{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T01:28:44Z","timestamp":1742952524628,"version":"3.40.3"},"publisher-location":"Cham","reference-count":28,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783031163630"},{"type":"electronic","value":"9783031163647"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-3-031-16364-7_20","type":"book-chapter","created":{"date-parts":[[2022,9,28]],"date-time":"2022-09-28T09:03:38Z","timestamp":1664355818000},"page":"271-284","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Enhanced Residual Connections Method for Low Resolution Images in Rice Plant Disease Classification"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6537-1772","authenticated-orcid":false,"given":"K.","family":"Sathya","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9229-5971","authenticated-orcid":false,"given":"M.","family":"Rajalakshmi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2022,9,29]]},"reference":[{"issue":"2","key":"20_CR1","doi-asserted-by":"publisher","first-page":"56","DOI":"10.1109\/38.988747","volume":"22","author":"WT Freeman","year":"2002","unstructured":"Freeman, W.T., Jones, T.R., Pasztor, E.C.: Example-based super-resolution. IEEE Comput. Graph. Appl. 22(2), 56\u201365 (2002)","journal-title":"IEEE Comput. Graph. Appl."},{"issue":"2","key":"20_CR2","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/1944846.1944852","volume":"30","author":"G Freedman","year":"2011","unstructured":"Freedman, G., Fattal, R.: Image and video upscaling from local self-examples. ACM Trans. Graph. (TOG) 30(2), 1\u201311 (2011)","journal-title":"ACM Trans. Graph. (TOG)"},{"key":"20_CR3","doi-asserted-by":"publisher","unstructured":"Wang, X.,\u00a0et al.: ESRGAN: enhanced super-resolution generative adversarial networks. In: Leal-Taix\u00e9, L., Roth, S. (eds.) ECCV 2018. LNCS, vol. 11133, pp. 63\u201379. Springer, Cham (2019). https:\/\/doi.org\/10.1007\/978-3-030-11021-5_5","DOI":"10.1007\/978-3-030-11021-5_5"},{"key":"20_CR4","unstructured":"Goodfellow, I., et al.: Generative adversarial nets. In: Advances in Neural Information Processing Systems, 27 (2014)"},{"key":"20_CR5","doi-asserted-by":"crossref","unstructured":"Lugmayr, A., Danelljan, M., Timofte, R.: Unsupervised learning for real-world super-resolution. In: 2019 IEEE\/CVF International Conference on Computer Vision Workshop (ICCVW), pp. 3408\u20133416. IEEE (2019)","DOI":"10.1109\/ICCVW.2019.00423"},{"issue":"2","key":"20_CR6","doi-asserted-by":"publisher","first-page":"295","DOI":"10.1109\/TPAMI.2015.2439281","volume":"38","author":"C Dong","year":"2015","unstructured":"Dong, C., Loy, C.C., He, K., Tang, X.: Image super-resolution using deep convolutional networks. IEEE Trans. Pattern Anal. Mach. Intell. 38(2), 295\u2013307 (2015)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"20_CR7","doi-asserted-by":"publisher","unstructured":"Dong, C., Loy, C.C., Tang, X.: Accelerating the super-resolution convolutional neural network. In: Leibe, B., Matas, J., Sebe, N., Welling, M. (eds.) ECCV 2016. LNCS, vol. 9906, pp. 391\u2013407. Springer, Cham (2016). https:\/\/doi.org\/10.1007\/978-3-319-46475-6_25","DOI":"10.1007\/978-3-319-46475-6_25"},{"key":"20_CR8","doi-asserted-by":"crossref","unstructured":"Kim, J., Lee, J.K., Lee, K.M.: Accurate image super-resolution using very deep convolutional networks. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 1646\u20131654 (2016)","DOI":"10.1109\/CVPR.2016.182"},{"key":"20_CR9","unstructured":"Simonyan, K., Zisserman, A.: Very deep convolutional networks for large-scale image recognition. arXiv preprint arXiv:1409.1556 (2014)"},{"key":"20_CR10","doi-asserted-by":"crossref","unstructured":"He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 770\u2013778 (2016)","DOI":"10.1109\/CVPR.2016.90"},{"key":"20_CR11","doi-asserted-by":"crossref","unstructured":"Zhang, Y., Tian, Y., Kong, Y., Zhong, B., Fu, Y.: Residual dense network for image super-resolution. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 2472\u20132481 (2018)","DOI":"10.1109\/CVPR.2018.00262"},{"key":"20_CR12","doi-asserted-by":"crossref","unstructured":"Lim, B., Son, S., Kim, H., Nah, S., Mu Lee, K.: Enhanced deep residual networks for single image super-resolution. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition Workshops, pp. 136\u2013144 (2017)","DOI":"10.1109\/CVPRW.2017.151"},{"key":"20_CR13","doi-asserted-by":"crossref","unstructured":"Tai, Y., Yang, J., Liu, X.: Image super-resolution via deep recursive residual network. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 3147\u20133155 (2017)","DOI":"10.1109\/CVPR.2017.298"},{"key":"20_CR14","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"256","DOI":"10.1007\/978-3-030-01249-6_16","volume-title":"Computer Vision \u2013 ECCV 2018","author":"N Ahn","year":"2018","unstructured":"Ahn, N., Kang, B., Sohn, K.-A.: Fast, accurate, and lightweight super-resolution with cascading residual network. In: Ferrari, V., Hebert, M., Sminchisescu, C., Weiss, Y. (eds.) ECCV 2018. LNCS, vol. 11214, pp. 256\u2013272. Springer, Cham (2018). https:\/\/doi.org\/10.1007\/978-3-030-01249-6_16"},{"key":"20_CR15","doi-asserted-by":"crossref","unstructured":"Ledig, C., et al.: Photo realistic single image super-resolution using a generative adversarial network. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 4681\u20134690 (2017)","DOI":"10.1109\/CVPR.2017.19"},{"issue":"6","key":"20_CR16","doi-asserted-by":"publisher","first-page":"1153","DOI":"10.1109\/TASSP.1981.1163711","volume":"29","author":"R Keys","year":"1981","unstructured":"Keys, R.: Cubic convolution interpolation for digital image processing. IEEE Trans. Acoust. Speech Signal Process. 29(6), 1153\u20131160 (1981)","journal-title":"IEEE Trans. Acoust. Speech Signal Process."},{"key":"20_CR17","doi-asserted-by":"crossref","unstructured":"Zhang, K., Zuo, W., Zhang, L.: Learning a single convolutional super-resolution network for multiple degradations. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 3262\u20133271 (2018)","DOI":"10.1109\/CVPR.2018.00344"},{"key":"20_CR18","doi-asserted-by":"publisher","unstructured":"Dong, C., Loy, C.C., He, K., Tang, X.: Learning a deep convolutional network for image super-resolution. In: Fleet, D., Pajdla, T., Schiele, B., Tuytelaars, T. (eds.) ECCV 2014. LNCS, vol. 8692, pp. 184\u2013199. Springer, Cham (2014). https:\/\/doi.org\/10.1007\/978-3-319-10593-2_13","DOI":"10.1007\/978-3-319-10593-2_13"},{"key":"20_CR19","doi-asserted-by":"crossref","unstructured":"Kim, J., Lee, J.K., Lee, K.M.: Deeply-recursive convolutional network for image super-resolution. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 1637\u20131645 (2016)","DOI":"10.1109\/CVPR.2016.181"},{"key":"20_CR20","doi-asserted-by":"crossref","unstructured":"Nah, S., Hyun Kim, T., Mu Lee, K.: Deep multi-scale convolutional neural network for dynamic scene deblurring. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 3883\u20133891 (2017)","DOI":"10.1109\/CVPR.2017.35"},{"key":"20_CR21","doi-asserted-by":"crossref","unstructured":"Szegedy, C., Ioffe, S., Vanhoucke, V., Alemi, A.A.: Inception-v4, inception-resnet and the impact of residual connections on learning. In: Thirty-first AAAI conference on Artificial Intelligence (2017)","DOI":"10.1609\/aaai.v31i1.11231"},{"key":"20_CR22","unstructured":"Timofte, R., Gu, S., Wu, J., Van Gool, L.: Ntire 2018 challenge on single image super-resolution: methods and results. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition Workshops, pp. 852\u2013863 (2018)"},{"key":"20_CR23","doi-asserted-by":"crossref","unstructured":"Huang, J.B., Singh, A., Ahuja, N.: Single image super-resolution from transformed self-exemplars. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 5197\u20135206 (2015)","DOI":"10.1109\/CVPR.2015.7299156"},{"key":"20_CR24","doi-asserted-by":"crossref","unstructured":"Martin, D., Fowlkes, C., Tal, D., Malik, J.: A database of human segmented natural images and its application to evaluating segmentation algorithms and measuring ecological statistics. In: Proceedings Eighth IEEE International Conference on Computer Vision. ICCV 2001, vol. 2, pp. 416\u2013423. IEEE (2001)","DOI":"10.1109\/ICCV.2001.937655"},{"issue":"11","key":"20_CR25","doi-asserted-by":"publisher","first-page":"2861","DOI":"10.1109\/TIP.2010.2050625","volume":"19","author":"J Yang","year":"2010","unstructured":"Yang, J., Wright, J., Huang, T.S., Ma, Y.: Image super-resolution via sparse representation. IEEE Trans. Image Process. 19(11), 2861\u20132873 (2010)","journal-title":"IEEE Trans. Image Process."},{"issue":"10","key":"20_CR26","doi-asserted-by":"publisher","first-page":"3365","DOI":"10.1109\/TPAMI.2020.2982166","volume":"43","author":"Z Wang","year":"2020","unstructured":"Wang, Z., Chen, J., Hoi, S.C.: Deep learning for image super-resolution: a survey. IEEE Trans. Pattern Anal. Mach. Intell. 43(10), 3365\u20133387 (2020)","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"key":"20_CR27","doi-asserted-by":"publisher","DOI":"10.1016\/j.compag.2020.105527","volume":"175","author":"PK Sethy","year":"2020","unstructured":"Sethy, P.K., Barpanda, N.K., Rath, A.K., Behera, S.K.: Deep feature-based rice leaf disease identification using support vector machine. Comput. Electron. Agric. 175, 105527 (2020)","journal-title":"Comput. Electron. Agric."},{"issue":"3","key":"20_CR28","doi-asserted-by":"publisher","first-page":"357","DOI":"10.3233\/IDT-170301","volume":"11","author":"HB Prajapati","year":"2017","unstructured":"Prajapati, H.B., Shah, J.P., Dabhi, V.K.: Detection and classification of rice plant diseases. Intell. Decis. Technol. 11(3), 357\u2013373 (2017)","journal-title":"Intell. Decis. Technol."}],"container-title":["IFIP Advances in Information and Communication Technology","Computational Intelligence in Data Science"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-16364-7_20","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,4]],"date-time":"2024-10-04T21:01:08Z","timestamp":1728075668000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-16364-7_20"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9783031163630","9783031163647"],"references-count":28,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-16364-7_20","relation":{},"ISSN":["1868-4238","1868-422X"],"issn-type":[{"type":"print","value":"1868-4238"},{"type":"electronic","value":"1868-422X"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"29 September 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ICCIDS","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Computational Intelligence in Data Science","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"24 March 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"26 March 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"5","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"iccids2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"http:\/\/iccids.in\/ICCIDS2022\/index.html","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"EquinOCS","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"96","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"28","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"29% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"2","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}