{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,8]],"date-time":"2025-09-08T06:33:07Z","timestamp":1757313187896,"version":"3.40.3"},"publisher-location":"Cham","reference-count":47,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030532901"},{"type":"electronic","value":"9783030532918"}],"license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0"},{"start":{"date-parts":[[2020,7,14]],"date-time":"2020-07-14T00:00:00Z","timestamp":1594684800000},"content-version":"vor","delay-in-days":195,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020]]},"DOI":"10.1007\/978-3-030-53291-8_33","type":"book-chapter","created":{"date-parts":[[2020,7,15]],"date-time":"2020-07-15T20:03:35Z","timestamp":1594843415000},"page":"658-680","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["Must Fault Localization for Program Repair"],"prefix":"10.1007","author":[{"given":"Bat-Chen","family":"Rothenberg","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Orna","family":"Grumberg","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2020,7,14]]},"reference":[{"key":"33_CR1","doi-asserted-by":"crossref","unstructured":"Abreu, R., Zoeteweij, P., Van Gemund, A.J.C.: An evaluation of similarity coefficients for software fault localization. In: Proceedings of the 12th Pacific Rim International Symposium on Dependable Computing, PRDC 2006, pp. 39\u201346 (2006)","DOI":"10.1109\/PRDC.2006.18"},{"key":"33_CR2","doi-asserted-by":"crossref","unstructured":"Agrawal, H., Horgan, J.R.: Dynamic Program Slicing. In: PLDI, pp. 246\u2013256 (1990)","DOI":"10.1145\/93548.93576"},{"key":"33_CR3","series-title":"Advances in Intelligent Systems and Computing","doi-asserted-by":"publisher","first-page":"256","DOI":"10.1007\/978-3-030-03405-4_17","volume-title":"Advances in Information and Communication Networks","author":"FY Assiri","year":"2019","unstructured":"Assiri, F.Y., Bieman, J.M.: MUT-APR: MUTation-based automated program repair research tool. In: Arai, K., Kapoor, S., Bhatia, R. (eds.) FICC 2018. AISC, vol. 887, pp. 256\u2013270. Springer, Cham (2019). \n                    https:\/\/doi.org\/10.1007\/978-3-030-03405-4_17"},{"issue":"2","key":"33_CR4","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/3147426","volume":"17","author":"PC Attie","year":"2017","unstructured":"Attie, P.C., Dak, K., Bab, A.L., Sakr, M.: Model and program repair via SAT solving. ACM Trans. Embed. Comput. Syst. 17(2), 1\u201325 (2017)","journal-title":"ACM Trans. Embed. Comput. Syst."},{"key":"33_CR5","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"260","DOI":"10.1007\/978-3-642-39611-3_24","volume-title":"Hardware and Software: Verification and Testing","author":"R Bloem","year":"2013","unstructured":"Bloem, R., Drechsler, R., Fey, G., Finder, A., Hofferek, G., K\u00f6nighofer, R., Raik, J., Repinski, U., S\u00fclflow, A.: FoREnSiC\u2013 an automatic debugging environment for C programs. In: Biere, A., Nahir, A., Vos, T. (eds.) HVC 2012. LNCS, vol. 7857, pp. 260\u2013265. Springer, Heidelberg (2013). \n                    https:\/\/doi.org\/10.1007\/978-3-642-39611-3_24"},{"key":"33_CR6","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"189","DOI":"10.1007\/978-3-642-35873-9_13","volume-title":"Verification, Model Checking, and Abstract Interpretation","author":"J Christ","year":"2013","unstructured":"Christ, J., Ermis, E., Sch\u00e4f, M., Wies, T.: Flow-sensitive fault localization. In: Giacobazzi, R., Berdine, J., Mastroeni, I. (eds.) VMCAI 2013. LNCS, vol. 7737, pp. 189\u2013208. Springer, Heidelberg (2013). \n                    https:\/\/doi.org\/10.1007\/978-3-642-35873-9_13"},{"key":"33_CR7","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"226","DOI":"10.1007\/978-3-030-17462-0_13","volume-title":"Tools and Algorithms for the Construction and Analysis of Systems","author":"M Christakis","year":"2019","unstructured":"Christakis, M., Heizmann, M., Mansur, M.N., Schilling, C., W\u00fcstholz, V.: Semantic fault localization