{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T12:02:36Z","timestamp":1743076956361,"version":"3.40.3"},"publisher-location":"Cham","reference-count":23,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783030873547"},{"type":"electronic","value":"9783030873554"}],"license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021]]},"DOI":"10.1007\/978-3-030-87355-4_10","type":"book-chapter","created":{"date-parts":[[2021,9,29]],"date-time":"2021-09-29T23:54:11Z","timestamp":1632959651000},"page":"114-125","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Open-Set Product Authentication Based on Deep Texture Verification"],"prefix":"10.1007","author":[{"given":"Sudao","family":"Cai","sequence":"first","affiliation":[]},{"given":"Lin","family":"Zhao","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4857-6810","authenticated-orcid":false,"given":"Changsheng","family":"Chen","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2021,9,30]]},"reference":[{"key":"10_CR1","unstructured":"Global Brand Counterfeiting Report, 2018. Research and Market Technical Report No. 4438394, December 2017"},{"issue":"3","key":"10_CR2","doi-asserted-by":"publisher","first-page":"306","DOI":"10.1016\/j.patrec.2008.10.005","volume":"30","author":"GJ Burghouts","year":"2009","unstructured":"Burghouts, G.J., Geusebroek, J.M.: Material-specific adaptation of color invariant features. Pattern Recogn. Lett. 30(3), 306\u2013313 (2009)","journal-title":"Pattern Recogn. Lett."},{"issue":"11","key":"10_CR3","doi-asserted-by":"publisher","first-page":"3300","DOI":"10.1109\/TCSVT.2017.2741472","volume":"28","author":"C Chen","year":"2018","unstructured":"Chen, C., Zhou, B., Mow, W.H.: RA code: a robust and aesthetic code for resolution-constrained applications. IEEE Trans. Circ. Syst. Video Technol. 28(11), 3300\u20133312 (2018)","journal-title":"IEEE Trans. Circ. Syst. Video Technol."},{"key":"10_CR4","doi-asserted-by":"crossref","unstructured":"He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: Proceedings of IEEE Conference on Computer Vision and Pattern Recognition, pp. 770\u2013778 (2016)","DOI":"10.1109\/CVPR.2016.90"},{"key":"10_CR5","doi-asserted-by":"crossref","unstructured":"Kim, S., Kim, D., Cho, M., Kwak, S.: Proxy anchor loss for deep metric learning. In: Proceedings of IEEE Conference on Computer Vision and Pattern Recognition, pp. 3238\u20133247 (2020)","DOI":"10.1109\/CVPR42600.2020.00330"},{"key":"10_CR6","doi-asserted-by":"publisher","first-page":"49","DOI":"10.1016\/j.neucom.2020.04.040","volume":"406","author":"X Li","year":"2020","unstructured":"Li, X., Yu, L., Fu, C.W., Fang, M., Heng, P.A.: Revisiting metric learning for few-shot image classification. Neurocomputing 406, 49\u201358 (2020)","journal-title":"Neurocomputing"},{"key":"10_CR7","doi-asserted-by":"crossref","unstructured":"Movshovitz-Attias, Y., Toshev, A., Leung, T.K., Ioffe, S., Singh, S.: No fuss distance metric learning using proxies. In: Proceedings of IEEE Conference on Computer Vision and Pattern Recognition, pp. 360\u2013368 (2017)","DOI":"10.1109\/ICCV.2017.47"},{"key":"10_CR8","unstructured":"Norouzi, M., et al.: Zero-shot learning by convex combination of semantic embeddings. arXiv preprint arXiv:1312.5650 (2013)"},{"key":"10_CR9","doi-asserted-by":"crossref","unstructured":"Oh Song, H., Xiang, Y., Jegelka, S., Savarese, S.: Deep metric learning via lifted structured feature embedding. In: Proceedings of IEEE Conference on Computer Vision and Pattern Recognition, pp. 4004\u20134012 (2016)","DOI":"10.1109\/CVPR.2016.434"},{"key":"10_CR10","doi-asserted-by":"crossref","unstructured":"Ojala, T., Maenpaa, T., Pietikainen, M., Viertola, J., Kyllonen, J., Huovinen, S.: Outex: new framework for empirical evaluation of texture analysis algorithms. In: Object Recognition Supported by User Interaction for Service Robots, vol. 1, pp. 701\u2013706. IEEE (2002)","DOI":"10.1109\/ICPR.2002.1044854"},{"issue":"7","key":"10_CR11","doi-asserted-by":"publisher","first-page":"971","DOI":"10.1109\/TPAMI.2002.1017623","volume":"24","author":"T Ojala","year":"2002","unstructured":"Ojala, T., Pietikainen, M., Maenpaa, T.: Multiresolution gray-scale and rotation invariant texture classification with local binary patterns. IEEE Trans. Pattern Anal. Mach. Intell. 24(7), 971\u2013987 (2002)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"issue":"2","key":"10_CR12","doi-asserted-by":"crossref","first-page":"88","DOI":"10.1080\/00031305.1994.10476030","volume":"48","author":"F Pukelsheim","year":"1994","unstructured":"Pukelsheim, F.: The three sigma rule. Am. Stat. 48(2), 88\u201391 (1994)","journal-title":"Am. Stat."