{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T10:44:57Z","timestamp":1742985897982,"version":"3.40.3"},"publisher-location":"Cham","reference-count":20,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030863647"},{"type":"electronic","value":"9783030863654"}],"license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021]]},"DOI":"10.1007\/978-3-030-86365-4_36","type":"book-chapter","created":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T11:02:39Z","timestamp":1631271759000},"page":"446-456","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Towards Image Retrieval with Noisy Labels via Non-deterministic Features"],"prefix":"10.1007","author":[{"given":"Hengwei","family":"Liu","sequence":"first","affiliation":[]},{"given":"Jinyu","family":"Ma","sequence":"additional","affiliation":[]},{"given":"Xiaodong","family":"Gu","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2021,9,7]]},"reference":[{"key":"36_CR1","unstructured":"Arpit, D., et al.: A closer look at memorization in deep networks. In: International Conference on Machine Learning, pp. 233\u2013242. PMLR, Sydney (2017)"},{"key":"36_CR2","doi-asserted-by":"crossref","unstructured":"Chang, J., Lan, Z., Cheng, C., Wei, Y.: Data uncertainty learning in face recognition. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 5710\u20135719. IEEE, Seattle (2020)","DOI":"10.1109\/CVPR42600.2020.00575"},{"key":"36_CR3","doi-asserted-by":"crossref","unstructured":"Chen, X., Gupta, A.: Webly supervised learning of convolutional networks. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 1431\u20131439. IEEE, Santiago (2015)","DOI":"10.1109\/ICCV.2015.168"},{"key":"36_CR4","doi-asserted-by":"crossref","unstructured":"Choi, J., Chun, D., Kim, H., Lee, H.J.: Gaussian YOLOv3: an accurate and fast object detector using localization uncertainty for autonomous driving. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision, pp. 502\u2013511. IEEE, Seoul (2019)","DOI":"10.1109\/ICCV.2019.00059"},{"key":"36_CR5","unstructured":"Gal, Y., Ghahramani, Z.: Dropout as a Bayesian approximation: representing model uncertainty in deep learning. In: International Conference on Machine Learning, pp. 1050\u20131059. PMLR, New York (2016)"},{"key":"36_CR6","unstructured":"Goldberger, J., Ben-Reuven, E.: Training deep neural-networks using a noise adaptation layer (2016)"},{"key":"36_CR7","unstructured":"Han, B., et al.: Co-teaching: robust training of deep neural networks with extremely noisy labels. arXiv preprint arXiv:1804.06872 (2018)"},{"key":"36_CR8","unstructured":"Ioffe, S., Szegedy, C.: Batch normalization: accelerating deep network training by reducing internal covariate shift. In: International Conference on Machine Learning, pp. 448\u2013456. PMLR, Lille (2015)"},{"key":"36_CR9","doi-asserted-by":"crossref","unstructured":"Isobe, S., Arai, S.: Deep convolutional encoder-decoder network with model uncertainty for semantic segmentation. In: 2017 IEEE International Conference on INnovations in Intelligent SysTems and Applications (INISTA), pp. 365\u2013370. IEEE, Gdynia (2017)","DOI":"10.1109\/INISTA.2017.8001187"},{"key":"36_CR10","unstructured":"Jiang, L., Huang, D., Liu, M., Yang, W.: Beyond synthetic noise: deep learning on controlled noisy labels. In: International Conference on Machine Learning, pp. 4804\u20134815. PMLR (2020)"},{"key":"36_CR11","unstructured":"Jiang, L., Zhou, Z., Leung, T., Li, L.J., Fei-Fei, L.: MentorNet: learning data-driven curriculum for very deep neural networks on corrupted labels. In: International Conference on Machine Learning, pp. 2304\u20132313. PMLR, Stockholm (2018)"},{"key":"36_CR12","unstructured":"Kendall, A., Gal, Y.: What uncertainties do we need in Bayesian deep learning for computer vision? arXiv preprint arXiv:1703.04977 (2017)"},{"key":"36_CR13","unstructured":"Kingma, D.P., Welling, M.: Auto-encoding variational Bayes. arXiv preprint arXiv:1312.6114 (2013)"},{"key":"36_CR14","doi-asserted-by":"crossref","unstructured":"Krause, J., Stark, M., Deng, J., Fei-Fei, L.: 3D object representations for fine-grained categorization. In: 4th International IEEE Workshop on 3D Representation and Recognition (3DRR-13). IEEE, Sydney (2013)","DOI":"10.1109\/ICCVW.2013.77"},{"key":"36_CR15","doi-asserted-by":"crossref","unstructured":"Oh Song, H., Xiang, Y., Jegelka, S., Savarese, S.: Deep metric learning via lifted structured feature embedding. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 4004\u20134012. IEEE, Las Vegas (2016)","DOI":"10.1109\/CVPR.2016.434"},{"key":"36_CR16","doi-asserted-by":"crossref","unstructured":"Shi, Y., Jain, A.K.: Probabilistic face embeddings. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision, pp. 6902\u20136911. IEEE, Seoul (2019)","DOI":"10.1109\/ICCV.2019.00700"},{"key":"36_CR17","unstructured":"Sohn, K.: Improved deep metric learning with multi-class N-pair loss objective. In: Advances in Neural Information Processing Systems, pp. 1857\u20131865. Curran Associates Inc., Red Hook (2016)"},{"key":"36_CR18","unstructured":"Vinyals, O., Blundell, C., Lillicrap, T., Kavukcuoglu, K., Wierstra, D.: Matching networks for one shot learning. In: Proceedings of the 30th International Conference on Neural Information Processing Systems, NIPS 2016, pp. 3637\u20133645. Curran Associates Inc., Red Hook (2016)"},{"key":"36_CR19","doi-asserted-by":"crossref","unstructured":"Wang, X., Han, X., Huang, W., Dong, D., Scott, M.R.: Multi-similarity loss with general pair weighting for deep metric learning. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 5022\u20135030 (2019)","DOI":"10.1109\/CVPR.2019.00516"},{"key":"36_CR20","unstructured":"Zhang, C., Bengio, S., Hardt, M., Recht, B., Vinyals, O.: Understanding deep learning requires rethinking generalization. arXiv preprint arXiv:1611.03530 (2016)"}],"container-title":["Lecture Notes in Computer Science","Artificial Neural Networks and Machine Learning \u2013 ICANN 2021"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-86365-4_36","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,9,10]],"date-time":"2021-09-10T11:11:43Z","timestamp":1631272303000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-86365-4_36"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"ISBN":["9783030863647","9783030863654"],"references-count":20,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-86365-4_36","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2021]]},"assertion":[{"value":"7 September 2021","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICANN","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Artificial Neural Networks","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Bratislava","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Slovakia","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2021","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"14 September 2021","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"17 September 2021","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"30","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"icann2021","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/e-nns.org\/icann2021\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"OCS","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"496","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"265","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"53% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.5","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Conference was held online due to the COVID-19 pandemic.","order":10,"name":"additional_info_on_review_process","label":"Additional Info on Review Process","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}