{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,25]],"date-time":"2025-03-25T21:18:01Z","timestamp":1742937481814,"version":"3.40.3"},"publisher-location":"Cham","reference-count":20,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030794620"},{"type":"electronic","value":"9783030794637"}],"license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021]]},"DOI":"10.1007\/978-3-030-79463-7_44","type":"book-chapter","created":{"date-parts":[[2021,7,18]],"date-time":"2021-07-18T23:03:07Z","timestamp":1626649387000},"page":"519-532","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["d-BTAI: The Dynamic-Binary Tree Based Anomaly Identification Algorithm for\u00a0Industrial Systems"],"prefix":"10.1007","author":[{"given":"Jyotirmoy","family":"Sarkar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Santonu","family":"Sarkar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Snehanshu","family":"Saha","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Swagatam","family":"Das","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2021,7,19]]},"reference":[{"key":"44_CR1","unstructured":"https:\/\/webscope.sandbox.yahoo.com\/catalog.php?datatype=s&did=70. Accessed 15 Jan 2019"},{"key":"44_CR2","unstructured":"Backblaze failure data. https:\/\/www.backblaze.com\/b2\/hard-drive-test-data.htm. Accessed 2 Mar 2019"},{"key":"44_CR3","unstructured":"Globenewswire. https:\/\/www.globenewswire.com\/news-release\/2019\/05\/13\/1822194\/0\/en\/Medical-Equipment-Maintenance-Market-to-Reach-26-4-Billion-by-2024-P-S-Intelligence.html. Accessed 15 Feb 2020"},{"key":"44_CR4","unstructured":"Nab. https:\/\/github.com\/numenta\/NAB\/tree\/master\/data. Accessed 15 Jan 2019"},{"key":"44_CR5","doi-asserted-by":"crossref","unstructured":"Apiletti, D., et al.: istep, an integrated self-tuning engine for predictive maintenance in industry 4.0. In: IEEE International Conference on ISPA-IUCC-BDCloud-SocialCom-SustainCom (2018)","DOI":"10.1109\/BDCloud.2018.00136"},{"key":"44_CR6","unstructured":"Bruke, R.: Hazmat studies: Nmr and mri medical scanners: Surviving the \u00efnvisible force (2012). https:\/\/www.firehouse.com\/rescue\/article\/10684588\/firefighter-hazmat-situations. Accessed 15 Feb 2019"},{"key":"44_CR7","doi-asserted-by":"publisher","unstructured":"Chandola, V., Banerjee, A., Kumar, V.: Anomaly detection. ACM Comput. Surv. 41(3), 1\u201358 (2009). https:\/\/doi.org\/10.1145\/1541880.1541882","DOI":"10.1145\/1541880.1541882"},{"key":"44_CR8","doi-asserted-by":"publisher","unstructured":"Chigurupati, A., Thibaux, R., Lassar, N.: Predicting hardware failure using machine learning. In: 2016 Annual Reliability and Maintainability Symposium (RAMS), Tucson, AZ, USA, January 2016. https:\/\/doi.org\/10.1109\/RAMS.2016.7448033","DOI":"10.1109\/RAMS.2016.7448033"},{"key":"44_CR9","doi-asserted-by":"publisher","first-page":"121","DOI":"10.1016\/j.patcog.2016.03.028","volume":"58","author":"S Erfani","year":"2016","unstructured":"Erfani, S., Rajasegarar, S., Karunasekera, S., Leckie, C.: High-dimensional and large-scale anomaly detection using a linear one-class SVM with deep learning. Pattern Recogn. 58, 121\u2013134 (2016)","journal-title":"Pattern Recogn."},{"key":"44_CR10","doi-asserted-by":"publisher","first-page":"1641","DOI":"10.1016\/S0167-8655(03)00003-5","volume":"24","author":"Z He","year":"2003","unstructured":"He, Z., Xu, X., Deng, S.: Discovering cluster-based local outliers. Pattern Recogn. Lett. 24, 1641\u20131650 (2003)","journal-title":"Pattern Recogn. Lett."