{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,22]],"date-time":"2026-03-22T18:35:06Z","timestamp":1774204506434,"version":"3.50.1"},"publisher-location":"Cham","reference-count":79,"publisher":"Springer Nature Switzerland","isbn-type":[{"value":"9783031198083","type":"print"},{"value":"9783031198090","type":"electronic"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-3-031-19809-0_25","type":"book-chapter","created":{"date-parts":[[2022,10,31]],"date-time":"2022-10-31T07:03:04Z","timestamp":1667199784000},"page":"435-454","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["A Non-isotropic Probabilistic Take on\u00a0Proxy-based Deep Metric Learning"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4521-9391","authenticated-orcid":false,"given":"Michael","family":"Kirchhof","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1510-7217","authenticated-orcid":false,"given":"Karsten","family":"Roth","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1432-7747","authenticated-orcid":false,"given":"Zeynep","family":"Akata","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3146-4484","authenticated-orcid":false,"given":"Enkelejda","family":"Kasneci","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2022,11,1]]},"reference":[{"key":"25_CR1","doi-asserted-by":"crossref","unstructured":"Bouchacourt, D., Tomioka, R., Nowozin, S.: Multi-level variational autoencoder: Learning disentangled representations from grouped observations. In: Thirty-Second AAAI Conference on Artificial Intelligence (AAAI) (2018)","DOI":"10.1609\/aaai.v32i1.11867"},{"key":"25_CR2","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"548","DOI":"10.1007\/978-3-030-58539-6_33","volume-title":"Computer Vision \u2013 ECCV 2020","author":"M Boudiaf","year":"2020","unstructured":"Boudiaf, M., et al.: A unifying mutual information view of metric learning: cross-entropy vs. pairwise losses. In: Vedaldi, A., Bischof, H., Brox, T., Frahm, J.-M. (eds.) ECCV 2020. LNCS, vol. 12351, pp. 548\u2013564. Springer, Cham (2020). https:\/\/doi.org\/10.1007\/978-3-030-58539-6_33"},{"key":"25_CR3","doi-asserted-by":"crossref","unstructured":"Brattoli, B., Tighe, J., Zhdanov, F., Perona, P., Chalupka, K.: Rethinking zero-shot video classification: End-to-end training for realistic applications. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2020)","DOI":"10.1109\/CVPR42600.2020.00467"},{"key":"25_CR4","unstructured":"Chen, S., Luo, L., Yang, J., Gong, C., Li, J., Huang, H.: Curvilinear distance metric learning. In: Advances in Neural Information Processing Systems 32, pp. 4223\u20134232. Curran Associates, Inc. (2019). https:\/\/papers.nips.cc\/paper\/8675-curvilinear-distance-metric-learning.pdf"},{"key":"25_CR5","unstructured":"Chen, T., Kornblith, S., Norouzi, M., Hinton, G.: A simple framework for contrastive learning of visual representations. In: Proceedings of the 37th International Conference on Machine Learning (ICML) (2020)"},{"key":"25_CR6","doi-asserted-by":"crossref","unstructured":"Chen, W., Chen, X., Zhang, J., Huang, K.: Beyond triplet loss: a deep quadruplet network for person re-identification. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2017)","DOI":"10.1109\/CVPR.2017.145"},{"key":"25_CR7","doi-asserted-by":"crossref","unstructured":"Chun, S., Oh, S.J., De Rezende, R.S., Kalantidis, Y., Larlus, D.: Probabilistic embeddings for cross-modal retrieval. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2021)","DOI":"10.1109\/CVPR46437.2021.00831"},{"key":"25_CR8","unstructured":"Davidson, T.R., Falorsi, L., De Cao, N., Kipf, T., Tomczak, J.M.: Hyperspherical variational auto-encoders. In: 34th Conference on Uncertainty in Artificial Intelligence (UAI) (2018)"},{"key":"25_CR9","doi-asserted-by":"crossref","unstructured":"Deng, J., Guo, J., Xue, N., Zafeiriou, S.: ArcFace: Additive angular margin loss for deep face recognition. