{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,12]],"date-time":"2026-03-12T15:46:19Z","timestamp":1773330379665,"version":"3.50.1"},"publisher-location":"Cham","reference-count":22,"publisher":"Springer International Publishing","isbn-type":[{"value":"9783030628062","type":"print"},{"value":"9783030628079","type":"electronic"}],"license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020]]},"DOI":"10.1007\/978-3-030-62807-9_18","type":"book-chapter","created":{"date-parts":[[2020,11,19]],"date-time":"2020-11-19T12:07:18Z","timestamp":1605787638000},"page":"215-226","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":9,"title":["FMECA-Based Risk Assessment Approach for Proactive Obsolescence Management"],"prefix":"10.1007","author":[{"given":"Imen","family":"Trabelsi","sequence":"first","affiliation":[]},{"given":"Marc","family":"Zolghadri","sequence":"additional","affiliation":[]},{"given":"Besma","family":"Zeddini","sequence":"additional","affiliation":[]},{"given":"Maher","family":"Barkallah","sequence":"additional","affiliation":[]},{"given":"Mohamed","family":"Haddar","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2020,11,10]]},"reference":[{"key":"18_CR1","unstructured":"SD-22: Diminishing Manufacturing Sources and Material Shortages (DMSMS) A Guidebook of Best Practices for Implementing a Robust DMSMS (2016)"},{"key":"18_CR2","unstructured":"Sandborn, P.: Designing for technology obsolescence management. In: IIE Annual Conference. Proceedings. Institute of Industrial and Systems Engineers (IISE), p. 1684 (2007)"},{"issue":"1","key":"18_CR3","doi-asserted-by":"publisher","first-page":"190","DOI":"10.1109\/6144.833060","volume":"23","author":"MG Pecht","year":"2000","unstructured":"Pecht, M.G., Das, D.: Electronic part life cycle. IEEE Trans. Compon. Packag. Technol. 23(1), 190\u2013192 (2000)","journal-title":"IEEE Trans. Compon. Packag. Technol."},{"issue":"9\u201312","key":"18_CR4","doi-asserted-by":"publisher","first-page":"1235","DOI":"10.1007\/s00170-009-2471-3","volume":"49","author":"FJR Rojo","year":"2010","unstructured":"Rojo, F.J.R., Roy, R., Shehab, E.: Obsolescence management for long-life contracts: state of the art and future trends. Int. J. Adv. Manuf. Technol. 49(9\u201312), 1235\u20131250 (2010)","journal-title":"Int. J. Adv. Manuf. Technol."},{"key":"18_CR5","unstructured":"IEC-International Electrotechnical Commission. IEC 62402 (2007)"},{"key":"18_CR6","unstructured":"Granberg, B.: The quality re-evaluation process: product obsolescence in a consumer-producer interaction framework, Swedish Environmental Protection Agency (1997)"},{"key":"18_CR7","doi-asserted-by":"publisher","first-page":"421","DOI":"10.1007\/s10603-004-2284-6","volume":"27","author":"T Cooper","year":"2004","unstructured":"Cooper, T.: Inadequate life? Evidence of consumer attitudes to product obsolescence. J. Consum. Policy 27, 421\u2013449 (2004)","journal-title":"J. Consum. Policy"},{"key":"18_CR8","unstructured":"Atterbury, R.: Component Obsolescence Group, United Kingdom; Minenfeld Obsolescence, A Guide to Tackling Disappearing Products, Issue 2 (2005)"},{"key":"18_CR9","unstructured":"Brewin, A.: The Pb-free minefield: a guide to mitigating risk during the transition to RoHS compliance (2005)"},{"key":"18_CR10","doi-asserted-by":"crossref","unstructured":"Bartels, B., Ermel, U., Sandborn, P., Pecht, M.G.: Strategies to the Prediction, Mitigation and Management of Product Obsolescence, vol. 87. Wiley, Hoboken (2012)","DOI":"10.1002\/9781118275474"},{"key":"18_CR11","doi-asserted-by":"crossref","unstructured":"Glinz, M.: On non-functional requirements. In: 15th IEEE International Requirements Engineering Conference (RE 2007), pp. 21\u201326. IEEE (2007)","DOI":"10.1109\/RE.2007.45"},{"key":"18_CR12","doi-asserted-by":"publisher","first-page":"774","DOI":"10.1016\/j.procir.2019.04.253","volume":"84","author":"A Soltan","year":"2019","unstructured":"Soltan, A., Addouche, S.A., Zolghadri, M., Barkallah, M., Haddar, M.: System Engineering for dependency analysis-a Bayesian approach: application to obsolescence study. Procedia CIRP 84, 774\u2013782 (2019)","journal-title":"Procedia CIRP"},{"key":"18_CR13","doi-asserted-by":"publisher","first-page":"392","DOI":"10.1016\/j.procir.2018.02.037","volume":"70","author":"M Zolghadri","year":"2018","unstructured":"Zolghadri, M., Addouche, S.A., Boissie, K., Richard, D.: Obsolescence prediction: a Bayesian model. Procedia CIRP 70, 392\u2013397 (2018)","journal-title":"Procedia CIRP"},{"issue":"6","key":"18_CR14","doi-asserted-by":"publisher","first-page":"1099","DOI":"10.1109\/TCPMT.2014.2316212","volume":"4","author":"X Meng","year":"2014","unstructured":"Meng, X., Th\u00f6rnberg, B., Olsson, L.: Strategic proactive obsolescence management model. IEEE Trans. Compon. Packag. Manuf. Technol. 