{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,4]],"date-time":"2026-07-04T10:07:06Z","timestamp":1783159626349,"version":"3.54.6"},"publisher-location":"Cham","reference-count":25,"publisher":"Springer International Publishing","isbn-type":[{"value":"9783030973476","type":"print"},{"value":"9783030973483","type":"electronic"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-3-030-97348-3_9","type":"book-chapter","created":{"date-parts":[[2022,3,8]],"date-time":"2022-03-08T07:02:49Z","timestamp":1646722969000},"page":"151-166","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":27,"title":["Multi-Spot Laser Fault Injection Setup: New Possibilities for\u00a0Fault Injection Attacks"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6028-3028","authenticated-orcid":false,"given":"Brice","family":"Colombier","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Paul","family":"Grandamme","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Julien","family":"Vernay","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"\u00c9milie","family":"Chanavat","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7964-3137","authenticated-orcid":false,"given":"Lilian","family":"Bossuet","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lucie","family":"de Laulani\u00e9","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bruno","family":"Chassagne","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2022,3,9]]},"reference":[{"key":"9_CR1","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"175","DOI":"10.1007\/978-3-319-66787-4_9","volume-title":"Cryptographic Hardware and Embedded Systems","author":"S Anceau","year":"2017","unstructured":"Anceau, S., Bleuet, P., Cl\u00e9di\u00e8re, J., Maingault, L., Rainard, J., Tucoulou, R.: Nanofocused x-ray beam to reprogram secure circuits. In: Fischer, W., Homma, N. (eds.) CHES 2017. LNCS, vol. 10529, pp. 175\u2013188. Springer, Cham (2017). https:\/\/doi.org\/10.1007\/978-3-319-66787-4_9"},{"key":"9_CR2","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"125","DOI":"10.1007\/BFb0028165","volume-title":"Security Protocols","author":"R Anderson","year":"1998","unstructured":"Anderson, R., Kuhn, M.: Low cost attacks on tamper resistant devices. In: Christianson, B., Crispo, B., Lomas, M., Roe, M. (eds.) Security Protocols 1997. LNCS, vol. 1361, pp. 125\u2013136. Springer, Heidelberg (1998). https:\/\/doi.org\/10.1007\/BFb0028165"},{"key":"9_CR3","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"260","DOI":"10.1007\/3-540-36400-5_20","volume-title":"Cryptographic Hardware and Embedded Systems","author":"C Aum\u00fcller","year":"2003","unstructured":"Aum\u00fcller, C., Bier, P., Fischer, W., Hofreiter, P., Seifert, J.-P.: Fault attacks on RSA with CRT: concrete results and practical countermeasures. In: Kaliski, B.S., Ko\u00e7, K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 260\u2013275. Springer, Heidelberg (2003). https:\/\/doi.org\/10.1007\/3-540-36400-5_20"},{"issue":"2","key":"9_CR4","doi-asserted-by":"publisher","first-page":"370","DOI":"10.1109\/JPROC.2005.862424","volume":"94","author":"H Bar-El","year":"2006","unstructured":"Bar-El, H., Choukri, H., Naccache, D., Tunstall, M., Whelan, C.: The sorcerer\u2019s apprentice guide to fault attacks. Proc. IEEE 94(2), 370\u2013382 (2006)","journal-title":"Proc. IEEE"},{"issue":"11","key":"9_CR5","doi-asserted-by":"publisher","first-page":"3056","DOI":"10.1109\/JPROC.2012.2188769","volume":"100","author":"A Barenghi","year":"2012","unstructured":"Barenghi, A., Breveglieri, L., Koren, I., Naccache, D.: Fault injection attacks on cryptographic devices: theory, practice, and countermeasures. Proc. IEEE 100(11), 3056\u20133076 (2012)","journal-title":"Proc. IEEE"},{"key":"9_CR6","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1007\/978-3-319-71501-8_1","volume-title":"International Conference on Security, Privacy, and Applied Cryptography Engineering","author":"S Bhasin","year":"2017","unstructured":"Bhasin, S., Lomn\u00e9, V., Tobich, K.: An industrial outlook on challenges of hardware security in digital economy. In: Ali, S.S., Danger, J., Eisenbarth, T. (eds.) International Conference on Security, Privacy, and Applied Cryptography Engineering. Lecture Notes in Computer Science, vol. 10662, pp. 1\u20139. Springer, Goa, India (Dec (2017). https:\/\/doi.org\/10.1007\/978-3-319-71501-8_1"},{"key":"9_CR7","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"37","DOI":"10.1007\/3-540-69053-0_4","volume-title":"Advances in Cryptology","author":"D Boneh","year":"1997","unstructured":"Boneh, D., DeMillo, R.A., Lipton, R.J.: On the importance of checking cryptographic protocols for faults. In: Fumy, W. (ed.) EUROCRYPT 1997. LNCS, vol. 1233, pp. 37\u201351. Springer, Heidelberg (1997). https:\/\/doi.org\/10.1007\/3-540-69053-0_4"},{"issue":"6","key":"9_CR8","doi-asserted-by":"publisher","first-page":"1825","DOI":"10.1109\/23.101196","volume":"37","author":"S Buchner","year":"1990","unstructured":"Buchner, S., et al.: Pulsed laser-induced SEU in integrated circuits: a practical method for hardness assurance testing. IEEE Trans. Nucl. Sci. 37(6), 1825\u20131831 (1990)","journal-title":"IEEE Trans. Nucl. Sci."