{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,8]],"date-time":"2025-10-08T15:53:28Z","timestamp":1759938808967,"version":"3.40.3"},"publisher-location":"Cham","reference-count":17,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783031074776"},{"type":"electronic","value":"9783031074783"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-3-031-07478-3_10","type":"book-chapter","created":{"date-parts":[[2022,5,24]],"date-time":"2022-05-24T09:03:27Z","timestamp":1653383007000},"page":"119-125","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":2,"title":["Supporting Zero Defect Manufacturing Through Cloud Computing and\u00a0Data Analytics: the Case Study of\u00a0Electrospindle 4.0"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9216-8502","authenticated-orcid":false,"given":"Francesco","family":"Leotta","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4626-826X","authenticated-orcid":false,"given":"Jerin George","family":"Mathew","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9730-8882","authenticated-orcid":false,"given":"Massimo","family":"Mecella","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3349-7861","authenticated-orcid":false,"given":"Flavia","family":"Monti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2022,5,25]]},"reference":[{"issue":"1","key":"10_CR1","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1080\/00207543.2019.1605228","volume":"58","author":"F Psarommatis","year":"2020","unstructured":"Psarommatis, F., May, G., Dreyfus, P.A., Kiritsis, D.: Zero defect manufacturing: state-of-the-art review, shortcomings and future directions in research. Int. J. Prod. Res. 58(1), 1\u201317 (2020)","journal-title":"Int. J. Prod. Res."},{"key":"10_CR2","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2021.103596","volume":"136","author":"D Powell","year":"2022","unstructured":"Powell, D., Magnanini, M.C., Colledani, M., Myklebust, O.: Advancing zero defect manufacturing: a state-of-the-art perspective and future research directions. Comput. Ind. 136, 103596 (2022)","journal-title":"Comput. Ind."},{"key":"10_CR3","unstructured":"Halpin, J.F.: Zero Defects: a New Dimension in Quality Assurance. McGraw-Hill, New York (1966)"},{"key":"10_CR4","first-page":"174","volume":"17","author":"PB Crosby","year":"1979","unstructured":"Crosby, P.B., Free, Q.I.: The art of making quality certain. N.Y. New Am. Library 17, 174\u201383 (1979)","journal-title":"N.Y. New Am. Library"},{"issue":"1","key":"10_CR5","doi-asserted-by":"publisher","first-page":"62","DOI":"10.1007\/s40436-013-0010-9","volume":"1","author":"KS Wang","year":"2013","unstructured":"Wang, K.S.: Towards zero-defect manufacturing (ZDM)-a data mining approach. Adv. Manuf. 1(1), 62\u201374 (2013)","journal-title":"Adv. Manuf."},{"key":"10_CR6","doi-asserted-by":"crossref","unstructured":"Angione, G., Cristalli, C., Barbosa, J., Leit\u00e3o, P.: Integration challenges for the deployment of a multi-stage zero-defect manufacturing architecture. In: 2019 IEEE 17th International Conference on Industrial Informatics (INDIN), vol. 1, pp. 1615\u20131620. IEEE (2019)","DOI":"10.1109\/INDIN41052.2019.8972259"},{"key":"10_CR7","doi-asserted-by":"publisher","first-page":"646","DOI":"10.1016\/j.procir.2020.05.154","volume":"93","author":"MC Magnanini","year":"2020","unstructured":"Magnanini, M.C., Colledani, M., Caputo, D.: Reference architecture for the industrial implementation of zero-defect manufacturing strategies. Procedia CIRP 93, 646\u2013651 (2020)","journal-title":"Procedia CIRP"},{"key":"10_CR8","doi-asserted-by":"crossref","unstructured":"Paolanti, M., Romeo, L., Felicetti, A., Mancini, A., Frontoni, E., Loncarski, J.: Machine learning approach for predictive maintenance in industry 4.0. In: 2018 14th IEEE\/ASME International Conference on Mechatronic and Embedded Systems and Applications (MESA), pp. 1\u20136. IEEE (2018)","DOI":"10.1109\/MESA.2018.8449150"},{"key":"10_CR9","doi-asserted-by":"publisher","first-page":"21","DOI":"10.1016\/j.ijmachtools.2016.10.005","volume":"112","author":"H Cao","year":"2017","unstructured":"Cao, H., Zhang, X., Chen, X.: The concept and progress of intelligent spindles: a review. Int. J. Mach. Tools Manuf. 112, 21\u201352 (2017)","journal-title":"Int. J. Mach. Tools Manuf."},{"key":"10_CR10","doi-asserted-by":"publisher","first-page":"81","DOI":"10.1016\/j.promfg.2020.06.015","volume":"49","author":"Y Wang","year":"2020","unstructured":"Wang, Y., Zhao, Y., Addepalli, S.: Remaining useful life prediction using deep learning approaches: a review. Procedia Manuf. 