{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T19:49:40Z","timestamp":1743104980714,"version":"3.40.3"},"publisher-location":"Cham","reference-count":22,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783031107658"},{"type":"electronic","value":"9783031107665"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-3-031-10766-5_15","type":"book-chapter","created":{"date-parts":[[2022,7,21]],"date-time":"2022-07-21T14:14:51Z","timestamp":1658412891000},"page":"197-209","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["A Secure Communication Gateway with Parity Generator Implementation in QCA Platform"],"prefix":"10.1007","author":[{"given":"Suparba","family":"Tapna","sequence":"first","affiliation":[]},{"given":"Kisalaya","family":"Chakrabarti","sequence":"additional","affiliation":[]},{"given":"Debarka","family":"Mukhopadhyay","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2022,7,22]]},"reference":[{"key":"15_CR1","unstructured":"Compano, R., Molenkamp, L., Paul, D.J.: Technology roadmap for nanoelectronics. In: European Commission IST Programme, Future and Emerging Technologies, pp. 1\u2013104 (2000)"},{"key":"15_CR2","doi-asserted-by":"publisher","first-page":"49","DOI":"10.1088\/0957-4484\/4\/1\/004","volume":"4","author":"CS Lent","year":"1993","unstructured":"Lent, C.S., Tougaw, P.D., Porod, W., Bernestein, G.H.: Quantum cellular automata. Nanotechnology 4, 49\u201357 (1993)","journal-title":"Nanotechnology"},{"key":"15_CR3","doi-asserted-by":"publisher","first-page":"49","DOI":"10.1002\/1097-007X(200101\/02)29:1<49::AID-CTA132>3.0.CO;2-1","volume":"29","author":"MT Niemer","year":"2001","unstructured":"Niemer, M.T., Kogge, P.M.: Problems in designing with QCAs: layout = timing. Int. J. Circuit Theory Appl. 29, 49\u201362 (2001)","journal-title":"Int. J. Circuit Theory Appl."},{"key":"15_CR4","doi-asserted-by":"publisher","first-page":"619","DOI":"10.1016\/j.mejo.2004.12.002","volume":"36","author":"GH Bernstein","year":"2005","unstructured":"Bernstein, G.H., et al.: Magnetic QCA systems. Microelectron. J. 36, 619\u2013624 (2005)","journal-title":"Microelectron. J."},{"key":"15_CR5","volume-title":"Design and Test of Digital Circuits by Quantum-dot Cellular Automata","author":"J Huang","year":"2007","unstructured":"Huang, J., Lombardi, F.: Design and Test of Digital Circuits by Quantum-dot Cellular Automata. Artech House Inc., Norwood (2007)"},{"issue":"12","key":"15_CR6","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TCSII.2020.3004371","volume":"67","author":"S Lee","year":"2020","unstructured":"Lee, S., Cho, K., Choi, S., Kang, S.: A new logic topology-based scan chain stitching for test-power reduction. IEEE Trans. Circuits Syst. II 67(12), 1\u20135 (2020)","journal-title":"IEEE Trans. Circuits Syst. II"},{"issue":"9","key":"15_CR7","doi-asserted-by":"publisher","first-page":"2096","DOI":"10.1109\/TVLSI.2019.2916497","volume":"27","author":"I Pomeranz","year":"2019","unstructured":"Pomeranz, I.: Extended transparent-scan. IEEE Trans. Very Large Scale Integr. VLSI Syst. 27(9), 2096\u20132104 (2019)","journal-title":"IEEE Trans. Very Large Scale Integr. VLSI Syst."},{"key":"15_CR8","doi-asserted-by":"publisher","first-page":"1546","DOI":"10.1166\/jctn.2010.1517","volume":"7","author":"K Navi","year":"2010","unstructured":"Navi, K., Sayedsalehi, S., Farazkish, R., Azghadi, M.R.: Five-input majority gate, a new device for quantum-dot cellular automata. J. Comput. Theor. Nanosci. 7, 1546\u20131553 (2010)","journal-title":"J. Comput. Theor. Nanosci."},{"issue":"3","key":"15_CR9","first-page":"1","volume":"67","author":"R Karmakar","year":"2020","unstructured":"Karmakar, R., Chattopadhyay, S., Kapur, R.: A scan obfuscation guided design for-security approach for sequential circuits. IEEE Trans. Circuits Syst. II Express Briefs 67(3), 1\u20135 (2020)","journal-title":"IEEE Trans. Circuits Syst. II Express Briefs"},{"key":"15_CR10","first-page":"160","volume":"2","author":"K Walus","year":"2003","unstructured":"Walus, K., Jullien, G.A., Dimitrov, V.S.: RAM design using quantum-dot cellular automata. Nanotechnol. Conf. Trade Show 2, 160\u2013163 (2003)","journal-title":"Nanotechnol. Conf. Trade Show"},{"issue":"5","key":"15_CR11","doi-asserted-by":"publisher","first-page":"895","DOI":"10.1109\/TCPMT.2020.2973182","volume":"10","author":"M Kanda","year":"2020","unstructured":"Kanda, M., Hashizume, M., Ashikin Binti Ali, F., Yotsuyanagi, H., Lu, S.-K.: Open defect detection not utilizing boundary scan flip-flops in assembled circuit boards. IEEE Trans. Compon. Packag. Manuf. Technol. 10(5), 895\u2013907 (2020)","journal-title":"IEEE Trans. Compon. Packag. Manuf. Technol."},{"issue":"1","key":"15_CR12","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TVLSI.2020.3025138","volume":"29","author":"N Mukherjee","year":"2021","unstructured":"Mukherjee, N., et al.: Time and area optimized testing of automotive ICs. IEEE Trans. Very Large Scale Integr. VLSI Syst. 29(1), 1\u201313 (2021)","journal-title":"IEEE Trans. Very Large Scale Integr. VLSI Syst."