{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,26]],"date-time":"2025-03-26T10:06:24Z","timestamp":1742983584774,"version":"3.40.3"},"publisher-location":"Cham","reference-count":15,"publisher":"Springer Nature Switzerland","isbn-type":[{"type":"print","value":"9783031215131"},{"type":"electronic","value":"9783031215148"}],"license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022]]},"DOI":"10.1007\/978-3-031-21514-8_16","type":"book-chapter","created":{"date-parts":[[2022,12,16]],"date-time":"2022-12-16T13:22:24Z","timestamp":1671196944000},"page":"172-184","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Four Differential Channels, Programmable Gain, Programmable Data Rate Delta Sigma ADC"],"prefix":"10.1007","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8412-2421","authenticated-orcid":false,"given":"Mohd Asim","family":"Saeed","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5062-6894","authenticated-orcid":false,"given":"Deep","family":"Sehgal","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7087-9717","authenticated-orcid":false,"given":"Surinder","family":"Singh","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2022,12,17]]},"reference":[{"issue":"4","key":"16_CR1","doi-asserted-by":"publisher","first-page":"484","DOI":"10.1109\/JETCAS.2015.2502164","volume":"5","author":"JM de la Rosa","year":"2015","unstructured":"de la Rosa, J.M., Schreier, R., Pun, K., Pavan, S.: Next-generation delta-sigma converters: trends and perspectives. IEEE J. Emerg. Sel. Top. Circuits Syst. 5(4), 484\u2013499 (2015). https:\/\/doi.org\/10.1109\/JETCAS.2015.2502164","journal-title":"IEEE J. Emerg. Sel. Top. Circuits Syst."},{"key":"16_CR2","doi-asserted-by":"crossref","unstructured":"Norsworthy, S.R., Schreier, R., Temes, G.C.: Delta-Sigma Data Converters: Theory, Design and Simulation, NewYork, NY. Wiley, USA (1997)","DOI":"10.1109\/9780470544358"},{"key":"16_CR3","doi-asserted-by":"publisher","DOI":"10.1007\/1-4020-4776-2","volume-title":"CMOS Cascade Sigma-Delta Modulators for Sensors and Telecom","author":"R del R\u00edo","year":"2006","unstructured":"del R\u00edo, R., Mederio, F., P\u00e9rez-Verd\u00fa, B., de la Rosa, J.M., Rodr\u00edguez-V\u00e1zquez, \u00c1.: CMOS Cascade Sigma-Delta Modulators for Sensors and Telecom. Springer, Netherlands (2006). https:\/\/doi.org\/10.1007\/1-4020-4776-2"},{"key":"16_CR4","unstructured":"Sreelal S. P., et al.: A versatile, software programmable telemetry system for satellite launch vehicles. In: Proceedings of 2006 International Telemetering Conference (ITC 06), San Diego, USA, pp. 06\u201318-04 (2006)"},{"key":"16_CR5","unstructured":"ADS1218: 8-Channel, 24-Bit Analog-to-Digital Converter Data sheet, Texas Instruments Inc., USA (2005)"},{"issue":"11","key":"16_CR6","doi-asserted-by":"publisher","first-page":"1584","DOI":"10.1109\/5.542410","volume":"84","author":"CC Enz","year":"1996","unstructured":"Enz, C.C., Temes, G.C.: Circuit techniques for reducing the effects of op-amp imperfections: autozeroing, correlated double sampling, and chopper stabilization. Proc. IEEE 84(11), 1584\u20131614 (1996)","journal-title":"Proc. IEEE"},{"key":"16_CR7","doi-asserted-by":"publisher","unstructured":"Samadpoor Rikan, B., et al.: A sigma-delta ADC for signal conditioning IC of automotive piezo-resistive pressure sensors with over 80 dB SNR. Sensors 18, 4199 (2018). https:\/\/doi.org\/10.3390\/s18124199","DOI":"10.3390\/s18124199"},{"key":"16_CR8","doi-asserted-by":"publisher","first-page":"1156","DOI":"10.3390\/electronics10101156","volume":"10","author":"L Benvenuti","year":"2021","unstructured":"Benvenuti, L., Catania, A., Manfredini, G., Ria, A., Piotto, M., Bruschi, P.: Design strategies and architectures for ultra-low-voltage delta-sigma ADCs. Electronics 10, 1156 (2021). https:\/\/doi.org\/10.3390\/electronics10101156","journal-title":"Electronics"},{"issue":"21","key":"16_CR9","doi-asserted-by":"publisher","first-page":"1103","DOI":"10.1049\/el:19860756","volume":"22","author":"K Nagaraj","year":"1986","unstructured":"Nagaraj, K., Vlach, J., Viswanathan, T.R., Singhal, K.: Switched-capacitor integrator with reduced sensitivity to amplifier gain. Electron. Lett. 22(21), 1103\u20131105 (1986)","journal-title":"Electron. Lett."},{"key":"16_CR10","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/INDICON.2015.7443484","volume":"2015","author":"MA Saeed","year":"2015","unstructured":"Saeed, M.A., Gadhia, J., Jatana, H.S.: Accurate analysis of settling error in CDS integrator based sigma delta modulators. Annu. IEEE India Conf. (INDICON) 2015, 1\u20136 (2015). https:\/\/doi.org\/10.1109\/INDICON.2015.7443484","journal-title":"Annu. IEEE India Conf. (INDICON)"},{"key":"16_CR11","doi-asserted-by":"publisher","unstructured":"Yao, L., Steyaert, M.S.J., Sansen, W.: A 1-V 140-\/spl mu\/W 88-dB audio sigma-delta modulator in 90-nm CMOS. IEEE J. Solid-State Circ. 39(11), 1809\u20131818 (2004). https:\/\/doi.org\/10.1109\/JSSC.2004.835825","DOI":"10.1109\/JSSC.2004.835825"},{"key":"16_CR12","doi-asserted-by":"crossref","unstructured":"Yin, G.M., Eynde, F.O., Sansen, W.: A high-speed CMOS comparator with 8-b resolution. IEEE J. Solid-State Circ. 27(2), 208\u2013211 (1992)","DOI":"10.1109\/4.127344"},{"issue":"2","key":"16_CR13","doi-asserted-by":"publisher","first-page":"155","DOI":"10.1109\/TASSP.1981.1163535","volume":"29","author":"E Hogenauer","year":"1981","unstructured":"Hogenauer, E.: An economical class of digital filters for decimation and interpolation. IEEE Trans. Acoust. Speech Signal Process. 