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2019)","DOI":"10.1109\/CVPR.2019.00482"},{"key":"25_CR10","doi-asserted-by":"crossref","unstructured":"Duan, Y., Zheng, W., Lin, X., Lu, J., Zhou, J.: Deep adversarial metric learning. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2018)","DOI":"10.1109\/CVPR.2018.00294"},{"key":"25_CR11","doi-asserted-by":"crossref","unstructured":"Dutta, U.K., Harandi, M., Sekhar, C.C.: Unsupervised deep metric learning via orthogonality based probabilistic loss. IEEE Trans.actions Artif. Intell. 1(1), 74\u201384 (2020)","DOI":"10.1109\/TAI.2020.3026982"},{"key":"25_CR12","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"277","DOI":"10.1007\/978-3-030-58571-6_17","volume-title":"Computer Vision \u2013 ECCV 2020","author":"I Elezi","year":"2020","unstructured":"Elezi, I., Vascon, S., Torcinovich, A., Pelillo, M., Leal-Taix\u00e9, L.: The group loss for deep metric learning. In: Vedaldi, A., Bischof, H., Brox, T., Frahm, J.-M. (eds.) ECCV 2020. LNCS, vol. 12352, pp. 277\u2013294. Springer, Cham (2020). https:\/\/doi.org\/10.1007\/978-3-030-58571-6_17"},{"key":"25_CR13","doi-asserted-by":"crossref","unstructured":"Fisher, R.A.: Dispersion on a sphere. Proc. Royal Society London. Series A. Math. Phys. Sci. 217 295\u2013305 (1953)","DOI":"10.1098\/rspa.1953.0064"},{"key":"25_CR14","unstructured":"Goldberger, J., Hinton, G.E., Roweis, S., Salakhutdinov, R.R.: Neighbourhood components analysis. In: Advances in Neural Information Processing Systems (NeurIPS) (2004)"},{"key":"25_CR15","unstructured":"Hadsell, R., Chopra, S., LeCun, Y.: Dimensionality reduction by learning an invariant mapping. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (2006)"},{"key":"25_CR16","doi-asserted-by":"crossref","unstructured":"Harwood, B., Kumar, B., Carneiro, G., Reid, I., Drummond, T., et al.: Smart mining for deep metric learning. In: Proceedings of the IEEE International Conference on Computer Vision (ICCV) (2017)","DOI":"10.1109\/ICCV.2017.307"},{"key":"25_CR17","unstructured":"Hasnat, M.A., Bohn\u00e9, J., Milgram, J., Gentric, S., Chen, L.: von Mises-Fisher mixture model-based deep learning: Application to face verification. arXiv preprint arXiv:1706.04264 (2017)"},{"key":"25_CR18","doi-asserted-by":"crossref","unstructured":"He, K., Fan, H., Wu, Y., Xie, S., Girshick, R.: Momentum contrast for unsupervised visual representation learning. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2020)","DOI":"10.1109\/CVPR42600.2020.00975"},{"key":"25_CR19","doi-asserted-by":"crossref","unstructured":"He, K., Zhang, X., Ren, S., Sun, J.: Deep residual learning for image recognition. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2016)","DOI":"10.1109\/CVPR.2016.90"},{"key":"25_CR20","doi-asserted-by":"crossref","unstructured":"Hu, J., Lu, J., Tan, Y.: Discriminative deep metric learning for face verification in the wild. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2014)","DOI":"10.1109\/CVPR.2014.242"},{"key":"25_CR21","doi-asserted-by":"crossref","unstructured":"Jacob, P., Picard, D., Histace, A., Klein, E.: Metric learning with horde: High-order regularizer for deep embeddings. In: The IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2019)","DOI":"10.1109\/ICCV.2019.00664"},{"key":"25_CR22","doi-asserted-by":"crossref","unstructured":"Jebara, T., Kondor, R.: Bhattacharyya and expected likelihood kernels. In: Learning Theory and Kernel Machines (2003)","DOI":"10.1007\/978-3-540-45167-9_6"},{"key":"25_CR23","doi-asserted-by":"crossref","unstructured":"Kemertas, M., Pishdad, L., Derpanis, K.G., Fazly, A.: RankMI: A mutual information maximizing ranking loss. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2020)","DOI":"10.1109\/CVPR42600.2020.01437"},{"key":"25_CR24","doi-asserted-by":"crossref","unstructured":"Kent, J.T.: The Fisher-Bingham distribution on the sphere. J. Royal Stat. Society: Series B (Methodological) 44(1) 71\u201380 (1982)","DOI":"10.1111\/j.2517-6161.1982.tb01189.x"},{"key":"25_CR25","unstructured":"Khosla, P., et al.: Supervised contrastive learning. Advances in Neural Information Processing Systems (NeurIPS) (2020)"},{"key":"25_CR26","doi-asserted-by":"crossref","unstructured":"Kim, S., Kim, D., Cho, M., Kwak, S.: Proxy anchor loss for deep metric learning. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2020)","DOI":"10.1109\/CVPR42600.2020.00330"},{"key":"25_CR27","doi-asserted-by":"crossref","unstructured":"Kim, S., Kim, D., Cho, M., Kwak, S.: Embedding transfer with label relaxation for improved metric learning. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2021)","DOI":"10.1109\/CVPR46437.2021.00396"},{"key":"25_CR28","unstructured":"Kingma, D.P., Ba, J.: Adam: A method for stochastic optimization. In: Bengio, Y., LeCun, Y. (eds.) 3rd International Conference on Learning Representations (ICLR) (2015)"},{"key":"25_CR29","doi-asserted-by":"crossref","unstructured":"Ko, B., Gu, G., Kim, H.G.: Learning with memory-based virtual classes for deep metric learning. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision (ICCV) (2021)","DOI":"10.1109\/ICCV48922.2021.01158"},{"key":"25_CR30","doi-asserted-by":"crossref","unstructured":"Krause, J., Stark, M., Deng, J., Fei-Fei, L.: 3d object representations for fine-grained categorization. In: Proceedings of the IEEE International Conference on Computer Vision Workshops (CVPR) (2013)","DOI":"10.1109\/ICCVW.2013.77"},{"key":"25_CR31","doi-asserted-by":"crossref","unstructured":"Li, S., Xu, J., Xu, X., Shen, P., Li, S., Hooi, B.: Spherical confidence learning for face recognition. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2021)","DOI":"10.1109\/CVPR46437.2021.01537"},{"key":"25_CR32","doi-asserted-by":"crossref","unstructured":"Lin, X., Duan, Y., Dong, Q., Lu, J., Zhou, J.: Deep variational metric learning. In: Proceedings of the European Conference on Computer Vision (ECCV) (2018)","DOI":"10.1109\/CVPR.2018.00294"},{"key":"25_CR33","doi-asserted-by":"crossref","unstructured":"Liu, W., Wen, Y., Yu, Z., Li, M., Raj, B., Song, L.: Sphereface: Deep hypersphere embedding for face recognition. Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2017)","DOI":"10.1109\/CVPR.2017.713"},{"key":"25_CR34","doi-asserted-by":"crossref","unstructured":"Marcel, S., Rodriguez, Y.: Torchvision the machine-vision package of torch. MM \u201910, Association for Computing Machinery (2010)","DOI":"10.1145\/1873951.1874254"},{"key":"25_CR35","unstructured":"Mardia, K.V., Jupp, P.E.: Directional statistics (2009)"},{"key":"25_CR36","doi-asserted-by":"crossref","unstructured":"Mardia, K.V.: Statistics of directional data. J. Royal Stat. Society: Series B (Methodological) 37(3), 349\u2013393 (1975)","DOI":"10.1111\/j.2517-6161.1975.tb01550.x"},{"key":"25_CR37","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"590","DOI":"10.1007\/978-3-030-58598-3_35","volume-title":"Computer Vision \u2013 ECCV 2020","author":"T Milbich","year":"2020","unstructured":"Milbich, T., et al.: DiVA: diverse visual feature aggregation for deep metric learning. In: Vedaldi, A., Bischof, H., Brox, T., Frahm, J.-M. (eds.) ECCV 2020. LNCS, vol. 12353, pp. 590\u2013607. Springer, Cham (2020). https:\/\/doi.org\/10.1007\/978-3-030-58598-3_35"},{"key":"25_CR38","doi-asserted-by":"publisher","unstructured":"Milbich, T., Roth, K., Brattoli, B., Ommer, B.: Sharing matters for generalization in deep metric learning. IEEE Trans. Pattern Anal. Mach. Intell. 