{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T13:26:13Z","timestamp":1743081973187,"version":"3.40.3"},"publisher-location":"Cham","reference-count":28,"publisher":"Springer International Publishing","isbn-type":[{"type":"print","value":"9783031168147"},{"type":"electronic","value":"9783031168154"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-3-031-16815-4_8","type":"book-chapter","created":{"date-parts":[[2022,9,23]],"date-time":"2022-09-23T20:19:35Z","timestamp":1663964375000},"page":"127-145","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["On the\u00a0Effect of\u00a0Clock Frequency on Voltage and Electromagnetic Fault Injection"],"prefix":"10.1007","author":[{"given":"Stefanos","family":"Koffas","sequence":"first","affiliation":[]},{"given":"Praveen Kumar","family":"Vadnala","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2022,9,24]]},"reference":[{"key":"8_CR1","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"125","DOI":"10.1007\/BFb0028165","volume-title":"Security Protocols","author":"R Anderson","year":"1998","unstructured":"Anderson, R., Kuhn, M.: Low cost attacks on tamper resistant devices. In: Christianson, B., Crispo, B., Lomas, M., Roe, M. (eds.) Security Protocols 1997. LNCS, vol. 1361, pp. 125\u2013136. Springer, Heidelberg (1998). https:\/\/doi.org\/10.1007\/BFb0028165"},{"key":"8_CR2","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"260","DOI":"10.1007\/3-540-36400-5_20","volume-title":"Cryptographic Hardware and Embedded Systems - CHES 2002","author":"C Aum\u00fcller","year":"2003","unstructured":"Aum\u00fcller, C., Bier, P., Fischer, W., Hofreiter, P., Seifert, J.-P.: Fault attacks on RSA with CRT: concrete results and practical countermeasures. In: Kaliski, B.S., Ko\u00e7, K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 260\u2013275. Springer, Heidelberg (2003). https:\/\/doi.org\/10.1007\/3-540-36400-5_20"},{"key":"8_CR3","doi-asserted-by":"crossref","unstructured":"Balasch, J., Gierlichs, B., Verbauwhede, I.: An in-depth and black-box characterization of the effects of clock glitches on 8-bit MCUs. In: 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 105\u2013114. IEEE (2011)","DOI":"10.1109\/FDTC.2011.9"},{"issue":"2","key":"8_CR4","doi-asserted-by":"publisher","first-page":"370","DOI":"10.1109\/JPROC.2005.862424","volume":"94","author":"H Bar-El","year":"2006","unstructured":"Bar-El, H., Choukri, H., Naccache, D., Tunstall, M., Whelan, C.: The sorcerer\u2019s apprentice guide to fault attacks. Proc. IEEE 94(2), 370\u2013382 (2006)","journal-title":"Proc. IEEE"},{"issue":"11","key":"8_CR5","doi-asserted-by":"publisher","first-page":"3056","DOI":"10.1109\/JPROC.2012.2188769","volume":"100","author":"A Barenghi","year":"2012","unstructured":"Barenghi, A., Breveglieri, L., Koren, I., Naccache, D.: Fault injection attacks on cryptographic devices: theory, practice, and countermeasures. Proc. IEEE 100(11), 3056\u20133076 (2012)","journal-title":"Proc. IEEE"},{"key":"8_CR6","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"151","DOI":"10.1007\/978-3-642-29912-4_12","volume-title":"Constructive Side-Channel Analysis and Secure Design","author":"P Bayon","year":"2012","unstructured":"Bayon, P., et al.: Contactless electromagnetic active attack on ring oscillator based true random number generator. In: Schindler, W., Huss, S.A. (eds.) COSADE 2012. LNCS, vol. 7275, pp. 151\u2013166. Springer, Heidelberg (2012). https:\/\/doi.org\/10.1007\/978-3-642-29912-4_12"},{"key":"8_CR7","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"151","DOI":"10.1007\/978-3-642-29912-4_12","volume-title":"Constructive Side-Channel Analysis and Secure Design","author":"P Bayon","year":"2012","unstructured":"Bayon, P., et al.: Contactless electromagnetic active attack on ring oscillator based true random number generator. In: Schindler, W., Huss, S.A. (eds.) COSADE 2012. LNCS, vol. 7275, pp. 151\u2013166. Springer, Heidelberg (2012). https:\/\/doi.org\/10.1007\/978-3-642-29912-4_12"},{"key":"8_CR8","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"513","DOI":"10.1007\/BFb0052259","volume-title":"Advances