and suspiciousness ranking. In: Vojnar, T., Zhang, L. (eds.) TACAS 2019. LNCS, vol. 11427, pp. 226\u2013243. Springer, Cham (2019). \n                    https:\/\/doi.org\/10.1007\/978-3-030-17462-0_13"},{"key":"33_CR8","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"168","DOI":"10.1007\/978-3-540-24730-2_15","volume-title":"Tools and Algorithms for the Construction and Analysis of Systems","author":"E Clarke","year":"2004","unstructured":"Clarke, E., Kroening, D., Lerda, F.: A tool for checking ANSI-C programs. In: Jensen, K., Podelski, A. (eds.) TACAS 2004. LNCS, vol. 2988, pp. 168\u2013176. Springer, Heidelberg (2004). \n                    https:\/\/doi.org\/10.1007\/978-3-540-24730-2_15"},{"key":"33_CR9","unstructured":"Clarke, E., Kroening, D., Yorav, K.: Behavioral consistency of C and Verilog programs using bounded model checking. In: Proceedings of the Design Automation Conference, 2003, pp. 368\u2013371. IEEE (2003)"},{"key":"33_CR10","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"383","DOI":"10.1007\/978-3-319-41540-6_21","volume-title":"Computer Aided Verification","author":"L D\u2019Antoni","year":"2016","unstructured":"D\u2019Antoni, L., Samanta, R., Singh, R.: Qlose: program repair with quantitative objectives. In: Chaudhuri, S., Farzan, A. (eds.) CAV 2016. LNCS, vol. 9780, pp. 383\u2013401. Springer, Cham (2016). \n                    https:\/\/doi.org\/10.1007\/978-3-319-41540-6_21"},{"key":"33_CR11","doi-asserted-by":"crossref","unstructured":"Debroy, V., Wong, W.E.: Using mutation to automatically suggest fixes for faulty programs. In: 2010 Third International Conference on Software Testing, Verification and Validation (ICST), pp. 65\u201374. IEEE (2010)","DOI":"10.1109\/ICST.2010.66"},{"issue":"4","key":"33_CR12","doi-asserted-by":"publisher","first-page":"405","DOI":"10.1007\/s10664-005-3861-2","volume":"10","author":"H Do","year":"2005","unstructured":"Do, H., Elbaum, S., Rothermel, G.: Supporting controlled experimentation with testing techniques: an infrastructure and its potential impact. Empir. Softw. Eng. 10(4), 405\u2013435 (2005)","journal-title":"Empir. Softw. Eng."},{"issue":"2","key":"33_CR13","doi-asserted-by":"publisher","first-page":"188","DOI":"10.1016\/j.jss.2009.09.037","volume":"83","author":"W Eric Wong","year":"2010","unstructured":"Eric Wong, W., Debroy, V., Choi, B.: A family of code coverage-based heuristics for effective fault localization. J. Syst. Softw. 83(2), 188\u2013208 (2010)","journal-title":"J. Syst. Softw."},{"key":"33_CR14","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"187","DOI":"10.1007\/978-3-642-32759-9_17","volume-title":"FM 2012: Formal Methods","author":"E Ermis","year":"2012","unstructured":"Ermis, E., Sch\u00e4f, M., Wies, T.: Error invariants. In: Giannakopoulou, D., M\u00e9ry, D. (eds.) FM 2012. LNCS, vol. 7436, pp. 187\u2013201. Springer, Heidelberg (2012). \n                    https:\/\/doi.org\/10.1007\/978-3-642-32759-9_17"},{"key":"33_CR15","doi-asserted-by":"crossref","unstructured":"Gong, P., Zhao, R., Li, Z.: Faster mutation-based fault localization with a novel mutation execution strategy. In: Proceedings of the 2015 IEEE 8th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2015, pp. 1\u201310. IEEE (2015)","DOI":"10.1109\/ICSTW.2015.7107448"},{"key":"33_CR16","first-page":"420","volume":"242","author":"B Hofer","year":"2012","unstructured":"Hofer, B., Wotawa, F.: Spectrum enhanced dynamic slicing for better fault localization. ECAI 242, 420\u2013425 (2012)","journal-title":"ECAI"},{"key":"33_CR17","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"370","DOI":"10.1007\/978-3-319-48989-6_23","volume-title":"FM 2016: Formal Methods","author":"A Holzer","year":"2016","unstructured":"Holzer, A., Schwartz-Narbonne, D., Tabaei Befrouei, M., Weissenbacher, G., Wies, T.: Error invariants for concurrent traces. In: Fitzgerald, J., Heitmeyer, C., Gnesi, S., Philippou, A. (eds.) FM 2016. LNCS, vol. 9995, pp. 