44(1), 416\u2013427 (2022). https:\/\/doi.org\/10.1109\/TPAMI.2020.3009620","DOI":"10.1109\/TPAMI.2020.3009620"},{"key":"25_CR39","unstructured":"Milbich, T., Roth, K., Sinha, S., Schmidt, L., Ghassemi, M., Ommer, B.: Characterizing generalization under out-of-distribution shifts in deep metric learning. In: Ranzato, M., Beygelzimer, A., Dauphin, Y., Liang, P., Vaughan, J.W. (eds.) Advances in Neural Information Processing Systems. vol. 34, pp. 25006\u201325018. Curran Associates, Inc. (2021), https:\/\/proceedings.neurips.cc\/paper\/2021\/file\/d1f255a373a3cef72e03aa9d980c7eca-Paper.pdf"},{"key":"25_CR40","doi-asserted-by":"crossref","unstructured":"Movshovitz-Attias, Y., Toshev, A., Leung, T.K., Ioffe, S., Singh, S.: No fuss distance metric learning using proxies. In: Proceedings of the IEEE International Conference on Computer Vision (ICCV) (2017)","DOI":"10.1109\/ICCV.2017.47"},{"key":"25_CR41","series-title":"Lecture Notes in Computer Science","doi-asserted-by":"publisher","first-page":"681","DOI":"10.1007\/978-3-030-58595-2_41","volume-title":"Computer Vision \u2013 ECCV 2020","author":"K Musgrave","year":"2020","unstructured":"Musgrave, K., Belongie, S., Lim, S.-N.: A metric learning reality check. In: Vedaldi, A., Bischof, H., Brox, T., Frahm, J.-M. (eds.) ECCV 2020. LNCS, vol. 12370, pp. 681\u2013699. Springer, Cham (2020). https:\/\/doi.org\/10.1007\/978-3-030-58595-2_41"},{"key":"25_CR42","doi-asserted-by":"crossref","unstructured":"Oh Song, H., Xiang, Y., Jegelka, S., Savarese, S.: Deep metric learning via lifted structured feature embedding. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2016)","DOI":"10.1109\/CVPR.2016.434"},{"key":"25_CR43","doi-asserted-by":"crossref","unstructured":"Opitz, M., Waltner, G., Possegger, H., Bischof, H.: Bier-boosting independent embeddings robustly. In: Proceedings of the IEEE International Conference on Computer Vision (ICCV) (2017)","DOI":"10.1109\/ICCV.2017.555"},{"key":"25_CR44","doi-asserted-by":"crossref","unstructured":"Opitz, M., Waltner, G., Possegger, H., Bischof, H.: Deep metric learning with BIER: Boosting independent embeddings robustly. IEEE Trans. Pattern Analysis Mach. Intell. 42(2), 276\u2013290 (2018)","DOI":"10.1109\/TPAMI.2018.2848925"},{"key":"25_CR45","unstructured":"Park, J., Yi, S., Choi, Y., Cho, D.Y., Kim, J.: Discriminative few-shot learning based on directional statistics. arXiv preprint arXiv:1906.01819 (2019)"},{"key":"25_CR46","unstructured":"Paszke, A., et al.: Automatic differentiation in pytorch. In: NIPS Workshop on Automatic Differentiation (2017)"},{"key":"25_CR47","doi-asserted-by":"crossref","unstructured":"Qian, Q., Shang, L., Sun, B., Hu, J., Li, H., Jin, R.: Softtriple loss: Deep metric learning without triplet sampling. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision (ICCV) (2019)","DOI":"10.1109\/ICCV.2019.00655"},{"key":"25_CR48","unstructured":"Ranjan, R., Castillo, C.D., Chellappa, R.: L2-constrained softmax loss for discriminative face verification. arXiv preprint arXiv:1703.09507 (2017)"},{"key":"25_CR49","doi-asserted-by":"crossref","unstructured":"Roth, K., Brattoli, B., Ommer, B.: Mic: Mining interclass characteristics for improved metric learning. In: Proceedings of the IEEE International Conference on Computer Vision (ICCV) (2019)","DOI":"10.1109\/ICCV.2019.00809"},{"key":"25_CR50","doi-asserted-by":"crossref","unstructured":"Roth, K., Milbich, T., Ommer, B.: PADS: Policy-adapted sampling for visual similarity learning. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2020)","DOI":"10.1109\/CVPR42600.2020.00660"},{"key":"25_CR51","unstructured":"Roth, K., Milbich, T., Ommer, B., Cohen, J.P., Ghassemi, M.: Simultaneous similarity-based self-distillation for deep metric learning. In: Proceedings of the 38th International Conference on Machine Learning (ICML) (2021)"},{"key":"25_CR52","unstructured":"Roth, K., Milbich, T., Sinha, S., Gupta, P., Ommer, B., Cohen, J.P.: Revisiting training strategies and generalization performance in deep metric learning. In: Proceedings of the 37th International Conference on Machine Learning (ICML) (2020)"},{"key":"25_CR53","doi-asserted-by":"crossref","unstructured":"Roth, K., Vinyals, O., Akata, Z.: Integrating language guidance into vision-based deep metric learning. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp. 16177\u201316189 (June 2022)","DOI":"10.1109\/CVPR52688.2022.01570"},{"key":"25_CR54","doi-asserted-by":"crossref","unstructured":"Roth, K., Vinyals, O., Akata, Z.: Non-isotropy regularization for proxy-based deep metric learning. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp. 7420\u20137430 (2022)","DOI":"10.1109\/CVPR52688.2022.00727"},{"key":"25_CR55","doi-asserted-by":"crossref","unstructured":"Sanakoyeu, A., Tschernezki, V., Buchler, U., Ommer, B.: Divide and conquer the embedding space for metric learning. In: The IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2019)","DOI":"10.1109\/CVPR.2019.00056"},{"key":"25_CR56","doi-asserted-by":"crossref","unstructured":"Schroff, F., Kalenichenko, D., Philbin, J.: Facenet: A unified embedding for face recognition and clustering. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2015)","DOI":"10.1109\/CVPR.2015.7298682"},{"key":"25_CR57","doi-asserted-by":"crossref","unstructured":"Scott, T.R., Gallagher, A.C., Mozer, M.C.: von Mises-Fisher loss: An exploration of embedding geometries for supervised learning. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision (ICCV) (2021)","DOI":"10.1109\/ICCV48922.2021.01044"},{"key":"25_CR58","doi-asserted-by":"crossref","unstructured":"Shi, Y., Jain, A.K.: Probabilistic face embeddings. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision (ICCV) (2019)","DOI":"10.1109\/ICCV.2019.00700"},{"key":"25_CR59","doi-asserted-by":"crossref","unstructured":"Sinha, S., et al.: Uniform priors for data-efficient learning. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops, pp. 4017\u20134028 (2022)","DOI":"10.1109\/CVPRW56347.2022.00447"},{"key":"25_CR60","unstructured":"Sohn, K.: Improved deep metric learning with multi-class n-pair loss objective. In: Advances in Neural Information Processing Systems (NeurIPS) (2016)"},{"key":"25_CR61","doi-asserted-by":"crossref","unstructured":"l. Sun, Y., et al.: Circle loss: A unified perspective of pair similarity optimization. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2020)","DOI":"10.1109\/CVPR42600.2020.00643"},{"key":"25_CR62","doi-asserted-by":"crossref","unstructured":"Szegedy, C., et al.: Going deeper with convolutions. In: Computer Vision and Pattern Recognition (CVPR) (2015)","DOI":"10.1109\/CVPR.2015.7298594"},{"key":"25_CR63","doi-asserted-by":"crossref","unstructured":"Teh, E.W., DeVries, T., Taylor, G.W.: ProxyNCA++: Revisiting and revitalizing proxy neighborhood component analysis. In: Proceedings of the European Conference on Computer Vision (ECCV) (2020)","DOI":"10.1007\/978-3-030-58586-0_27"},{"key":"25_CR64","unstructured":"Wah, C., Branson, S., Welinder, P., Perona, P., Belongie, S.: The Caltech-UCSD birds-200-2011 dataset. Tech. Rep. CNS-TR-2011-001, California Institute of Technology (2011)"},{"key":"25_CR65","doi-asserted-by":"crossref","unstructured":"Wang, J., Zhou, F., Wen, S., Liu, X., Lin, Y.: Deep metric learning with angular loss. In: Proceedings of the IEEE International Conference on Computer Vision (ICCV) (2017)","DOI":"10.1109\/ICCV.2017.283"},{"key":"25_CR66","unstructured":"Wang, T., Isola, P.: Understanding contrastive representation learning through alignment and uniformity on the hypersphere. In: Proceedings of the 37th International Conference on Machine Learning (ICML) (2020)"},{"key":"25_CR67","doi-asserted-by":"crossref","unstructured":"Wang, X., Han, X., Huang, W., Dong, D., Scott, M.R.: Multi-similarity loss with general pair weighting for deep metric learning. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2019)","DOI":"10.1109\/CVPR.2019.00516"},{"key":"25_CR68","unstructured":"Weisstein, E.W.: Hypersphere (2002)"},{"key":"25_CR69","unstructured":"Wightman, R.: Pytorch image models. https:\/\/github.com\/rwightman\/pytorch-image-models (2019)"},{"key":"25_CR70","doi-asserted-by":"crossref","unstructured":"Wu, C.Y., Manmatha, R., Smola, A.J., Krahenbuhl, P.: Sampling matters in deep embedding learning. In: Proceedings of the IEEE International Conference on Computer Vision (ICCV) (2017)","DOI":"10.1109\/ICCV.2017.309"},{"key":"25_CR71","doi-asserted-by":"crossref","unstructured":"Xuan, H., Stylianou, A., Pless, R.: Improved embeddings with easy positive triplet mining. In: Proceedings of the IEEE\/CVF Winter Conference on Applications of Computer Vision (WACV) (March 2020)","DOI":"10.1109\/WACV45572.2020.9093432"},{"key":"25_CR72","doi-asserted-by":"crossref","unstructured":"Xuan, H., Stylianou, A., Pless, R.: Improved embeddings with easy positive triplet mining. In: Proceedings of the IEEE\/CVF Winter Conference on Applications of Computer Vision (WACV) (March 2020)","DOI":"10.1109\/WACV45572.2020.9093432"},{"key":"25_CR73","unstructured":"Zhai, A., Wu, H.: Making classification competitive for deep metric learning. arXiv Preprint arXiv:1811.12649 (2018)"},{"key":"25_CR74","doi-asserted-by":"crossref","unstructured":"Zhe, X., Chen, S., Yan, H.: Directional statistics-based deep metric learning for image classification and retrieval. Pattern Recognition 93 (2018)","DOI":"10.1016\/j.patcog.2019.04.005"},{"key":"25_CR75","doi-asserted-by":"crossref","unstructured":"Zheng, W., Chen, Z., Lu, J., Zhou, J.: Hardness-aware deep metric learning. The IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2019)","DOI":"10.1109\/CVPR.2019.00016"},{"key":"25_CR76","doi-asserted-by":"crossref","unstructured":"Zheng, W., Wang, C., Lu, J., Zhou, J.: Deep compositional metric learning. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (2021)","DOI":"10.1109\/CVPR46437.2021.00920"},{"key":"25_CR77","doi-asserted-by":"crossref","unstructured":"Zheng, W., Zhang, B., Lu, J., Zhou, J.: Deep relational metric learning. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision (ICCV) (2021)","DOI":"10.1109\/ICCV48922.2021.01185"},{"key":"25_CR78","unstructured":"Zhu, Y., Yang, M., Deng, C., Liu, W.: Fewer is more: A deep graph metric learning perspective using fewer proxies. In: Larochelle, H., Ranzato, M., Hadsell, R., Balcan, M.F., Lin, H. (eds.) Advances in Neural Information Processing Systems (NeurIPS) (2020)"},{"key":"25_CR79","unstructured":"Zimmermann, R.S., Sharma, Y., Schneider, S., Bethge, M., Brendel, W.: Contrastive learning inverts the data generating process. In: Proceedings of the 38th International Conference on Machine Learning (ICML) (2021)"}],"container-title":["Lecture Notes in Computer Science","Computer Vision \u2013 ECCV 2022"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-19809-0_25","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,3]],"date-time":"2022-11-03T00:13:49Z","timestamp":1667434429000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-19809-0_25"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9783031198083","9783031198090"],"references-count":79,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-19809-0_25","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"value":"0302-9743","type":"print"},{"value":"1611-3349","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"1 November 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"ECCV","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"European Conference on Computer Vision","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Tel Aviv","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Israel","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"23 October 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"27 October 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"17","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"eccv2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/eccv2022.ecva.net\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"CMT","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"5804","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"1645","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"0","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"28% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.21","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3.91","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}