{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T11:02:26Z","timestamp":1762254146484,"version":"3.40.3"},"publisher-location":"Cham","reference-count":21,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783031024436"},{"type":"electronic","value":"9783031024443"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-3-031-02444-3_42","type":"book-chapter","created":{"date-parts":[[2022,5,9]],"date-time":"2022-05-09T12:02:50Z","timestamp":1652097770000},"page":"562-574","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["A Fast and\u00a0Accurate Point Pattern Matching Algorithm Based on\u00a0Multi-Hilbert Scans"],"prefix":"10.1007","author":[{"given":"Jegoon","family":"Ryu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sei-ichiro","family":"Kamata","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2022,5,10]]},"reference":[{"issue":"10","key":"42_CR1","doi-asserted-by":"publisher","first-page":"1041","DOI":"10.1109\/34.329004","volume":"16","author":"XP Hu","year":"1994","unstructured":"Hu, X.P., Ahuja, N.: Matching point features with ordered geometric, rigidity, and disparity constraints. IEEE Trans. Pattern Anal. Mach. Intell. 16(10), 1041\u20131049 (1994)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"42_CR2","doi-asserted-by":"publisher","first-page":"25892","DOI":"10.1109\/ACCESS.2020.2969995","volume":"8","author":"Y Wen","year":"2020","unstructured":"Wen, Y., Zhou, M., Zhang, P., Geng, G.: Matching method of cultural relic fragments constrained by thickness and contour feature. IEEE Access 8, 25892\u201325904 (2020)","journal-title":"IEEE Access"},{"key":"42_CR3","doi-asserted-by":"publisher","first-page":"83526","DOI":"10.1109\/ACCESS.2019.2923795","volume":"7","author":"X Meng","year":"2019","unstructured":"Meng, X., et al.: Multi-feature fusion: a driver-car matching model based on curve comparison. IEEE Access 7, 83526\u201383535 (2019)","journal-title":"IEEE Access"},{"key":"42_CR4","doi-asserted-by":"crossref","unstructured":"Czovny, R.K., Bellon, O.R.P., Silva, L., Costa, H.S.G.: Minutia matching using 3D pore clouds. In: Proceedings of the International Conference on Pattern Recognition, pp. 3138\u20133143. IAPR (2018)","DOI":"10.1109\/ICPR.2018.8546036"},{"key":"42_CR5","doi-asserted-by":"crossref","unstructured":"Dubuisson, M.P., Jain, A.K.: A modified Hausdorff distance for object matching. In: Proceedings of the International Conference on Pattern Recognition, pp. 566\u2013568. IAPR (1994)","DOI":"10.1109\/ICPR.1994.576361"},{"issue":"4","key":"42_CR6","doi-asserted-by":"publisher","first-page":"261","DOI":"10.4236\/jbise.2009.24040","volume":"2","author":"CB Yu","year":"2009","unstructured":"Yu, C.B., Qin, H.F., Cui, Y.Z., Hu, X.Q.: Finger-vein image recognition combining modified Hausdorff distance with minutiae feature matching. J. Biomed. Sci. Eng. 2(4), 261\u2013272 (2009)","journal-title":"J. Biomed. Sci. Eng."},{"key":"42_CR7","doi-asserted-by":"crossref","unstructured":"Shao, F., Cai, S., GU, J.: A modified Hausdorff distance based algorithm for 2-dimensional spatial trajectory matching. In: Proceedings of the International Conference on Computer Science and Education, pp. 166\u2013172. IEEE (2010)","DOI":"10.1109\/ICCSE.2010.5593666"},{"issue":"4","key":"42_CR8","doi-asserted-by":"publisher","first-page":"504","DOI":"10.1109\/TEVC.2011.2161872","volume":"16","author":"O Schhutze","year":"2012","unstructured":"Schhutze, O., Esquivel, X., Lara, A., Coello, C.A.C.: Using the averaged Hausdorff distance as a performance measure in evolutionary multiobjective optimization. IEEE Trans. Evol. Comp. 16(4), 504\u2013522 (2012)","journal-title":"IEEE Trans. Evol. Comp."},{"key":"42_CR9","doi-asserted-by":"crossref","unstructured":"Kim, J., Kim, M., Kim, T.: Recognition of face orientation angle using modified hausdorff distance. In: Proceedings of International Symposium on Consumer Electronics. IEEE (2014)","DOI":"10.1109\/ISCE.2014.6884449"},{"key":"42_CR10","doi-asserted-by":"crossref","unstructured":"Sarangi, P.P., Panda, M., Mishra, B.S.P., Dehuri, S.: An automated ear localization technique based on modified hausdorff distance. In: Proceedings of the International Conference on Computer Vision and Image Processing, pp. 229\u2013240. IAPR (2016)","DOI":"10.1007\/978-981-10-2107-7_21"},{"key":"42_CR11","doi-asserted-by":"crossref","unstructured":"Shamai, G., Kimmel, R.: Geodesic distance descriptors. In: Proceedings of the International Conference on Computer Vision and Pattern Recognition, pp. 6410\u20136418. IEEE (2017)","DOI":"10.1109\/CVPR.2017.386"},{"issue":"29","key":"42_CR12","first-page":"1","volume":"15","author":"AA Taha","year":"2015","unstructured":"Taha, A.A., Hanbury, A.: Metrics for evaluating 3D medical image segmentation: analysis, selection, and tool. BMC Med. Imaging 15(29), 1\u201328 (2015)","journal-title":"BMC Med. Imaging"},{"issue":"11","key":"42_CR13","doi-asserted-by":"publisher","first-page":"2153","DOI":"10.1109\/TPAMI.2015.2408351","volume":"37","author":"AA Taha","year":"2015","unstructured":"Taha, A.A., Hanbury, A.: An efficient algorithm for calculating the exact Hausdorff distance. IEEE Trans. Pattern Anal. Mach. Intell. 