370\u2013387. Springer, Cham (2016). \n                    https:\/\/doi.org\/10.1007\/978-3-319-48989-6_23"},{"key":"33_CR18","doi-asserted-by":"crossref","unstructured":"Hong, S., Lee, B., Kwak, T., Jeon, Y., Ko, B., Kim, Y., Kim, M.: Mutation-based fault localization for real-world multilingual programs. In: ASE, pp. 464\u2013475 (2015)","DOI":"10.1109\/ASE.2015.14"},{"key":"33_CR19","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"226","DOI":"10.1007\/11513988_23","volume-title":"Computer Aided Verification","author":"B Jobstmann","year":"2005","unstructured":"Jobstmann, B., Griesmayer, A., Bloem, R.: Program repair as a game. In: Etessami, K., Rajamani, S.K. (eds.) CAV 2005. LNCS, vol. 3576, pp. 226\u2013238. Springer, Heidelberg (2005). \n                    https:\/\/doi.org\/10.1007\/11513988_23"},{"key":"33_CR20","unstructured":"Jones, J., Harrold, M., Stasko, J.: Visualization for fault localization. In: Proceedings of ICSE 2001 Workshop on Software Visualization, pp. 71\u201375 (2001)"},{"key":"33_CR21","doi-asserted-by":"crossref","unstructured":"Jose, M., Majumdar, R.: Cause clue clauses: error localization using maximum satisfiability. In: PLDI, pp. 437\u2013446 (2011)","DOI":"10.1145\/1993316.1993550"},{"key":"33_CR22","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"217","DOI":"10.1007\/978-3-319-21668-3_13","volume-title":"Computer Aided Verification","author":"E Kneuss","year":"2015","unstructured":"Kneuss, E., Koukoutos, M., Kuncak, V.: Deductive program repair. In: Kroening, D., P\u0103s\u0103reanu, C.S. (eds.) CAV 2015. LNCS, vol. 9207, pp. 217\u2013233. Springer, Cham (2015). \n                    https:\/\/doi.org\/10.1007\/978-3-319-21668-3_13"},{"key":"33_CR23","doi-asserted-by":"publisher","first-page":"155","DOI":"10.1016\/0020-0190(88)90054-3","volume":"29","author":"B Korel","year":"1988","unstructured":"Korel, B., Laski, J.: Dynamic program slicing. Inf. Process. Lett. 29, 155\u2013163 (1988)","journal-title":"Inf. Process. Lett."},{"key":"33_CR24","first-page":"88","volume":"24","author":"S-M Lamraoui","year":"2016","unstructured":"Lamraoui, S.-M., Nakajima, S.: A formula-based approach for automatic fault localization of multi-fault programs. J. Inf. Process. 24, 88\u201398 (2016)","journal-title":"J. Inf. Process."},{"key":"33_CR25","doi-asserted-by":"crossref","unstructured":"Lamraoui, S.-M., Nakajima, S., Hosobe, H.: Hardened flow-sensitive trace formula for fault localization. In: ICECCS (2015)","DOI":"10.1109\/ICECCS.2015.16"},{"issue":"1","key":"33_CR26","doi-asserted-by":"publisher","first-page":"54","DOI":"10.1109\/TSE.2011.104","volume":"38","author":"C Le Goues","year":"2012","unstructured":"Le Goues, C., Nguyen, T., Forrest, S., Weimer, W.: GenProg: a generic method for automatic software repair. IEEE Trans. Softw. Eng. 38(1), 54\u201372 (2012)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"33_CR27","doi-asserted-by":"crossref","unstructured":"Liu, K., Koyuncu, A., Bissyande, T.F., Kim, D., Klein, J., Le Traon, Y.: You cannot fix what you cannot find! An investigation of fault localization bias in benchmarking automated program repair systems. In: ICST, pp. 102\u2013113 (2019)","DOI":"10.1109\/ICST.2019.00020"},{"key":"33_CR28","doi-asserted-by":"crossref","unstructured":"Mechtaev, S., Nguyen, M.-D., Noller, Y., Grunske, L., Roychoudhury, A.: Semantic program repair using a reference implementation. In: ICSE (2018)","DOI":"10.1145\/3180155.3180247"},{"key":"33_CR29","doi-asserted-by":"crossref","unstructured":"Mechtaev, S., Yi, J., Roychoudhury, A.: Angelix: scalable multiline program patch synthesis via symbolic analysis. In: ICSE (2016)","DOI":"10.1145\/2884781.2884807"},{"key":"33_CR30","doi-asserted-by":"crossref","unstructured":"Moon, S., Kim, Y., Kim, M., Yoo, S.: Ask the mutants: mutating faulty programs for fault localization. In: ICST (2014)","DOI":"10.1109\/ICST.2014.28"},{"issue":"3","key":"33_CR31","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/2000791.2000795","volume":"20","author":"L Naish","year":"2011","unstructured":"Naish, L., Lee, H.J., Ramamohanarao, K.: A model for spectra-based software diagnosis. ACM Trans. Softw. Eng. Methodol. 