in Cryptology \u2014 CRYPTO \u201997","author":"E Biham","year":"1997","unstructured":"Biham, E., Shamir, A.: Differential fault analysis of secret key cryptosystems. In: Kaliski, B.S. (ed.) CRYPTO 1997. LNCS, vol. 1294, pp. 513\u2013525. Springer, Heidelberg (1997). https:\/\/doi.org\/10.1007\/BFb0052259"},{"key":"8_CR9","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"37","DOI":"10.1007\/3-540-69053-0_4","volume-title":"Advances in Cryptology \u2014 EUROCRYPT \u201997","author":"D Boneh","year":"1997","unstructured":"Boneh, D., DeMillo, R.A., Lipton, R.J.: On the importance of checking cryptographic protocols for faults. In: Fumy, W. (ed.) EUROCRYPT 1997. LNCS, vol. 1233, pp. 37\u201351. Springer, Heidelberg (1997). https:\/\/doi.org\/10.1007\/3-540-69053-0_4"},{"key":"8_CR10","doi-asserted-by":"publisher","first-page":"199","DOI":"10.46586\/tches.v2019.i2.199-224","volume":"2019","author":"C Bozzato","year":"2019","unstructured":"Bozzato, C., Focardi, R., Palmarini, F.: Shaping the glitch: Optimizing voltage fault injection attacks. IACR Trans. Cryptogr. Hardw. Embed. Syst. 2019, 199\u2013224 (2019)","journal-title":"IACR Trans. Cryptogr. Hardw. Embed. Syst."},{"key":"8_CR11","unstructured":"Cui, A., Housley, R.: BADFET: defeating modern secure boot using second-order pulsed electromagnetic fault injection. In: 11th $$\\text{USENIX}$$ Workshop on Offensive Technologies ($$\\text{ WOOT }$$ 17) (2017)"},{"key":"8_CR12","doi-asserted-by":"crossref","unstructured":"Dehbaoui, A., Dutertre, J.-M., Robisson, B., Tria, A.: Electromagnetic transient faults injection on a hardware and a software implementations of AES. In: 2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 7\u201315. IEEE (2012)","DOI":"10.1109\/FDTC.2012.15"},{"key":"8_CR13","doi-asserted-by":"publisher","unstructured":"Dumont, M., Lisart, M., Maurine, P.: Electromagnetic fault injection : How faults occur. In: 2019 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 9\u201316 (2019). https:\/\/doi.org\/10.1109\/FDTC.2019.00010","DOI":"10.1109\/FDTC.2019.00010"},{"key":"8_CR14","doi-asserted-by":"publisher","unstructured":"Elmohr, M.A., Liao, H., Gebotys, C.H.: EM fault injection on ARM and RISC-V. In: 2020 21st International Symposium on Quality Electronic Design (ISQED), pp. 206\u2013212 (2020). https:\/\/doi.org\/10.1109\/ISQED48828.2020.9137051","DOI":"10.1109\/ISQED48828.2020.9137051"},{"key":"8_CR15","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"27","DOI":"10.1007\/11506447_4","volume-title":"Advanced Encryption Standard \u2013 AES","author":"C Giraud","year":"2005","unstructured":"Giraud, C.: DFA on AES. In: Dobbertin, H., Rijmen, V., Sowa, A. (eds.) AES 2004. LNCS, vol. 3373, pp. 27\u201341. Springer, Heidelberg (2005). https:\/\/doi.org\/10.1007\/11506447_4"},{"key":"8_CR16","doi-asserted-by":"publisher","unstructured":"Liao, H., Gebotys, C.: Methodology for EM fault injection: charge-based fault model. In: 2019 Design, Automation Test in Europe Conference Exhibition (DATE), pp. 256\u2013259 (2019). https:\/\/doi.org\/10.23919\/DATE.2019.8715150","DOI":"10.23919\/DATE.2019.8715150"},{"key":"8_CR17","doi-asserted-by":"crossref","unstructured":"Moro, N., Dehbaoui, A., Heydemann, K., Robisson, B., Encrenaz, E.: Electromagnetic fault injection: towards a fault model on a 32-bit microcontroller. In: 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, pp. 77\u201388. IEEE (2013)","DOI":"10.1109\/FDTC.2013.9"},{"key":"8_CR18","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"245","DOI":"10.1007\/978-3-319-16763-3_15","volume-title":"Smart Card Research and Advanced Applications","author":"S Ordas","year":"2015","unstructured":"Ordas, S., Guillaume-Sage, L., Tobich, K., Dutertre, J.