49, 81\u201388 (2020)","journal-title":"Procedia Manuf."},{"key":"10_CR11","doi-asserted-by":"publisher","first-page":"830","DOI":"10.1016\/j.jmsy.2021.02.006","volume":"61","author":"S Zhai","year":"2021","unstructured":"Zhai, S., Gehring, B., Reinhart, G.: Enabling predictive maintenance integrated production scheduling by operation-specific health prognostics with generative deep learning. J. Manuf. Syst. 61, 830\u2013855 (2021)","journal-title":"J. Manuf. Syst."},{"issue":"3","key":"10_CR12","doi-asserted-by":"publisher","first-page":"2213","DOI":"10.1109\/JSYST.2019.2905565","volume":"13","author":"W Zhang","year":"2019","unstructured":"Zhang, W., Yang, D., Wang, H.: Data-driven methods for predictive maintenance of industrial equipment: a survey. IEEE Syst. J. 13(3), 2213\u20132227 (2019)","journal-title":"IEEE Syst. J."},{"key":"10_CR13","doi-asserted-by":"crossref","unstructured":"Catarci, T., Firmani, D., Leotta, F., Mandreoli, F., Mecella, M., Sapio, F.: A conceptual architecture and model for smart manufacturing relying on service-based digital twins. In: 2019 IEEE International Conference on Web Services (ICWS), pp. 229\u2013236. IEEE (2019)","DOI":"10.1109\/ICWS.2019.00047"},{"key":"10_CR14","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"3","DOI":"10.1007\/978-3-030-85469-0_1","volume-title":"Business Process Management","author":"S Rinderle-Ma","year":"2021","unstructured":"Rinderle-Ma, S., Mangler, J.: Process automation and process mining in manufacturing. In: Polyvyanyy, A., Wynn, M.T., Van Looy, A., Reichert, M. (eds.) BPM 2021. LNCS, vol. 12875, pp. 3\u201314. Springer, Cham (2021). https:\/\/doi.org\/10.1007\/978-3-030-85469-0_1"},{"issue":"3","key":"10_CR15","doi-asserted-by":"publisher","first-page":"241","DOI":"10.1016\/S0360-8352(01)00045-6","volume":"41","author":"TC Kuo","year":"2001","unstructured":"Kuo, T.C., Huang, S.H., Zhang, H.C.: Design for manufacture and design for \u2018x\u2019: concepts, applications, and perspectives. Comput. Ind. Eng. 41(3), 241\u2013260 (2001)","journal-title":"Comput. Ind. Eng."},{"issue":"3","key":"10_CR16","first-page":"20","volume":"6","author":"S Goyal","year":"2014","unstructured":"Goyal, S.: Public vs private vs hybrid vs community-cloud computing: a critical review. Int. J. Comput. Netw. Inf. Secur. 6(3), 20\u201329 (2014)","journal-title":"Int. J. Comput. Netw. Inf. Secur."},{"issue":"8","key":"10_CR17","doi-asserted-by":"publisher","first-page":"1655","DOI":"10.1109\/JPROC.2019.2921977","volume":"107","author":"J Chen","year":"2019","unstructured":"Chen, J., Ran, X.: Deep learning with edge computing: a review. Proc. IEEE 107(8), 1655\u20131674 (2019)","journal-title":"Proc. IEEE"}],"container-title":["Lecture Notes in Business Information Processing","Advanced Information Systems Engineering Workshops"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-07478-3_10","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,29]],"date-time":"2022-05-29T23:09:23Z","timestamp":1653865763000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-07478-3_10"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9783031074776","9783031074783"],"references-count":17,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-07478-3_10","relation":{},"ISSN":["1865-1348","1865-1356"],"issn-type":[{"type":"print","value":"1865-1348"},{"type":"electronic","value":"1865-1356"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"25 May 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"CAiSE","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Advanced Information Systems Engineering","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Leuven","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Belgium","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"6 June 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"10 June 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"34","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"caise2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/caise22.ugent.be\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Single-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EasyChair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"203","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"31","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"15% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2-3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"6-10","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}