{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T01:32:46Z","timestamp":1743039166280,"version":"3.40.3"},"publisher-location":"Cham","reference-count":20,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783031039478"},{"type":"electronic","value":"9783031039485"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-3-031-03948-5_25","type":"book-chapter","created":{"date-parts":[[2022,5,23]],"date-time":"2022-05-23T14:07:17Z","timestamp":1653314837000},"page":"313-326","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Fault Localization Based on Deep Neural Network and Execution Slicing"],"prefix":"10.1007","author":[{"given":"Wei-Dong","family":"Zhao","sequence":"first","affiliation":[]},{"given":"Xin-Ling","family":"Li","sequence":"additional","affiliation":[]},{"given":"Ming","family":"Wang","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2022,4,25]]},"reference":[{"issue":"008","key":"25_CR1","doi-asserted-by":"publisher","first-page":"1411","DOI":"10.3724\/SP.J.1016.2011.01411","volume":"34","author":"K Yu","year":"2011","unstructured":"Yu, K., Lin, M.: Advances in fault localization techniques for automation software. Chin. J. Comput. 34(008), 1411\u20131422 (2011)","journal-title":"Chin. J. Comput."},{"issue":"04","key":"25_CR2","doi-asserted-by":"publisher","first-page":"573","DOI":"10.1142\/S021819400900426X","volume":"19","author":"WE Wong","year":"2009","unstructured":"Wong, W.E., Qi, Y.: BP neural network-based effective fault localization. Int. J. Softw. Eng. Knowl. Eng. 19(04), 573\u2013597 (2009)","journal-title":"Int. J. Softw. Eng. Knowl. Eng."},{"key":"25_CR3","doi-asserted-by":"crossref","unstructured":"Ascari, L.C., Araki, L.Y., Pozo, A.R.T., Vergilio, S.R.: Exploring machine learning techniques for fault localization, pp. 1\u20136. IEEE (2009)","DOI":"10.1109\/LATW.2009.4813783"},{"issue":"1","key":"25_CR4","doi-asserted-by":"publisher","first-page":"149","DOI":"10.1109\/TR.2011.2172031","volume":"61","author":"WE Wong","year":"2012","unstructured":"Wong, W.E., Debroy, V., Golden, R., Xu, X., Thuraisingham, B.: Effective software fault localization using an RBF neural network. IEEE Trans. Reliab. 61(1), 149\u2013169 (2012)","journal-title":"IEEE Trans. Reliab."},{"key":"25_CR5","doi-asserted-by":"crossref","unstructured":"Briand, L.C., Labiche, Y., Liu, X.: Using machine learning to support debugging with Tarantula, pp. 137\u2013146. IEEE (2007)","DOI":"10.1109\/ISSRE.2007.31"},{"issue":"10","key":"25_CR6","doi-asserted-by":"publisher","first-page":"1061","DOI":"10.1002\/spe.798","volume":"37","author":"CD Sterling","year":"2010","unstructured":"Sterling, C.D., Olsson, R.A.: Automated bug isolation via program chipping. Softw. Pract. Experiance 37(10), 1061\u20131086 (2010)","journal-title":"Softw. Pract. Experiance"},{"key":"25_CR7","doi-asserted-by":"crossref","unstructured":"Wang, Y., Patil, H., Pereira, C., Lueck, G., Gupta, R., Neamtiu, I.: DrDebug: deterministic replay based cyclic debugging with dynamic slicing, pp. 98\u2013108. ACM (2014)","DOI":"10.1145\/2544137.2544152"},{"key":"25_CR8","doi-asserted-by":"crossref","unstructured":"Ju, X., Jiang, S., Xiang, C., Wang, X., Zhang, Y., Cao, H.: HSFal: effective fault localization using a hybrid spectrum of full slices and execution slices. J. Syst. Softw. 90, 3\u201317 (2014)","DOI":"10.1016\/j.jss.2013.11.1109"},{"key":"25_CR9","unstructured":"Chao, L., Zhang, X., Han, J., Yu, Z., Bhargava, B.K.: Indexing noncrashing failures: a dynamic program slicing-based approach. IEEE (2015)"},{"key":"25_CR10","doi-asserted-by":"crossref","unstructured":"Mao, X., Yan, L., Dai, Z., Qi, Y., Wang, C.: Slice-based statistical fault localization. J. Syst. Softw. 89, 51\u201362 (2014)","DOI":"10.1016\/j.jss.2013.08.031"},{"key":"25_CR11","doi-asserted-by":"crossref","unstructured":"Alves, E., Gligoric, M., Jagannath, V., D'Amorim, M.: Fault-localization using dynamic slicing and change impact analysis (2011)","DOI":"10.1109\/ASE.2011.6100114"},{"issue":"8","key":"25_CR12","doi-asserted-by":"publisher","first-page":"707","DOI":"10.1109\/TSE.2016.2521368","volume":"42","author":"WE Wong","year":"2016","unstructured":"Wong, W.E., Gao, R., Li, Y., Abreu, R., Wotawa, F.: A survey on software fault localization. IEEE Trans. Software Eng. 42(8), 707\u2013740 (2016)","journal-title":"IEEE Trans. Software Eng."