{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T04:29:18Z","timestamp":1742963358139,"version":"3.40.3"},"publisher-location":"Cham","reference-count":17,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030706388"},{"type":"electronic","value":"9783030706395"}],"license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021]]},"DOI":"10.1007\/978-3-030-70639-5_33","type":"book-chapter","created":{"date-parts":[[2021,2,19]],"date-time":"2021-02-19T16:00:37Z","timestamp":1613750437000},"page":"358-369","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Using Object Detection Technology to Measure the Accuracy of the TFT-LCD Printing Process by Using Deep Learning"],"prefix":"10.1007","author":[{"given":"Ting-Wei","family":"Yeh","sequence":"first","affiliation":[]},{"given":"Fang-Yie","family":"Leu","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2021,2,19]]},"reference":[{"key":"33_CR1","unstructured":"TFT LCD Manufacturing Process. https:\/\/insightsolutionsglobal.com\/tft-lcd-manufacturing-process\/"},{"key":"33_CR2","unstructured":"Huang, S.C., Chang, Y.C.: Examine the effect of the Image Preprocessing on Defect Detection of TFT-LCD Panels by Automatic Optical Inspection, Master Thesis, National Chiao Tung University (2017)"},{"key":"33_CR3","doi-asserted-by":"publisher","first-page":"119","DOI":"10.1016\/S0141-9382(99)00013-X","volume":"20","author":"RW Sabnis","year":"1999","unstructured":"Sabnis, R.W.: Color filter technology for liquid crystal displays. Displays 20, 119\u2013129 (1999)","journal-title":"Displays"},{"key":"33_CR4","unstructured":"Lai, C.H., Cheng, S.: Improvement on Fat Edge Defects of Polyimide Coating Film in LCD Alignment Process, Master Thesis, National Chiao Tung University (2010)"},{"key":"33_CR5","doi-asserted-by":"publisher","unstructured":"Hayashi, N., et al.: Development of TFT-LCD TAB modules. In: Proceedings of Japan IEMT Symposium, Sixth IEEE\/CHMT International Electronic Manufacturing Technology Symposium, Nara, Japan, pp. 79\u201382 (1989). https:\/\/doi.org\/10.1109\/IEMTS.1989.76114.","DOI":"10.1109\/IEMTS.1989.76114"},{"key":"33_CR6","doi-asserted-by":"crossref","unstructured":"Redmon, J., Divvala, S., Girshick, R., Farhadi, A.: You only look once: unified, real-time object detection, arXiv preprint arXiv:1506.02640 (2015)","DOI":"10.1109\/CVPR.2016.91"},{"key":"33_CR7","unstructured":"Yolo: Object detection based on deep learning (including YoloV3). https:\/\/mropengate.blogspot.com\/2018\/06\/yolo-yolov3.html"},{"key":"33_CR8","doi-asserted-by":"crossref","unstructured":"Girshick, R., Donahue, J., Darrell, T., Malik, J.: Rich feature hierarchies for accurate object detection and semantic segmentation. In: IEEE Conference on Computer Vision and Pattern Recognition, pp. 580\u2013587 (2014)","DOI":"10.1109\/CVPR.2014.81"},{"key":"33_CR9","doi-asserted-by":"crossref","unstructured":"Girshick, R.: Fast R-CNN. In: The IEEE International Conference on Computer Vision, pp. 1440\u20131448 (2015)","DOI":"10.1109\/ICCV.2015.169"},{"issue":"6","key":"33_CR10","doi-asserted-by":"publisher","first-page":"1137","DOI":"10.1109\/TPAMI.2016.2577031","volume":"39","author":"S Ren","year":"2017","unstructured":"Ren, S., He, K., Girshick, R., Sun, J.: Faster R-CNN: towards real-time object detection with region proposal networks. IEEE Trans. Pattern Anal. Mach. Intell. 39(6), 1137\u20131149 (2017)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"33_CR11","doi-asserted-by":"crossref","unstructured":"Redmon, J., Farhadi, A.: YOLO9000: better, faster, stronger. In: The IEEE Conference on Computer Vision and Pattern Recognition, pp. 7263\u20137271 (2017)","DOI":"10.1109\/CVPR.2017.690"},{"key":"33_CR12","doi-asserted-by":"crossref","unstructured":"He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: The IEEE Conference on Computer Vision and Pattern Recognition, pp. 770\u2013778 (2016)","DOI":"10.1109\/CVPR.2016.90"},{"key":"33_CR13","doi-asserted-by":"crossref","unstructured":"Lin, T.Y., Dollar, P., Girshick, R., He, K., Hariharan, B., Belongie, S.: Feature pyramid networks for object detection. In: The IEEE Conference on Computer Vision and Pattern Recognition, pp. 2117\u20132125 (2017)","DOI":"10.1109\/CVPR.2017.106"},{"key":"33_CR14","unstructured":"Redmon, J.: Darknet: open source neural networks in C. https:\/\/pjreddie.com\/darknet\/"},{"key":"33_CR15","unstructured":"Tzutalin. LabelImg. Git code (2015). https:\/\/github.com\/tzutalin\/labelImg"},{"issue":"4","key":"33_CR16","doi-asserted-by":"publisher","first-page":"380","DOI":"10.1117\/1.482706","volume":"8","author":"GJ Braun","year":"1999","unstructured":"Braun, G.J., Fairchild, M.D.: Image lightness rescaling using sigmoidal contrast enhancement function. J. Electron. Imaging 8(4), 380\u2013393 (1999)","journal-title":"J. Electron. Imaging"},{"key":"33_CR17","doi-asserted-by":"crossref","unstructured":"Chen, S.L., Jhou, J.W.: Automatic optical inspection on mura defect of TFT-LCD. In: Proceedings of the 35th International MATADOR Conference, pp. 233\u2013236 (2007)","DOI":"10.1007\/978-1-84628-988-0_52"}],"container-title":["Lecture Notes on Data Engineering and Communications Technologies","Advances in Internet, Data and Web Technologies"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-70639-5_33","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,2,19]],"date-time":"2021-02-19T16:20:16Z","timestamp":1613751616000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/978-3-030-70639-5_33"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"ISBN":["9783030706388","9783030706395"],"references-count":17,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-70639-5_33","relation":{},"ISSN":["2367-4512","2367-4520"],"issn-type":[{"type":"print","value":"2367-4512"},{"type":"electronic","value":"2367-4520"}],"subject":[],"published":{"date-parts":[[2021]]},"assertion":[{"value":"19 February 2021","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"EIDWT","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Emerging Internetworking, Data & Web Technologies","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Chiang Mai","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Thailand","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2021","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"25 February 2021","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"27 February 2021","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"eidwt2021","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}