{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,28]],"date-time":"2025-03-28T06:14:09Z","timestamp":1743142449812,"version":"3.40.3"},"publisher-location":"Cham","reference-count":20,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030532727"},{"type":"electronic","value":"9783030532734"}],"license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020]]},"DOI":"10.1007\/978-3-030-53273-4_6","type":"book-chapter","created":{"date-parts":[[2020,7,22]],"date-time":"2020-07-22T09:07:29Z","timestamp":1595408849000},"page":"115-137","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Efficient Soft Error Vulnerability Analysis Using Non-intrusive Fault Injection Techniques"],"prefix":"10.1007","author":[{"given":"Vitor","family":"Bandeira","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Felipe","family":"Rosa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ricardo","family":"Reis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luciano","family":"Ost","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2020,7,22]]},"reference":[{"issue":"3","key":"6_CR1","doi-asserted-by":"publisher","first-page":"305","DOI":"10.1109\/TDMR.2005.853449","volume":"5","author":"R Baumann","year":"2005","unstructured":"Baumann, R.: Radiation-induced soft errors in advanced semiconductor technologies. IEEE Trans. Device Mater. Reliab. 5(3), 305\u2013316 (2005)","journal-title":"IEEE Trans. Device Mater. Reliab."},{"issue":"2","key":"6_CR2","doi-asserted-by":"publisher","first-page":"129","DOI":"10.1177\/1094342014522573","volume":"28","author":"M Snir","year":"2014","unstructured":"Snir, M., et al.: Addressing failures in exascale computing. Int. J. High Perform. Comput. Appl. 28(2), 129\u2013173 (2014)","journal-title":"Int. J. High Perform. Comput. Appl."},{"key":"6_CR3","doi-asserted-by":"crossref","unstructured":"Kaliorakis, M., Tselonis, S., Chatzidimitriou, A., Foutris, N., Gizopoulos, D.: Differential fault injection on microarchitectural simulators. In: International Symposium on Workload Characterization, Atlanta, GA, USA, pp. 172\u2013182. IEEE (October 2015)","DOI":"10.1109\/IISWC.2015.28"},{"key":"6_CR4","doi-asserted-by":"crossref","unstructured":"Didehban, M., Shrivastava, A.: nZDC: a compiler technique for near zero silent data corruption. In: Design Automation Conference, Austin, Texas. ACM Press (2016)","DOI":"10.1145\/2897937.2898054"},{"key":"6_CR5","doi-asserted-by":"crossref","unstructured":"Tanikella, K., Koy, Y., Jeyapaul, R., Kyoungwoo, L., Shrivastava, A.: gemV: a validated toolset for the early exploration of system reliability. In: International Conference on Application-Specific Systems, Architectures and Processors, London, United Kingdom, pp. 159\u2013163. IEEE (July 2016)","DOI":"10.1109\/ASAP.2016.7760786"},{"key":"6_CR6","doi-asserted-by":"crossref","unstructured":"Bandeira, V., Rosa, F., Reis, R., Ost, L.: Non-intrusive fault injection techniques for efficient soft error vulnerability analysis. In: International Conference on Very Large Scale Integration (VLSI-SoC), Cuzco, Peru, pp. 123\u2013128. IEEE (October 2019)","DOI":"10.1109\/VLSI-SoC.2019.8920378"},{"key":"6_CR7","doi-asserted-by":"crossref","unstructured":"Hari, S.K.S., Adve, S.V., Naeimi, H., Ramachandran, P.: Relyzer: exploiting application-level fault equivalence to analyze application resiliency to transient faults. In: International Conference on Architectural Support for Programming Languages and Operating Systems, New York, NY, USA, Association for Computing Machinery, pp. 123\u2013134 (2012)","DOI":"10.1145\/2248487.2150990"},{"issue":"2","key":"6_CR8","doi-asserted-by":"publisher","first-page":"50","DOI":"10.1109\/2.982916","volume":"35","author":"P Magnusson","year":"2002","unstructured":"Magnusson, P., et al.: Simics: a full system simulation platform. Computer 35(2), 50\u201358 (2002)","journal-title":"Computer"},{"issue":"4","key":"6_CR9","doi-asserted-by":"publisher","first-page":"92","DOI":"10.1145\/1105734.1105747","volume":"33","author":"MMK Martin","year":"2005","unstructured":"Martin, M.M.K., et al.: Multifacet\u2019s general execution-driven multiprocessor simulator (GEMS) toolset. ACM SIGARCH Comput. Archit. News 33(4), 92 (2005)","journal-title":"ACM SIGARCH Comput. Archit. News"},{"key":"6_CR10","doi-asserted-by":"crossref","unstructured":"de Aguiar Geissler, F., Kastensmidt, F.L., Souza, J.E.P.: Soft