{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T09:54:44Z","timestamp":1743069284773,"version":"3.40.3"},"publisher-location":"Cham","reference-count":17,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030623647"},{"type":"electronic","value":"9783030623654"}],"license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020]]},"DOI":"10.1007\/978-3-030-62365-4_46","type":"book-chapter","created":{"date-parts":[[2020,10,29]],"date-time":"2020-10-29T06:02:51Z","timestamp":1603951371000},"page":"485-494","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["A Deep Metric Neural Network with Disentangled Representation for Detecting Smartphone Glass Defects"],"prefix":"10.1007","author":[{"given":"Gwang-Myong","family":"Go","sequence":"first","affiliation":[]},{"given":"Seok-Jun","family":"Bu","sequence":"additional","affiliation":[]},{"given":"Sung-Bae","family":"Cho","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2020,10,27]]},"reference":[{"key":"46_CR1","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"375","DOI":"10.1007\/978-3-030-33607-3_41","volume-title":"Intelligent Data Engineering and Automated Learning \u2013 IDEAL 2019","author":"G-M Go","year":"2019","unstructured":"Go, G.-M., Bu, S.-J., Cho, S.-B.: A deep learning-based surface defect inspection system for smartphone glass. In: Yin, H., Camacho, D., Tino, P., Tall\u00f3n-Ballesteros, Antonio J., Menezes, R., Allmendinger, R. (eds.) IDEAL 2019. LNCS, vol. 11871, pp. 375\u2013385. Springer, Cham (2019). https:\/\/doi.org\/10.1007\/978-3-030-33607-3_41"},{"key":"46_CR2","doi-asserted-by":"publisher","first-page":"2055","DOI":"10.1109\/TIM.2016.2566442","volume":"65","author":"T Chen","year":"2016","unstructured":"Chen, T., Wang, Y., Xiao, C., Wu, Q.J.: A machine vision apparatus and method for can-end inspection. IEEE Trans. Instrum. Measur. 65, 2055\u20132066 (2016)","journal-title":"IEEE Trans. Instrum. Measur."},{"key":"46_CR3","doi-asserted-by":"publisher","first-page":"36235","DOI":"10.1109\/ACCESS.2018.2842028","volume":"6","author":"G Cao","year":"2018","unstructured":"Cao, G., Ruan, S., Peng, Y., Huang, S., Kwok, N.: Large-complex-surface defect detection by hybrid gradient threshold segmentation and image registration. IEEE Access 6, 36235\u201336246 (2018)","journal-title":"IEEE Access"},{"key":"46_CR4","doi-asserted-by":"publisher","first-page":"348","DOI":"10.1016\/j.asoc.2016.10.030","volume":"52","author":"C Jian","year":"2017","unstructured":"Jian, C., Gao, J., Ao, Y.: Automatic surface defect detection for mobile phone screen glass based on machine vision. Appl. Soft Comput. 52, 348\u2013358 (2017)","journal-title":"Appl. Soft Comput."},{"key":"46_CR5","doi-asserted-by":"publisher","first-page":"690","DOI":"10.1109\/TIM.2017.2783098","volume":"67","author":"R Borwankar","year":"2018","unstructured":"Borwankar, R., Ludwig, R.: An optical surface inspection and automatic classification technique using the rotated wavelet transform. IEEE Trans. Instrum. Measur. 67, 690\u2013697 (2018)","journal-title":"IEEE Trans. Instrum. Measur."},{"key":"46_CR6","doi-asserted-by":"publisher","first-page":"484","DOI":"10.1016\/j.procir.2019.02.123","volume":"79","author":"B Staar","year":"2019","unstructured":"Staar, B., Lutjen, M., Freitag, M.: Anomaly detection with convolutional neural networks for industrial surface inspection. Procedia CIRP 79, 484\u2013489 (2019)","journal-title":"Procedia CIRP"},{"key":"46_CR7","doi-asserted-by":"crossref","unstructured":"Natarajan, V., Hung, T.Y., Vaikundam, S., Chia, L.T.: Convolutional networks for voting-based anomaly classification in metal surface inspection. In: IEEE International Conference on Industrial Technology, pp. 986\u2013991 (2017)","DOI":"10.1109\/ICIT.2017.7915495"},{"key":"46_CR8","doi-asserted-by":"crossref","unstructured":"Gupta, E., Kushwah, R.S.: Combination of global and local features using DWT with SVM for CBIR. In: International Conference on Reliability, Infocom Technologies and Optimization, pp. 1\u20136 (2015)","DOI":"10.1109\/ICRITO.2015.7359320"},{"key":"46_CR9","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"398","DOI":"10.1007\/978-3-030-11018-5_35","volume-title":"Computer Vision \u2013 ECCV 2018 Workshops","author":"X Dong","year":"2019","unstructured":"Dong, X., Taylor, Chris J., Cootes, Tim F.: Small defect detection using convolutional neural network features and random forests. In: Leal-Taix\u00e9, L., Roth, S. (eds.) ECCV 2018. LNCS, vol. 11132, pp. 398\u2013412. Springer, Cham (2019). https:\/\/doi.org\/10.1007\/978-3-030-11018-5_35"},{"key":"46_CR10","doi-asserted-by":"publisher","first-page":"397","DOI":"10.1016\/j.optlaseng.2019.05.005","volume":"121","author":"G Fu","year":"2019","unstructured":"Fu, G., Sun, P., Zhu, W., Yang, J., Cao, Y., Yang, M.Y., Cao, Y.: A Deep-learning-based approach for fast and robust steel surface defects classification. Opt. Lasers Eng. 121, 397\u2013405 (2019)","journal-title":"Opt. Lasers Eng."