},{"key":"25_CR13","unstructured":"Mao, Y., Gui, X., Li, Q., He, X.: Deep learning applied technology research. Application Research of Computers (2016)"},{"key":"25_CR14","doi-asserted-by":"publisher","first-page":"350","DOI":"10.1016\/j.neucom.2017.01.026","volume":"237","author":"L Zhou","year":"2017","unstructured":"Zhou, L., Pan, S., Wang, J., Vasilakos, A.V.: Machine learning on big data: opportunities and challenges. Neurocomputing (Amsterdam) 237, 350\u2013361 (2017)","journal-title":"Neurocomputing (Amsterdam)"},{"issue":"6245","key":"25_CR15","doi-asserted-by":"publisher","first-page":"255","DOI":"10.1126\/science.aaa8415","volume":"349","author":"MI Jordan","year":"2015","unstructured":"Jordan, M.I., Mitchell, T.M.: Machine learning: trends, perspectives, and prospects. Science 349(6245), 255\u2013260 (2015)","journal-title":"Science"},{"issue":"4","key":"25_CR16","doi-asserted-by":"publisher","first-page":"3039","DOI":"10.1109\/COMST.2019.2926625","volume":"21","author":"M Chen","year":"2017","unstructured":"Chen, M., Challita, U., Saad, W., Yin, C., Debbah, M.: Artificial neural networks-based machine learning for wireless networks: a tutorial. IEEE Commun. Surv. Tutorials 21(4), 3039\u20133071 (2017)","journal-title":"IEEE Commun. Surv. Tutorials"},{"key":"25_CR17","doi-asserted-by":"crossref","unstructured":"Ju, X., Jiang, S., Chen, X., Zhang, Y., Shao, H.: 51(12), 16 (2014)","DOI":"10.1155\/2014\/525141"},{"key":"25_CR18","doi-asserted-by":"publisher","first-page":"1573","DOI":"10.1016\/j.infsof.2009.06.013","volume":"51","author":"Z Zhang","year":"2009","unstructured":"Zhang, Z., Chan, W.K., Tse, T.H., Hu, P., Wang, X.: Is non-parametric hypothesis testing model robust for statistical fault localization? Inf. Softw. Technol. 51, 1573\u20131585 (2009)","journal-title":"Inf. Softw. Technol."},{"key":"25_CR19","doi-asserted-by":"crossref","unstructured":"Gong, C., Zheng, Z., Li, W., Hao, P.: Effects of class imbalance in test suites: an empirical study of spectrum-based fault localization, pp. 470\u2013475. IEEE (2012)","DOI":"10.1109\/COMPSACW.2012.89"},{"key":"25_CR20","doi-asserted-by":"crossref","unstructured":"Wong, W.E., Debroy, V., Li, Y., Gao, R.: Software fault localization using DStar (D*) (2012)","DOI":"10.1109\/SERE.2012.12"}],"container-title":["IFIP Advances in Information and Communication Technology","Intelligent Information Processing XI"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-03948-5_25","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,28]],"date-time":"2024-05-28T08:11:39Z","timestamp":1716883899000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-03948-5_25"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9783031039478","9783031039485"],"references-count":20,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-03948-5_25","relation":{},"ISSN":["1868-4238","1868-422X"],"issn-type":[{"type":"print","value":"1868-4238"},{"type":"electronic","value":"1868-422X"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"25 April 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"IIP","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Intelligent Information Processing","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Qingdao","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"27 May 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"30 May 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"12","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"iip2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.intsci.ac.cn\/iip2022","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"3 reviews per paper","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EasyChair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"56","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"37","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"6","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"66% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"No","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}