37(11), 2153\u20132163 (2015)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"42_CR14","doi-asserted-by":"publisher","first-page":"1350","DOI":"10.1109\/ACCESS.2017.2778745","volume":"6","author":"D Jhang","year":"2018","unstructured":"Jhang, D., Jou, L., Chen, Y., He, F.: Efficient and accurate Hausdorff distance computation based on diffusion search. IEEE Access 6, 1350\u20131361 (2018)","journal-title":"IEEE Access"},{"issue":"107857","key":"42_CR15","first-page":"1","volume":"114","author":"J Ryu","year":"2021","unstructured":"Ryu, J., Kamata, S.: An efficient computational algorithm for Hausdorff distance based on points-ruling-out and systematic random sampling. Pattern Recogn. 114(107857), 1\u201312 (2021)","journal-title":"Pattern Recogn."},{"issue":"7","key":"42_CR16","doi-asserted-by":"publisher","first-page":"964","DOI":"10.1109\/83.772242","volume":"8","author":"S Kamata","year":"1999","unstructured":"Kamata, S., Eason, R.O., Bandou, Y.: A new algorithm for n-dimensional Hilbert scanning. IEEE Trans. Image Pro. 8(7), 964\u2013973 (1999)","journal-title":"IEEE Trans. Image Pro."},{"key":"42_CR17","doi-asserted-by":"crossref","unstructured":"Hao, P., Kamata, S.: Hilbert scan based bag-of-features for image retrieval. IEICE Trans. Inf. Syst. E94-D(6), 1260\u20131268 (2011)","DOI":"10.1587\/transinf.E94.D.1260"},{"key":"42_CR18","doi-asserted-by":"crossref","unstructured":"Zhang, J, Kamata, S., Ueshige, Y.: A pseudo-Hilbert scan for arbitrarily-sized arrays. IEICE Trans. Inf. Syst. E90-A(3), 682\u2013690 (2007)","DOI":"10.1093\/ietfec\/e90-a.3.682"},{"key":"42_CR19","doi-asserted-by":"publisher","first-page":"850","DOI":"10.1109\/34.232073","volume":"15","author":"DP Huttenlocher","year":"1993","unstructured":"Huttenlocher, D.P., Klanderman, G.A., Rucklidge, W.J.: Comparing images using the Hausdorff distance. IEEE Trans. Pattern Anal. Mach. Intell. 15, 850\u2013863 (1993)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"42_CR20","unstructured":"Gonzlez, R.C., Woods, R.E.: Digital Image Processing. Second edn., Prectice Hall, Upper Saddle River (2002)"},{"issue":"12","key":"42_CR21","doi-asserted-by":"publisher","first-page":"1351","DOI":"10.1109\/34.977560","volume":"23","author":"D Comaniciu","year":"2001","unstructured":"Comaniciu, D., Meer, P.: Edge detection with embedded confidence. IEEE Trans. Pattern Anal. Mach. Intell. 23(12), 1351\u20131365 (2001)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."}],"container-title":["Lecture Notes in Computer Science","Pattern Recognition"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-02444-3_42","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,24]],"date-time":"2024-09-24T04:06:35Z","timestamp":1727150795000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-02444-3_42"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9783031024436","9783031024443"],"references-count":21,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-02444-3_42","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"10 May 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ACPR","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Asian Conference on Pattern Recognition","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Jeju Island","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Korea (Republic of)","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2021","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"9 November 2021","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"12 November 2021","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"6","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"acpr2021","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.acpr2021.org","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EasyChair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"154","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"85","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"55% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}