20(3), 1\u201332 (2011)","journal-title":"ACM Trans. Softw. Eng. Methodol."},{"key":"33_CR32","doi-asserted-by":"crossref","unstructured":"Nguyen, H.D.T., Qi, D., Roychoudhury, A., Chandra, S.: SemFix: program repair via semantic analysis. In: Proceedings of the 2013 International Conference on Software Engineering, pp. 772\u2013781. IEEE Press (2013)","DOI":"10.1109\/ICSE.2013.6606623"},{"key":"33_CR33","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"301","DOI":"10.1007\/978-3-662-54577-5_17","volume-title":"Tools and Algorithms for the Construction and Analysis of Systems","author":"TV Nguyen","year":"2017","unstructured":"Nguyen, T.V., Weimer, W., Kapur, D., Forrest, S.: Connecting program synthesis and reachability: automatic program repair using test-input generation. In: Legay, A., Margaria, T. (eds.) TACAS 2017. LNCS, vol. 10205, pp. 301\u2013318. Springer, Heidelberg (2017). \n                    https:\/\/doi.org\/10.1007\/978-3-662-54577-5_17"},{"key":"33_CR34","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"70","DOI":"10.1007\/978-3-030-11245-5_4","volume-title":"Verification, Model Checking, and Abstract Interpretation","author":"T-T Nguyen","year":"2019","unstructured":"Nguyen, T.-T., Ta, Q.-T., Chin, W.-N.: Automatic program repair using formal verification and expression templates. In: Enea, C., Piskac, R. (eds.) VMCAI 2019. LNCS, vol. 11388, pp. 70\u201391. Springer, Cham (2019). \n                    https:\/\/doi.org\/10.1007\/978-3-030-11245-5_4"},{"issue":"3","key":"33_CR35","first-page":"195","volume":"21","author":"M Papadakis","year":"2015","unstructured":"Papadakis, M., Traon, Y.L.: Metallaxis-FL: mutation-based fault localization. Softw. Test. Verif. Reliab. 21(3), 195\u2013214 (2015)","journal-title":"Softw. Test. Verif. Reliab."},{"key":"33_CR36","doi-asserted-by":"crossref","unstructured":"Qian, J., Xu, B.: Scenario oriented program slicing. In: Proceedings of the ACM Symposium on Applied Computing, pp. 748\u20137752 (2008)","DOI":"10.1145\/1363686.1363861"},{"key":"33_CR37","doi-asserted-by":"crossref","unstructured":"Repinski, U., Hantson, H., Jenihhin, M., Raik, J., Ubar, R., Guglielmo, G.D., Pravadelli, G., Fummi, F.: Combining dynamic slicing and mutation operators for ESL correction. In: 2012 17th IEEE European Test Symposium (ETS), pp. 1\u20136. IEEE (2012)","DOI":"10.1109\/ETS.2012.6233020"},{"key":"33_CR38","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"593","DOI":"10.1007\/978-3-319-48989-6_36","volume-title":"FM 2016: Formal Methods","author":"B-C Rothenberg","year":"2016","unstructured":"Rothenberg, B.-C., Grumberg, O.: Sound and complete mutation-based program repair. In: Fitzgerald, J., Heitmeyer, C., Gnesi, S., Philippou, A. (eds.) FM 2016. LNCS, vol. 9995, pp. 593\u2013611. Springer, Cham (2016). \n                    https:\/\/doi.org\/10.1007\/978-3-319-48989-6_36"},{"key":"33_CR39","unstructured":"Rothenberg, B.-C., Grumberg, O.: Must fault localization for program repair. \n                    https:\/\/batg.cswp.cs.technion.ac.il\/wp-content\/uploads\/sites\/78\/2020\/05\/MustFaultLocalizationForProgramRepairCav2020.pdf\n                    \n                  , May 2020. A full version of the CAV 2020 paper of the same title"},{"key":"33_CR40","doi-asserted-by":"crossref","unstructured":"Sch\u00e4f, M., Schwartz-Narbonne, D., Wies, T.: Explaining inconsistent code. In: ESEC\/FSE, pp. 521\u2013531 (2013)","DOI":"10.1145\/2491411.2491448"},{"key":"33_CR41","unstructured":"Tan, S.H., Yi, J., Yulis, Mechtaev, S., Roychoudhury, A.: Codeflaws: A programming competition benchmark for evaluating automated program repair tools. In: Proceedings of the 2017 IEEE\/ACM 39th International Conference on Software Engineering Companion, ICSE-C 2017, pp. 180\u2013182 (2017)"},{"issue":"1","key":"33_CR42","doi-asserted-by":"publisher","first-page":"26","DOI":"10.1007\/s10703-015-0223-6","volume":"47","author":"C von Essen","year":"2015","unstructured":"von Essen, C., Jobstmann, B.: Program repair without regret. Form. Methods Syst. Des. 47(1), 26\u201350 (2015). \n                    https:\/\/doi.org\/10.1007\/s10703-015-0223-6","journal-title":"Form. Methods Syst. Des."