIntosh, S., Hassan, A.E.: A large-scale study of the impact of feature selection techniques on defect classification models. In: 2017 IEEE\/ACM 14th International Conference on Mining Software Repositories (MSR), pp. 146\u2013157. IEEE (2017)","DOI":"10.1109\/MSR.2017.18"},{"key":"43_CR19","doi-asserted-by":"publisher","first-page":"1324","DOI":"10.4304\/jsw.9.5.1324-1333","volume":"9","author":"RS Wahono","year":"2014","unstructured":"Wahono, R.S., Suryana, N., Ahmad, S.: Metaheuristic optimization based feature selection for software defect prediction. J. Softw. 9, 1324\u20131333 (2014)","journal-title":"J. Softw."},{"key":"43_CR20","doi-asserted-by":"publisher","first-page":"356","DOI":"10.1109\/TSE.2010.90","volume":"37","author":"Q Song","year":"2010","unstructured":"Song, Q., Jia, Z., Shepperd, M., Ying, S., Liu, J.: A general software defect-proneness prediction framework. IEEE Trans. Softw. Eng. 37, 356\u2013370 (2010)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"43_CR21","doi-asserted-by":"crossref","unstructured":"Muthukumaran, K., Rallapalli, A., Murthy, N.B.: Impact of feature selection techniques on bug prediction models. In: Proceedings of the 8th India Software Engineering Conference, pp. 120\u2013129 (2015)","DOI":"10.1145\/2723742.2723754"},{"key":"43_CR22","doi-asserted-by":"crossref","unstructured":"Rodr\u00edguez, D., Ruiz, R., Cuadrado-Gallego, J., Aguilar-Ruiz, J.: Detecting fault modules applying feature selection to classifiers. In: 2007 IEEE International Conference on Information Reuse and Integration, pp. 667\u2013672. IEEE (2007)","DOI":"10.1109\/IRI.2007.4296696"},{"key":"43_CR23","doi-asserted-by":"publisher","first-page":"39496","DOI":"10.1109\/ACCESS.2019.2906757","volume":"7","author":"Q Al-Tashi","year":"2019","unstructured":"Al-Tashi, Q., Abdulkadir, S.J., Rais, H.M., Mirjalili, S., Alhussian, H.: Binary optimization using hybrid grey wolf optimization for feature selection. IEEE Access 7, 39496\u201339508 (2019)","journal-title":"IEEE Access"},{"key":"43_CR24","doi-asserted-by":"publisher","first-page":"265","DOI":"10.1587\/transinf.2016EDP7204","volume":"100","author":"Q Yu","year":"2017","unstructured":"Yu, Q., Jiang, S., Zhang, Y.: The performance stability of defect prediction models with class imbalance: an empirical study. IEICE Trans. Inf. Syst. 100, 265\u2013272 (2017)","journal-title":"IEICE Trans. Inf. Syst."},{"key":"43_CR25","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1109\/TSE.2007.256941","volume":"33","author":"T Menzies","year":"2007","unstructured":"Menzies, T., Greenwald, J., Frank, A.: Data mining static code attributes to learn defect predictors. IEEE Trans. Softw. Eng. 33, 2\u201313 (2007)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"43_CR26","doi-asserted-by":"publisher","first-page":"485","DOI":"10.1109\/TSE.2008.35","volume":"34","author":"S Lessmann","year":"2008","unstructured":"Lessmann, S., Baesens, B., Mues, C., Pietsch, S.: Benchmarking classification models for software defect prediction: a proposed framework and novel findings. IEEE Trans. Softw. Eng. 34, 485\u2013496 (2008)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"43_CR27","doi-asserted-by":"publisher","first-page":"1208","DOI":"10.1109\/TSE.2013.11","volume":"39","author":"M Shepperd","year":"2013","unstructured":"Shepperd, M., Song, Q., Sun, Z., Mair, C.: Data quality: Some comments on the NASA software defect datasets. IEEE Trans. Softw. Eng. 39, 1208\u20131215 (2013)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"4","key":"43_CR28","doi-asserted-by":"publisher","first-page":"1925","DOI":"10.1007\/s10664-018-9679-5","volume":"24","author":"M Kondo","year":"2019","unstructured":"Kondo, M., Bezemer, C.-P., Kamei, Y., Hassan, A.E., Mizuno, O.: The impact of feature reduction techniques on defect prediction models. Empirical Softw. Eng. 24(4), 1925\u20131963 (2019). https:\/\/doi.org\/10.1007\/s10664-018-9679-5","journal-title":"Empirical Softw. Eng."