},{"key":"10_CR13","doi-asserted-by":"crossref","unstructured":"Qian, Q., Shang, L., Sun, B., Hu, J., Li, H., Jin, R.: SoftTriple loss: deep metric learning without triplet sampling. In: Proceedings of IEEE Conference on Computer Vision and Pattern Recognition, pp. 6450\u20136458 (2019)","DOI":"10.1109\/ICCV.2019.00655"},{"key":"10_CR14","doi-asserted-by":"crossref","unstructured":"Sanakoyeu, A., Tschernezki, V., Buchler, U., Ommer, B.: Divide and conquer the embedding space for metric learning. In: Proceedings of IEEE Conference on Computer Vision and Pattern Recognition, pp. 471\u2013480 (2019)","DOI":"10.1109\/CVPR.2019.00056"},{"key":"10_CR15","doi-asserted-by":"crossref","unstructured":"Schraml, R., Debiasi, L., Kauba, C., Uhl, A.: On the feasibility of classification-based product package authentication. In: IEEE Workshop on International Forensics and Security (WIFS), pp. 1\u20136 (2017)","DOI":"10.1109\/WIFS.2017.8267659"},{"key":"10_CR16","doi-asserted-by":"crossref","unstructured":"Sharma, A., Srinivasan, V., Kanchan, V., Subramanian, L.: The fake vs real goods problem: microscopy and machine learning to the rescue. In: Proceedings of the 23rd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, pp. 2011\u20132019 (2017)","DOI":"10.1145\/3097983.3098186"},{"issue":"10","key":"10_CR17","doi-asserted-by":"publisher","first-page":"1997","DOI":"10.1109\/TPAMI.2015.2505293","volume":"38","author":"Y Sun","year":"2015","unstructured":"Sun, Y., Wang, X., Tang, X.: Hybrid deep learning for face verification. IEEE Trans. Pattern Anal. Mach. Intell. 38(10), 1997\u20132009 (2015)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"issue":"6","key":"10_CR18","doi-asserted-by":"publisher","first-page":"1635","DOI":"10.1109\/TIP.2010.2042645","volume":"19","author":"X Tan","year":"2010","unstructured":"Tan, X., Triggs, B.: Enhanced local texture feature sets for face recognition under difficult lighting conditions. IEEE Trans. Image Process. 19(6), 1635\u20131650 (2010)","journal-title":"IEEE Trans. Image Process."},{"key":"10_CR19","doi-asserted-by":"crossref","unstructured":"Wang, X., Ye, Y., Gupta, A.: Zero-shot recognition via semantic embeddings and knowledge graphs. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 6857\u20136866 (2018)","DOI":"10.1109\/CVPR.2018.00717"},{"issue":"8","key":"10_CR20","doi-asserted-by":"publisher","first-page":"1885","DOI":"10.1109\/TIFS.2017.2694404","volume":"12","author":"CW Wong","year":"2017","unstructured":"Wong, C.W., Wu, M.: Counterfeit detection based on unclonable feature of paper using mobile camera. IEEE Trans. Inf. Forensics Secur. 12(8), 1885\u20131899 (2017)","journal-title":"IEEE Trans. Inf. Forensics Secur."},{"key":"10_CR21","doi-asserted-by":"crossref","unstructured":"Wu, C.Y., Manmatha, R., Smola, A.J., Krahenbuhl, P.: Sampling matters in deep embedding learning. In: Proceedings of IEEE Conference on Computer Vision and Pattern Recognition, pp. 2840\u20132848 (2017)","DOI":"10.1109\/ICCV.2017.309"},{"key":"10_CR22","unstructured":"Zhai, A., Wu, H.Y.: Classification is a strong baseline for deep metric learning. In: Proceedings of the British Machine Vision Conference (BMVC) (2019)"},{"issue":"1","key":"10_CR23","doi-asserted-by":"publisher","first-page":"464","DOI":"10.1109\/TIP.2018.2868383","volume":"28","author":"L Zhang","year":"2018","unstructured":"Zhang, L., Chen, C., Mow, W.H.: Accurate modeling and efficient estimation of the print-capture channel with application in barcoding. IEEE Trans. Image Process. 28(1), 464\u2013478 (2018)","journal-title":"IEEE Trans. Image Process."}],"container-title":["Lecture Notes in Computer Science","Image and Graphics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-87355-4_10","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,9]],"date-time":"2024-09-09T01:29:01Z","timestamp":1725845341000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-87355-4_10"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"ISBN":["9783030873547","9783030873554"],"references-count":23,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-87355-4_10","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2021]]},"assertion":[{"value":"30 September 2021","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICIG","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Image and Graphics","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Haikou","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2021","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"6 August 2021","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"8 August 2021","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"11","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"icig2021","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/icig2021.csig.org.cn\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"CMT","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"421","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"198","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"47% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Conference was postponed due to the COVID19 pandemic.","order":10,"name":"additional_info_on_review_process","label":"Additional Info on Review Process","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}