},{"key":"15_CR13","doi-asserted-by":"crossref","unstructured":"Debnath, B., Das, J.C., De, D., Ghaemi, F., Ahmadian, A., Senu, N.: Reversible palm vein authenticator design with quantum dot cellular automata for information security in nanocommunication network. IEEE Access 8, 174821\u2013174832 (2020)","DOI":"10.1109\/ACCESS.2020.3025822"},{"issue":"8","key":"15_CR14","doi-asserted-by":"publisher","first-page":"1972","DOI":"10.1109\/TVLSI.2019.2916637","volume":"27","author":"J Kim","year":"2019","unstructured":"Kim, J., Lee, S., Kang, S.: Test-friendly data-selectable self-gating (DSSG). IEEE Trans. Very Large Scale Integr. VLSI Syst. 27(8), 1972\u20131976 (2019)","journal-title":"IEEE Trans. Very Large Scale Integr. VLSI Syst."},{"issue":"1","key":"15_CR15","doi-asserted-by":"publisher","first-page":"26","DOI":"10.1109\/TNANO.2003.820815","volume":"3","author":"K Walus","year":"2004","unstructured":"Walus, K., Dysart, T.J., Jullien, G.A., Budiman, R.A.: QCADesigner: a rapid design and simulation tool for quantum-dot cellular automata. IEEE Trans. Nanotechnol. 3(1), 26\u201331 (2004)","journal-title":"IEEE Trans. Nanotechnol."},{"key":"15_CR16","doi-asserted-by":"publisher","first-page":"519","DOI":"10.1016\/j.mejo.2015.03.001","volume":"46","author":"D Mukhopadhyay","year":"2015","unstructured":"Mukhopadhyay, D., Dutta, P.: A study on energy optimized 4 dot 2 electron two dimensional quantum dot cellular automata logical reversible flip-flops. Microelectron. J. 46, 519\u2013530 (2015)","journal-title":"Microelectron. J."},{"key":"15_CR17","doi-asserted-by":"publisher","first-page":"22400","DOI":"10.1109\/ACCESS.2020.2969258","volume":"8","author":"K Kim","year":"2020","unstructured":"Kim, K., Ibtesam, M., Kim, D., Jung, J., Park, S.: CAN-based aging monitoring technique for automotive ASICs with efficient soft error resilience. IEEE Access 8, 22400\u201322410 (2020)","journal-title":"IEEE Access"},{"key":"15_CR18","unstructured":"Ottavi, M., Vankamamidi, V., Lombardi, F., Pontarelli, S.: Novel memory designs for QCA implementation. In: The fifth IEEE Conference on Nanotechnology, pp. 545\u2013548 (2005)"},{"key":"15_CR19","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/ACCESS.2020.3002081","volume":"8","author":"B Debnath","year":"2020","unstructured":"Debnath, B., et al.: Security analysis with novel image masking based quantum-dot cellular automata information security model. IEEE Access 8, 1\u20134 (2020)","journal-title":"IEEE Access"},{"issue":"5","key":"15_CR20","doi-asserted-by":"publisher","first-page":"1659","DOI":"10.1007\/s00542-017-3445-2","volume":"25","author":"K Datta","year":"2017","unstructured":"Datta, K., Mukhopadhyay, D., Dutta, P.: Comprehensive study on the performance comparison of logically reversible and irreversible parity generator and checker designs using two-dimensional two-dot one-electron QCA. Microsyst. Technol. 25(5), 1659\u20131667 (2017). https:\/\/doi.org\/10.1007\/s00542-017-3445-2","journal-title":"Microsyst. Technol."},{"key":"15_CR21","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1007\/s00542-018-3818-1","volume":"28","author":"K Datta","year":"2018","unstructured":"Datta, K., Mukhopadhyay, D., Dutta, P.: Comprehensive design and analysis of Gray code counters using 2-dimensional 2-dot 1-electron QCA. Microsyst. Technol. 28, 1\u201319 (2018). https:\/\/doi.org\/10.1007\/s00542-018-3818-1","journal-title":"Microsyst. Technol."},{"key":"15_CR22","doi-asserted-by":"crossref","unstructured":"Ghosh, M., Mukhopadhyay, D., Dutta, P.: A novel parallel memory design using 2 dot 1 electron QCA. In: IEEE 2nd International Conference on Recent Trends in Information Systems, pp. 485\u2013490 (2015)","DOI":"10.1109\/ReTIS.2015.7232928"}],"container-title":["Communications in Computer and Information Science","Computational Intelligence in Communications and Business Analytics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-10766-5_15","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,16]],"date-time":"2022-11-16T17:12:08Z","timestamp":1668618728000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-10766-5_15"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9783031107658","9783031107665"],"references-count":22,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-10766-5_15","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"type":"print","value":"1865-0929"},{"type":"electronic","value":"1865-0937"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"22 July 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"CICBA","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Computational Intelligence in Communications and Business Analytics","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Silchar","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"India","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"7 January 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"8 January 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"4","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"cicba2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/www.cicba.in","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"CMT","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"107","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"21","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"13","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"20% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2.5","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}