4(6), 1099\u20131108 (2014)","journal-title":"IEEE Trans. Compon. Packag. Manuf. Technol."},{"key":"18_CR15","doi-asserted-by":"publisher","first-page":"15","DOI":"10.1016\/j.procir.2013.07.073","volume":"11","author":"P Sandborn","year":"2013","unstructured":"Sandborn, P.: Design for obsolescence risk management. Procedia CIRP 11, 15\u201322 (2013)","journal-title":"Procedia CIRP"},{"key":"18_CR16","unstructured":"Pingle, P.: Selection of obsolescence resolution strategy based on a multi criteria decision model (2015)"},{"key":"18_CR17","doi-asserted-by":"crossref","unstructured":"Meyer, A., Pretorius, L., Pretorius, J.H.C.: A model to manage electronic component obsolescence for complex or long life systems. In: 2004 IEEE International Engineering Management Conference (IEEE Cat. No. 04CH37574), vol. 3, pp. 1303\u20131309, October 2004","DOI":"10.1109\/IEMC.2004.1408905"},{"key":"18_CR18","unstructured":"Sandborn, P., Mauro, F., Knox, R.: A data mining based approach to electronic part obsolescence forecasting. In: Proceedings of the 2005 DMSMS Conference, 11\u201315 April, Nashville, TN (20052005)"},{"key":"18_CR19","doi-asserted-by":"crossref","unstructured":"Roques, P.: Systems Architecture Modeling with the Arcadia Method: A Practical Guide to Capella. Elsevier (2017)","DOI":"10.1016\/B978-1-78548-168-0.50001-3"},{"issue":"5","key":"18_CR20","doi-asserted-by":"publisher","first-page":"470","DOI":"10.1080\/0740817X.2013.812269","volume":"46","author":"L Bian","year":"2014","unstructured":"Bian, L., Gebraeel, N.: Stochastic modeling and real-time prognostics for multi-component systems with degradation rate interactions. IIE Trans. 46(5), 470\u2013482 (2014)","journal-title":"IIE Trans."},{"key":"18_CR21","doi-asserted-by":"crossref","unstructured":"Carmignani, G.: An integrated structural framework to cost-basedfmeca: the priority-cost fmeca. Reliab. Eng. Syst. Saf. 94(4), 861\u2013871 (2009)","DOI":"10.1016\/j.ress.2008.09.009"},{"key":"18_CR22","doi-asserted-by":"crossref","unstructured":"Weibull, W.: Wide applicability. J. Appl. Mech. 103(730), 293\u2013297 (1951)","DOI":"10.1115\/1.4010337"}],"container-title":["IFIP Advances in Information and Communication Technology","Product Lifecycle Management Enabling Smart X"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-62807-9_18","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,19]],"date-time":"2024-11-19T00:04:23Z","timestamp":1731974663000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-62807-9_18"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"ISBN":["9783030628062","9783030628079"],"references-count":22,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-62807-9_18","relation":{},"ISSN":["1868-4238","1868-422X"],"issn-type":[{"value":"1868-4238","type":"print"},{"value":"1868-422X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]},"assertion":[{"value":"10 November 2020","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"PLM","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"IFIP International Conference on Product Lifecycle Management","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Rapperswil","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Switzerland","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2020","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"5 July 2020","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"8 July 2020","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"17","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"plm2020","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/www.plm-conference.org\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"conftool.net","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"80","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"60","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"75% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.6","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.3","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2 technical industrial contributions are also included. The conference was held virtually.","order":10,"name":"additional_info_on_review_process","label":"Additional Info on Review Process","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}