{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T09:26:18Z","timestamp":1742981178096,"version":"3.40.3"},"publisher-location":"Cham","reference-count":14,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783031067877"},{"type":"electronic","value":"9783031067884"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-3-031-06788-4_14","type":"book-chapter","created":{"date-parts":[[2022,7,3]],"date-time":"2022-07-03T23:03:27Z","timestamp":1656889407000},"page":"161-172","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["A Power Grid Equipment Fault Prediction Model Based on Faster RCNN and Video Streaming"],"prefix":"10.1007","author":[{"given":"Youjun","family":"Feng","sequence":"first","affiliation":[]},{"given":"Jinman","family":"Luo","sequence":"additional","affiliation":[]},{"given":"Zhaocong","family":"Wen","sequence":"additional","affiliation":[]},{"given":"Zirui","family":"Yao","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2022,7,4]]},"reference":[{"key":"14_CR1","unstructured":"Qian, J., Wang, K., Wang, R., Peng, X.: Inspection mission planning for substation intelligent robot. Guangdong Electric Power (2017)"},{"issue":"2","key":"14_CR2","first-page":"368","volume":"45","author":"X Peng","year":"2019","unstructured":"Peng, X., Wang, K., Xiao, X., Wu, K., Gu, W.: Broadband satellite communication system in the intelligent inspection of electric power line base on large scale unmanned helicopter. Gaodianya Jishu\/High Voltage Eng. 45(2), 368\u2013376 (2019)","journal-title":"Gaodianya Jishu\/High Voltage Eng."},{"issue":"1","key":"14_CR3","first-page":"14","volume":"46","author":"G Shao","year":"2020","unstructured":"Shao, G., Liu, Z., Fu, J.: Research progress in unmanned aerial vehicle inspection technology on overhead transmission lines. High Voltage Eng. 46(1), 14\u201322 (2020)","journal-title":"High Voltage Eng."},{"key":"14_CR4","unstructured":"Zhang, C.F., Xu, W., Liu, J.F.: Research on surveillance video data structuring method based on computer vision in substation. Electric Power Information and Communication Technology (2018)"},{"key":"14_CR5","unstructured":"Wu, H., Li, M., Yang, Y., et al.: An object detection method and its optimization for substation video surveillance terminals. Guangdong Electric Power (2019)"},{"issue":"8","key":"14_CR6","first-page":"1289","volume":"43","author":"H Zhang","year":"2017","unstructured":"Zhang, H., Wang, K., Wang, F.: Advances and perspectives on applications of deep learning in visual object detections. Acta Automatica Sinica 43(8), 1289\u20131305 (2017)","journal-title":"Acta Automatica Sinica"},{"key":"14_CR7","unstructured":"Krizhevsky, A., Sutskever, I., Hinton, G.: ImageNet classification with deep convolutional neural networks. In: Advances in Neural Information Processing Systems (2012)"},{"key":"14_CR8","doi-asserted-by":"crossref","unstructured":"Girshick, R., Donahue, J., Darrell, T., Malik, J.: Rich feature hierarchies for accurate object detection and semantic segmentation. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (2013)","DOI":"10.1109\/CVPR.2014.81"},{"key":"14_CR9","doi-asserted-by":"crossref","unstructured":"Redmon, J., Divvala, S., Girshick, R., Farhadi, A.: You only look once: unified, real-time object detection. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 779\u2013788 (2016)","DOI":"10.1109\/CVPR.2016.91"},{"key":"14_CR10","doi-asserted-by":"crossref","unstructured":"Girshick, R. Fast R-CNN. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 1440\u20131448 (2015)","DOI":"10.1109\/ICCV.2015.169"},{"issue":"6","key":"14_CR11","doi-asserted-by":"publisher","first-page":"1137","DOI":"10.1109\/TPAMI.2016.2577031","volume":"39","author":"S Ren","year":"2017","unstructured":"Ren, S., He, K., Girshick, R., Sun, J.: Faster R-CNN: towards real-time object detection with region proposal networks. IEEE Trans. Pattern Anal. Mach. Intell. 39(6), 1137\u20131149 (2017)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"issue":"4","key":"14_CR12","first-page":"640","volume":"39","author":"J Long","year":"2015","unstructured":"Long, J., Shelhamer, E., Darrell, T.: Fully convolutional networks for semantic segmentation. IEEE Trans. Pattern Anal. Mach. Intell. 39(4), 640\u2013651 (2015)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"14_CR13","unstructured":"Simonyan, K., Zisserman, A.: Very deep convolutional networks for large-scale image recognition. arXiv:1409.1556 (2014)"},{"key":"14_CR14","doi-asserted-by":"crossref","unstructured":"He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 770\u2013778 (2015)","DOI":"10.1109\/CVPR.2016.90"}],"container-title":["Lecture Notes in Computer Science","Artificial Intelligence and Security"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-06788-4_14","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T12:22:32Z","timestamp":1657714952000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-06788-4_14"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9783031067877","9783031067884"],"references-count":14,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-06788-4_14","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"4 July 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICAIS","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Artificial Intelligence and Security","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Qinghai","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"China","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"15 July 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"20 July 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"8","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"incodldos2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/www.icaisconf.com\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"CMT","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"1124","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"115","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"53","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"10% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"8","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}