-M., Maurine, P.: Evidence of a larger EM-induced fault model. In: Joye, M., Moradi, A. (eds.) CARDIS 2014. LNCS, vol. 8968, pp. 245\u2013259. Springer, Cham (2015). https:\/\/doi.org\/10.1007\/978-3-319-16763-3_15"},{"key":"8_CR19","unstructured":"Riscure. Inspector fault injection (2020). https:\/\/getquote.riscure.com\/en\/inspector-fault-injection.html. Accessed 19 Aug 2022"},{"key":"8_CR20","doi-asserted-by":"crossref","unstructured":"Riviere, L., Najm, Z., Rauzy, P., Danger, J.L., Bringer, J., Sauvage, L.: High precision fault injections on the instruction cache of ARMv7-M architectures. In: 2015 IEEE International Symposium on Hardware Oriented Security and Trust (HOST), pp. 62\u201367. IEEE (2015)","DOI":"10.1109\/HST.2015.7140238"},{"key":"8_CR21","unstructured":"SiFive. FE310-G000 Datasheet (2017). https:\/\/sifive.cdn.prismic.io\/sifive%2Ffeb6f967-ff96-418f-9af4-a7f3b7fd1dfc_fe310-g000-ds.pdf. Accessed 19 Aug 2022"},{"key":"8_CR22","unstructured":"SiFive. FE310-G000 Manual (2019). https:\/\/static.dev.sifive.com\/FE310-G000.pdf. Accessed 19 Aug 2022"},{"key":"8_CR23","unstructured":"SiFive. HiFive1 Schematics (2016). https:\/\/sifive.cdn.prismic.io\/sifive%2F080cdef9-4631-4c9b-b8f5-7937fbdec8a4_hifive1-a01-schematics.pdf. Accessed 19 Aug 2022"},{"key":"8_CR24","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1007\/3-540-36400-5_2","volume-title":"Cryptographic Hardware and Embedded Systems - CHES 2002","author":"SP Skorobogatov","year":"2003","unstructured":"Skorobogatov, S.P., Anderson, R.J.: Optical fault induction attacks. In: Kaliski, B.S., Ko\u00e7, K., Paar, C. (eds.) CHES 2002. LNCS, vol. 2523, pp. 2\u201312. Springer, Heidelberg (2003). https:\/\/doi.org\/10.1007\/3-540-36400-5_2"},{"key":"8_CR25","doi-asserted-by":"crossref","unstructured":"Timmers, N., Mune, C.: Escalating privileges in linux using voltage fault injection. In: 2017 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 1\u20138 (2017)","DOI":"10.1109\/FDTC.2017.16"},{"key":"8_CR26","doi-asserted-by":"crossref","unstructured":"Timmers, N., Spruyt, A., Witteman, M.: Controlling pc on ARM using fault injection. In: 2016 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp. 25\u201335 (2016)","DOI":"10.1109\/FDTC.2016.18"},{"key":"8_CR27","doi-asserted-by":"publisher","first-page":"1449","DOI":"10.1109\/TC.2018.2860010","volume":"69","author":"A Vasselle","year":"2018","unstructured":"Vasselle, A., Thiebeauld, H., Maouhoub, Q., Morisset, A., Ermeneux, S.: Laser-induced fault injection on smartphone bypassing the secure boot. IEEE Trans. Comput. 69, 1449\u20131459 (2018)","journal-title":"IEEE Trans. Comput."},{"key":"8_CR28","doi-asserted-by":"crossref","unstructured":"Zussa, L., Dutertre, J.-M., Clediere, J., Tria, A.: Power supply glitch induced faults on FPGA: an in-depth analysis of the injection mechanism. In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), pp. 110\u2013115. IEEE (2013)","DOI":"10.1109\/IOLTS.2013.6604060"}],"container-title":["Lecture Notes in Computer Science","Applied Cryptography and Network Security Workshops"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-16815-4_8","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,15]],"date-time":"2025-03-15T13:08:59Z","timestamp":1742044139000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-16815-4_8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9783031168147","9783031168154"],"references-count":28,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-16815-4_8","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"24 September 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ACNS","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Conference on Applied Cryptography and Network Security","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Rome","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Italy","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"20 June 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"23 June 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"20","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"acns2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/sites.google.com\/di.uniroma1.it\/acns2022\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}}]}}