},{"key":"33_CR43","doi-asserted-by":"crossref","unstructured":"Wang, Y., Patil, H., Pereira, C., Lueck, G., Gupta, R., Neamtiu, I.: DrDebug: deterministic replay based cyclic debugging with dynamic slicing. In: Proceedings of the 12th ACM\/IEEE International Symposium on Code Generation and Optimization, CGO 2014, pp. 98\u2013108 (2014)","DOI":"10.1145\/2544137.2544152"},{"issue":"1","key":"33_CR44","doi-asserted-by":"publisher","first-page":"290","DOI":"10.1109\/TR.2013.2285319","volume":"63","author":"WE Wong","year":"2014","unstructured":"Wong, W.E., Debroy, V., Gao, R., Li, Y.: The DStar method for effective software fault localization. IEEE Trans. Reliab. 63(1), 290\u2013308 (2014)","journal-title":"IEEE Trans. Reliab."},{"key":"33_CR45","doi-asserted-by":"crossref","unstructured":"Wotawa, F.: Fault localization based on dynamic slicing and hitting-set computation. In: Proceedings of the International Conference on Quality Software, pp. 161\u2013170 (2010)","DOI":"10.1109\/QSIC.2010.51"},{"issue":"2","key":"33_CR46","doi-asserted-by":"publisher","first-page":"143","DOI":"10.1007\/s10664-006-9007-3","volume":"12","author":"X Zhang","year":"2007","unstructured":"Zhang, X., Gupta, N., Gupta, R.: A study of effectiveness of dynamic slicing in locating real faults. Empir. Softw. Eng. 12(2), 143\u2013160 (2007)","journal-title":"Empir. Softw. Eng."},{"issue":"7","key":"33_CR47","first-page":"661","volume":"39","author":"X Zhang","year":"2007","unstructured":"Zhang, X., Gupta, N., Gupta, R.: Locating faulty code by multiple points slicing. Softw. Pract. Exp. 39(7), 661\u2013699 (2007)","journal-title":"Softw. Pract. Exp."}],"container-title":["Lecture Notes in Computer Science","Computer Aided Verification"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-53291-8_33","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,7,16]],"date-time":"2020-07-16T02:03:11Z","timestamp":1594864991000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-030-53291-8_33"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"ISBN":["9783030532901","9783030532918"],"references-count":47,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-53291-8_33","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2020]]},"assertion":[{"value":"14 July 2020","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"CAV","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Computer Aided Verification","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Los Angeles, CA","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"USA","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2020","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"21 July 2020","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"24 July 2020","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"32","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"cav2020","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/i-cav.org\/2020\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EasyChair.org","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"240","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"43","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"22","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"18% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"11","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"The conference was held virtually due to the COVID-19 pandemic.","order":10,"name":"additional_info_on_review_process","label":"Additional Info on Review Process","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}