{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T06:05:01Z","timestamp":1742969101034,"version":"3.40.3"},"publisher-location":"Cham","reference-count":26,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783031048807"},{"type":"electronic","value":"9783031048814"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-3-031-04881-4_35","type":"book-chapter","created":{"date-parts":[[2022,4,25]],"date-time":"2022-04-25T19:02:54Z","timestamp":1650913374000},"page":"447-457","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["An End-to-End Approach for\u00a0Seam Carving Detection Using Deep Neural Networks"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3410-6247","authenticated-orcid":false,"given":"Thierry P.","family":"Moreira","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2568-8019","authenticated-orcid":false,"given":"Marcos Cleison S.","family":"Santana","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3529-3109","authenticated-orcid":false,"given":"Leandro A.","family":"Passos","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6494-7514","authenticated-orcid":false,"given":"Jo\u00e3o Paulo","family":"Papa","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5458-3908","authenticated-orcid":false,"given":"Kelton Augusto P.","family":"da Costa","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2022,4,26]]},"reference":[{"key":"35_CR1","doi-asserted-by":"crossref","unstructured":"Avidan, S., Shamir, A.: Seam carving for content-aware image resizing. ACM Trans. Graph. 26(3), July 2007","DOI":"10.1145\/1276377.1276390"},{"issue":"9","key":"35_CR2","doi-asserted-by":"publisher","first-page":"1705","DOI":"10.1109\/TPAMI.2009.155","volume":"32","author":"J Chen","year":"2010","unstructured":"Chen, J., Shan, S., He, C., Zhao, G., Pietikainen, M., Chen, X., Gao, W.: Wld: a robust local image descriptor. Pattern Anal. Mach. Intell. 32(9), 1705\u20131720 (2010)","journal-title":"Pattern Anal. Mach. Intell."},{"key":"35_CR3","unstructured":"Chollet, F., et al.: Keras (2015). https:\/\/keras.io"},{"key":"35_CR4","unstructured":"Cieslak, L.F.S., Costa, K.A.P., Papa, J.P.: Seam carving detection using convolutional neural networks. In: IEEE 12th International Symposium on Applied Computational Intelligence and Informatics (SACI), pp. 195\u2013200, May 2018"},{"key":"35_CR5","first-page":"273","volume":"20","author":"C Cortes","year":"1995","unstructured":"Cortes, C., Vapnik, V.: Support vector networks. Mach. Learn. 20, 273\u2013297 (1995)","journal-title":"Mach. Learn."},{"key":"35_CR6","unstructured":"Fan, R.E., Chang, K.W., Hsieh, C.J., Wang, X.R., Lin, C.J.: Liblinear: A library for large linear classification. J. Mach. Learn. Res. 9, 1871\u20131874 (2008)"},{"key":"35_CR7","doi-asserted-by":"publisher","unstructured":"Giancardo, L., Arevalo, O., Tenreiro, A., Riascos, R., Bonfante, E.: Mri compatibility: automatic brain shunt valve recognition using feature engineering and deep convolutional neural networks. Sci. Rep. 8, December 2018. https:\/\/doi.org\/10.1038\/s41598-018-34164-6","DOI":"10.1038\/s41598-018-34164-6"},{"key":"35_CR8","doi-asserted-by":"publisher","unstructured":"Ji, P., Salzmann, M., Li, H.: Efficient dense subspace clustering. In: IEEE Winter Conference on Applications of Computer Vision, pp. 461\u2013468, March 2014. https:\/\/doi.org\/10.1109\/WACV.2014.6836065","DOI":"10.1109\/WACV.2014.6836065"},{"key":"35_CR9","unstructured":"Krizhevsky, A., Ilya, S., Hinton, G.E.: Imagenet classification with deep convolutional neural networks. In: Advances in Neural Information Processing Systems, pp. 1097\u20131105. Curran Associates, Inc. (2012)"},{"key":"35_CR10","doi-asserted-by":"crossref","unstructured":"Li, Y., Xia, M., Liu, X., Yang, G.: Identification of various image retargeting techniques using hybrid features. J. Inf. Secur. Appl. 51, 102459 (2020)","DOI":"10.1016\/j.jisa.2020.102459"},{"key":"35_CR11","doi-asserted-by":"publisher","unstructured":"Liu, N., Fang, Y., Guo, Y.: Enhancing feature correlation for\u00a0bi-modal group emotion recognition. In: Hong, R., Cheng, W.-H., Yamasaki, T., Wang, M., Ngo, C.-W. (eds.) PCM 2018. LNCS, vol. 11165, pp. 24\u201334. Springer, Cham (2018). https:\/\/doi.org\/10.1007\/978-3-030-00767-6_3","DOI":"10.1007\/978-3-030-00767-6_3"},{"key":"35_CR12","doi-asserted-by":"crossref","unstructured":"Liu, Q., Cooper, P.A., Zhou, B.: An improved approach to detecting content-aware scaling-based tampering in jpeg images. In: IEEE China Summit International Conference on Signal and Information Processing (ChinaSIP), pp. 432\u2013436, July 2013","DOI":"10.1109\/ChinaSIP.2013.6625376"},{"key":"35_CR13","unstructured":"Loshchilov, I., Hutter, F.: Sgdr: stochastic gradient descent with warm restarts. arXiv preprint arXiv:1608.03983 (2016)"},{"key":"35_CR14","doi-asserted-by":"crossref","unstructured":"McInnes, L., Healy, J.: Umap: uniform manifold approximation and projection for dimension reduction. arXiv preprint arXiv:1802.03426 (2018)","DOI":"10.21105\/joss.00861"},{"key":"35_CR15","doi-asserted-by":"crossref","unstructured":"Nam, S.H., Ahn, W., Yu, I.J., Kwon, M.J., Son, M., Lee, H.K.: Deep convolutional neural network for identifying seam-carving forgery. IEEE Trans. Circuits Syst. Video Technol. 