29(2), 155\u2013162 (1981). https:\/\/doi.org\/10.1109\/TASSP.1981.1163535","journal-title":"IEEE Trans. Acoust. Speech Signal Process."},{"issue":"6","key":"16_CR14","doi-asserted-by":"publisher","first-page":"868","DOI":"10.1109\/19.199424","volume":"41","author":"S Park","year":"1992","unstructured":"Park, S.: Multi-stage decimation filter design technique for high-resolution sigma-delta A\/D converters. IEEE Trans. Instrum. Meas. 41(6), 868\u2013873 (1992). https:\/\/doi.org\/10.1109\/19.199424","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"16_CR15","unstructured":"Baker, B.: A glossary of analog-to-digital specifications and performance characteristics. Texas Instruments Application Report, SBAA147B (2011)"}],"container-title":["Communications in Computer and Information Science","VLSI Design and Test"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/978-3-031-21514-8_16","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,16]],"date-time":"2022-12-16T14:39:57Z","timestamp":1671201597000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/978-3-031-21514-8_16"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"ISBN":["9783031215131","9783031215148"],"references-count":15,"URL":"https:\/\/doi.org\/10.1007\/978-3-031-21514-8_16","relation":{},"ISSN":["1865-0929","1865-0937"],"issn-type":[{"type":"print","value":"1865-0929"},{"type":"electronic","value":"1865-0937"}],"subject":[],"published":{"date-parts":[[2022]]},"assertion":[{"value":"17 December 2022","order":1,"name":"first_online","label":"First Online","group":{"name":"ChapterHistory","label":"Chapter History"}},{"value":"VDAT","order":1,"name":"conference_acronym","label":"Conference Acronym","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"International Symposium on VLSI Design and Test","order":2,"name":"conference_name","label":"Conference Name","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Jammu","order":3,"name":"conference_city","label":"Conference City","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"India","order":4,"name":"conference_country","label":"Conference Country","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"2022","order":5,"name":"conference_year","label":"Conference Year","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"17 July 2022","order":7,"name":"conference_start_date","label":"Conference Start Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"19 July 2022","order":8,"name":"conference_end_date","label":"Conference End Date","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"26","order":9,"name":"conference_number","label":"Conference Number","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"vdat2022","order":10,"name":"conference_id","label":"Conference ID","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"https:\/\/iitjammu.ac.in\/vdat2022\/","order":11,"name":"conference_url","label":"Conference URL","group":{"name":"ConferenceInfo","label":"Conference Information"}},{"value":"Double-blind","order":1,"name":"type","label":"Type","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Easychair","order":2,"name":"conference_management_system","label":"Conference Management System","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"220","order":3,"name":"number_of_submissions_sent_for_review","label":"Number of Submissions Sent for Review","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"32","order":4,"name":"number_of_full_papers_accepted","label":"Number of Full Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"16","order":5,"name":"number_of_short_papers_accepted","label":"Number of Short Papers Accepted","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"15% - The value is computed by the equation \"Number of Full Papers Accepted \/ Number of Submissions Sent for Review * 100\" and then rounded to a whole number.","order":6,"name":"acceptance_rate_of_full_papers","label":"Acceptance Rate of Full Papers","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"3","order":7,"name":"average_number_of_reviews_per_paper","label":"Average Number of Reviews per Paper","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"4","order":8,"name":"average_number_of_papers_per_reviewer","label":"Average Number of Papers per Reviewer","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}},{"value":"Yes","order":9,"name":"external_reviewers_involved","label":"External Reviewers Involved","group":{"name":"ConfEventPeerReviewInformation","label":"Peer Review Information (provided by the conference organizers)"}}]}}