{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,8]],"date-time":"2025-05-08T06:42:53Z","timestamp":1746686573397,"version":"3.40.3"},"publisher-location":"Cham","reference-count":7,"publisher":"Springer Nature Switzerland","isbn-type":[{"type":"print","value":"9783031215131"},{"type":"electronic","value":"9783031215148"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-3-031-21514-8_14","type":"book-chapter","created":{"date-parts":[[2022,12,16]],"date-time":"2022-12-16T13:22:24Z","timestamp":1671196944000},"page":"150-157","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["High Resolution Temperature Sensor Signal Processing ASIC for\u00a0Cryo-Cooler Electronics"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3274-7120","authenticated-orcid":false,"given":"Anuj","family":"Srivastava","sequence":"first","affiliation":[]},{"given":"Nishant","family":"Kumar","sequence":"additional","affiliation":[]},{"given":"Nihar Ranjan","family":"Mohapatra","sequence":"additional","affiliation":[]},{"given":"Hari Shankar","family":"Gupta","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2022,12,17]]},"reference":[{"key":"14_CR1","doi-asserted-by":"crossref","unstructured":"Chowdhury, A.R., et al.: Imaging Infrared Spectrometer (IIRS) onboard Chandrayaan-2 Orbiter-craft. Curr. Sci. 118(3), 560 (2020)","DOI":"10.18520\/cs\/v118\/i3\/368-375"},{"issue":"1","key":"14_CR2","doi-asserted-by":"publisher","first-page":"673","DOI":"10.1016\/j.ifacol.2018.05.113","volume":"51","author":"HH Nagarsheth","year":"2018","unstructured":"Nagarsheth, H.H., Bhatt, J.H., Barve, J.J.: Cold-Tip temperature control of space-borne satellite stirling cryocooler: mathematical modeling and control investigation. IFAC-Papers OnLine 51(1), 673\u2013679 (2018)","journal-title":"IFAC-Papers OnLine"},{"key":"14_CR3","doi-asserted-by":"publisher","unstructured":"Gupta, H.S., Kumar, A.S.K., Baghini, M.S., Chakrabarti, S., Sharma, D.K.: Design of high-precision ROIC for quantum dot infrared photodetector. IEEE Photonics Technol. Lett. 28(15), 1673\u20131676, (2016). https:\/\/doi.org\/10.1109\/LPT.2016.2560804","DOI":"10.1109\/LPT.2016.2560804"},{"key":"14_CR4","unstructured":"Design of analog CMOS integrated circuits 2nd ed. California: McGraw Hill, pp. 539\u2013571"},{"key":"14_CR5","doi-asserted-by":"publisher","first-page":"40","DOI":"10.2139\/ssrn.3433181","volume":"3","author":"S Suman","year":"2019","unstructured":"Suman, S.: Two stage CMOS operational amplifier: analysis and design. SSRN Electron. J. 3, 40\u201344 (2019). https:\/\/doi.org\/10.2139\/ssrn.3433181","journal-title":"SSRN Electron. J."},{"key":"14_CR6","unstructured":"Texas Instruments, Noise Analysis in Operational Amplifier Circuits, Application Report (2007) SLVA043B"},{"key":"14_CR7","doi-asserted-by":"crossref","unstructured":"Kouhalvandi, L., et al.: An improved 2 stage opamp with rail-to-rai! gain-boosted folded cascode input stage and monticelli rail-to-rail class AB output stage. In: 2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS), pp. 542\u2013545 (2017)","DOI":"10.1109\/ICECS.2017.8292126"}],"container-title":["Communications in Computer and Information Science","VLSI Design and Test"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-21514-8_14","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,16]],"date-time":"2022-12-16T14:39:32Z","timestamp":1671201572000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-21514-8_14"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9783031215131","9783031215148"],"references-count":7,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-21514-8_14","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"type":"print","value":"1865-0929"},{"type":"electronic","value":"1865-0937"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"17 December 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"VDAT","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Symposium on VLSI Design and Test","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Jammu","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"India","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"17 July 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"19 July 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"26","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"vdat2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/iitjammu.ac.in\/vdat2022\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Easychair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"220","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"32","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"16","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"15% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}