},{"key":"46_CR11","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TASE.2019.2941047","volume":"99","author":"H Yang","year":"2019","unstructured":"Yang, H., Chen, Y., Song, K., Yin, Z.: Multiscale feature-clustering-based fully convolutional autoencoder for fast accurate visual inspection of texture surface defects. IEEE Trans. Autom. Sci. Eng. 99, 1\u201318 (2019)","journal-title":"IEEE Trans. Autom. Sci. Eng."},{"key":"46_CR12","unstructured":"Krizhevsky, A., Sutskever, I., Hinton, G.E.: Imagenet classification with deep convolutional neural networks. In: Advances in Neural Information Processing Systems, pp. 1097\u20131105 (2012)"},{"issue":"12","key":"46_CR13","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TIM.2019.2949484","volume":"68","author":"J Sun","year":"2019","unstructured":"Sun, J., Wang, P., Luo, Y.K., Li, W.: Surface defects detection based on adaptive multiscale image collection and convolutional neural networks. IEEE Trans. Instrum. Measur. 68(12), 1\u201311 (2019)","journal-title":"IEEE Trans. Instrum. Measur."},{"key":"46_CR14","doi-asserted-by":"crossref","unstructured":"Zhou, B., Khosla, A., Lapedriza, A., Olivia, A., Torralba, A.: Learning deep features for discriminative localization. In: IEEE Conference on Computer Vision and Pattern Recognition, pp. 2921\u20132929 (2016)","DOI":"10.1109\/CVPR.2016.319"},{"key":"46_CR15","doi-asserted-by":"crossref","unstructured":"Schroff, F., Kalenichenko, D., Philbin, J.: Facenet: a unified embedding for face recognition and clustering. In: IEEE Conference on Computer Vision and Pattern Recognition, pp. 815\u2013823 (2015)","DOI":"10.1109\/CVPR.2015.7298682"},{"key":"46_CR16","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"84","DOI":"10.1007\/978-3-319-24261-3_7","volume-title":"Similarity-Based Pattern Recognition","author":"E Hoffer","year":"2015","unstructured":"Hoffer, E., Ailon, N.: Deep metric learning using triplet network. In: Feragen, A., Pelillo, M., Loog, M. (eds.) SIMBAD 2015. LNCS, vol. 9370, pp. 84\u201392. Springer, Cham (2015). https:\/\/doi.org\/10.1007\/978-3-319-24261-3_7"},{"key":"46_CR17","doi-asserted-by":"publisher","first-page":"34627","DOI":"10.1007\/s11042-019-08042-w","volume":"78","author":"S Wu","year":"2019","unstructured":"Wu, S., Wu, Y., Cao, D., Zheng, C.: A fast button surface defect detection method based on siamese network with imbalanced samples. Multimedia Tools Appl. 78, 34627\u201334648 (2019)","journal-title":"Multimedia Tools Appl."}],"container-title":["Lecture Notes in Computer Science","Intelligent Data Engineering and Automated Learning \u2013 IDEAL 2020"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-62365-4_46","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,12]],"date-time":"2024-03-12T18:08:34Z","timestamp":1710266914000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-62365-4_46"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"ISBN":["9783030623647","9783030623654"],"references-count":17,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-62365-4_46","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2020]]},"assertion":[{"value":"27 October 2020","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"IDEAL","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Intelligent Data Engineering and Automated Learning","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Guimaraes","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Portugal","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2020","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"4 November 2020","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"6 November 2020","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"21","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"ideal2020","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/islab.di.uminho.pt\/ideal2020\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Open","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Easychair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"134","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"93","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"69% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.8","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"The conference was held virtually due to the COVID-19 pandemic.","order":10,"name":"additional_info_on_review_process","label":"Additional Info on Review Process","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}