},{"issue":"6","key":"9_CR9","doi-asserted-by":"publisher","first-page":"1517","DOI":"10.1109\/23.25490","volume":"35","author":"S Buchner","year":"1988","unstructured":"Buchner, S., Knudson, A.R., Kang, K., Campbell, A.: Charge collection from focussed picosecond laser pulses. IEEE Trans. Nucl. Sci. 35(6), 1517\u20131522 (1988)","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"9_CR10","doi-asserted-by":"crossref","unstructured":"Champeix, C., Borrel, N., Dutertre, J., Robisson, B., Lisart, M., Sarafianos, A.: SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D flip-flop in 40 nm CMOS technology. In: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, pp. 177\u2013182. IEEE Computer Society, Amherst, MA, USA, October 2015","DOI":"10.1109\/DFT.2015.7315158"},{"key":"9_CR11","doi-asserted-by":"crossref","unstructured":"Colombier, B., Menu, A., Dutertre, J.M., Mo\u00ebllic, P.A., Rigaud, J.B., Danger, J.L.: Laser-induced single-bit faults in flash memory: instructions corruption on a 32-bit microcontroller. In: IEEE International Symposium on Hardware Oriented Security and Trust, pp. 1\u201310. McLean, VA, USA, May 2019","DOI":"10.1109\/HST.2019.8741030"},{"key":"9_CR12","doi-asserted-by":"crossref","unstructured":"Dutertre, J.M., et al.: Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model. In: Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 1\u20136. IEEE Computer Society, Amsterdam, The Netherlands, September 2018","DOI":"10.1109\/FDTC.2018.00009"},{"key":"9_CR13","doi-asserted-by":"crossref","unstructured":"Garb, K., Obermaier, J.: Temporary laser fault injection into flash memory: calibration, enhanced attacks, and countermeasures. In: International Symposium on On-Line Testing and Robust System Design, pp. 1\u20137. IEEE, Napoli, Italy, July 2020","DOI":"10.1109\/IOLTS50870.2020.9159712"},{"key":"9_CR14","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"219","DOI":"10.1007\/978-3-319-08302-5_15","volume-title":"Smart Card Research and Advanced Applications","author":"M Hutter","year":"2014","unstructured":"Hutter, M., Schmidt, J.-M.: The temperature side channel and heating fault attacks. In: Francillon, A., Rohatgi, P. (eds.) CARDIS 2013. LNCS, vol. 8419, pp. 219\u2013235. Springer, Cham (2014). https:\/\/doi.org\/10.1007\/978-3-319-08302-5_15"},{"key":"9_CR15","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"156","DOI":"10.1007\/978-3-030-15462-2_11","volume-title":"Smart Card Research and Advanced Applications","author":"DSV Kumar","year":"2019","unstructured":"Kumar, D.S.V., Beckers, A., Balasch, J., Gierlichs, B., Verbauwhede, I.: An in-depth and black-box characterization of the effects of laser pulses on ATmega328P. In: Bilgin, B., Fischer, J.-B. (eds.) CARDIS 2018. LNCS, vol. 11389, pp. 156\u2013170. Springer, Cham (2019). https:\/\/doi.org\/10.1007\/978-3-030-15462-2_11"},{"key":"9_CR16","doi-asserted-by":"crossref","unstructured":"Maurine, P.: Techniques for EM fault injection: equipments and experimental results. In: Bertoni, G., Gierlichs, B. (eds.) Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 3\u20134. IEEE Computer Society, Leuven, Belgium, September 2012","DOI":"10.1109\/FDTC.2012.21"},{"key":"9_CR17","doi-asserted-by":"crossref","unstructured":"Menu, A., Dutertre, J.M., Rigaud, J.B., Colombier, B., Mo\u00ebllic, P.A., Danger, J.L.: Single-bit laser fault model in NOR flash memories: analysis and exploitation. In: Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 41\u201348. IEEE, Milan, Italy, September 2020","DOI":"10.1109\/FDTC51366.2020.00013"},{"key":"9_CR18","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"243","DOI":"10.1007\/978-3-319-10175-0_17","volume-title":"Constructive Side-Channel Analysis and Secure Design","author":"C O\u2019Flynn","year":"2014","unstructured":"O\u2019Flynn, C., Chen, Z.D.: ChipWhisperer: an open-source platform for hardware embedded security research. In: Prouff, E. (ed.) COSADE 2014. LNCS, vol. 8622, pp. 243\u2013260. Springer, Cham (2014). https:\/\/doi.org\/10.1007\/978-3-319-10175-0_17"},{"key":"9_CR19","doi-asserted-by":"crossref","unstructured":"Papadimitriou, A., H\u00e9ly, D., Beroulle, V., Maistri, P., Leveugle, R.: A multiple fault injection methodology based on cone partitioning towards RTL modeling of laser attacks. In: Fettweis, G.P., Nebel, W. (eds.) Design, Automation & Test in Europe Conference & Exhibition, pp. 1\u20134. European Design and Automation Association, Dresden, Germany, March 2014","DOI":"10.7873\/DATE2014.219"},{"key":"9_CR20","doi-asserted-by":"crossref","unstructured":"Roscian, C., Sarafianos, A., Dutertre, J., Tria, A.: Fault model analysis of laser-induced faults in SRAM memory cells. In: Fischer, W., Schmidt, J. (eds.) Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 89\u201398. IEEE Computer Society, Los Alamitos, CA, USA, August 2013","DOI":"10.1109\/FDTC.2013.17"},{"key":"9_CR21","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"193","DOI":"10.1007\/978-3-319-31271-2_12","volume-title":"Smart Card Research and Advanced Applications","author":"B Selmke","year":"2016","unstructured":"Selmke, B., Brummer, S., Heyszl, J., Sigl, G.: Precise laser fault injections into 90\u00a0nm and 45\u00a0nm SRAM-cells. In: Homma, N., Medwed, M. (eds.) CARDIS 2015. LNCS, vol. 9514, pp. 193\u2013205. Springer, Cham (2016). https:\/\/doi.org\/10.1007\/978-3-319-31271-2_12"},{"key":"9_CR22","doi-asserted-by":"crossref","unstructured":"Selmke, B., Heyszl, J., Sigl, G.: Attack on a DFA protected AES by simultaneous laser fault injections. In: Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 36\u201346. IEEE Computer Society, Santa Barbara, CA, USA, August 2016","DOI":"10.1109\/FDTC.2016.16"},{"key":"9_CR23","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1007\/3-540-36400-5_2","volume-title":"Cryptographic Hardware and Embedded Systems","author":"SP Skorobogatov","year":"2003","unstructured":"Skorobogatov, S.P., Anderson, R.J.: Optical fault induction attacks. In: Kaliski, B.S., Ko\u00e7, K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 2\u201312. Springer, Heidelberg (2003). https:\/\/doi.org\/10.1007\/3-540-36400-5_2"},{"issue":"10","key":"9_CR24","doi-asserted-by":"publisher","first-page":"1449","DOI":"10.1109\/TC.2018.2860010","volume":"69","author":"A Vasselle","year":"2020","unstructured":"Vasselle, A., Thiebeauld, H., Maouhoub, Q., Morisset, A., Ermeneux, S.: Laser-induced fault injection on smartphone bypassing the secure boot-extended version. IEEE Trans. Comput. 69(10), 1449\u20131459 (2020)","journal-title":"IEEE Trans. Comput."},{"key":"9_CR25","doi-asserted-by":"crossref","unstructured":"Werner, V., Maingault, L., Potet, M.: An end-to-end approach for multi-fault attack vulnerability assessment. In: Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 10\u201317. IEEE, Milan, Italy, September 2020","DOI":"10.1109\/FDTC51366.2020.00009"}],"container-title":["Lecture Notes in Computer Science","Smart Card Research and Advanced Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-030-97348-3_9","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,3,8]],"date-time":"2022-03-08T07:05:19Z","timestamp":1646723119000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-030-97348-3_9"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9783030973476","9783030973483"],"references-count":25,"URL":"https:\/\/doi.org\/10.1007\/978-3-030-97348-3_9","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"9 March 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"CARDIS","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Smart Card Research and Advanced Applications","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"L\u00fcbeck","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Germany","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2021","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"11 November 2021","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"12 November 2021","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"20","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"cardis2021","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/cardis2021.its.uni-luebeck.de\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EasyChair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"32","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"16","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"50% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.5","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.5","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}