error injection methodology based on QEMU software platform. In: Latin American Test Workshop, Fortaleza, Brazil. IEEE (March 2014)","DOI":"10.1109\/LATW.2014.6841910"},{"key":"6_CR11","unstructured":"Guan, Q., et al.: Design, use and evaluation of P-FSEFI: a parallel soft error fault injection framework for emulating soft errors in parallel applications. In: International Conference on Simulation Tools and Techniques, Brussels, BEL, ICST (Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering), pp. 9\u201317 (2016)"},{"key":"6_CR12","doi-asserted-by":"crossref","unstructured":"Guan, Q., Debardeleben, N., Blanchard, S., Fu, S.: F-SEFI: a fine-grained soft error fault injection tool for profiling application vulnerability. In: International Parallel and Distributed Processing Symposium, Phoenix, AZ, USA, pp. 1245\u20131254. IEEE (May 2014)","DOI":"10.1109\/IPDPS.2014.128"},{"key":"6_CR13","doi-asserted-by":"crossref","unstructured":"Rosa, F., Kastensmidt, F., Reis, R., Ost, L.: A fast and scalable fault injection framework to evaluate multi\/many-core soft error reliability. In: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Amherst, MA, USA, pp. 211\u2013214. IEEE (October 2015)","DOI":"10.1109\/DFT.2015.7315164"},{"key":"6_CR14","doi-asserted-by":"crossref","unstructured":"Feng, S., Gupta, S., Ansari, A., Mahlke, S.: Shoestring: probabilistic soft error reliability on the cheap. In: International Conference on Architectural Support for Programming Languages and Operating Systems, ASPLOS XV, New York, NY, USA, Association for Computing Machinery, pp. 385\u2013396 (2010)","DOI":"10.1145\/1736020.1736063"},{"key":"6_CR15","doi-asserted-by":"crossref","unstructured":"Cho, H., Mirkhani, S., Cher, C.Y., Abraham, J.A., Mitra, S.: Quantitative evaluation of soft error injection techniques for robust system design. In: Design Automation Conference, Austin, Texas. ACM Press (2013)","DOI":"10.1145\/2463209.2488859"},{"key":"6_CR16","unstructured":"Bailey, D.H., et al.: The NAS parallel benchmarks-summary and preliminary results. In: Conference on Supercomputing, Albuquerque, New Mexico, United States. ACM Press (1991)"},{"key":"6_CR17","unstructured":"Redmon, J.: Darknet: open source neural networks in C (2016). https:\/\/pjreddie.com\/darknet\/"},{"key":"6_CR18","unstructured":"Dukhan, M.: Maratyszcza\/NNPACK (February 2020)"},{"key":"6_CR19","unstructured":"Redmon, J., Farhadi, A.: YOLOv3: an incremental improvement. arXiv:1804.02767 (2018)"},{"key":"6_CR20","doi-asserted-by":"crossref","unstructured":"Menze, M., Geiger, A.: Object scene flow for autonomous vehicles. In: Conference on Computer Vision and Pattern Recognition, Boston, MA, USA, pp. 3061\u20133070. IEEE (June 2015)","DOI":"10.1109\/CVPR.2015.7298925"}],"container-title":["IFIP Advances in Information and Communication Technology","VLSI-SoC: New Technology Enabler"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-53273-4_6","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,22]],"date-time":"2024-07-22T00:02:24Z","timestamp":1721606544000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-53273-4_6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"ISBN":["9783030532727","9783030532734"],"references-count":20,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-53273-4_6","relation":{},"ISSN":["1868-4238","1868-422X"],"issn-type":[{"type":"print","value":"1868-4238"},{"type":"electronic","value":"1868-422X"}],"subject":[],"published":{"date-parts":[[2020]]},"assertion":[{"value":"22 July 2020","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"VLSI-SoC","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"IFIP\/IEEE International Conference on Very Large Scale Integration - System on a Chip","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Cusco","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Peru","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2019","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"6 October 2019","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"9 October 2019","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"27","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"vlsi-soc2019","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/vlsi-soc.pe\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"This content has been made available to all.","name":"free","label":"Free to read"}]}}