},{"key":"43_CR29","doi-asserted-by":"publisher","first-page":"2764","DOI":"10.3390\/app9132764","volume":"9","author":"AO Balogun","year":"2019","unstructured":"Balogun, A.O., Basri, S., Abdulkadir, S.J., Hashim, A.S.: Performance analysis of feature selection methods in software defect prediction: a search method approach. Appl. Sci. 9, 2764 (2019)","journal-title":"Appl. Sci."},{"key":"43_CR30","doi-asserted-by":"crossref","unstructured":"Rathore, S.S., Gupta, A.: A comparative study of feature-ranking and feature-subset selection techniques for improved fault prediction. In: Proceedings of the 7th India Software Engineering Conference, p. 7. ACM (2014)","DOI":"10.1145\/2590748.2590755"},{"key":"43_CR31","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-7138-7","volume-title":"An Introduction to Statistical Learning","author":"G James","year":"2013","unstructured":"James, G., Witten, D., Hastie, T., Tibshirani, R.: An Introduction to Statistical Learning. Springer, Heidelberg (2013)"},{"key":"43_CR32","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-6849-3","volume-title":"Applied Predictive Modeling","author":"M Kuhn","year":"2013","unstructured":"Kuhn, M., Johnson, K.: Applied Predictive Modeling. Springer, Heidelberg (2013)"},{"key":"43_CR33","doi-asserted-by":"publisher","first-page":"10","DOI":"10.1145\/1656274.1656278","volume":"11","author":"M Hall","year":"2009","unstructured":"Hall, M., Frank, E., Holmes, G., Pfahringer, B., Reutemann, P., Witten, I.H.: The WEKA data mining software: an update. ACM Sig. Exp. 11, 10\u201318 (2009)","journal-title":"ACM Sig. Exp."},{"issue":"7","key":"43_CR34","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TSE.2018.2876537","volume":"45","author":"C Tantithamthavorn","year":"2018","unstructured":"Tantithamthavorn, C., McIntosh, S., Hassan, A.E., Matsumoto, K.: The impact of automated parameter optimization on defect prediction models. IEEE Trans. Softw. Eng. 45(7), 1\u201332 (2018)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"43_CR35","doi-asserted-by":"crossref","unstructured":"Chen, X., Shen, Y., Cui, Z., Ju, X.: Applying feature selection to software defect prediction using multi-objective optimization. In: 2017 IEEE 41st Annual Computer Software and Applications Conference (COMPSAC), vol. 2, pp. 54\u201359. IEEE (2017)","DOI":"10.1109\/COMPSAC.2017.65"}],"container-title":["Advances in Intelligent Systems and Computing","Intelligent Algorithms in Software Engineering"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-51965-0_43","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,3,28]],"date-time":"2021-03-28T01:46:10Z","timestamp":1616895970000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-030-51965-0_43"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"ISBN":["9783030519643","9783030519650"],"references-count":35,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-51965-0_43","relation":{},"ISSN":["2194-5357","2194-5365"],"issn-type":[{"value":"2194-5357","type":"print"},{"value":"2194-5365","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]},"assertion":[{"value":"9 August 2020","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"CSOC","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Computer Science On-line Conference","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Zlin","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Czech Republic","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2020","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"15 July 2020","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"15 July 2020","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"9","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"csolc2020","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/csoc.openpublish.eu","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}