31, 3308\u20133326(2020)","DOI":"10.1109\/TCSVT.2020.3037662"},{"key":"35_CR16","doi-asserted-by":"publisher","unstructured":"Nataraj, L., Gudavalli, C., Manhar Mohammed, T., Chandrasekaran, S., Manjunath, B.S.: Seam carving detection and localization using two-stage deep neural networks. In: Gopi, E.S. (ed.) Machine Learning, Deep Learning and Computational Intelligence for Wireless Communication. LNEE, vol. 749, pp. 381\u2013394. Springer, Singapore (2021). https:\/\/doi.org\/10.1007\/978-981-16-0289-4_29","DOI":"10.1007\/978-981-16-0289-4_29"},{"issue":"1","key":"35_CR17","doi-asserted-by":"publisher","first-page":"512","DOI":"10.1016\/j.patcog.2011.07.013","volume":"45","author":"JP Papa","year":"2012","unstructured":"Papa, J.P., Falc\u00e3o, A.X., Albuquerque, V.H.C., Tavares, J.M.R.S.: Efficient supervised optimum-path forest classification for large datasets. Pattern Recogn. 45(1), 512\u2013520 (2012)","journal-title":"Pattern Recogn."},{"issue":"2","key":"35_CR18","doi-asserted-by":"publisher","first-page":"120","DOI":"10.1002\/ima.20188","volume":"19","author":"JP Papa","year":"2009","unstructured":"Papa, J.P., Falc\u00e3o, A.X., Suzuki, C.T.N.: Supervised pattern classification based on optimum-path forest. Int. J. Imaging Syst. Technol. 19(2), 120\u2013131 (2009)","journal-title":"Int. J. Imaging Syst. Technol."},{"key":"35_CR19","doi-asserted-by":"crossref","unstructured":"Papa, J.P., Fernandes, S.E.N., Falc\u00e3o, A.X.: Optimum-path forest based on k-connectivity: theory and applications. Pattern Recogn. Lett. 87, 117\u2013126, 102459 (2017)","DOI":"10.1016\/j.patrec.2016.07.026"},{"key":"35_CR20","unstructured":"Pedregosa, F., et al.: Scikit-learn: machine learning in Python. J. Mach. Learn. Res. 12, 2825\u20132830, 102459 (2011)"},{"key":"35_CR21","doi-asserted-by":"crossref","unstructured":"Ryu, S., Lee, H., Lee, H.: Detecting trace of seam carving for forensic analysis. IEICE Trans. Inf. Syst. E97.D(5), 1304\u20131311 (2014)","DOI":"10.1587\/transinf.E97.D.1304"},{"issue":"19","key":"35_CR22","doi-asserted-by":"publisher","first-page":"2507","DOI":"10.1093\/bioinformatics\/btm344","volume":"23","author":"Y Saeys","year":"2007","unstructured":"Saeys, Y., Inza, I., Larra\u00f1aga, P.: A review of feature selection techniques in bioinformatics. Bioinformatics 23(19), 2507\u20132517 (2007)","journal-title":"Bioinformatics"},{"issue":"1","key":"35_CR23","doi-asserted-by":"publisher","first-page":"44","DOI":"10.1109\/MIS.2019.2949984","volume":"35","author":"MC Santana","year":"2019","unstructured":"Santana, M.C., Passos, L.A., Moreira, T.P., Colombo, D., de Albuquerque, V.H.C., Papa, J.P.: A novel siamese-based approach for scene change detection with applications to obstructed routes in hazardous environments. IEEE Intell. Syst. 35(1), 44\u201353 (2019)","journal-title":"IEEE Intell. Syst."},{"issue":"8","key":"35_CR24","doi-asserted-by":"publisher","first-page":"905","DOI":"10.1016\/0031-3203(90)90135-8","volume":"23","author":"L Wang","year":"1990","unstructured":"Wang, L., He, D.: Texture classification using texture spectrum. Pattern Recogn. 23(8), 905\u2013910 (1990)","journal-title":"Pattern Recogn."},{"key":"35_CR25","doi-asserted-by":"crossref","unstructured":"Yin, T., Yang, G., Li, L., Zhang, D., Sun, X.: Detecting seam carving based image resizing using local binary patterns. Comput. Secur. 55, 130\u2013141, 102459 (2015)","DOI":"10.1016\/j.cose.2015.09.003"},{"key":"35_CR26","doi-asserted-by":"crossref","unstructured":"Zhang, D., Li, Q., Yang, G., Li, L., Sun, X.: Detection of image seam carving by using weber local descriptor and local binary patterns. J. Inf. Secur. Appl. 36(C), 135\u2013144 (2017)","DOI":"10.1016\/j.jisa.2017.09.003"}],"container-title":["Lecture Notes in Computer Science","Pattern Recognition and Image Analysis"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-04881-4_35","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,7]],"date-time":"2024-03-07T16:04:29Z","timestamp":1709827469000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-04881-4_35"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9783031048807","9783031048814"],"references-count":26,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-04881-4_35","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"26 April 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"IbPRIA","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Iberian Conference on Pattern Recognition and Image Analysis","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Aveiro","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Portugal","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"4 May 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"6 May 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"10","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"ibpria2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.ibpria.org\/2022\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EasyChair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"72","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"54","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"75% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}