},{"key":"44_CR11","doi-asserted-by":"crossref","unstructured":"Karczmarek, P., Kiersztyn, A., Pedrycz, W., Al, E.: K-means-based isolation forest. Knowl. Syst. 195 (2020)","DOI":"10.1016\/j.knosys.2020.105659"},{"key":"44_CR12","doi-asserted-by":"publisher","unstructured":"Liu, T.F., Ting, M.K., Zhou, Z.H.: Isolation forest. In: 2008 Eighth IEEE International Conference on Data Mining, pp. 273\u2013280 (2008). https:\/\/doi.org\/10.1109\/ICDMW.2016.0046","DOI":"10.1109\/ICDMW.2016.0046"},{"key":"44_CR13","doi-asserted-by":"publisher","unstructured":"Munir, M., Siddiqui, A.S., Dengel, A., Ahmed, S.: Deepant: a deep learning approach for unsupervised anomaly detection in time series. IEEE Access 1(1), 1085\u20131100 (2018). https:\/\/doi.org\/10.1109\/access.2018.2886457","DOI":"10.1109\/access.2018.2886457"},{"key":"44_CR14","doi-asserted-by":"crossref","unstructured":"Narsingyani, D., Kale, O.: Optimizing false positive in anomaly based intrusion detection using genetic algorithm. In: 2015 IEEE 3rd International Conference on MOOCs, Innovation and Technology in Education (MITE) (2015)","DOI":"10.1109\/MITE.2015.7375291"},{"key":"44_CR15","doi-asserted-by":"publisher","unstructured":"Rousseeuw, P.J., Driessen, K.V.: A fast algorithm for the minimum covariance determinant estimator. Technometrics 41(3), 212\u2013223 (1999). https:\/\/doi.org\/10.1080\/00401706.1999.10485670","DOI":"10.1080\/00401706.1999.10485670"},{"key":"44_CR16","unstructured":"Russo, A., Sarkar, S., Pecchia, S.: Assessing invariant mining techniques for cloud-based utility computing systems. IEEE Trans. Serv. Comput. (2017)"},{"key":"44_CR17","doi-asserted-by":"publisher","unstructured":"Shang, W., Li, L., Wan, M., Zeng, P.: Industrial communication intrusion detection algorithm based on improved one-class SVM. In: 2015 World Congress on Industrial Control Systems Security (WCICSS) (2015). https:\/\/doi.org\/10.1109\/wcicss.2015.7420317","DOI":"10.1109\/wcicss.2015.7420317"},{"key":"44_CR18","doi-asserted-by":"publisher","unstructured":"Yin, C., S. Zhang, J.W., Xiong, N.N.: Anomaly detection based on convolutional recurrent autoencoder for IoT time series. IEEE Trans. Syst. Man Cybern. Syst. 1\u201311 (2020). https:\/\/doi.org\/10.1109\/tsmc.2020.2968516","DOI":"10.1109\/tsmc.2020.2968516"},{"key":"44_CR19","doi-asserted-by":"crossref","unstructured":"Zhang, L., Lin, J., Karim, R.: Adaptive kernel density-based anomaly detection for nonlinear systems. Knowl. Based Syst. 41(3), 50\u201363 (2018)","DOI":"10.1016\/j.knosys.2017.10.009"},{"key":"44_CR20","doi-asserted-by":"publisher","unstructured":"Zhou, C., Paffenroth, R.C.: Anomaly detection with robust deep autoencoders. In: Proceedings of the 23rd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining - KDD (2017). https:\/\/doi.org\/10.1145\/3097983.3098052","DOI":"10.1145\/3097983.3098052"}],"container-title":["Lecture Notes in Computer Science","Advances and Trends in Artificial Intelligence. From Theory to Practice"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-79463-7_44","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,7,18]],"date-time":"2021-07-18T23:26:41Z","timestamp":1626650801000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-79463-7_44"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"ISBN":["9783030794620","9783030794637"],"references-count":20,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-79463-7_44","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2021]]},"assertion":[{"value":"19 July 2021","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"IEA\/AIE","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Kuala Lumpur","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Malaysia","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2021","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"26 July 2021","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"29 July 2021","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"34","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"ieaaie2021","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/ieeecomputer.my\/ieaaie2021\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Microsoft CMT","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"145","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"87","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"19","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"60% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4.35","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}